JPWO2022107764A1 - - Google Patents

Info

Publication number
JPWO2022107764A1
JPWO2022107764A1 JP2022563770A JP2022563770A JPWO2022107764A1 JP WO2022107764 A1 JPWO2022107764 A1 JP WO2022107764A1 JP 2022563770 A JP2022563770 A JP 2022563770A JP 2022563770 A JP2022563770 A JP 2022563770A JP WO2022107764 A1 JPWO2022107764 A1 JP WO2022107764A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022563770A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2022107764A1 publication Critical patent/JPWO2022107764A1/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/0052Manufacturing aspects; Manufacturing of single devices, i.e. of semiconductor magnetic sensor chips
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/0005Geometrical arrangement of magnetic sensor elements; Apparatus combining different magnetic sensor types
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/02Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09Magnetoresistive devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/02Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09Magnetoresistive devices
    • G01R33/093Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N50/00Galvanomagnetic devices
    • H10N50/10Magnetoresistive devices

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Hall/Mr Elements (AREA)
  • Measuring Magnetic Variables (AREA)
JP2022563770A 2020-11-23 2021-11-16 Pending JPWO2022107764A1 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US202063117154P 2020-11-23 2020-11-23
JP2021022904 2021-02-16
PCT/JP2021/042084 WO2022107764A1 (ja) 2020-11-23 2021-11-16 磁気センサ

Publications (1)

Publication Number Publication Date
JPWO2022107764A1 true JPWO2022107764A1 (ja) 2022-05-27

Family

ID=81708985

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022563770A Pending JPWO2022107764A1 (ja) 2020-11-23 2021-11-16

Country Status (4)

Country Link
US (1) US20240003990A1 (ja)
JP (1) JPWO2022107764A1 (ja)
CN (1) CN216900887U (ja)
WO (1) WO2022107764A1 (ja)

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2990971B2 (ja) * 1992-09-22 1999-12-13 松下電器産業株式会社 半導体薄膜磁気抵抗素子およびその製造方法
JP3684658B2 (ja) * 1996-03-25 2005-08-17 松下電器産業株式会社 磁気抵抗素子およびその製造方法
JP2001043981A (ja) * 1999-05-24 2001-02-16 Toray Ind Inc 表示装置およびその製造方法
JP2011146735A (ja) * 2011-03-22 2011-07-28 Rohm Co Ltd 半導体発光装置の製造方法
KR101768254B1 (ko) * 2013-06-12 2017-08-16 매그나칩 반도체 유한회사 반도체 기반의 자기 센서 및 그 제조 방법
JP6500583B2 (ja) * 2015-05-11 2019-04-17 日立化成株式会社 導電粒子、及び導電粒子を用いた半導体パッケージ
JP6651271B2 (ja) * 2017-02-15 2020-02-19 三菱電機株式会社 半導体素子及びその製造方法
WO2019111547A1 (ja) * 2017-12-04 2019-06-13 株式会社村田製作所 電子部品及び電子部品の製造方法
JP7296744B2 (ja) * 2019-03-01 2023-06-23 太陽誘電株式会社 積層セラミックコンデンサ及びその製造方法
JP2020178045A (ja) * 2019-04-18 2020-10-29 パナソニックIpマネジメント株式会社 磁気抵抗素子およびその製造方法

Also Published As

Publication number Publication date
CN216900887U (zh) 2022-07-05
US20240003990A1 (en) 2024-01-04
WO2022107764A1 (ja) 2022-05-27

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