JPWO2021246497A1 - - Google Patents

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Publication number
JPWO2021246497A1
JPWO2021246497A1 JP2022528897A JP2022528897A JPWO2021246497A1 JP WO2021246497 A1 JPWO2021246497 A1 JP WO2021246497A1 JP 2022528897 A JP2022528897 A JP 2022528897A JP 2022528897 A JP2022528897 A JP 2022528897A JP WO2021246497 A1 JPWO2021246497 A1 JP WO2021246497A1
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2022528897A
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Japanese (ja)
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JP7376052B2 (ja
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Publication of JPWO2021246497A1 publication Critical patent/JPWO2021246497A1/ja
Application granted granted Critical
Publication of JP7376052B2 publication Critical patent/JP7376052B2/ja
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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/16Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/18Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge using photoelastic elements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress, in general
    • G01L1/24Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet
    • G01L1/242Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet the material being an optical fibre
    • G01L1/246Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet the material being an optical fibre using integrated gratings, e.g. Bragg gratings
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/636Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited using an arrangement of pump beam and probe beam; using the measurement of optical non-linear properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/954Inspecting the inner surface of hollow bodies, e.g. bores
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N2021/4704Angular selective
    • G01N2021/4709Backscatter
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/636Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited using an arrangement of pump beam and probe beam; using the measurement of optical non-linear properties
    • G01N2021/638Brillouin effect, e.g. stimulated Brillouin effect
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/954Inspecting the inner surface of hollow bodies, e.g. bores
    • G01N2021/9542Inspecting the inner surface of hollow bodies, e.g. bores using a probe
    • G01N2021/9546Inspecting the inner surface of hollow bodies, e.g. bores using a probe with remote light transmitting, e.g. optical fibres

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nonlinear Science (AREA)
  • Optics & Photonics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2022528897A 2020-06-05 2021-06-03 形状測定システム及び形状測定方法 Active JP7376052B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020098349 2020-06-05
JP2020098349 2020-06-05
PCT/JP2021/021283 WO2021246497A1 (ja) 2020-06-05 2021-06-03 形状測定システム及び形状測定方法

Publications (2)

Publication Number Publication Date
JPWO2021246497A1 true JPWO2021246497A1 (https=) 2021-12-09
JP7376052B2 JP7376052B2 (ja) 2023-11-08

Family

ID=78831274

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022528897A Active JP7376052B2 (ja) 2020-06-05 2021-06-03 形状測定システム及び形状測定方法

Country Status (4)

Country Link
US (1) US12203847B2 (https=)
EP (1) EP4163586B1 (https=)
JP (1) JP7376052B2 (https=)
WO (1) WO2021246497A1 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4455617A4 (en) * 2021-12-24 2025-12-17 Ntt Inc FORM MEASURING SYSTEM AND FORM MEASURING METHOD
CN115900579B (zh) * 2023-01-06 2023-05-26 山东大学 一种自校正可拼接式光纤位移场传感系统及其校正方法
WO2025047077A1 (ja) * 2023-08-28 2025-03-06 日本電信電話株式会社 測定システム、測定方法、及び、解析装置
CN118149723B (zh) * 2024-05-09 2024-07-19 武汉理工大学 一种长距离水下线缆姿态检测方法及系统

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013505441A (ja) * 2009-09-18 2013-02-14 ルナ イノベーションズ インコーポレイテッド 光学的位置および/または形状センシング
JP2016102691A (ja) * 2014-11-27 2016-06-02 日本電信電話株式会社 光ファイバの曲げ形状測定装置及びその曲げ形状測定方法
JP2018527041A (ja) * 2015-06-15 2018-09-20 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. 後方散乱反射光測定を用いて医療デバイスの位置及び/又は形状を感知するための光学的形状感知システム並びに方法
JP2019522776A (ja) * 2016-05-11 2019-08-15 インテュイティブ サージカル オペレーションズ, インコーポレイテッド 安全性のためのマルチコア光ファイバ内の冗長コア
JP2019531487A (ja) * 2016-08-10 2019-10-31 フラウンホファー ゲセルシャフト ツール フェールデルンク ダー アンゲヴァンテン フォルシュンク エー.ファオ. 光学導波路の屈曲及び/またはひずみを決定するための方法

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JP4985405B2 (ja) * 2005-09-29 2012-07-25 住友電気工業株式会社 センサ及びそれを用いた外乱測定方法
JP2007101508A (ja) * 2005-10-07 2007-04-19 Sumitomo Electric Ind Ltd 温度測定方法及び温度測定装置
JP5769676B2 (ja) * 2012-08-17 2015-08-26 公益財団法人地球環境産業技術研究機構 物質の圧力、温度、ひずみ分布測定システム、これを用いた二酸化炭素地中貯留の監視方法、二酸化炭素注入による地層安定性への影響評価方法、および結氷監視方法
US9366526B2 (en) * 2012-11-30 2016-06-14 Neubrex Co., Ltd. Three-dimensional position measurement system
US10228556B2 (en) * 2014-04-04 2019-03-12 The General Hospital Corporation Apparatus and method for controlling propagation and/or transmission of electromagnetic radiation in flexible waveguide(s)
CN105371781B (zh) * 2015-11-13 2018-09-07 华中科技大学 一种三维形状测量方法
US10145681B2 (en) * 2016-07-19 2018-12-04 Corning Incorporated Brillouin-based distributed bend fiber sensor and method for using same
US10530114B2 (en) * 2017-08-31 2020-01-07 United States Of America As Represented By The Administrator Of Nasa Polarization maintaining, large mode area (PMVLMA) erbium-doped optical fiber and amplifier
CN110243302B (zh) * 2018-03-08 2020-11-06 桂林电子科技大学 反射式多芯循环串接光纤形状传感器
EP3832254B1 (en) * 2018-07-31 2023-08-30 Furukawa Electric Co., Ltd. Cable, cable shape sensing system, sensing system, and method for sensing cable shape
EP3969866B1 (en) * 2019-05-12 2025-12-24 Hampidjan HF. A process for ascertaining the elongation of a load-bearing cable
WO2021086129A1 (ko) * 2019-10-31 2021-05-06 (주)옵토닉스 3차원 곡선 형상을 측정하기 위한 특수 광섬유 및 그의 제조 방법, 그리고 특수 광섬유를 이용하여 3차원 곡선 형상을 측정하는 시스템

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013505441A (ja) * 2009-09-18 2013-02-14 ルナ イノベーションズ インコーポレイテッド 光学的位置および/または形状センシング
JP2016102691A (ja) * 2014-11-27 2016-06-02 日本電信電話株式会社 光ファイバの曲げ形状測定装置及びその曲げ形状測定方法
JP2018527041A (ja) * 2015-06-15 2018-09-20 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. 後方散乱反射光測定を用いて医療デバイスの位置及び/又は形状を感知するための光学的形状感知システム並びに方法
JP2019522776A (ja) * 2016-05-11 2019-08-15 インテュイティブ サージカル オペレーションズ, インコーポレイテッド 安全性のためのマルチコア光ファイバ内の冗長コア
JP2019531487A (ja) * 2016-08-10 2019-10-31 フラウンホファー ゲセルシャフト ツール フェールデルンク ダー アンゲヴァンテン フォルシュンク エー.ファオ. 光学導波路の屈曲及び/またはひずみを決定するための方法

Also Published As

Publication number Publication date
EP4163586B1 (en) 2025-04-09
EP4163586A1 (en) 2023-04-12
JP7376052B2 (ja) 2023-11-08
US20230147800A1 (en) 2023-05-11
EP4163586A4 (en) 2024-02-21
WO2021246497A1 (ja) 2021-12-09
US12203847B2 (en) 2025-01-21

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