JP7376052B2 - 形状測定システム及び形状測定方法 - Google Patents

形状測定システム及び形状測定方法 Download PDF

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JP7376052B2
JP7376052B2 JP2022528897A JP2022528897A JP7376052B2 JP 7376052 B2 JP7376052 B2 JP 7376052B2 JP 2022528897 A JP2022528897 A JP 2022528897A JP 2022528897 A JP2022528897 A JP 2022528897A JP 7376052 B2 JP7376052 B2 JP 7376052B2
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optical fiber
core optical
strain
linear structure
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Japanese (ja)
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JPWO2021246497A1 (https=
Inventor
信智 半澤
和秀 中島
隆 松井
英晶 村山
良太 和田
真輝人 小林
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University of Tokyo NUC
NTT Inc
NTT Inc USA
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Nippon Telegraph and Telephone Corp
University of Tokyo NUC
NTT Inc USA
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/18—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge using photoelastic elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/24—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet
    • G01L1/242—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet the material being an optical fibre
    • G01L1/246—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet the material being an optical fibre using integrated gratings, e.g. Bragg gratings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/636—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited using an arrangement of pump beam and probe beam; using the measurement of optical non-linear properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/954—Inspecting the inner surface of hollow bodies, e.g. bores
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4709—Backscatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/636—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited using an arrangement of pump beam and probe beam; using the measurement of optical non-linear properties
    • G01N2021/638—Brillouin effect, e.g. stimulated Brillouin effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/954—Inspecting the inner surface of hollow bodies, e.g. bores
    • G01N2021/9542—Inspecting the inner surface of hollow bodies, e.g. bores using a probe
    • G01N2021/9546—Inspecting the inner surface of hollow bodies, e.g. bores using a probe with remote light transmitting, e.g. optical fibres

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nonlinear Science (AREA)
  • Optics & Photonics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2022528897A 2020-06-05 2021-06-03 形状測定システム及び形状測定方法 Active JP7376052B2 (ja)

Applications Claiming Priority (3)

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JP2020098349 2020-06-05
JP2020098349 2020-06-05
PCT/JP2021/021283 WO2021246497A1 (ja) 2020-06-05 2021-06-03 形状測定システム及び形状測定方法

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JPWO2021246497A1 JPWO2021246497A1 (https=) 2021-12-09
JP7376052B2 true JP7376052B2 (ja) 2023-11-08

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US (1) US12203847B2 (https=)
EP (1) EP4163586B1 (https=)
JP (1) JP7376052B2 (https=)
WO (1) WO2021246497A1 (https=)

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Publication number Priority date Publication date Assignee Title
EP4455617A4 (en) * 2021-12-24 2025-12-17 Ntt Inc FORM MEASURING SYSTEM AND FORM MEASURING METHOD
CN115900579B (zh) * 2023-01-06 2023-05-26 山东大学 一种自校正可拼接式光纤位移场传感系统及其校正方法
WO2025047077A1 (ja) * 2023-08-28 2025-03-06 日本電信電話株式会社 測定システム、測定方法、及び、解析装置
CN118149723B (zh) * 2024-05-09 2024-07-19 武汉理工大学 一种长距离水下线缆姿态检测方法及系统

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JP2013505441A (ja) 2009-09-18 2013-02-14 ルナ イノベーションズ インコーポレイテッド 光学的位置および／または形状センシング
JP2016102691A (ja) 2014-11-27 2016-06-02 日本電信電話株式会社 光ファイバの曲げ形状測定装置及びその曲げ形状測定方法
JP2018527041A (ja) 2015-06-15 2018-09-20 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 後方散乱反射光測定を用いて医療デバイスの位置及び／又は形状を感知するための光学的形状感知システム並びに方法
JP2019522776A (ja) 2016-05-11 2019-08-15 インテュイティブ サージカル オペレーションズ， インコーポレイテッド 安全性のためのマルチコア光ファイバ内の冗長コア
JP2019531487A (ja) 2016-08-10 2019-10-31 フラウンホファー ゲセルシャフト ツール フェールデルンク ダー アンゲヴァンテン フォルシュンク エー．ファオ． 光学導波路の屈曲及び／またはひずみを決定するための方法

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JP2007101508A (ja) * 2005-10-07 2007-04-19 Sumitomo Electric Ind Ltd 温度測定方法及び温度測定装置
JP5769676B2 (ja) * 2012-08-17 2015-08-26 公益財団法人地球環境産業技術研究機構 物質の圧力、温度、ひずみ分布測定システム、これを用いた二酸化炭素地中貯留の監視方法、二酸化炭素注入による地層安定性への影響評価方法、および結氷監視方法
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Publication number Priority date Publication date Assignee Title
JP2013505441A (ja) 2009-09-18 2013-02-14 ルナ イノベーションズ インコーポレイテッド 光学的位置および／または形状センシング
JP2016102691A (ja) 2014-11-27 2016-06-02 日本電信電話株式会社 光ファイバの曲げ形状測定装置及びその曲げ形状測定方法
JP2018527041A (ja) 2015-06-15 2018-09-20 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 後方散乱反射光測定を用いて医療デバイスの位置及び／又は形状を感知するための光学的形状感知システム並びに方法
JP2019522776A (ja) 2016-05-11 2019-08-15 インテュイティブ サージカル オペレーションズ， インコーポレイテッド 安全性のためのマルチコア光ファイバ内の冗長コア
JP2019531487A (ja) 2016-08-10 2019-10-31 フラウンホファー ゲセルシャフト ツール フェールデルンク ダー アンゲヴァンテン フォルシュンク エー．ファオ． 光学導波路の屈曲及び／またはひずみを決定するための方法

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Publication number Publication date
EP4163586B1 (en) 2025-04-09
EP4163586A1 (en) 2023-04-12
US20230147800A1 (en) 2023-05-11
JPWO2021246497A1 (https=) 2021-12-09
EP4163586A4 (en) 2024-02-21
WO2021246497A1 (ja) 2021-12-09
US12203847B2 (en) 2025-01-21

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