JPWO2021182279A1 - - Google Patents

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Publication number
JPWO2021182279A1
JPWO2021182279A1 JP2022505995A JP2022505995A JPWO2021182279A1 JP WO2021182279 A1 JPWO2021182279 A1 JP WO2021182279A1 JP 2022505995 A JP2022505995 A JP 2022505995A JP 2022505995 A JP2022505995 A JP 2022505995A JP WO2021182279 A1 JPWO2021182279 A1 JP WO2021182279A1
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JP
Japan
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JP2022505995A
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JP7228209B2 (ja
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/33—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N21/031—Multipass arrangements
    • G01N2021/0314—Double pass, autocollimated path
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G01N21/276—Calibration, base line adjustment, drift correction with alternation of sample and standard in optical path
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation
    • G01N2201/12746—Calibration values determination
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02A—TECHNOLOGIES FOR ADAPTATION TO CLIMATE CHANGE
    • Y02A50/00—TECHNOLOGIES FOR ADAPTATION TO CLIMATE CHANGE in human health protection, e.g. against extreme weather
    • Y02A50/20—Air quality improvement or preservation, e.g. vehicle emission control or emission reduction by using catalytic converters

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2022505995A 2020-03-13 2021-03-04 濃度測定方法 Active JP7228209B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020044828 2020-03-13
JP2020044828 2020-03-13
PCT/JP2021/008377 WO2021182279A1 (ja) 2020-03-13 2021-03-04 濃度測定方法および濃度測定装置

Publications (2)

Publication Number Publication Date
JPWO2021182279A1 true JPWO2021182279A1 (ja) 2021-09-16
JP7228209B2 JP7228209B2 (ja) 2023-02-24

Family

ID=77672332

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022505995A Active JP7228209B2 (ja) 2020-03-13 2021-03-04 濃度測定方法

Country Status (5)

Country Link
US (1) US20230124208A1 (ja)
JP (1) JP7228209B2 (ja)
KR (1) KR20220079977A (ja)
TW (1) TWI762233B (ja)
WO (1) WO2021182279A1 (ja)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62266440A (ja) * 1986-05-14 1987-11-19 Fujitsu Ltd ガス検出装置
JP2017129374A (ja) * 2016-01-18 2017-07-27 株式会社堀場製作所 分析装置、及び、分析方法
WO2020158506A1 (ja) * 2019-01-31 2020-08-06 株式会社フジキン 濃度測定装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08128955A (ja) * 1994-09-27 1996-05-21 Okitoronikusu Kk ガス濃度計の検査方法およびガス濃度計
JP4472156B2 (ja) * 2000-11-02 2010-06-02 中部電力株式会社 ガス成分測定装置及び方法
DE102012007016B3 (de) * 2012-04-05 2013-10-10 Dräger Safety AG & Co. KGaA Optischer Gassensor
JP5885699B2 (ja) 2013-05-09 2016-03-15 株式会社フジキン 脆性破壊性光透過窓板の固定構造及びこれを用いた脆性破壊性光透過窓板の固定方法
KR20170103779A (ko) * 2014-11-23 2017-09-13 가부시키가이샤 후지킨 광학적 가스 농도측정 방법 및 그 방법에 의한 가스 농도 모니터 방법
CN106062533A (zh) * 2015-01-20 2016-10-26 株式会社东芝 呼气测量装置和呼气测量方法以及气室
KR102082172B1 (ko) 2015-08-18 2020-02-27 가부시키가이샤 후지킨 농도 측정 장치
TW201719154A (zh) * 2015-11-26 2017-06-01 財團法人工業技術研究院 光學感測模組
JP6643715B2 (ja) * 2016-03-29 2020-02-12 東亜ディーケーケー株式会社 オゾン測定装置
TWI592647B (zh) * 2016-05-25 2017-07-21 熱映光電股份有限公司 氣體測量裝置及氣體濃度測量方法
JP6912766B2 (ja) * 2016-07-29 2021-08-04 国立大学法人徳島大学 濃度測定装置
JP6786099B2 (ja) * 2016-08-12 2020-11-18 株式会社フジキン 濃度測定装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62266440A (ja) * 1986-05-14 1987-11-19 Fujitsu Ltd ガス検出装置
JP2017129374A (ja) * 2016-01-18 2017-07-27 株式会社堀場製作所 分析装置、及び、分析方法
WO2020158506A1 (ja) * 2019-01-31 2020-08-06 株式会社フジキン 濃度測定装置

Also Published As

Publication number Publication date
JP7228209B2 (ja) 2023-02-24
WO2021182279A1 (ja) 2021-09-16
TW202146881A (zh) 2021-12-16
KR20220079977A (ko) 2022-06-14
TWI762233B (zh) 2022-04-21
US20230124208A1 (en) 2023-04-20

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