JPWO2021015039A1 - - Google Patents

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Publication number
JPWO2021015039A1
JPWO2021015039A1 JP2021533955A JP2021533955A JPWO2021015039A1 JP WO2021015039 A1 JPWO2021015039 A1 JP WO2021015039A1 JP 2021533955 A JP2021533955 A JP 2021533955A JP 2021533955 A JP2021533955 A JP 2021533955A JP WO2021015039 A1 JPWO2021015039 A1 JP WO2021015039A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021533955A
Other versions
JP7445993B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021015039A1 publication Critical patent/JPWO2021015039A1/ja
Application granted granted Critical
Publication of JP7445993B2 publication Critical patent/JP7445993B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J29/00Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
    • H01J29/46Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
    • H01J29/48Electron guns
    • H01J29/485Construction of the gun or of parts thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/06Electron sources; Electron guns
    • H01J37/073Electron guns using field emission, photo emission, or secondary emission electron sources
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J1/00Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
    • H01J1/02Main electrodes
    • H01J1/04Liquid electrodes, e.g. liquid cathode
    • H01J1/05Liquid electrodes, e.g. liquid cathode characterised by material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J1/00Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
    • H01J1/02Main electrodes
    • H01J1/04Liquid electrodes, e.g. liquid cathode
    • H01J1/06Containers for liquid-pool electrodes; Arrangement or mounting thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • H01J35/04Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/06Cathodes
    • H01J35/064Details of the emitter, e.g. material or structure
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/06Electron sources; Electron guns
    • H01J37/065Construction of guns or parts thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/305Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating or etching
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J1/00Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
    • H01J1/02Main electrodes
    • H01J1/04Liquid electrodes, e.g. liquid cathode
    • H01J1/10Cooling, heating, circulating, filtering, or controlling level of liquid in a liquid-pool electrode
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/06Sources
    • H01J2237/063Electron sources
    • H01J2237/06308Thermionic sources
    • H01J2237/06316Schottky emission
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26Electron or ion microscopes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/30Electron or ion beam tubes for processing objects
    • H01J2237/31Processing objects on a macro-scale
    • H01J2237/3104Welding
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J9/00Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
    • H01J9/02Manufacture of electrodes or electrode systems
    • H01J9/04Manufacture of electrodes or electrode systems of thermionic cathodes
    • H01J9/042Manufacture, activation of the emissive part

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Electron Beam Exposure (AREA)
  • Electron Sources, Ion Sources (AREA)
JP2021533955A 2019-07-23 2020-07-13 電子銃装置 Active JP7445993B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019135618 2019-07-23
JP2019135618 2019-07-23
PCT/JP2020/027255 WO2021015039A1 (ja) 2019-07-23 2020-07-13 電子銃装置

Publications (2)

Publication Number Publication Date
JPWO2021015039A1 true JPWO2021015039A1 (ja) 2021-01-28
JP7445993B2 JP7445993B2 (ja) 2024-03-08

Family

ID=74193454

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021533955A Active JP7445993B2 (ja) 2019-07-23 2020-07-13 電子銃装置

Country Status (6)

Country Link
US (1) US11295925B2 (ja)
EP (1) EP3923313B1 (ja)
JP (1) JP7445993B2 (ja)
KR (1) KR102425178B1 (ja)
CN (1) CN113678224A (ja)
WO (1) WO2021015039A1 (ja)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4131327A4 (en) * 2020-04-21 2023-07-05 Denka Company Limited ELECTRON SOURCE, METHOD FOR THE MANUFACTURE, TRANSMITTER, AND DEVICE COMPRISING THEM
CN114512378A (zh) * 2022-02-18 2022-05-17 西湖大学 一种电子发射装置以及电子装置
US20230298847A1 (en) * 2022-03-18 2023-09-21 Kla Corporation Electron gun and electron microscope
CN115148561A (zh) * 2022-07-08 2022-10-04 西湖大学 一种电子发射装置以及电子装置
CN117943494B (zh) * 2024-03-22 2024-06-18 常州富丽康精密机械有限公司 一种具有力反馈功能的冷轧丝杠生产用轧制设备

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1574611A (en) * 1976-04-13 1980-09-10 Atomic Energy Authority Uk Ion sources
JPS5838905B2 (ja) * 1981-09-03 1983-08-26 日本電子株式会社 金属イオン源
JPS5846542A (ja) * 1981-09-11 1983-03-18 Nippon Telegr & Teleph Corp <Ntt> 電界放出型液体金属アルミニウムイオン銃及びその製造方法
JPS62140340A (ja) * 1985-12-14 1987-06-23 Denki Kagaku Kogyo Kk 電界放射型イオン源
DE3677062D1 (de) * 1985-06-04 1991-02-28 Denki Kagaku Kogyo Kk Quelle geladener teilchen.
JPH02195640A (ja) * 1989-01-23 1990-08-02 Toshiba Corp 電子銃による加熱装置および同位体分離装置
JP2688261B2 (ja) * 1989-10-25 1997-12-08 電気化学工業株式会社 電界放出型イオン源
JPH03272500A (ja) * 1990-03-22 1991-12-04 Toshiba Corp 電子銃
JPH05205680A (ja) * 1992-01-27 1993-08-13 Hitachi Ltd 電気流体力学的イオン源、それを用いたフッ素イオンの放出方法、二次イオン質量分析装置、それを用いた質量分析方法、加工装置及びそれを用いた加工方法
JP3272500B2 (ja) 1993-07-30 2002-04-08 オリンパス光学工業株式会社 球面測定装置
JP3233826B2 (ja) 1995-09-13 2001-12-04 新日本製鐵株式会社 スポット溶接部の遅れ破壊特性の優れた高強度pc鋼棒およびその製造方法
JP2002025421A (ja) * 2000-07-10 2002-01-25 Matsushita Electric Ind Co Ltd 電子銃及びその製造方法、及びその電子銃を用いたカラー受像管、カラー受像システム
CN1820346B (zh) 2003-05-09 2011-01-19 株式会社荏原制作所 基于带电粒子束的检查装置及采用了该检查装置的器件制造方法
JP4685115B2 (ja) * 2007-02-20 2011-05-18 株式会社アドバンテスト 電子ビーム露光方法
JP5595199B2 (ja) 2010-09-23 2014-09-24 株式会社ニューフレアテクノロジー 電子銃および電子銃を用いた電子ビーム描画装置
WO2012114521A1 (ja) * 2011-02-25 2012-08-30 株式会社Param 電子銃および電子ビーム装置
JP5846542B2 (ja) 2011-09-21 2016-01-20 トヨタ自動車株式会社 燃料電池システム
JP5838905B2 (ja) 2012-03-14 2016-01-06 株式会社Jvcケンウッド ヘッドホン
JP2017201609A (ja) * 2016-05-06 2017-11-09 株式会社Param 電子銃

Also Published As

Publication number Publication date
KR102425178B1 (ko) 2022-07-27
EP3923313A4 (en) 2022-05-18
US20220051866A1 (en) 2022-02-17
US11295925B2 (en) 2022-04-05
EP3923313B1 (en) 2023-09-27
CN113678224A (zh) 2021-11-19
WO2021015039A1 (ja) 2021-01-28
KR20210114535A (ko) 2021-09-23
JP7445993B2 (ja) 2024-03-08
EP3923313A1 (en) 2021-12-15

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