JPWO2021010063A1 - - Google Patents
Info
- Publication number
- JPWO2021010063A1 JPWO2021010063A1 JP2021532730A JP2021532730A JPWO2021010063A1 JP WO2021010063 A1 JPWO2021010063 A1 JP WO2021010063A1 JP 2021532730 A JP2021532730 A JP 2021532730A JP 2021532730 A JP2021532730 A JP 2021532730A JP WO2021010063 A1 JPWO2021010063 A1 JP WO2021010063A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B3/00—Ohmic-resistance heating
- H05B3/10—Heating elements characterised by the composition or nature of the materials or by the arrangement of the conductor
- H05B3/12—Heating elements characterised by the composition or nature of the materials or by the arrangement of the conductor characterised by the composition or nature of the conductive material
- H05B3/14—Heating elements characterised by the composition or nature of the materials or by the arrangement of the conductor characterised by the composition or nature of the conductive material the material being non-metallic
- H05B3/141—Conductive ceramics, e.g. metal oxides, metal carbides, barium titanate, ferrites, zirconia, vitrous compounds
- H05B3/143—Conductive ceramics, e.g. metal oxides, metal carbides, barium titanate, ferrites, zirconia, vitrous compounds applied to semiconductors, e.g. wafers heating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67103—Apparatus for thermal treatment mainly by conduction
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B3/00—Ohmic-resistance heating
- H05B3/02—Details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68792—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the construction of the shaft
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B3/00—Ohmic-resistance heating
- H05B3/20—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater
- H05B3/22—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater non-flexible
- H05B3/28—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater non-flexible heating conductor embedded in insulating material
- H05B3/283—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater non-flexible heating conductor embedded in insulating material the insulating material being an inorganic material, e.g. ceramic
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B3/00—Ohmic-resistance heating
- H05B3/68—Heating arrangements specially adapted for cooking plates or analogous hot-plates
- H05B3/74—Non-metallic plates, e.g. vitroceramic, ceramic or glassceramic hobs, also including power or control circuits
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B2203/00—Aspects relating to Ohmic resistive heating covered by group H05B3/00
- H05B2203/016—Heaters using particular connecting means
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B2203/00—Aspects relating to Ohmic resistive heating covered by group H05B3/00
- H05B2203/017—Manufacturing methods or apparatus for heaters
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Ceramic Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Resistance Heating (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019130906 | 2019-07-16 | ||
JP2019130906 | 2019-07-16 | ||
PCT/JP2020/022835 WO2021010063A1 (ja) | 2019-07-16 | 2020-06-10 | シャフト付きセラミックヒータ |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2021010063A1 true JPWO2021010063A1 (ja) | 2021-01-21 |
JP7174159B2 JP7174159B2 (ja) | 2022-11-17 |
Family
ID=74210589
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2021532730A Active JP7174159B2 (ja) | 2019-07-16 | 2020-06-10 | シャフト付きセラミックヒータ |
Country Status (5)
Country | Link |
---|---|
US (1) | US20220030668A1 (ja) |
JP (1) | JP7174159B2 (ja) |
KR (1) | KR102603485B1 (ja) |
CN (1) | CN114041323A (ja) |
WO (1) | WO2021010063A1 (ja) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006517740A (ja) * | 2003-01-17 | 2006-07-27 | ゼネラル・エレクトリック・カンパニイ | ウェーハ加工装置及びその製造方法 |
JP2007173828A (ja) * | 2005-12-21 | 2007-07-05 | General Electric Co <Ge> | エッチング耐性ウェーハ加工装置及びその製造方法 |
JP2016536803A (ja) * | 2013-09-16 | 2016-11-24 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 温度プロファイル制御装置を有する加熱基板支持体 |
JP2017162878A (ja) * | 2016-03-07 | 2017-09-14 | 日本特殊陶業株式会社 | 基板支持装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2003047312A1 (fr) * | 2001-11-30 | 2003-06-05 | Ibiden Co., Ltd. | Dispositif chauffant en ceramique |
JP4365766B2 (ja) * | 2004-10-26 | 2009-11-18 | 京セラ株式会社 | ウェハ支持部材とそれを用いた半導体製造装置 |
JP2006139958A (ja) * | 2004-11-10 | 2006-06-01 | Toshiba Corp | 荷電ビーム装置 |
JP5894401B2 (ja) * | 2011-09-12 | 2016-03-30 | モメンティブ・パフォーマンス・マテリアルズ・ジャパン合同会社 | ポスト型セラミックスヒータおよびその製造方法 |
CN103811102A (zh) * | 2014-02-19 | 2014-05-21 | 上海和辉光电有限公司 | 各向异性导电膜及其制造方法 |
TWI654332B (zh) * | 2014-07-02 | 2019-03-21 | 美商應用材料股份有限公司 | 用於電漿處理的多區域基座 |
-
2020
- 2020-06-10 KR KR1020217033955A patent/KR102603485B1/ko active IP Right Grant
- 2020-06-10 JP JP2021532730A patent/JP7174159B2/ja active Active
- 2020-06-10 WO PCT/JP2020/022835 patent/WO2021010063A1/ja active Application Filing
- 2020-06-10 CN CN202080047846.4A patent/CN114041323A/zh active Pending
-
2021
- 2021-10-13 US US17/450,704 patent/US20220030668A1/en active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006517740A (ja) * | 2003-01-17 | 2006-07-27 | ゼネラル・エレクトリック・カンパニイ | ウェーハ加工装置及びその製造方法 |
JP2007173828A (ja) * | 2005-12-21 | 2007-07-05 | General Electric Co <Ge> | エッチング耐性ウェーハ加工装置及びその製造方法 |
JP2016536803A (ja) * | 2013-09-16 | 2016-11-24 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 温度プロファイル制御装置を有する加熱基板支持体 |
JP2017162878A (ja) * | 2016-03-07 | 2017-09-14 | 日本特殊陶業株式会社 | 基板支持装置 |
Also Published As
Publication number | Publication date |
---|---|
WO2021010063A1 (ja) | 2021-01-21 |
CN114041323A (zh) | 2022-02-11 |
KR102603485B1 (ko) | 2023-11-16 |
JP7174159B2 (ja) | 2022-11-17 |
US20220030668A1 (en) | 2022-01-27 |
KR20210144780A (ko) | 2021-11-30 |
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