JPWO2020262674A1 - - Google Patents

Info

Publication number
JPWO2020262674A1
JPWO2020262674A1 JP2021528283A JP2021528283A JPWO2020262674A1 JP WO2020262674 A1 JPWO2020262674 A1 JP WO2020262674A1 JP 2021528283 A JP2021528283 A JP 2021528283A JP 2021528283 A JP2021528283 A JP 2021528283A JP WO2020262674 A1 JPWO2020262674 A1 JP WO2020262674A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021528283A
Other languages
Japanese (ja)
Other versions
JP7261298B2 (ja
JPWO2020262674A5 (US20030157376A1-20030821-M00001.png
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2020262674A1 publication Critical patent/JPWO2020262674A1/ja
Publication of JPWO2020262674A5 publication Critical patent/JPWO2020262674A5/ja
Application granted granted Critical
Publication of JP7261298B2 publication Critical patent/JP7261298B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B19/00Condensers, e.g. light collectors or similar non-imaging optics
    • G02B19/0004Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed
    • G02B19/0019Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed having reflective surfaces only (e.g. louvre systems, systems with multiple planar reflectors)
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/18Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors
    • G02B7/182Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors for mirrors
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/18Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors
    • G02B7/181Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors with means for compensating for changes in temperature or for controlling the temperature; thermal stabilisation
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70716Stages
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70775Position control, e.g. interferometers or encoders for determining the stage position
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70808Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
    • G03F7/70825Mounting of individual elements, e.g. mounts, holders or supports
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70808Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
    • G03F7/70833Mounting of optical systems, e.g. mounting of illumination system, projection system or stage systems on base-plate or ground
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/7085Detection arrangement, e.g. detectors of apparatus alignment possibly mounted on wafers, exposure dose, photo-cleaning flux, stray light, thermal load
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • G02B1/10Optical coatings produced by application to, or surface treatment of, optical elements
    • G02B1/11Anti-reflection coatings
    • G02B1/113Anti-reflection coatings using inorganic layer materials only

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Optics & Photonics (AREA)
  • Optical Elements Other Than Lenses (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
JP2021528283A 2019-06-28 2020-06-26 ミラー装着部材、これを使用した位置計測用ミラー、および露光装置 Active JP7261298B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019122425 2019-06-28
JP2019122425 2019-06-28
PCT/JP2020/025391 WO2020262674A1 (ja) 2019-06-28 2020-06-26 ミラー装着部材、これを使用した位置計測用ミラー、および露光装置

Publications (3)

Publication Number Publication Date
JPWO2020262674A1 true JPWO2020262674A1 (US20030157376A1-20030821-M00001.png) 2020-12-30
JPWO2020262674A5 JPWO2020262674A5 (US20030157376A1-20030821-M00001.png) 2022-03-11
JP7261298B2 JP7261298B2 (ja) 2023-04-19

Family

ID=74061283

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021528283A Active JP7261298B2 (ja) 2019-06-28 2020-06-26 ミラー装着部材、これを使用した位置計測用ミラー、および露光装置

Country Status (6)

Country Link
US (1) US20220269040A1 (US20030157376A1-20030821-M00001.png)
EP (1) EP3992716A4 (US20030157376A1-20030821-M00001.png)
JP (1) JP7261298B2 (US20030157376A1-20030821-M00001.png)
KR (1) KR20220011153A (US20030157376A1-20030821-M00001.png)
CN (1) CN113994267B (US20030157376A1-20030821-M00001.png)
WO (1) WO2020262674A1 (US20030157376A1-20030821-M00001.png)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022145470A1 (ja) * 2020-12-28 2022-07-07 京セラ株式会社 構造体、これを使用した位置計測用ミラーおよび露光装置

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0373906U (US20030157376A1-20030821-M00001.png) * 1989-11-22 1991-07-25
JP2002182103A (ja) * 2000-12-14 2002-06-26 Alps Electric Co Ltd 樹脂成形光学部品及びそれを備えた光ピックアップ装置
JP2002277782A (ja) * 2001-03-16 2002-09-25 Sharp Corp 光学部品の取付構造
JP2004163491A (ja) * 2002-11-11 2004-06-10 Nippon Sheet Glass Co Ltd 光学素子及びその製造方法
JP2004177331A (ja) * 2002-11-28 2004-06-24 Taiheiyo Cement Corp 位置測定用ミラーおよびミラー用部材
JP2004309733A (ja) * 2003-04-04 2004-11-04 Seiko Epson Corp 凹部付き基材の製造方法、凹部付き基材、マイクロレンズ用凹部付き基材、マイクロレンズ基板、透過型スクリーンおよびリア型プロジェクタ
JP2008124219A (ja) * 2006-11-10 2008-05-29 Canon Inc 液浸露光装置
JP2008191592A (ja) * 2007-02-07 2008-08-21 Hitachi Ltd 光学部材
CN105589170A (zh) * 2016-01-28 2016-05-18 中国华能集团清洁能源技术研究院有限公司 一种桁架式线性菲涅尔太阳能反射镜框架
JP2018004956A (ja) * 2016-07-01 2018-01-11 恵和株式会社 光学ユニット及び光学ユニットの製造方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3795869B2 (ja) * 2003-02-18 2006-07-12 株式会社東芝 光モジュール
JP2012203371A (ja) * 2011-03-28 2012-10-22 Nippon Shokubai Co Ltd 金属膜を用いた光導波路のミラー部の製造方法、及び光導波路
JP6301067B2 (ja) * 2013-04-26 2018-03-28 富士通コンポーネント株式会社 光学部材、光モジュール
CN105652393B (zh) * 2016-03-18 2018-01-05 武汉华工正源光子技术有限公司 基于光学基座的单纤双向器件的封装结构及封装方法
KR102354871B1 (ko) * 2016-12-21 2022-01-21 니치아 카가쿠 고교 가부시키가이샤 발광 장치의 제조 방법

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0373906U (US20030157376A1-20030821-M00001.png) * 1989-11-22 1991-07-25
JP2002182103A (ja) * 2000-12-14 2002-06-26 Alps Electric Co Ltd 樹脂成形光学部品及びそれを備えた光ピックアップ装置
JP2002277782A (ja) * 2001-03-16 2002-09-25 Sharp Corp 光学部品の取付構造
JP2004163491A (ja) * 2002-11-11 2004-06-10 Nippon Sheet Glass Co Ltd 光学素子及びその製造方法
JP2004177331A (ja) * 2002-11-28 2004-06-24 Taiheiyo Cement Corp 位置測定用ミラーおよびミラー用部材
JP2004309733A (ja) * 2003-04-04 2004-11-04 Seiko Epson Corp 凹部付き基材の製造方法、凹部付き基材、マイクロレンズ用凹部付き基材、マイクロレンズ基板、透過型スクリーンおよびリア型プロジェクタ
JP2008124219A (ja) * 2006-11-10 2008-05-29 Canon Inc 液浸露光装置
JP2008191592A (ja) * 2007-02-07 2008-08-21 Hitachi Ltd 光学部材
CN105589170A (zh) * 2016-01-28 2016-05-18 中国华能集团清洁能源技术研究院有限公司 一种桁架式线性菲涅尔太阳能反射镜框架
JP2018004956A (ja) * 2016-07-01 2018-01-11 恵和株式会社 光学ユニット及び光学ユニットの製造方法

Also Published As

Publication number Publication date
JP7261298B2 (ja) 2023-04-19
KR20220011153A (ko) 2022-01-27
US20220269040A1 (en) 2022-08-25
WO2020262674A1 (ja) 2020-12-30
CN113994267A (zh) 2022-01-28
EP3992716A1 (en) 2022-05-04
CN113994267B (zh) 2024-01-19
EP3992716A4 (en) 2023-08-09

Similar Documents

Publication Publication Date Title
BR112019017762A2 (US20030157376A1-20030821-M00001.png)
BR112021017339A2 (US20030157376A1-20030821-M00001.png)
BR112021018450A2 (US20030157376A1-20030821-M00001.png)
BR112021017939A2 (US20030157376A1-20030821-M00001.png)
BR112021017738A2 (US20030157376A1-20030821-M00001.png)
BR112021017892A2 (US20030157376A1-20030821-M00001.png)
BR112019016141A2 (US20030157376A1-20030821-M00001.png)
BR112021017782A2 (US20030157376A1-20030821-M00001.png)
BR112021008711A2 (US20030157376A1-20030821-M00001.png)
BR112019016138A2 (US20030157376A1-20030821-M00001.png)
BR112019016142A2 (US20030157376A1-20030821-M00001.png)
BR112021018168A2 (US20030157376A1-20030821-M00001.png)
BR112021017728A2 (US20030157376A1-20030821-M00001.png)
AU2020104490A5 (US20030157376A1-20030821-M00001.png)
BR112021018452A2 (US20030157376A1-20030821-M00001.png)
BR112021017234A2 (US20030157376A1-20030821-M00001.png)
BR112021017355A2 (US20030157376A1-20030821-M00001.png)
BR112021017703A2 (US20030157376A1-20030821-M00001.png)
BR112021017173A2 (US20030157376A1-20030821-M00001.png)
BR112021018102A2 (US20030157376A1-20030821-M00001.png)
BR112021018584A2 (US20030157376A1-20030821-M00001.png)
BR112021017637A2 (US20030157376A1-20030821-M00001.png)
BR112021012348A2 (US20030157376A1-20030821-M00001.png)
BR112021018250A2 (US20030157376A1-20030821-M00001.png)
BR112021018093A2 (US20030157376A1-20030821-M00001.png)

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20211217

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20211217

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20221005

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20221129

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20230322

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20230407

R150 Certificate of patent or registration of utility model

Ref document number: 7261298

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150