JPWO2020144861A1 - Manufacturing method of metal-clad laminate, metal-clad laminate, printed wiring board and semiconductor package, coreless substrate forming support and semiconductor rewiring layer forming support - Google Patents
Manufacturing method of metal-clad laminate, metal-clad laminate, printed wiring board and semiconductor package, coreless substrate forming support and semiconductor rewiring layer forming support Download PDFInfo
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- JPWO2020144861A1 JPWO2020144861A1 JP2020565556A JP2020565556A JPWO2020144861A1 JP WO2020144861 A1 JPWO2020144861 A1 JP WO2020144861A1 JP 2020565556 A JP2020565556 A JP 2020565556A JP 2020565556 A JP2020565556 A JP 2020565556A JP WO2020144861 A1 JPWO2020144861 A1 JP WO2020144861A1
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- clad laminate
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B37/00—Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding
- B32B37/14—Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding characterised by the properties of the layers
- B32B37/15—Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding characterised by the properties of the layers with at least one layer being manufactured and immediately laminated before reaching its stable state, e.g. in which a layer is extruded and laminated while in semi-molten state
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B38/00—Ancillary operations in connection with laminating processes
- B32B38/18—Handling of layers or the laminate
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B5/00—Layered products characterised by the non- homogeneity or physical structure, i.e. comprising a fibrous, filamentary, particulate or foam layer; Layered products characterised by having a layer differing constitutionally or physically in different parts
- B32B5/22—Layered products characterised by the non- homogeneity or physical structure, i.e. comprising a fibrous, filamentary, particulate or foam layer; Layered products characterised by having a layer differing constitutionally or physically in different parts characterised by the presence of two or more layers which are next to each other and are fibrous, filamentary, formed of particles or foamed
- B32B5/24—Layered products characterised by the non- homogeneity or physical structure, i.e. comprising a fibrous, filamentary, particulate or foam layer; Layered products characterised by having a layer differing constitutionally or physically in different parts characterised by the presence of two or more layers which are next to each other and are fibrous, filamentary, formed of particles or foamed one layer being a fibrous or filamentary layer
- B32B5/28—Layered products characterised by the non- homogeneity or physical structure, i.e. comprising a fibrous, filamentary, particulate or foam layer; Layered products characterised by having a layer differing constitutionally or physically in different parts characterised by the presence of two or more layers which are next to each other and are fibrous, filamentary, formed of particles or foamed one layer being a fibrous or filamentary layer impregnated with or embedded in a plastic substance
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B38/00—Ancillary operations in connection with laminating processes
- B32B38/0012—Mechanical treatment, e.g. roughening, deforming, stretching
- B32B2038/0016—Abrading
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2305/00—Condition, form or state of the layers or laminate
- B32B2305/07—Parts immersed or impregnated in a matrix
- B32B2305/076—Prepregs
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2457/00—Electrical equipment
- B32B2457/08—PCBs, i.e. printed circuit boards
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Laminated Bodies (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
Abstract
板厚精度に優れた金属張り積層板及びその製造方法を提供する。また、前記金属張り積層板に回路形成してなるプリント配線板及び該プリント配線板に半導体素子を搭載してなる半導体パッケージを提供する。さらに、前記金属張り積層板を含有してなるコアレス基板形成用支持体及び半導体再配線層形成用支持体を提供する。前記金属張り積層板の製造方法としては、具体的には、(1)熱硬化性樹脂組成物及び基材を含有してなるプリプレグの硬化物の少なくとも一方の面を研磨する工程と、(2−1)前記工程(1)で研磨された面に金属箔を積層して金属張り積層板を形成する工程又は(2−2)前記工程(1)で研磨された面に、金属箔及び熱硬化性樹脂フィルムを又は金属箔付き熱硬化性樹脂フィルムを、熱硬化性樹脂フィルムが前記研磨された面側となるように積層して金属張り積層板を形成する工程と、を有する、金属張り積層板の製造方法である。Provided are a metal-clad laminated board having excellent plate thickness accuracy and a method for manufacturing the same. Further, the present invention provides a printed wiring board in which a circuit is formed on the metal-clad laminated board, and a semiconductor package in which a semiconductor element is mounted on the printed wiring board. Further, a support for forming a coreless substrate and a support for forming a semiconductor rewiring layer, which include the metal-clad laminate, are provided. Specific examples of the method for manufacturing the metal-clad laminate include (1) a step of polishing at least one surface of a cured product of a prepreg containing a thermosetting resin composition and a base material, and (2). -1) The step of laminating a metal foil on the surface polished in the step (1) to form a metal-clad laminate, or (2-2) the metal foil and heat on the surface polished in the step (1). Metal-clad, comprising a step of laminating a curable resin film or a thermosetting resin film with a metal foil so that the thermocurable resin film is on the polished surface side to form a metal-clad laminate. This is a method for manufacturing a laminated board.
Description
本発明は、金属張り積層板の製造方法、金属張り積層板、プリント配線板及び半導体パッケージ、並びにコアレス基板形成用支持体及び半導体再配線層形成用支持体に関する。 The present invention relates to a method for manufacturing a metal-clad laminate, a metal-clad laminate, a printed wiring board and a semiconductor package, and a support for forming a coreless substrate and a support for forming a semiconductor rewiring layer.
近年、電子機器の高密度化に伴い、小型化、軽量化及び多機能化が一段と進み、これに伴い、プリント配線板、及びLSI(Large Scale Integration)を実装する半導体パッケージにおいても高密度化及び高い信頼性が要求されている。それに起因して、金属張り積層板の板厚精度の向上の要求が厳しくなりつつある。
複数枚のプリプレグを金属箔で挟み込んでプレス成形等によって積層成形して得られる金属張り積層板はプリント配線板のコア基板として用いられる(例えば特許文献1の段落[0057]参照)が、プリプレグ内に存在するガラスクロス等の基材の影響等によって、プレス成型後に表面うねりが発生する。従来はこの程度の表面うねりは許容範囲であったが、さらなる高密度化及び高信頼性確保のため、金属張り積層板の板厚精度をより高い水準で達成することが求められる傾向にあり、当該表面うねりによる板厚精度の低下の問題を解消する必要性が出てきた。
また、板厚精度は樹脂組成物の流動性にも依存する傾向にあり、図7に示すように、プレス成形等の積層成形をして得られる金属張り積層板(所定サイズにカットされる前の、いわゆるプレスパネル)の端部における樹脂組成物層は薄くなるのが通常であり、板厚精度の観点からは、樹脂組成物層が薄くなった部位は破棄せざるを得なかった。一方で、樹脂組成物の流動性を低減するために無機充填材を高充填する方法等が知られているが、板厚精度の改善効果には限界があり、且つ、無機充填材の高充填が必須の場合にはドリル加工性等の加工性の大幅な低下を免れないという問題がある。In recent years, with the increasing density of electronic devices, miniaturization, weight reduction, and multifunctionality have further progressed, and along with this, the density of printed wiring boards and semiconductor packages for mounting LSI (Large Scale Integration) have also increased. High reliability is required. As a result, the demand for improving the plate thickness accuracy of metal-clad laminates is becoming stricter.
A metal-clad laminate obtained by sandwiching a plurality of prepregs between metal foils and laminating by press molding or the like is used as a core substrate of a printed wiring board (see, for example, paragraph [0057] of Patent Document 1). Surface waviness occurs after press molding due to the influence of the base material such as glass cloth existing in. In the past, this level of surface waviness was acceptable, but there is a tendency to achieve a higher level of plate thickness accuracy for metal-clad laminates in order to further increase the density and ensure high reliability. It has become necessary to solve the problem of deterioration of plate thickness accuracy due to the surface waviness.
Further, the plate thickness accuracy tends to depend on the fluidity of the resin composition, and as shown in FIG. 7, a metal-clad laminated plate obtained by laminating molding such as press molding (before being cut to a predetermined size). The resin composition layer at the end of the so-called press panel) is usually thin, and from the viewpoint of plate thickness accuracy, the thinned portion of the resin composition layer has to be discarded. On the other hand, a method of highly filling an inorganic filler in order to reduce the fluidity of the resin composition is known, but the effect of improving the plate thickness accuracy is limited and the inorganic filler is highly filled. If is essential, there is a problem that the workability such as drill workability is significantly reduced.
そこで、本発明の課題は、板厚精度に優れた金属張り積層板及びその製造方法を提供することにある。さらに本発明の課題は、前記金属張り積層板に回路形成してなるプリント配線板及び該プリント配線板に半導体素子を搭載してなる半導体パッケージ、並びに前記金属張り積層板を含有してなるコアレス基板形成用支持体及び半導体再配線層形成用支持体を提供することにある。 Therefore, an object of the present invention is to provide a metal-clad laminated board having excellent plate thickness accuracy and a method for manufacturing the same. Further, an object of the present invention is a printed wiring board formed by forming a circuit on the metal-clad laminate, a semiconductor package in which a semiconductor element is mounted on the printed wiring board, and a coreless substrate including the metal-clad laminate. It is an object of the present invention to provide a support for forming and a support for forming a semiconductor rewiring layer.
本発明者らは、上記の課題を解決すべく鋭意研究した結果、プレス成型して得られた金属張り積層板の金属箔をエッチング除去する等の方法によって得られるプリプレグの硬化物について、少なくとも一方の面を研磨することによって上記課題を解決し得ることを見出し、本発明を完成するに至った。本発明は、係る知見に基づいて完成したものである。 As a result of diligent research to solve the above problems, the present inventors have obtained at least one of the cured products of the prepreg obtained by a method such as etching and removing the metal foil of the metal-clad laminate obtained by press molding. It has been found that the above-mentioned problems can be solved by polishing the surface of the above-mentioned surface, and the present invention has been completed. The present invention has been completed based on such findings.
本発明は、下記[1]〜[15]に関する。
[1](1)熱硬化性樹脂組成物及び基材を含有してなるプリプレグの硬化物の少なくとも一方の面を研磨する工程、
(2−1)前記工程(1)で研磨された面に金属箔を積層して金属張り積層板を形成する工程、
を有する、金属張り積層板の製造方法。
[2](1)熱硬化性樹脂組成物及び基材を含有してなるプリプレグの硬化物の少なくとも一方の面を研磨する工程、
(2−2)前記工程(1)で研磨された面に、金属箔及び熱硬化性樹脂フィルムを又は金属箔付き熱硬化性樹脂フィルムを、熱硬化性樹脂フィルムが前記研磨された面側となるように積層して金属張り積層板を形成する工程、
を有する、金属張り積層板の製造方法。
[3]前記工程(1)において、前記プリプレグの硬化物の両面を研磨する、上記[1]又は[2]に記載の金属張り積層板の製造方法。
[4]前記工程(1)における研磨により、前記プリプレグの硬化物の厚みを略均一化する、上記[1]〜[3]のいずれかに記載の金属張り積層板の製造方法。
[5]前記プリプレグの硬化物が、内部の硬化物の表面が研磨されていない金属張り積層板の金属箔をエッチング除去して得られたものである、上記[1]〜[4]のいずれかに記載の金属張り積層板の製造方法。
[6]前記プリプレグの硬化物の最も面積の大きい面のサイズが、縦200mm〜1,300mm×横200mm〜1,300mmであり、且つ、前記プリプレグの硬化物の端部から70mm以内の範囲における少なくとも一部の厚みが硬化物の中央部の厚みに比べて薄い、上記[1]〜[5]のいずれかに記載の金属張り積層板の製造方法。
[7]前記工程(1)において、前記プリプレグの硬化物の最も薄い部分の厚みに揃うまで面全体を研磨する、上記[1]〜[6]のいずれかに記載の金属張り積層板の製造方法。
[8]前記工程(1)において、(i)CMP(Chemical mechanical polishing)法、(ii)フライカット、グラインド、サンドブラスト、ベルト研磨、スクラブ研磨等の機械研磨、(iii)過硫酸塩、過酸化水素−硫酸混合物、無機酸、有機酸等を使用する化学研磨、からなる群から選択される方法によって研磨する、上記[1]〜[7]のいずれかに記載の金属張り積層板の製造方法。
[9]得られる金属張り積層板の厚みの最大値と最小値の差が20μm以下である、上記[1]〜[8]のいずれかに記載の金属張り積層板の製造方法。
[10]上記[1]〜[9]のいずれかに記載の製造方法により得られる金属張り積層板。
[11](a)熱硬化性樹脂組成物及び基材を含有してなるプリプレグの硬化物であって、該硬化物の少なくとも一方の面が研磨された硬化物、(b)基材を含まない熱硬化性樹脂組成物層、及び(c)金属箔、を含有する金属張り積層板。
[12]上記[10]又は[11]に記載の金属張り積層板を含有してなるプリント配線板。
[13]上記[12]に記載のプリント配線板に半導体素子を搭載してなる半導体パッケージ。
[14]上記[10]又は[11]に記載の金属張り積層板を含有してなる、コアレス基板形成用支持体。
[15]上記[10]又は[11]に記載の金属張り積層板を含有してなる、半導体再配線層形成用支持体。The present invention relates to the following [1] to [15].
[1] (1) A step of polishing at least one surface of a cured product of a prepreg containing a thermosetting resin composition and a base material.
(2-1) A step of laminating a metal foil on a surface polished in the step (1) to form a metal-clad laminate.
A method for manufacturing a metal-clad laminated board.
[2] (1) A step of polishing at least one surface of a cured product of a prepreg containing a thermosetting resin composition and a base material.
(2-2) A metal foil and a thermosetting resin film or a thermosetting resin film with a metal foil are placed on the surface polished in the step (1), and the surface side on which the thermosetting resin film is polished is used. The process of forming a metal-clad laminated board by laminating so as to
A method for manufacturing a metal-clad laminated board.
[3] The method for manufacturing a metal-clad laminate according to the above [1] or [2], wherein in the step (1), both sides of the cured product of the prepreg are polished.
[4] The method for producing a metal-clad laminate according to any one of [1] to [3] above, wherein the thickness of the cured product of the prepreg is substantially made uniform by polishing in the step (1).
[5] Any of the above [1] to [4], wherein the cured product of the prepreg is obtained by etching and removing the metal foil of the metal-clad laminate whose surface of the cured product inside is not polished. A method for manufacturing a metal-clad laminate described in Crab.
[6] The size of the surface having the largest area of the cured product of the prepreg is 200 mm to 1,300 mm in length × 200 mm to 1,300 mm in width, and within 70 mm from the end of the cured product of the prepreg. The method for manufacturing a metal-clad laminate according to any one of [1] to [5] above, wherein at least a part of the thickness is thinner than the thickness of the central portion of the cured product.
[7] The production of the metal-clad laminate according to any one of [1] to [6] above, wherein in the step (1), the entire surface is polished until the thickness of the thinnest portion of the cured product of the prepreg is aligned. Method.
[8] In the step (1), (i) CMP (Chemical mechanical polishing) method, (ii) mechanical polishing such as fly cut, grind, sand blast, belt polishing, scrub polishing, (iii) persulfate, peroxidation. The method for producing a metal-clad laminate according to any one of the above [1] to [7], which is polished by a method selected from the group consisting of a hydrogen-sulfuric acid mixture, chemical polishing using an inorganic acid, an organic acid, or the like. ..
[9] The method for manufacturing a metal-clad laminate according to any one of the above [1] to [8], wherein the difference between the maximum value and the minimum value of the thickness of the obtained metal-clad laminate is 20 μm or less.
[10] A metal-clad laminate obtained by the manufacturing method according to any one of the above [1] to [9].
[11] (a) A cured product of a prepreg containing a thermosetting resin composition and a base material, which comprises a cured product in which at least one surface of the cured product is polished, and (b) a base material. A metal-clad laminate containing no thermosetting resin composition layer, and (c) metal foil.
[12] A printed wiring board containing the metal-clad laminate according to the above [10] or [11].
[13] A semiconductor package in which a semiconductor element is mounted on the printed wiring board according to the above [12].
[14] A support for forming a coreless substrate, which comprises the metal-clad laminate according to the above [10] or [11].
[15] A support for forming a semiconductor rewiring layer, comprising the metal-clad laminate according to the above [10] or [11].
本発明により、板厚精度に優れた金属張り積層板及びその製造方法を提供することができる。また、前記金属張り積層板に回路形成してなるプリント配線板及び該プリント配線板に半導体素子を搭載してなる半導体パッケージ、並びに前記金属張り積層板を含有してなるコアレス基板形成用支持体及び半導体再配線層形成用支持体を提供することができる。
本発明の方法によれば、無機充填材を高充填せずとも板厚精度に優れた金属張り積層板が得られるため、加工性が良好な金属張り積層板とすることが可能である。INDUSTRIAL APPLICABILITY According to the present invention, it is possible to provide a metal-clad laminated board having excellent plate thickness accuracy and a method for manufacturing the same. Further, a printed wiring board formed by forming a circuit on the metal-clad laminate, a semiconductor package in which a semiconductor element is mounted on the printed wiring board, a support for forming a coreless substrate including the metal-clad laminate, and a support for forming the coreless substrate. A support for forming a semiconductor rewiring layer can be provided.
According to the method of the present invention, a metal-clad laminate having excellent plate thickness accuracy can be obtained without high filling with an inorganic filler, so that a metal-clad laminate with good workability can be obtained.
本明細書中に記載されている数値範囲において、その数値範囲の上限値又は下限値は、実施例に示されている値に置き換えてもよい。また、数値範囲の下限値及び上限値は、それぞれ他の数値範囲の下限値又は上限値と任意に組み合わせられる。
また、本明細書に例示する各成分及び材料は、特に断らない限り、1種を単独で使用してもよいし、2種以上を併用してもよい。
本明細書における記載事項を任意に組み合わせた態様も本発明に含まれる。In the numerical range described in the present specification, the upper limit value or the lower limit value of the numerical range may be replaced with the value shown in the examples. Further, the lower limit value and the upper limit value of the numerical range are arbitrarily combined with the lower limit value or the upper limit value of another numerical range.
Further, as for each component and material exemplified in this specification, one kind may be used alone or two or more kinds may be used in combination unless otherwise specified.
The present invention also includes aspects in which the items described in the present specification are arbitrarily combined.
[金属張り積層板の製造方法]
本発明の金属張り積層板の製造方法の一態様は、
(1)熱硬化性樹脂組成物及び基材を含有してなるプリプレグの硬化物の少なくとも一方の面を研磨する工程[以下、工程(1)と称することがある]、
(2−1)前記工程(1)で研磨された面に金属箔を積層して金属張り積層板を形成する工程[以下、工程(2−1)と称することがある]、
を有する、金属張り積層板の製造方法である。[Manufacturing method of metal-clad laminate]
One aspect of the method for manufacturing a metal-clad laminate of the present invention is
(1) A step of polishing at least one surface of a cured product of a prepreg containing a thermosetting resin composition and a base material [hereinafter, may be referred to as step (1)].
(2-1) A step of laminating a metal foil on a surface polished in the step (1) to form a metal-clad laminate [hereinafter, may be referred to as step (2-1)].
It is a method of manufacturing a metal-clad laminated board having.
また、本発明の金属張り積層板の製造方法の別の一態様は、
(1)熱硬化性樹脂組成物及び基材を含有してなるプリプレグの硬化物の少なくとも一方の面を研磨する工程、
(2−2)前記工程(1)で研磨された面に、金属箔及び熱硬化性樹脂フィルムを又は金属箔付き熱硬化性樹脂フィルムを、熱硬化性樹脂フィルムが前記研磨された面側となるように積層して金属張り積層板を形成する工程[以下、工程(2−2)と称することがある]、
を有する、金属張り積層板の製造方法である。
以下、必要に応じて図1又は図2を参照しながら、前記工程(1)から順に詳述する。Further, another aspect of the method for manufacturing a metal-clad laminate of the present invention is as follows.
(1) A step of polishing at least one surface of a cured product of a prepreg containing a thermosetting resin composition and a base material.
(2-2) A metal foil and a thermosetting resin film or a thermosetting resin film with a metal foil are placed on the surface polished in the step (1), and the surface side on which the thermosetting resin film is polished is used. Step of forming a metal-clad laminate by laminating so as to be [hereinafter, may be referred to as step (2-2)],
It is a method of manufacturing a metal-clad laminated board having.
Hereinafter, the steps (1) will be described in detail in order from the above step (1) with reference to FIG. 1 or FIG. 2 as necessary.
<工程(1)>
工程(1)は、熱硬化性樹脂組成物6及び基材7を含有してなるプリプレグの硬化物1の少なくとも一方の面を研磨する工程である。ここで本発明において、プリプレグの硬化物とは、プリプレグが含有する熱硬化性樹脂組成物がC−ステージ化された状態のものを言い、熱硬化性樹脂組成物がB−ステージ化された状態のものは含まれない。また、「プリプレグの硬化物1の少なくとも一方の面」とは、プリプレグの硬化物1において、最も面積の大きい2面のうちの少なくとも一方の面を意味し、厚み方向の面(横の面)は含まれない。但し、「プリプレグの硬化物1の少なくとも一方の面」に加えて、厚み方向の面(横の面)を研磨することを否定するものではない。
工程(1)で使用するプリプレグの硬化物1は、内部の硬化物の表面が研磨されていない金属張り積層板の金属箔をエッチング除去することによって得ることができる。換言すると、1枚又は複数枚のプリプレグの片面又は両面に金属箔を配置し、プレス成形等の積層成形をして得られる金属張り積層板は表面うねりが生じており、板厚精度が十分ではないため、当該金属張り積層板から金属箔をエッチング除去し、当該工程(1)を経ることによって、表面うねりを解消し、ひいては高い板厚精度を有する金属張り積層板を形成することに繋がる。
ここで、表面うねりとは、表面粗さより大きい間隔で繰り返される起伏のことである。本発明では、高精度3次元表面形状粗さ測定システムを用いて実施例に記載の条件にて表面観察した図4が示すように、X軸:95μm及びY軸:95μmという広い範囲(但し、場所は任意である。)において表面粗さ(算術平均粗さ:Ra)が1.0μm以下となる箇所と1.0μm超となる箇所とを有するとき、表面うねりが大きいと称し、この場合、板厚精度が低いこととなる。該表面粗さ(Ra)が1.0μm超となる箇所の表面粗さが大きい程(例えば、1.5μm以上、2.0μm以上等)、表面うねりが大きいと言える。本発明では表面うねりが解消されているため、前記高精度3次元表面形状粗さ測定システムを用いて表面粗さを観察すると、プリプレグの硬化物の表面全範囲において表面粗さが1.0μm以下となり、好ましくは0.9μm以下、より好ましくは0.8μm以下となる。<Process (1)>
The step (1) is a step of polishing at least one surface of the cured product 1 of the prepreg containing the
The cured product 1 of the prepreg used in the step (1) can be obtained by etching and removing the metal foil of the metal-clad laminate whose surface of the cured product inside is not polished. In other words, the metal-clad laminate obtained by arranging metal foils on one or both sides of one or more prepregs and laminating such as press molding has surface waviness, and the plate thickness accuracy is not sufficient. Therefore, by etching and removing the metal foil from the metal-clad laminate and going through the step (1), the surface waviness is eliminated, which in turn leads to the formation of a metal-clad laminate having high plate thickness accuracy.
Here, the surface waviness is an undulation that is repeated at intervals larger than the surface roughness. In the present invention, as shown in FIG. 4, which is surface-observed under the conditions described in Examples using a high-precision three-dimensional surface shape roughness measurement system, a wide range of X-axis: 95 μm and Y-axis: 95 μm (however, however). The place is arbitrary.) When the surface roughness (arithmetic average roughness: Ra) has a place where the surface roughness is 1.0 μm or less and a place where the surface roughness is more than 1.0 μm, it is said that the surface waviness is large. The plate thickness accuracy is low. It can be said that the larger the surface roughness of the portion where the surface roughness (Ra) exceeds 1.0 μm (for example, 1.5 μm or more, 2.0 μm or more, etc.), the larger the surface waviness. Since the surface waviness is eliminated in the present invention, when the surface roughness is observed using the high-precision three-dimensional surface shape roughness measurement system, the surface roughness is 1.0 μm or less in the entire surface range of the cured product of the prepreg. It is preferably 0.9 μm or less, and more preferably 0.8 μm or less.
内部の硬化物の表面が研磨されていない金属張り積層板の金属箔をエッチング除去する方法に特に制限はなく、プリント配線板の製造に用いられる金属張り積層板の金属箔の通常のエッチング除去方法を採用することができる。例えば、塩化第二鉄液、過硫酸アンモニウム等を用いて金属箔をエッチング除去できる。
なお、内部の硬化物の表面が研磨されていない金属張り積層板としては、市販されている金属張り積層板を用いることもできる、公知の方法で製造することもできる。製造する方法としては、例えば、熱硬化性樹脂組成物及び基材を含有してなるプリプレグ1枚の又は複数枚(例えば2〜20枚)を重ねたものの片面又は両面に金属箔を配置し、積層成形して得られる硬化物を使用することもできる。前記熱硬化性樹脂組成物及び前記基材については後述する。前記積層成形条件としては、特に制限されるものではないが、例えば、多段プレス、多段真空プレス、連続成形、オートクレーブ成形機等を使用して、温度100〜250℃、圧力0.2〜10MPa、加熱時間0.1〜5時間の条件が挙げられる。There is no particular limitation on the method of etching and removing the metal foil of the metal-clad laminate whose surface of the hardened material inside is not polished, and the usual etching removal method of the metal foil of the metal-clad laminate used for manufacturing the printed wiring board. Can be adopted. For example, the metal foil can be removed by etching using ferric chloride solution, ammonium persulfate, or the like.
As the metal-clad laminate whose surface of the cured product inside is not polished, a commercially available metal-clad laminate can be used, and it can also be manufactured by a known method. As a method for producing, for example, a metal foil is placed on one side or both sides of one or a plurality of (for example, 2 to 20) prepregs containing a thermosetting resin composition and a base material. A cured product obtained by laminating molding can also be used. The thermosetting resin composition and the base material will be described later. The laminating molding conditions are not particularly limited, but for example, using a multi-stage press, a multi-stage vacuum press, continuous molding, an autoclave molding machine, etc., the temperature is 100 to 250 ° C., the pressure is 0.2 to 10 MPa, and the pressure is 0.2 to 10 MPa. Conditions include a heating time of 0.1 to 5 hours.
内部の硬化物の表面が研磨されていない金属張り積層板の金属箔としては、例えば、銅箔、ニッケル箔、アルミ箔等が挙げられ、これらの中でも銅箔が好ましい。金属箔の厚みに特に制限はないが、例えば、0.5〜150μmが好ましく、1〜100μmがより好ましく、5〜50μmがさらに好ましく、5〜30μmが特に好ましく、7〜18μmが最も好ましい。 Examples of the metal foil of the metal-clad laminate in which the surface of the cured product inside is not polished include copper foil, nickel foil, aluminum foil, and the like, and among these, copper foil is preferable. The thickness of the metal foil is not particularly limited, but for example, 0.5 to 150 μm is preferable, 1 to 100 μm is more preferable, 5 to 50 μm is further preferable, 5 to 30 μm is particularly preferable, and 7 to 18 μm is most preferable.
研磨する面2は、硬化物の少なくとも一方の面であればよいが、十分に表面うねりを解消し、板厚精度を高いものとする観点からは、硬化物の両面を研磨することが好ましい。ここで、「硬化物の少なくとも一方の面」とは、硬化物において、最も面積の大きい2面のうちの少なくとも一方の面を意味し、厚み方向の面(横の面)は含まれない。また、「硬化物の両面」とは、硬化物において、最も面積の大きい2面を意味し、厚み方向の面(横の面)は含まれない。但し、「硬化物の両面」に加えて、厚み方向の面(横の面)を研磨することを否定するものではない。
なお、十分に表面うねりを解消し、板厚精度を高いものとする観点から、研磨対象の面全体を研磨することが好ましい。
前記プリプレグの硬化物1のサイズに特に制限はないが、プレス成形して得られる金属張り積層板(つまり、所定サイズにカットされる前の、いわゆるプレスパネル)サイズとして、最も面積の大きい面のサイズが、縦200mm〜1,300mm×横200mm〜1,300mmであることがより好ましい。さらに、前記プリプレグの硬化物は、例えば、前記プリプレグの硬化物の端部から70mm以内の範囲(又は前記端部から50mm以内の範囲)における少なくとも一部の厚みが硬化物の中央部3の厚みに比べて薄い部位4があっても使用することができる。ここで、前記「プリプレグの硬化物の端部から70mm以内の範囲」とは、プリプレグの硬化物の任意の端部から硬化物の内側に向かって、端部に対して垂直に測定したときに70mm以内の範囲であることを意味する。The
From the viewpoint of sufficiently eliminating surface waviness and increasing the plate thickness accuracy, it is preferable to polish the entire surface to be polished.
The size of the cured product 1 of the prepreg is not particularly limited, but the size of the metal-clad laminate (that is, the so-called press panel before being cut to a predetermined size) obtained by press molding has the largest area. It is more preferable that the size is 200 mm to 1,300 mm in length × 200 mm to 1,300 mm in width. Further, in the cured product of the prepreg, for example, at least a part of the thickness in the range within 70 mm (or within 50 mm from the end) of the cured product of the prepreg is the thickness of the central portion 3 of the cured product. It can be used even if there is a portion 4 thinner than that of the above. Here, the above-mentioned "range within 70 mm from the end of the cured product of the prepreg" is when measured from any end of the cured product of the prepreg toward the inside of the cured product and perpendicular to the end. It means that the range is within 70 mm.
硬化物の面を研磨する方法に特に制限はないが、(i)CMP(Chemical mechanical polishing)法、(ii)フライカット、グラインド、サンドブラスト、ベルト研磨、スクラブ研磨等の機械研磨、(iii)過硫酸塩、過酸化水素−硫酸混合物、無機酸、有機酸等を使用する化学研磨、からなる群から選択される方法によって研磨することが好ましい。これらの中でも、CMP法、フライカット、グラインドによる研磨がより好ましい。研磨する方法は、1種を単独で使用してもよいし、2種以上を併用してもよい。
研磨により、研磨された硬化物の面の表面うねりは低減され、前記面の表面粗さ(Ra)は好ましくは1.0μm以下、より好ましくは0.9μm以下、さらに好ましくは0.8μm以下となる。なお、本発明において、表面粗さ(Ra)は、触針式表面形状測定器(Bruker Corporation社製、商品名「DektakXT」)を用いて測定することができる。
前記CMP法は、アルカリ性の研磨溶液による化学的エッチング作用を伴う機械的研磨である。CMP法を利用する場合、特に制限されるものではないが、例えば、「太田真朗、外2名、''酸化膜CMP用光学式終点検出モニタ''、[online]、エバラ時報、No.207(2005−4)、[平成30年6月12日検索]、インターネット、<URL:https://www.ebara.co.jp/about/technologies/abstract/detail/__icsFiles/afieldfile/2016/04/25/207_P25.pdf>」に記載されたCMP装置等を利用することができる。また、前記機械研磨として、例えばフライカットは、特に制限されるものではないが、ダイヤモンドバイトによる研削装置、例えば、300mmウェハ対応のオートマチックサーフェースプレーナ(株式会社ディスコ製、商品名「DAS8930」)、グラインダ(株式会社ディスコ製、商品名「DFG8540」「DFG8560」)等を使用して、物理的に研削(研磨)する方法である。There is no particular limitation on the method of polishing the surface of the cured product, but (i) CMP (Chemical mechanical polishing) method, (ii) mechanical polishing such as fly cut, grind, sand blast, belt polishing, scrub polishing, (iii) excessive. It is preferable to polish by a method selected from the group consisting of a sulfate, a hydrogen peroxide-sulfuric acid mixture, a chemical polishing using an inorganic acid, an organic acid and the like. Among these, polishing by the CMP method, fly cut, and grind is more preferable. As the polishing method, one type may be used alone, or two or more types may be used in combination.
By polishing, the surface waviness of the surface of the polished cured product is reduced, and the surface roughness (Ra) of the surface is preferably 1.0 μm or less, more preferably 0.9 μm or less, still more preferably 0.8 μm or less. Become. In the present invention, the surface roughness (Ra) can be measured by using a stylus type surface shape measuring instrument (manufactured by Bruker Corporation, trade name "DectakXT").
The CMP method is mechanical polishing accompanied by a chemical etching action with an alkaline polishing solution. When the CMP method is used, it is not particularly limited, but for example, "Maro Ota, 2 outsiders," Optical end point detection monitor for oxide film CMP ", [online], Ebara Time Signal, No. 207. (2005-4), [Search on June 12, 2018], Internet, <URL: https://www.ebara.co.jp/about/technologies/abstract/detail/__icsFiles/afieldfile/2016/04/ The CMP device described in "25 / 207_P25.pdf>" can be used. Further, as the mechanical polishing, for example, fly cutting is not particularly limited, but a grinding device using a diamond bite, for example, an automatic surface planar (manufactured by DISCO Co., Ltd., trade name "DAS8930") compatible with a 300 mm wafer, and the like. This is a method of physically grinding (polishing) using a grinder (manufactured by DISCO Co., Ltd., trade names "DFG8540" and "DFG8560") and the like.
当該工程(1)によって、プリプレグの硬化物の表面うねりを解消し、且つ板厚精度を高めることができる。該硬化物は厚みが略均一化されているといえる。ここで、略均一化とは、完全に厚みが均一化されている態様と共に、完全ではなくても、表面うねりが前述の範囲となる程度に厚みが均一化されている態様も含まれる。
また、図1及び図2に示すように、前記研磨は、前記プリプレグの硬化物中の最も薄い部位5の厚みに揃うまで面全体を研磨することが好ましい。ここで、「前記プリプレグの硬化物中の最も薄い部位5の厚みに揃う」とは、プリプレグ全体の厚みが略均一化される程度に揃っていることを意味する。このように研磨することによって硬化物全体の厚みが略均一化されるため、硬化物の厚みが薄くなっていた部位を破棄する必要がなくなる。研磨の際、プリプレグ中の基材まで研磨しても特に問題はないが、基材を研磨しない程度に調整しながら研磨してもよい。By the step (1), the surface waviness of the cured product of the prepreg can be eliminated and the plate thickness accuracy can be improved. It can be said that the cured product has a substantially uniform thickness. Here, the substantially uniformization includes not only a mode in which the thickness is completely uniform, but also a mode in which the thickness is uniform to the extent that the surface waviness is within the above-mentioned range, even if it is not perfect.
Further, as shown in FIGS. 1 and 2, it is preferable that the polishing is performed on the entire surface until the thickness of the
(熱硬化性樹脂組成物)
前記プリプレグが含有する熱硬化性樹脂組成物としては、熱硬化性樹脂を含有していれば特に制限されるものではない。熱硬化性樹脂としては、例えば、エポキシ樹脂、フェノール樹脂、不飽和イミド樹脂、シアネート樹脂、イソシアネート樹脂、ベンゾオキサジン樹脂、オキセタン樹脂、不飽和ポリエステル樹脂、アリル樹脂、ジシクロペンタジエン樹脂、シリコーン樹脂、変性シリコーン樹脂、トリアジン樹脂、メラミン樹脂、尿素樹脂、フラン樹脂等が挙げられる。また、特にこれらに制限されず、公知の熱硬化性樹脂を使用できる。これらは、1種を単独で使用してもよいし、2種以上を併用することもできる。これらの中でも、エポキシ樹脂、不飽和イミド樹脂、変性シリコーン樹脂が好ましい。(Thermosetting resin composition)
The thermosetting resin composition contained in the prepreg is not particularly limited as long as it contains a thermosetting resin. Examples of the thermosetting resin include epoxy resin, phenol resin, unsaturated imide resin, cyanate resin, isocyanate resin, benzoxazine resin, oxetane resin, unsaturated polyester resin, allyl resin, dicyclopentadiene resin, silicone resin, and modification. Examples thereof include silicone resin, triazine resin, melamine resin, urea resin, furan resin and the like. Further, without being particularly limited to these, known thermosetting resins can be used. These may be used alone or in combination of two or more. Among these, epoxy resin, unsaturated imide resin, and modified silicone resin are preferable.
前記エポキシ樹脂としては、特に制限されるものではないが、例えば、ビスフェノールA型エポキシ樹脂、ビスフェノールF型エポキシ樹脂、ビスフェノールS型エポキシ樹脂等のビスフェノール型エポキシ樹脂;脂環式エポキシ樹脂;脂肪族鎖状エポキシ樹脂;フェノールノボラック型エポキシ樹脂、クレゾールノボラック型エポキシ樹脂、ビスフェノールAノボラック型エポキシ樹脂、ビスフェノールFノボラック型エポキシ樹脂等のノボラック型エポキシ樹脂;フェノールアラルキル型エポキシ樹脂;スチルベン型エポキシ樹脂;ジシクロペンタジエン型エポキシ樹脂;ナフトールノボラック型エポキシ樹脂、ナフトールアラルキル型エポキシ樹脂等のナフタレン骨格含有型エポキシ樹脂;ビフェニル型エポキシ樹脂;ビフェニルアラルキル型エポキシ樹脂;キシリレン型エポキシ樹脂;ジヒドロアントラセン型エポキシ樹脂などが挙げられる。これらの中から、ナフタレン骨格含有型エポキシ樹脂を選択してもよく、ナフトールアラルキル型エポキシ樹脂を選択してもよい。 The epoxy resin is not particularly limited, but is, for example, a bisphenol type epoxy resin such as a bisphenol A type epoxy resin, a bisphenol F type epoxy resin, or a bisphenol S type epoxy resin; an alicyclic epoxy resin; an aliphatic chain. Epoxy resin; Novolak type epoxy resin such as phenol novolac type epoxy resin, cresol novolak type epoxy resin, bisphenol A novolak type epoxy resin, bisphenol F novolak type epoxy resin; phenol aralkyl type epoxy resin; stillben type epoxy resin; dicyclopentadiene Type epoxy resin; naphthalen skeleton-containing epoxy resin such as naphthol novolac type epoxy resin and naphthol aralkyl type epoxy resin; biphenyl type epoxy resin; biphenyl aralkyl type epoxy resin; xylylene type epoxy resin; dihydroanthracene type epoxy resin and the like. From these, a naphthalene skeleton-containing epoxy resin may be selected, or a naphthol aralkyl type epoxy resin may be selected.
前記不飽和イミド樹脂としては、例えば、マレイミド樹脂、マレイミド樹脂とモノアミン化合物との付加反応物、マレイミド樹脂とモノアミン化合物とジアミン化合物との反応物等が挙げられる。前記マレイミド化合物としては、特に制限されるものではないが、例えば、ビス(4−マレイミドフェニル)メタン、ポリフェニルメタンマレイミド、ビス(4−マレイミドフェニル)エーテル、3,3’−ジメチル−5,5’−ジエチル−4,4’−ジフェニルメタンビスマレイミド、4−メチル−1,3−フェニレンビスマレイミド、m−フェニレンビスマレイミド、ビス(4−マレイミドフェニル)スルホン、ビス(4−マレイミドフェニル)スルフィド、ビス(4−マレイミドフェニル)ケトン、2,2−ビス(4−(4−マレイミドフェノキシ)フェニル)プロパン、ビス(4−(4−マレイミドフェノキシ)フェニル)スルホン、4,4’−ビス(3−マレイミドフェノキシ)ビフェニル、1,6−ビスマレイミド−(2,2,4−トリメチル)ヘキサン等が挙げられる。これらの中から、ビス(4−マレイミドフェニル)メタンを選択してもよい。
上記モノアミン化合物としては、酸性置換基(例えば、水酸基、カルボキシ基等)を有するモノアミン化合物が好ましく、具体的には、o−アミノフェノール、m−アミノフェノール、p−アミノフェノール、o−アミノ安息香酸、m−アミノ安息香酸、p−アミノ安息香酸、o−アミノベンゼンスルホン酸、m−アミノベンゼンスルホン酸、p−アミノベンゼンスルホン酸、3,5−ジヒドロキシアニリン、3,5−ジカルボキシアニリン等が挙げられる。
上記ジアミン化合物としては、少なくとも2個のベンゼン環を有するジアミン化合物が好ましく、2つのアミノ基の間に少なくとも2個のベンゼン環を直鎖状に有するジアミン化合物がより好ましく、4,4’−ジアミノジフェニルメタン、4,4’−ジアミノ−3,3’−ジメチル−ジフェニルメタン、4,4’−ジアミノ−3,3’−ジエチル−ジフェニルメタン、4,4’−ジアミノジフェニルエーテル、4,4’−ジアミノジフェニルスルホン、3,3’−ジアミノジフェニルスルホン、4,4’−ジアミノジフェニルケトン等が挙げられる。
前記不飽和イミド樹脂としては、例えば、特開2018−165340号公報等に記載のマレイミド化合物を使用することもできる。Examples of the unsaturated imide resin include a maleimide resin, an addition reaction product of a maleimide resin and a monoamine compound, and a reaction product of a maleimide resin, a monoamine compound, and a diamine compound. The maleimide compound is not particularly limited, and is, for example, bis (4-maleimidephenyl) methane, polyphenylmethane maleimide, bis (4-maleimidephenyl) ether, 3,3'-dimethyl-5,5. '-Diethyl-4,4'-diphenylmethanebismaleimide, 4-methyl-1,3-phenylenebismaleimide, m-phenylenebismaleimide, bis (4-maleimidephenyl) sulfone, bis (4-maleimidephenyl) sulfide, bis (4-Maleimidephenyl) ketone, 2,2-bis (4- (4-maleimidephenoxy) phenyl) propane, bis (4- (4-maleimidephenoxy) phenyl) sulfone, 4,4'-bis (3-maleimide) Phenoxy) biphenyl, 1,6-bismaleimide- (2,2,4-trimethyl) hexane and the like. From these, bis (4-maleimidephenyl) methane may be selected.
As the monoamine compound, a monoamine compound having an acidic substituent (for example, a hydroxyl group, a carboxy group, etc.) is preferable, and specifically, o-aminophenol, m-aminophenol, p-aminophenol, o-aminobenzoic acid. , M-aminobenzoic acid, p-aminobenzoic acid, o-aminobenzenesulfonic acid, m-aminobenzenesulfonic acid, p-aminobenzenesulfonic acid, 3,5-dihydroxyaniline, 3,5-dicarboxyaniline, etc. Can be mentioned.
As the diamine compound, a diamine compound having at least two benzene rings is preferable, and a diamine compound having at least two benzene rings linearly between two amino groups is more preferable, and 4,4'-diamino. Diphenylmethane, 4,4'-diamino-3,3'-dimethyl-diphenylmethane, 4,4'-diamino-3,3'-diethyl-diphenylmethane, 4,4'-diaminodiphenyl ether, 4,4'-diaminodiphenylsulfone , 3,3'-diaminodiphenyl sulfone, 4,4'-diaminodiphenyl ketone and the like.
As the unsaturated imide resin, for example, the maleimide compound described in JP-A-2018-165340 can also be used.
熱硬化性樹脂組成物は、前記熱硬化性樹脂の他に、必要に応じて、硬化剤、硬化促進剤、無機充填材、有機充填材、カップリング剤、レベリング剤、酸化防止剤、難燃剤、難燃助剤、揺変性付与剤、増粘剤、チキソ性付与剤、可撓性材料、界面活性剤及び光重合開始材等から選択される少なくとも1つを含有する態様が好ましい。特に、無機充填材については、本発明ではこれを高充填しなくとも板厚精度を高めることができるため、該無機充填材の含有量を例えば10〜60体積%にすることができ、20〜60体積%にしてもよく、30〜60体積%にしてもよく、当該数値範囲においてさらに上限値を57体積%とすることもでき、55体積%とすることもできる。但し、無機充填材を高充填する必要がある場合には、本発明においては、無機充填材の含有量が60体積%を超えることを必ずしも否定はせず、例えば前記含有量の数値範囲の上限値を70体積%としてもよいし、80体積%としてもよい。 In addition to the thermosetting resin, the thermosetting resin composition includes a curing agent, a curing accelerator, an inorganic filler, an organic filler, a coupling agent, a leveling agent, an antioxidant, and a flame retardant, if necessary. , A mode containing at least one selected from a flame retardant aid, a rocking modification imparting agent, a thickening agent, a thixophilic imparting agent, a flexible material, a surfactant, a photopolymerization initiator and the like is preferable. In particular, with respect to the inorganic filler, in the present invention, the plate thickness accuracy can be improved without high filling, so that the content of the inorganic filler can be, for example, 10 to 60% by volume, and 20 to 20 to 60% by volume. It may be 60% by volume, 30 to 60% by volume, and the upper limit may be 57% by volume or 55% by volume in the numerical range. However, when it is necessary to highly fill the inorganic filler, in the present invention, it is not always denied that the content of the inorganic filler exceeds 60% by volume, for example, the upper limit of the numerical range of the content. The value may be 70% by volume or 80% by volume.
また、例えば国際公開第2012/099133号に記載されている、変性シリコーン化合物(変性シリコーン樹脂)、必要に応じてさらに、他の熱硬化性樹脂、硬化剤、硬化促進剤、無機充填材、熱可塑性樹脂、エラストマー、有機充填材、難燃剤、紫外線吸収剤、酸化防止剤、光重合開始剤、蛍光増白剤及び接着性向上剤等からなる群から選択される少なくとも1種を含有する熱硬化性樹脂組成物等も用いることができる。
前記変性シリコーン化合物としては、両末端アミノ変性シリコーン化合物が好ましく、具体的には、(A)下記一般式(1)に示すシロキサンジアミン、(B)分子構中に少なくとも2個のN−置換マレイミド基を有するマレイミド化合物、(C)下記一般式(2)に示す酸性置換基を有するアミン化合物を反応させてなる両末端アミノ変性シリコーン化合物であり、詳細は国際公開第2012/099133号に記載の通りである。
[式(1)中、複数のR1は、それぞれ独立にアルキル基、フェニル基又は置換フェニル基を示し、互いに同じでも異なっていてもよく、複数のR2は、それぞれ独立にアルキル基、フェニル基又は置換フェニル基を示し、互いに同じでも異なっていてもよく、R3及びR4はそれぞれ独立にアルキル基、フェニル基又は置換フェニル基を示し、R5及びR6はそれぞれ独立に2価の有機基を示す。nは2〜50の整数を示す。]
[式(2)中、R7は複数ある場合は各々独立に、水酸基、カルボキシル基又はスルホン酸基を示し、R8は複数ある場合は各々独立に水素原子、炭素数1〜5の脂肪族炭化水素基、ハロゲン原子を示す。xは1〜5の整数、yは0〜4の整数であり、x+y=5である。]Further, for example, a modified silicone compound (modified silicone resin) described in International Publication No. 2012/099133, and if necessary, other thermosetting resins, curing agents, curing accelerators, inorganic fillers, heat. Thermosetting containing at least one selected from the group consisting of plastic resins, elastomers, organic fillers, flame retardants, ultraviolet absorbers, antioxidants, photopolymerization initiators, fluorescent whitening agents, adhesion improvers and the like. A sex resin composition or the like can also be used.
As the modified silicone compound, both terminal amino-modified silicone compounds are preferable, specifically, (A) siloxane diamine represented by the following general formula (1), and (B) at least two N-substituted maleimides in the molecular structure. A maleimide compound having a group, (C) a two-terminal amino-modified silicone compound obtained by reacting an amine compound having an acidic substituent represented by the following general formula (2), the details of which are described in International Publication No. 2012/099133. It's a street.
Wherein (1), a plurality of R 1 each independently represent an alkyl group, a phenyl group or substituted phenyl group, may be the same or different from each other, a plurality of R 2 each independently represent an alkyl group, a phenyl It represents a group or a substituted phenyl group and may be the same or different from each other, R 3 and R 4 independently represent an alkyl group, a phenyl group or a substituted phenyl group, respectively, and R 5 and R 6 are independently divalent. Indicates an organic group. n represents an integer of 2 to 50. ]
[In the formula (2), when there are a plurality of R 7, each independently indicates a hydroxyl group, a carboxyl group or a sulfonic acid group, and when there are a plurality of R 8, each independently has a hydrogen atom and an aliphatic group having 1 to 5 carbon atoms. Indicates a hydrocarbon group and a halogen atom. x is an integer of 1 to 5, y is an integer of 0 to 4, and x + y = 5. ]
(基材)
前記プリプレグが含有する基材としては、シート状補強基材が用いられ、各種の電気絶縁材料用積層板に用いられている周知のものが使用できる。基材の材質としては、紙、コットンリンター等の天然繊維;ガラス繊維及びアスベスト等の無機繊維;アラミド、ポリイミド、ポリビニルアルコール、ポリエステル、テトラフルオロエチレン及びアクリル等の有機繊維;これらの混合物などが挙げられる。これらの中でも、難燃性の観点から、ガラス繊維が好ましい。ガラス繊維基材としては、Eガラス、Cガラス、Dガラス、Sガラス等を用いた織布又は短繊維を有機バインダーで接着したガラス織布;ガラス繊維とセルロース繊維とを混抄したもの等が挙げられる。より好ましくは、Eガラスを使用したガラス織布である。
これらの基材は、例えば、織布、不織布、ロービンク、チョップドストランドマット又はサーフェシングマット等の形状を有する。なお、材質及び形状は、目的とする成形物の用途や性能により選択され、1種を単独で使用してもよいし、必要に応じて、2種以上の材質及び形状を組み合わせることもできる。
基材の厚さは、例えば、0.01〜0.5mmであってもよく、成形性及び高密度配線を可能にする観点から、0.015〜0.2mmが好ましく、0.02〜0.15mmがより好ましい。これらの基材は、耐熱性、耐湿性、加工性等の観点から、シランカップリング剤等で表面処理したもの、機械的に開繊処理を施したものなどであることが好ましい。(Base material)
As the base material contained in the prepreg, a sheet-shaped reinforcing base material is used, and well-known materials used for various laminated plates for electrical insulating materials can be used. Examples of the material of the base material include natural fibers such as paper and cotton linter; inorganic fibers such as glass fiber and asbestos; organic fibers such as aramid, polyimide, polyvinyl alcohol, polyester, tetrafluoroethylene and acrylic; and a mixture thereof. Be done. Among these, glass fiber is preferable from the viewpoint of flame retardancy. Examples of the glass fiber base material include woven fabrics using E glass, C glass, D glass, S glass, etc., or glass woven fabrics in which short fibers are bonded with an organic binder; a mixture of glass fibers and cellulose fibers. Be done. More preferably, it is a glass woven fabric using E glass.
These substrates have the shape of, for example, woven fabrics, non-woven fabrics, robinks, chopped strand mats or surfaced mats. The material and shape are selected according to the intended use and performance of the molded product, and one type may be used alone, or two or more types of materials and shapes may be combined as needed.
The thickness of the base material may be, for example, 0.01 to 0.5 mm, preferably 0.015 to 0.2 mm, preferably 0.02 to 0, from the viewpoint of formability and enabling high-density wiring. .15 mm is more preferred. From the viewpoint of heat resistance, moisture resistance, processability, etc., these base materials are preferably surface-treated with a silane coupling agent or the like, mechanically opened, or the like.
(プリプレグ)
前記熱硬化性樹脂組成物を前記基材に含浸した後、加熱処理を施すことによって、熱硬化性樹脂組成物をB−ステージ化させたプリプレグが得られる。プリプレグは、プリプレグの取扱い性及びタック性の観点から、これを冷却する冷却工程に供することが好ましい。プリプレグの冷却は、自然放冷によって行ってもよく、送風装置、冷却ロール等の冷却装置を用いて行ってもよい。冷却後のプリプレグの温度は、通常、5〜80℃であり、8〜50℃が好ましく、10〜30℃がより好ましく、室温がさらに好ましい。また、プリプレグ中の熱硬化性樹脂組成物の固形分換算の含有量は、特に制限されるものではないが、20〜90質量%が好ましく、30〜85質量%がより好ましく、50〜80質量%がさらに好ましい。プリプレグの厚さは、特に制限されるものではないが、例えば、20〜150μmが好ましく、60〜120μmがより好ましい。(Prepreg)
By impregnating the base material with the thermosetting resin composition and then heat-treating the substrate, a prepreg obtained by B-staged the thermosetting resin composition can be obtained. From the viewpoint of handleability and tackiness of the prepreg, the prepreg is preferably used in a cooling step for cooling the prepreg. The prepreg may be cooled by natural cooling, or may be cooled by using a cooling device such as a blower or a cooling roll. The temperature of the prepreg after cooling is usually 5 to 80 ° C, preferably 8 to 50 ° C, more preferably 10 to 30 ° C, and even more preferably room temperature. The content of the thermosetting resin composition in the prepreg in terms of solid content is not particularly limited, but is preferably 20 to 90% by mass, more preferably 30 to 85% by mass, and 50 to 80% by mass. % Is more preferable. The thickness of the prepreg is not particularly limited, but is preferably 20 to 150 μm, more preferably 60 to 120 μm, for example.
<工程(2−1)及び工程(2−2)>
工程(2−1)は、前記工程(1)で研磨された面に金属箔9を積層して金属張り積層板を形成する工程である。一方、工程(2−2)は、前記工程(1)で研磨された面8に、金属箔9及び熱硬化性樹脂フィルム10を又は金属箔付き熱硬化性樹脂フィルム11を、熱硬化性樹脂フィルム10が研磨された面8側となるように積層して金属張り積層板12を形成する工程である。なお、前記金属箔付き熱硬化性樹脂フィルム11は、金属箔9上に熱硬化性樹脂フィルム10が配置されてなるものである。
工程(1)の後は、工程(2−1)及び工程(2−2)のいずれを選択してもよいが、プリプレグの硬化物を研磨した深さ分の熱硬化性樹脂層を設けることが可能である工程(2−2)を選択することが好ましい。該工程(2−2)を選択することにより、前記工程(1)における研磨の量によらず、プリプレグの厚みを研磨前の厚みに戻すことも可能であり、また、任意の厚みに調整することも可能である。<Step (2-1) and Step (2-2)>
The step (2-1) is a step of laminating the
After the step (1), either the step (2-1) or the step (2-2) may be selected, but a thermosetting resin layer corresponding to the depth obtained by polishing the cured product of the prepreg is provided. It is preferable to select the step (2-2) in which the above is possible. By selecting the step (2-2), the thickness of the prepreg can be returned to the thickness before polishing regardless of the amount of polishing in the step (1), and can be adjusted to an arbitrary thickness. It is also possible.
前記金属箔9(金属箔付き熱硬化性樹脂フィルム11の金属箔を含む。)の金属としては、電気絶縁材料用途で用いられるものであれば特に制限されず、導電性の観点から、銅、金、銀、ニッケル、白金、モリブデン、ルテニウム、アルミニウム、タングステン、鉄、チタン、クロム、又はこれらの金属元素のうちの少なくとも1種を含む合金が好ましく、銅、アルミニウムがより好ましく、銅がさらに好ましい。
また、前記工程(2−2)で使用する熱硬化性樹脂フィルムの素材としては、前記工程(1)で使用するプリプレグが含有する熱硬化性樹脂組成物と同じであることが好ましい。The metal of the metal foil 9 (including the metal foil of the
Further, the material of the thermosetting resin film used in the step (2-2) is preferably the same as the thermosetting resin composition contained in the prepreg used in the step (1).
[金属張り積層板]
本発明は、上記製造方法により得られる金属張り積層板も提供する。
内部の硬化物の厚みが略均一化されているため、本発明の金属張り積層板も厚みが略均一化されており、具体的には、厚みの最大値と最小値の差が20μm以下となり得るものであり、板厚精度に優れている。厚みの最大値と最小値の差は、より優れたものでは10μm以下、さらに優れたものでは5μm以下となる。
ここで、厚みの最大値と最小値の差及びそれらの差は以下の方法に従って測定した値であり、より詳細には実施例に記載の方法に従って測定した値である。
<厚みの最大値と最小値の差及びそれらの差の算出方法>
550mm角の金属張り積層板を、50mm角のサイズにカットし、計81個に小片化する。端部及びセンター部を含む17か所のサンプルを選択し、任意4点の厚みをマイクロメータにより計測する。計68点のデータから、板厚の最大値、最小値、及びそれらの差を算出する。[Metal-clad laminate]
The present invention also provides a metal-clad laminate obtained by the above manufacturing method.
Since the thickness of the cured product inside is substantially uniform, the thickness of the metal-clad laminate of the present invention is also substantially uniform. Specifically, the difference between the maximum value and the minimum value of the thickness is 20 μm or less. It is obtained and has excellent plate thickness accuracy. The difference between the maximum value and the minimum value of the thickness is 10 μm or less for the better one and 5 μm or less for the better one.
Here, the difference between the maximum value and the minimum value of the thickness and the difference between them are the values measured according to the following methods, and more specifically, the values measured according to the method described in Examples.
<Difference between maximum and minimum thickness and calculation method of those differences>
A 550 mm square metal-clad laminate is cut into a 50 mm square size and fragmented into a total of 81 pieces. Select 17 samples including the end and center, and measure the thickness at any 4 points with a micrometer. From the data of 68 points in total, the maximum value, the minimum value, and the difference between them are calculated.
また、本発明の製造方法により得られる金属張り積層板は、厚みの標準偏差(σ)が10μm以下となり得るものであり、板厚精度に優れている。該標準偏差(σ)は、より優れたものでは5μm以下、さらに優れたものでは3μm以下となる。なお、厚みの標準偏差(σ)は、例えば、金属張り積層板の任意のn箇所の厚みを測定したときのそれらの厚みをそれぞれT1、T2、・・・、Tnとし、金属張り積層板の平均厚みをTとするとき、下記式からn箇所での標準偏差を求めることができる。Further, the metal-clad laminate obtained by the manufacturing method of the present invention can have a standard deviation (σ) of thickness of 10 μm or less, and is excellent in plate thickness accuracy. The standard deviation (σ) is 5 μm or less for the better one and 3 μm or less for the better one. The standard deviation (σ) of the thickness is, for example, T 1 , T 2 , ..., T n when the thicknesses of arbitrary n points of the metal-clad laminate are measured, respectively, and the metal-clad laminates are metal-clad. When the average thickness of the laminated board is T, the standard deviation at n points can be obtained from the following formula.
また、本発明の製造方法により得られる金属張り積層板の一態様として、(a)熱硬化性樹脂組成物及び基材を含有してなるプリプレグの硬化物であって、該硬化物の少なくとも一方の面が研磨された硬化物、(b)基材を含まない熱硬化性樹脂組成物層、及び(c)金属箔、を含有する金属張り積層板が挙げられる。特に、前記製造方法における工程(1)及び工程(2−2)を経ることにより当該金属張り積層板を製造することができる。
前記(a)については、特に制限されるものではないが、硬化物の両面が研磨されている態様が好ましい。研磨する方法の好ましい態様としては、前述の通りである。Further, as one aspect of the metal-clad laminate obtained by the production method of the present invention, (a) a cured product of a prepreg containing a thermosetting resin composition and a base material, at least one of the cured products. Examples thereof include a metal-clad laminate containing a cured product having a polished surface, (b) a thermosetting resin composition layer containing no substrate, and (c) a metal foil. In particular, the metal-clad laminate can be manufactured by going through the steps (1) and (2-2) in the manufacturing method.
The above (a) is not particularly limited, but it is preferable that both sides of the cured product are polished. The preferred embodiment of the polishing method is as described above.
[プリント配線板]
本発明は、前記金属張り積層板を含有してなるプリント配線板も提供する。
より詳細には、本発明のプリント配線板は、金属張り積層板の金属箔に対して回路加工を施すことにより製造することができる。回路加工は、例えば、金属箔表面にレジストパターンを形成後、エッチングにより不要部分の金属箔を除去し、レジストパターンを剥離後、ドリルにより必要なスルーホールを形成し、再度レジストパターンを形成後、スルーホールに導通させるためのメッキを施し、最後にレジストパターンを剥離することにより行うことができる。このようにして得られたプリント配線板の表面にさらに上記の金属張り積層板を前記したのと同様の条件で積層し、さらに、上記と同様にして回路加工して多層プリント配線板とすることができる。この場合、必ずしもスルーホールを形成する必要はなく、ビアホールを形成してもよく、両方を形成することができる。このような多層化は必要枚数行われる。
こうして得られる本発明のプリント配線板も、板厚精度に優れている。[Printed circuit board]
The present invention also provides a printed wiring board containing the metal-clad laminate.
More specifically, the printed wiring board of the present invention can be manufactured by applying circuit processing to the metal foil of the metal-clad laminate. In circuit processing, for example, after forming a resist pattern on the surface of a metal foil, removing unnecessary metal foil by etching, peeling off the resist pattern, forming necessary through holes by a drill, and forming a resist pattern again, the resist pattern is formed. This can be done by plating the through holes to make them conductive, and finally peeling off the resist pattern. The above-mentioned metal-clad laminate is further laminated on the surface of the printed wiring board thus obtained under the same conditions as described above, and further circuit-processed in the same manner as described above to obtain a multilayer printed wiring board. Can be done. In this case, it is not always necessary to form through holes, via holes may be formed, and both can be formed. Such multi-layering is performed in the required number of sheets.
The printed wiring board of the present invention thus obtained is also excellent in plate thickness accuracy.
[半導体パッケージ]
本発明の半導体パッケージは、本発明のプリント配線板に半導体を搭載してなるものである。本発明の半導体パッケージは、本発明のプリント配線板の所定の位置に、半導体チップ、メモリ等を搭載して製造することができる。本発明のプリント配線板が板厚精度に優れているため、本発明の半導体パッケージは、(1)半導体チップ実装時の歩留まりが向上し、(2)ビルドアップフィルム上又は再配線層上にてL/S=2μm/2μm以下の微細配線形成性が向上し、(3)反り量が低減し、且つ反り量のばらつきが生じ難い、という傾向にある。[Semiconductor package]
The semiconductor package of the present invention comprises mounting a semiconductor on the printed wiring board of the present invention. The semiconductor package of the present invention can be manufactured by mounting a semiconductor chip, a memory, or the like at a predetermined position on the printed wiring board of the present invention. Since the printed wiring board of the present invention has excellent plate thickness accuracy, the semiconductor package of the present invention can (1) improve the yield at the time of mounting a semiconductor chip, and (2) on a build-up film or a rewiring layer. There is a tendency that the fine wiring formability of L / S = 2 μm / 2 μm or less is improved, (3) the amount of warpage is reduced, and the amount of warpage is unlikely to vary.
[コアレス基板形成用支持体]
本発明は、本発明の金属張り積層板を含有してなる、コアレス基板形成用支持体も提供する。該コアレス基板形成用支持体(コア基板)上に、回路パターンを有する絶縁樹脂組成物層を順次積層してビルドアップ層を形成した後、前記支持体を分離することにより、コアレス基板の作製が可能である。本発明のコアレス基板形成用支持体は板厚精度が良好であるため、こうして得られるコアレス基板の反り及び表面うねりを低減することができるため、該コアレス基板の板厚精度向上に適している。
なお、前記ビルドアップ層の形成方法に特に制限はなく、公知の方法を採用できる。図3を参照しながら説明すると、例えば、ビルドアップ層は次の方法によって形成できる。
まず、本発明のコアレス基板形成用支持体(コア基板)13上にプリプレグ14を配置する。なお、前記コアレス基板形成用支持体(コア基板)13上には接着層を配置した上で、プリプレグ14を配置してもよい。その後、プリプレグ14を加熱硬化して絶縁層とする。次いで、ドリル切削方法、又はYAGレーザー、CO2レーザー等を用いるレーザー加工方法などによってビアホール15を形成した後、必要に応じて表面粗化処理及びデスミア処理を行なう。続いて、サブトラクティブ法、フルアディティブ法、セミアディティブ法(SAP:Semi Additive Process)、モディファイドセミアディティブ法(m−SAP:modified Semi Additive Process)等によって回路パターン16を形成する。以上の過程を繰り返すことによって、ビルドアップ層17が形成される。形成したビルドアップ層17を、コアレス基板形成用支持体(コア基板)13から分離することによって、コアレス基板18が得られる。なお、ビルドアップ層17は、支持体(コア基板)13の片面に形成してもよいし、両面に形成してもよい。[Support for forming coreless substrate]
The present invention also provides a support for forming a coreless substrate, which comprises the metal-clad laminate of the present invention. A coreless substrate can be produced by sequentially laminating an insulating resin composition layer having a circuit pattern on the coreless substrate forming support (core substrate) to form a build-up layer, and then separating the support. It is possible. Since the support for forming a coreless substrate of the present invention has good plate thickness accuracy, warpage and surface waviness of the coreless substrate thus obtained can be reduced, and thus it is suitable for improving the plate thickness accuracy of the coreless substrate.
The method for forming the build-up layer is not particularly limited, and a known method can be adopted. Explaining with reference to FIG. 3, for example, the build-up layer can be formed by the following method.
First, the
[半導体再配線層形成用支持体]
本発明は、本発明の金属張り積層板を含有してなる、半導体再配線層形成用支持体も提供する。前記半導体再配線層とは、はんだボールに繋げる銅配線が設けられる絶縁層のことであり、通常、半導体チップとはんだボールとの間に設けられる絶縁層である。当該半導体再配線層を形成するために、好ましくは半導体再配線層形成用樹脂フィルムが使用されるが、本発明の半導体再配線層形成用支持体は板厚精度が良好であるため、当該半導体再配線層形成用樹脂フィルムの支持体として有効に機能する。[Support for forming semiconductor rewiring layer]
The present invention also provides a support for forming a semiconductor rewiring layer, which comprises the metal-clad laminate of the present invention. The semiconductor rewiring layer is an insulating layer provided with copper wiring connected to the solder ball, and is usually an insulating layer provided between the semiconductor chip and the solder ball. A resin film for forming a semiconductor rewiring layer is preferably used to form the semiconductor rewiring layer, but the support for forming the semiconductor rewiring layer of the present invention has good plate thickness accuracy, so that the semiconductor is used. It functions effectively as a support for the resin film for forming the rewiring layer.
次に、下記の実施例により本発明をさらに詳しく説明するが、これらの実施例は本発明をいかなる意味においても制限するものではない。 Next, the present invention will be described in more detail with reference to the following examples, but these examples do not limit the present invention in any sense.
[実施例1]
まず、下記の手順に従いプリプレグを作製した。
両末端アミノ変性シリコーン化合物100質量部、ビス(4−マレイミドフェニル)メタン222質量部及びp−アミノフェノール8.5質量部を反応させて、変性シリコーン化合物含有溶液を得た。次に、該変性シリコーン化合物含有溶液を固形分換算で16質量部、ナフトールアラルキル型エポキシ樹脂16質量部、溶融シリカ〔平均粒子径:0.5μm〕69質量部、イソシアネートマスクイミダゾール0.15質量部を混合し、樹脂分65質量%のワニスを得た。得られたワニスを厚さ0.1mmのEガラスクロスに含浸塗工し、加熱乾燥してプリプレグ(溶融シリカの充填率:50体積%)を得た。
こうして得られたプリプレグを8枚重ね合わせ、その両面に、ロープロタイプ銅箔(厚み12μm、最大高さ粗さ(Rz)約4.0μm、三井金属鉱業株式会社製)を重ね、圧力0.5MPa、温度200〜230℃で約2時間加熱加圧成型することによって、両面に銅箔を有する積層板(以下、銅張積層板aと称する。)を得た。
次に、得られた銅張積層板aを用い、銅箔をエッチングで除去して積層体を得た。該積層体の表面について、高精度3次元表面形状粗さ測定システム(Veeco Instruments社製、Wyko NT9100)を用いて下記測定条件にて表面粗さ(Ra)を測定した。その結果を図4に示す。
次に、この積層体の表裏両面(つまり最も面積の大きい2面)をダイヤモンドバイトによる研削装置(300mmウェハ対応のオートマチックサーフェースプレーナ、株式会社ディスコ製、商品名「DAS8930」)を使用して、両面に研磨加工を施し、平坦化処理した。研磨加工後の表面について、高精度3次元表面形状粗さ測定システム(Veeco Instruments社製、Wyko NT9100)を用いて下記測定条件にて表面粗さ(Ra)を測定した。その結果を図5に示す。図4に比べて、図5の方が表面うねりが小さいことを確認できた。
さらに、この平坦化処理した積層体の両面に、前記プリプレグ「GEA−705G」と同一成分の熱硬化性樹脂フィルム(厚み10μm)を配し、さらにその外側に銅箔(厚み12μm)を配し、熱プレスで加熱及び加圧することにより、最外層に回路形成可能な550mm角の銅張り積層板Aを得た。こうして得られた銅張積層板Aの断面をデジタルマイクロスコープ(キーエンス製、商品名「VHX−5000」)を用いて観察した。その画像を図6に示す。
<高精度3次元表面形状粗さ測定システムの測定条件>
内部レンズ:1倍
外部レンズ:50倍
測定範囲:95μm(Y軸)×95μm(X軸)の範囲で任意の位置
測定深度:10μm
測定方式:垂直走査型干渉方式(VSI方式)[Example 1]
First, a prepreg was prepared according to the following procedure.
100 parts by mass of both terminal amino-modified silicone compounds, 222 parts by mass of bis (4-maleimidephenyl) methane and 8.5 parts by mass of p-aminophenol were reacted to obtain a modified silicone compound-containing solution. Next, the modified silicone compound-containing solution was added by 16 parts by mass in terms of solid content, 16 parts by mass of naphthol aralkyl type epoxy resin, 69 parts by mass of molten silica [average particle size: 0.5 μm], and 0.15 parts by mass of isocyanate mask imidazole. Was mixed to obtain a varnish having a resin content of 65% by mass. The obtained varnish was impregnated and coated on an E glass cloth having a thickness of 0.1 mm and dried by heating to obtain a prepreg (filling rate of molten silica: 50% by volume).
Eight prepregs thus obtained were laminated, and low-pro type copper foil (
Next, using the obtained copper-clad laminate a, the copper foil was removed by etching to obtain a laminate. The surface roughness (Ra) of the surface of the laminate was measured under the following measurement conditions using a high-precision three-dimensional surface shape roughness measurement system (Wyko NT9100, manufactured by Veeco Instruments). The results are shown in FIG.
Next, a grinding device using a diamond bite (automatic surface planar for 300 mm wafers, manufactured by DISCO Inc., trade name "DAS8930") was used to grind both the front and back surfaces (that is, the two surfaces having the largest area) of this laminate. Both sides were polished and flattened. The surface roughness (Ra) of the surface after polishing was measured under the following measurement conditions using a high-precision three-dimensional surface shape roughness measurement system (Wyko NT9100 manufactured by Veeco Instruments). The results are shown in FIG. It was confirmed that the surface waviness was smaller in FIG. 5 than in FIG.
Further, a thermosetting resin film (
<Measurement conditions of high-precision 3D surface roughness measurement system>
Internal lens: 1x External lens: 50x Measurement range: Any position within the range of 95 μm (Y-axis) x 95 μm (X-axis) Measurement depth: 10 μm
Measurement method: Vertical scanning interference method (VSI method)
上記方法によって得られた銅張積層板について、下記評価方法に従って各評価を行った。結果を表1に示す。 The copper-clad laminates obtained by the above method were evaluated according to the following evaluation methods. The results are shown in Table 1.
<評価方法>
(1.銅張積層板の板厚の最大値、最小値及びそれらの差)
各例にて得た銅張り積層板は、湿式ダイヤモンドカッターによって50mm角のサイズにカットし、計81個に小片化した。端部及びセンター部を含む17か所のサンプルを選択し、任意4点の厚みをマイクロメータにより計測した。計68点のデータから、板厚の最大値、最小値、及びそれらの差を算出した。<Evaluation method>
(1. Maximum and minimum values of copper-clad laminates and their differences)
The copper-clad laminates obtained in each example were cut into 50 mm square sizes by a wet diamond cutter and sliced into 81 pieces in total. 17 samples including the end and center were selected, and the thickness at any 4 points was measured with a micrometer. From the data of 68 points in total, the maximum value, the minimum value, and the difference between them were calculated.
(2.ドリル加工性−折損寿命)
ドリルとしてULFコートドリル「MCW Z699MWU」(φ0.15mm(小径)×φ3.5mm(大径)、ユニオンツール株式会社製、商品名)を用い、回転数:200,000rpm、送り速度:2.0m/分、チップロード:10.0μm/rev、の条件でドリル加工を行った。10,000ヒットさせて評価を行い、折損が生じるまでのヒット数(折損寿命)を求め、これをドリル加工性の指標とした。(2. Drill workability-breaking life)
ULF coated drill "MCW Z699MWU" (φ0.15mm (small diameter) x φ3.5mm (large diameter), manufactured by Union Tool Co., Ltd., trade name) is used as the drill, and the rotation speed is 200,000 rpm and the feed rate is 2.0 m. Drilling was performed under the conditions of / min and tip load: 10.0 μm / rev. The evaluation was performed by making 10,000 hits, and the number of hits (breaking life) until the breakage occurred was obtained, and this was used as an index of drill workability.
[比較例1]
実施例1において、銅張積層板a中の積層体の表面を研磨せず、銅張積層板aをそのまま用い、前記方法に従って各評価を行った。結果を表1に示す。[Comparative Example 1]
In Example 1, the surface of the laminated body in the copper-clad laminate a was not polished, and the copper-clad laminate a was used as it was, and each evaluation was performed according to the above method. The results are shown in Table 1.
[参考例1]
実施例1の銅張積層板aの製造において、プリプレグ中の無機充填材の充填率を58体積%へ増加したこと以外は同様にして、銅張積層板bを製造した。無機充填材の充填率を高めたときのドリル加工性を確認するため、該銅張積層板bについて、前記方法に従ってドリル加工性の評価を行った。結果を表1に示す。[Reference Example 1]
In the production of the copper-clad laminate a of Example 1, the copper-clad laminate b was produced in the same manner except that the filling rate of the inorganic filler in the prepreg was increased to 58% by volume. In order to confirm the drill workability when the filling rate of the inorganic filler was increased, the drill workability of the copper-clad laminate b was evaluated according to the above method. The results are shown in Table 1.
表1より、実施例1で得た銅張積層板Aは、板厚精度が極めて高く、且つ、加工性(ドリル加工性)が良好である。一方、比較例の銅張積層板aは、実施例1で得た銅張積層板Aと比べて、板厚精度が劣る結果となった。
なお、熱硬化性樹脂組成物中の無機充填材の充填率を高くした参考例1の銅張積層板bでは、加工性(ドリル加工性)が低下した。From Table 1, the copper-clad laminated plate A obtained in Example 1 has extremely high plate thickness accuracy and good workability (drill workability). On the other hand, the copper-clad laminate a of the comparative example was inferior in plate thickness accuracy to the copper-clad laminate A obtained in Example 1.
In the copper-clad laminate b of Reference Example 1 in which the filling rate of the inorganic filler in the thermosetting resin composition was increased, the workability (drill workability) was lowered.
本発明の製造方法により得られる金属張り積層板は板厚精度に優れているため、電子機器用のプリント配線板及び半導体パッケージに有用である。 Since the metal-clad laminate obtained by the manufacturing method of the present invention has excellent plate thickness accuracy, it is useful for printed wiring boards and semiconductor packages for electronic devices.
1 プリプレグの硬化物
2 研磨する面
3 硬化物の中央部
4 硬化物の中央部の厚みに比べて薄い部位
5 硬化物中の最も薄い部位
6 熱硬化性樹脂組成物
7 基材
8 工程(1)で研磨された面
9 金属箔
10 熱硬化性樹脂フィルム
11 金属箔付き熱硬化性樹脂フィルム
12 金属張り積層板
13 コアレス基板形成用支持体(コア基板)
14 プリプレグ
15 ビアホール
16 回路パターン
17 ビルドアップ層
18 コアレス基板1 Cured product of
14
Claims (15)
(2−1)前記工程(1)で研磨された面に金属箔を積層して金属張り積層板を形成する工程、
を有する、金属張り積層板の製造方法。(1) A step of polishing at least one surface of a cured product of a prepreg containing a thermosetting resin composition and a base material.
(2-1) A step of laminating a metal foil on a surface polished in the step (1) to form a metal-clad laminate.
A method for manufacturing a metal-clad laminated board.
(2−2)前記工程(1)で研磨された面に、金属箔及び熱硬化性樹脂フィルムを又は金属箔付き熱硬化性樹脂フィルムを、熱硬化性樹脂フィルムが前記研磨された面側となるように積層して金属張り積層板を形成する工程、
を有する、金属張り積層板の製造方法。(1) A step of polishing at least one surface of a cured product of a prepreg containing a thermosetting resin composition and a base material.
(2-2) A metal foil and a thermosetting resin film or a thermosetting resin film with a metal foil are placed on the surface polished in the step (1), and the surface side on which the thermosetting resin film is polished is used. The process of forming a metal-clad laminated board by laminating so as to
A method for manufacturing a metal-clad laminated board.
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WO2024122585A1 (en) * | 2022-12-07 | 2024-06-13 | 株式会社レゾナック | Metal-clad laminate, printed wiring board, and semiconductor package |
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WO2024122586A1 (en) * | 2022-12-07 | 2024-06-13 | 株式会社レゾナック | Metal-clad laminated board, printed wiring board, and semiconductor package |
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JP2001085838A (en) * | 1999-09-14 | 2001-03-30 | Matsushita Electric Works Ltd | Method for manufacturing multilayer laminated plate |
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WO2011138865A1 (en) | 2010-05-07 | 2011-11-10 | 住友ベークライト株式会社 | Epoxy resin composition for circuit boards, prepreg, laminate, resin sheet, laminate for printed wiring boards, printed wiring boards, and semiconductor devices |
JP5152601B2 (en) * | 2010-06-01 | 2013-02-27 | 日立化成工業株式会社 | Method for manufacturing connection board using thin plate-like article and method for manufacturing multilayer wiring board |
JP6697759B2 (en) * | 2016-02-05 | 2020-05-27 | パナソニックIpマネジメント株式会社 | Metal-clad laminate, method of manufacturing metal-clad laminate, metal member with resin, method of manufacturing metal member with resin, wiring board, and method of manufacturing wiring board |
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2019
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JPS6334019B2 (en) * | 1982-09-09 | 1988-07-07 | Sumitomo Bakelite Co | |
JPH04279081A (en) * | 1991-02-13 | 1992-10-05 | Mitsubishi Electric Corp | Epoxy resin-copper foil laminated board and manufacture thereof |
JPH05320382A (en) * | 1992-05-28 | 1993-12-03 | Toshiba Chem Corp | Production of prepreg |
JPH1134221A (en) * | 1997-07-15 | 1999-02-09 | Matsushita Electric Works Ltd | Production of copper clad laminated sheet |
JP2019089978A (en) * | 2017-11-16 | 2019-06-13 | 株式会社ディスコ | Method for manufacturing core material and method for manufacturing copper-clad laminate |
JP2020070386A (en) * | 2018-11-01 | 2020-05-07 | 株式会社ディスコ | Production method of core material and production method of copper-clad laminate plate |
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