JPWO2019038877A1 - 窒化物半導体紫外線発光素子の製造方法及び窒化物半導体紫外線発光素子 - Google Patents
窒化物半導体紫外線発光素子の製造方法及び窒化物半導体紫外線発光素子 Download PDFInfo
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Abstract
Description
前記基板の厚さDは、
を満たすと、好ましい。
最初に、本発明の実施形態に係る窒化物半導体紫外線発光素子の構造の一例について、図面を参照して説明する。図1は、本発明の実施形態に係る窒化物半導体紫外線発光素子の構造の一例を示した平面図である。図2は、図1のA−A断面を示した断面図である。図3は、図1のp電極及びn電極を示した平面図である。なお、図2に示す断面図では、図示の都合上、基板、半導体層及び電極の厚さ(図中の上下方向の長さ)を模式的に示しているため、必ずしも実際の寸法比とは一致しない。特に、半導体層の厚さを、実際よりも拡大して図示している。
一般的に、図1及び図2に示したようなチップ状の窒化物半導体紫外線発光素子1は、平板状の基板の主面上に複数の素子構造部が整列するように形成したウエハを、素子構造部ごとに分断することで得られる。ただし、図2に示したチップ状の窒化物半導体紫外線発光素子1が備える基板10は、第1部分110の側周面111及び第2部分120の側周面121が凸状の曲面となる形状であるため、基板10をこのような形状に加工する工程が必要である。そこで、以下では、基板10の第1部分110の側周面111及び第2部分120の側周面121を凸状の曲面に加工する工程を中心に、本発明の実施形態に係る窒化物半導体紫外線発光素子1の製造方法について図面を参照して説明する。
[1] 図7に示したような研削加工装置60を用いて基板10の側面を球面に加工した場合、研削加工によって基板10の第2部分120の側周面121に微細な凹凸が形成されることで当該側周面121に到達した光が反射され易くなり、それによって光の取出効率が低下し得る。そこで、これを防止するために、研削加工後のチップ40に対して、基板10の第2部分120の側周面121の研磨加工をしてもよい。例えば、バレル研磨機などの周知の球体研磨装置を用いて、研削加工後のチップ40の表面を研磨してもよい。
10,10C :基板
101 :主面
102 :裏面
110 :第1部分
111 :側周面
120,120C :第2部分
121,121C :側周面
20 :素子構造部
21,21D :AlGaN系半導体層
211 :下地層
212 :n型クラッド層(n型AlGaN)
213 :活性層
214 :電子ブロック層(p型AlGaN)
215 :p型クラッド層(p型AlGaN)
216 :p型コンタクト層(p型GaN)
22,22D :p電極
23,23D :n電極
24 :pメッキ電極
25 :nメッキ電極
26 :絶縁膜
31 :発光領域
32 :周辺領域
40 :チップ
50 :保護材
60 :研削加工装置
61 :側壁部
62 :底部
63 :回転軸
70 :透過材
80 :反射材
L1〜L3 :光線
Claims (18)
- サファイア基板と、当該基板の主面上に積層される複数のAlGaN系半導体層を有するとともに通電することで発光中心波長が365nm以下の光を出射する素子構造部と、を備えるチップに対して、前記基板を研削加工する基板加工工程を備え、
前記基板加工工程は、少なくとも、前記主面における4つの角と、前記主面の反対側の面である裏面における4つの角と、のそれぞれを研削加工する工程であることを特徴とする窒化物半導体紫外線発光素子の製造方法。 - 前記研削加工工程は、少なくとも、前記主面における4つの角と、前記裏面における4つの角と、のそれぞれを凸状の曲面に研削加工する工程であることを特徴とする請求項1に記載の窒化物半導体紫外線発光素子の製造方法。
- 前記研削加工工程は、前記裏面側に前記主面と平行な面が残るように、前記基板を研削加工する工程であることを特徴とする請求項1または2に記載の窒化物半導体紫外線発光素子の製造方法。
- 前記基板加工工程が、前記主面に対して垂直な方向から見た平面視における前記基板が円形状、長円形状、または、4つの角が丸い四角形状になるように、前記基板を研削加工する工程であることを特徴とする請求項1〜3のいずれか1項に記載の窒化物半導体紫外線発光素子の製造方法。
- 前記基板加工工程が、
前記チップに対して、前記素子構造部の表面を覆う保護材を形成する第1工程と、
前記保護材が形成された前記チップの前記基板を研削加工する第2工程と、
前記第2工程の後に前記保護材を除去する第3工程と、
を備えることを特徴とする請求項1〜4のいずれか1項に記載の窒化物半導体紫外線発光素子の製造方法。 - 前記第2工程において、砥粒が付着された凹状の曲面を有する容器内で、1以上の前記チップを転動させて前記凹状の曲面に衝突させることを特徴とする請求項5に記載の窒化物半導体紫外線発光素子の製造方法。
- 前記第3工程において、前記保護材を溶媒に溶解させて除去することを特徴とする請求項5〜7のいずれか1項に記載の窒化物半導体紫外線発光素子の製造方法。
- 少なくとも、前記基板加工工程によって前記基板の前記裏面における4つの角が研削加工されて表出した面の一部または全部に対して、最表面が非晶質フッ素樹脂であるとともに前記素子構造部から出射される光を透過する透過材を形成する透過材形成工程を、さらに備えることを特徴とする請求項1〜8のいずれか1項に記載の窒化物半導体紫外線発光素子の製造方法。
- 前記基板加工工程は、前記主面と平行であって平坦である前記裏面の一部が残るように前記裏面の4つの角を研削加工するものであり、
前記透過材形成工程は、少なくとも前記裏面に対して反射防止層を形成する工程と、前記反射防止層の表面に前記非晶質フッ素樹脂を形成する工程と、を含むことを特徴とする請求項9に記載の窒化物半導体紫外線発光素子の製造方法。 - 前記基板加工工程によって前記基板の前記主面における4つの角が研削加工されて表出した面の少なくとも一部に対して、前記素子構造部から出射される光を反射する反射材を形成する反射材形成工程を、さらに備えることを特徴とする請求項1〜10のいずれか1項に記載の窒化物半導体紫外線発光素子の製造方法。
- サファイア基板と、
前記基板の主面上に積層される複数のAlGaN系半導体層を有するとともに通電することで発光中心波長が365nm以下の光を出射する素子構造部と、を備え、
前記基板は、
前記主面から第1距離までの第1部分において、前記主面と平行な断面の断面積が、前記主面から離れるにつれて連続的に増加し、
前記主面の反対側から第2距離までの第2部分において、前記主面と平行な断面の断面積が、前記主面の反対側から離れるにつれて連続的に増加しており、
前記第1距離及び前記第2距離の和は、前記基板の厚さ以下であることを特徴とする窒化物半導体紫外線発光素子。 - 前記第1部分は、前記主面から離れる方向に単位距離だけ離れた場合における前記主面と平行な断面の断面積の単位増加量が、前記主面から離れるにつれて連続的に減少し、
前記第2部分は、前記主面の反対側から離れる方向に単位距離だけ離れた場合における前記主面と平行な断面の断面積の単位増加量が、前記主面の反対側から離れるにつれて連続的に減少することを特徴とする請求項12に記載の窒化物半導体紫外線発光素子。 - 前記基板における前記主面の反対側に、前記主面と平行な面があることを特徴とする請求項12または13に記載の窒化物半導体紫外線発光素子。
- 前記主面に対して垂直な方向から見た平面視において、前記基板が、円形状、長円形状、または、4つの角が丸い四角形状であることを特徴とする請求項12〜14のいずれか1項に記載の窒化物半導体紫外線発光素子。
- 少なくとも、前記基板における前記第2部分の側周面の一部または全部に、最表面が非晶質フッ素樹脂であるとともに前記素子構造部から出射される光を透過する透過材が形成されていることを特徴とする請求項12〜15のいずれか1項に記載の窒化物半導体紫外線発光素子。
- 前記基板における前記主面の反対側に、前記主面と平行であって平坦な面である裏面があり、前記透過材が前記裏面の一部または全部に形成されており、
前記透過材は、少なくとも前記裏面に対して形成されている反射防止層を含むことを特徴とする請求項16に記載の窒化物半導体紫外線発光素子。 - 前記基板における前記第1部分の側周面の少なくとも一部に、前記素子構造部から出射される光を反射する反射材が形成されていることを特徴とする請求項12〜17のいずれか1項に記載の窒化物半導体紫外線発光素子。
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