JPWO2018025953A1 - Composition for Release Layer Formation and Release Layer - Google Patents

Composition for Release Layer Formation and Release Layer Download PDF

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JPWO2018025953A1
JPWO2018025953A1 JP2018531972A JP2018531972A JPWO2018025953A1 JP WO2018025953 A1 JPWO2018025953 A1 JP WO2018025953A1 JP 2018531972 A JP2018531972 A JP 2018531972A JP 2018531972 A JP2018531972 A JP 2018531972A JP WO2018025953 A1 JPWO2018025953 A1 JP WO2018025953A1
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江原 和也
和也 江原
和也 進藤
和也 進藤
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Abstract

下記式(1)で表されるポリアミック酸と有機溶媒とを含む剥離層形成用組成物を提供する。(式中、Xは、下記式(2a)又は(2b)で表される芳香族基を表し、Yは、フッ素原子を有する2価の芳香族基を表し、Zは、Xが式(2a)である場合、互いに独立して、下記式(3a)又は(4a)で表される芳香族基を表し、Xが式(2b)である場合、互いに独立して、下記式(3b)又は(4b)で表される芳香族基を表し、mは、自然数を表す。)Provided is a composition for forming a release layer, which comprises a polyamic acid represented by the following formula (1) and an organic solvent. (Wherein, X represents an aromatic group represented by the following formula (2a) or (2b), Y represents a divalent aromatic group having a fluorine atom, and Z represents X having the formula (2a) And when X represents an aromatic group represented by the following formula (3a) or (4a), and X is the formula (2b), they are independently from each other; (4b) represents an aromatic group, and m represents a natural number.)

Description

本発明は、剥離層形成用組成物及び剥離層に関する。   The present invention relates to a release layer-forming composition and a release layer.

近年、電子デバイスには薄型化及び軽量化という特性に加え、曲げることができるという機能を付与することが求められている。このことから、従来の重く脆弱で曲げることができないガラス基板に代わって、軽量なフレキシブルプラスチック基板を用いることが求められる。
特に、新世代ディスプレイでは、軽量なフレキシブルプラスチック基板(以下、樹脂基板と表記する)を用いたアクティブマトリクス型フルカラーTFTディスプレイパネルの開発が求められている。この新世代ディスプレイに関する技術は、フレキシブルディスプレイや、フレキシブルスマートフォン、ミラーディスプレイ等の様々な分野への転用が期待されている。
In recent years, in addition to the characteristics of thickness reduction and weight reduction, electronic devices are required to have a function of being able to be bent. For this reason, it is required to use a lightweight flexible plastic substrate instead of the conventional heavy, fragile, and inflexible glass substrate.
In particular, in the new-generation display, development of an active matrix full-color TFT display panel using a lightweight flexible plastic substrate (hereinafter referred to as a resin substrate) is required. Technologies related to this new generation display are expected to be diverted to various fields such as flexible displays, flexible smartphones, and mirror displays.

そこで、樹脂フィルムを基板とした電子デバイスの製造方法が各種検討され始めており、新世代ディスプレイでは、既存のTFTディスプレイパネル製造用の設備が転用可能なプロセスの検討が進められている。また、タッチパネル式ディスプレイにおいては、ディスプレイパネルに組み合わせて使用されるタッチパネルの透明電極用の樹脂基板等を効率的に製造するための方策が検討されている。一般的に、タッチパネルに使用される樹脂基板は、TFTディスプレイパネル等と同様に、ガラスと同等程度の透明性を有するポリイミド樹脂基板やアクリル樹脂基板、ポリエチレンテレフタレート(PET)樹脂基板、シクロオレフィン樹脂基板等のフィルム基板が使用されている。   Therefore, various methods of manufacturing electronic devices using resin films as substrates have begun to be studied, and in new generation displays, studies are being made on processes in which existing equipment for manufacturing TFT display panels can be diverted. Moreover, in a touch panel type display, measures for efficiently manufacturing a resin substrate or the like for a transparent electrode of a touch panel used in combination with a display panel have been studied. Generally, a resin substrate used for a touch panel is a polyimide resin substrate, an acrylic resin substrate, a polyethylene terephthalate (PET) resin substrate, a cycloolefin resin substrate having the same degree of transparency as glass as the TFT display panel etc. Film substrates are used.

フレキシブルディスプレイの作製方法としては、主に直接法が知られている(非特許文献1)。直接法としては、予め作製した樹脂基板を、接着剤層を介してガラス基板上に貼り付け、その基板上にTFTを含む画素回路と有機ELを直接形成する方法や、ガラス基板上に樹脂基板を作製し、その基板上にTFTを含む画素回路と有機ELを直接形成する方法がある。   As a method of producing a flexible display, a direct method is mainly known (Non-Patent Document 1). As a direct method, a resin substrate prepared in advance is attached to a glass substrate through an adhesive layer, and a pixel circuit including a TFT and an organic EL are directly formed on the substrate, or a resin substrate on a glass substrate And a method of directly forming a pixel circuit including a TFT and an organic EL on the substrate.

そして、この直接法では、ガラス基板上で画素回路等が形成された樹脂基板を後述する種々の方法で剥離し、ディスプレイパネル等の目的とする電子デバイスの作製に供する。   And in this direct method, the resin substrate in which the pixel circuit etc. were formed on the glass substrate is exfoliated by the various methods mentioned later, and it uses for preparation of the electronic device made into the object of a display panel etc.

例えば、特許文献1、2及び3では、ガラス基板上にアモルファスシリコン薄膜層を形成し、その薄膜層上にプラスチック基板を形成した後に、ガラス基板側からレーザーを照射してアモルファスシリコンを結晶化させ、その結晶化に伴い発生する水素ガスによりプラスチック基板をガラス基板から剥離する方法が開示されている。   For example, in Patent Documents 1, 2 and 3, after an amorphous silicon thin film layer is formed on a glass substrate and a plastic substrate is formed on the thin film layer, laser is irradiated from the glass substrate side to crystallize amorphous silicon. There is disclosed a method of peeling a plastic substrate from a glass substrate by hydrogen gas generated along with its crystallization.

また、特許文献4では、特許文献1〜3で開示された技術を用いて被剥離層(特許文献4において「被転写層」と記載されている)をプラスチックフィルムに貼りつけて液晶表示装置を完成させる方法が開示されている。   Further, in Patent Document 4, a liquid crystal display device is obtained by attaching a layer to be peeled (described as "transferred layer" in Patent Document 4) to a plastic film using the techniques disclosed in Patent Documents 1 to 3. A method of completion is disclosed.

しかし、特許文献1〜4で開示された方法、特に特許文献4で開示された方法では、レーザー光を透過させるために透光性の高い基板を使用することが必須であること、基板を通過させ、更にアモルファスシリコンに含まれる水素を放出させるのに十分な、比較的大きなエネルギーのレーザー光の照射が必要とされること、レーザー光の照射によって被剥離層に損傷を与えてしまう場合があること、といった問題がある。
しかも、被剥離層が大面積である場合には、レーザー処理に長時間を要するため、デバイス作製の生産性を上げることが難しい。
However, in the methods disclosed in Patent Literatures 1 to 4, in particular, the method disclosed in Patent Literature 4, it is essential to use a highly translucent substrate to transmit the laser light, and the substrate passes In addition, it is necessary to irradiate a laser beam of relatively large energy which is sufficient to release hydrogen contained in amorphous silicon, and the layer to be peeled may be damaged by the laser beam irradiation. And there is a problem.
In addition, when the layer to be peeled has a large area, it takes a long time to perform the laser treatment, so it is difficult to increase the productivity of device fabrication.

このような問題を解決する手段として、特許文献5では、現行のガラス基板を基体(以下、ガラス基体という)として用い、このガラス基体上に環状オレフィンコポリマーのようなポリマーを用いて剥離層を形成し、その剥離層上にポリイミドフィルム等の耐熱樹脂フィルム(樹脂基板)を形成後、そのフィルム上にITO透明電極やTFT等を真空プロセスで形成・封止後、最終的にガラス基体を剥離・除去する製造工程が採用されている。   As a means to solve such problems, Patent Document 5 uses a current glass substrate as a substrate (hereinafter referred to as a glass substrate), and forms a release layer on the glass substrate using a polymer such as cyclic olefin copolymer. After forming a heat-resistant resin film (resin substrate) such as a polyimide film on the peeling layer, forming and sealing an ITO transparent electrode or TFT on the film by a vacuum process, finally peeling off the glass substrate A manufacturing process to remove is employed.

一方、新世代ディスプレイでは、大画面への対応や歩留まりの向上等の要請から、基板の大面積化が求められている。大面積の塗布面に樹脂組成物を均一に塗布するには、一般的にスリットコーター等を用いたスリット塗布方式が有利とされる。スリット塗布方式はスリットノズルを用いた塗布方式であり、従来のスピン塗布方式のように基板を回転する必要がないことから、樹脂組成物の使用量削減と工程安全性の観点から広く採用されている。しかしながら、このスリット塗布方式では、生産性向上の観点から、塗布工程の高速化が望まれている。スリット塗布方式の高速化を実現するためには、塗布時におけるスジムラ等の発生を抑制する必要があり、そのためには最も重要なパラメータのひとつである溶液の粘度を低下させる必要がある。   On the other hand, in the case of a new generation display, a large area of a substrate is required in response to a request for handling a large screen and improvement in yield. In order to apply the resin composition uniformly to a large area coated surface, a slit coating method using a slit coater or the like is generally advantageous. The slit coating method is a coating method using a slit nozzle, and since it is not necessary to rotate the substrate as in the conventional spin coating method, it is widely adopted from the viewpoint of reduction in the amount of resin composition used and process safety. There is. However, in this slit coating method, from the viewpoint of productivity improvement, speeding up of the coating process is desired. In order to realize the speeding up of the slit coating method, it is necessary to suppress the occurrence of streaks and the like at the time of coating, and for that purpose, it is necessary to reduce the viscosity of the solution which is one of the most important parameters.

例えば、特許文献6及び7では、スリット塗布方式に適したフォトレジスト用の組成物として、プロピレングリコールモノメチルエーテルアセテートやプロピレングリコールモノメチルエーテル等のいわゆる低粘度溶媒を使用した組成物が開示されている。しかしながら、剥離層形成用組成物で一般的に使用されるポリイミド樹脂等の樹脂(もしくはその前駆体)は、これらの低粘度溶媒に溶解しないため、剥離層の形成にスリット塗布方式を採用することが難しかった。従って、剥離層形成用組成物に使用する樹脂(もしくはその前駆体)を上記低粘度溶媒に溶解することが可能となれば、従来のスピン塗布方式での塗布性が向上するだけでなく、スリット塗布方式にも好適に使用できるものとなり得る。   For example, Patent Documents 6 and 7 disclose a composition using a so-called low viscosity solvent such as propylene glycol monomethyl ether acetate or propylene glycol monomethyl ether as a composition for a photoresist suitable for the slit coating method. However, since a resin (or a precursor thereof) such as a polyimide resin generally used in a composition for forming a release layer is not dissolved in these low viscosity solvents, a slit coating method should be adopted for forming the release layer. Was difficult. Therefore, if it becomes possible to dissolve the resin (or its precursor) used in the composition for forming the release layer in the low viscosity solvent, not only the coating property in the conventional spin coating method is improved but also the slit It can be used suitably also as a coating system.

特開平10−125929号公報Japanese Patent Application Laid-Open No. 10-125929 特開平10−125931号公報Japanese Patent Application Laid-Open No. 10-125931 国際公開第2005/050754号WO 2005/050754 特開平10−125930号公報Unexamined-Japanese-Patent No. 10-125930 gazette 特開2010−111853号公報Unexamined-Japanese-Patent No. 2010-111853 国際公開第2011/030744号International Publication No. 2011/030744 特開2008−70480号公報JP, 2008-70480, A

NHK技研 R&D/No.145/2014.5NHK Giken R & D / No. 145 / 2014.5

本発明は、上記事情に鑑みてなされたものであり、プロピレングリコールモノメチルエーテル等のいわゆる低粘度溶媒にも可溶で、スリット塗布方式にも容易に適用し得、その上に形成されたフレキシブル電子デバイスの樹脂基板、特にポリイミド樹脂やアクリル樹脂、シクロオレフィンポリマー樹脂等で形成されるフィルム基板を損傷せずに剥離することが可能となる剥離層を与える、剥離層形成用組成物を提供することを目的とする。   The present invention has been made in view of the above circumstances, is also soluble in so-called low viscosity solvents such as propylene glycol monomethyl ether, can be easily applied to a slit coating method, and is a flexible electron formed thereon Provided is a composition for forming a release layer, which provides a release layer which can be released without damaging the resin substrate of a device, particularly a film substrate formed of polyimide resin, acrylic resin, cycloolefin polymer resin or the like. With the goal.

本発明者らは、上記課題を解決すべく鋭意検討を重ねた結果、特定の構造を有するポリアミック酸が、低粘度溶媒にも容易に溶解し得ることを知見すると共に、当該ポリアミック酸と有機溶媒とを含む組成物が、ガラス基板等の基体との優れた密着性及びフレキシブル電子デバイスに用いられる樹脂基板、特に波長400nmの光透過率が80%以上である樹脂基板との適度な密着性と適度な剥離性を有する剥離層を与えることを見出し、本発明を完成させた。   As a result of intensive studies to solve the above problems, the present inventors have found that polyamic acid having a specific structure can be easily dissolved in a low viscosity solvent, and the polyamic acid and the organic solvent And the composition having excellent adhesion to a substrate such as a glass substrate and the like, and appropriate adhesion to a resin substrate used for a flexible electronic device, particularly a resin substrate having a light transmittance of 80% or more at a wavelength of 400 nm. The present invention has been completed by finding that a release layer having a suitable release property is provided.

従って、本発明は下記の剥離層形成用組成物及び剥離層を提供する。
[1]下記式(1)で表されるポリアミック酸と有機溶媒とを含むことを特徴とする剥離層形成用組成物。

Figure 2018025953
(式中、Xは、下記式(2a)又は(2b)で表される芳香族基を表し、Yは、フッ素原子を有する2価の芳香族基を表し、Zは、Xが式(2a)で表される芳香族基である場合、互いに独立して、下記式(3a)又は(4a)で表される芳香族基を表し、Xが式(2b)で表される芳香族基である場合、互いに独立して、下記式(3b)又は(4b)で表される芳香族基を表し、mは、自然数を表す。)
Figure 2018025953
Figure 2018025953
[2]上記Yが、下記式(5)で表される芳香族基である[1]記載の剥離層形成用組成物。
Figure 2018025953
[3]上記Yが、下記式(6)で表される芳香族基である[2]記載の剥離層形成用組成物。
Figure 2018025953
[4]上記Xにおいて、上記式(2a)で表される芳香族基が、下記式(7a)又は(8a)で表される芳香族基であり、上記Zが、互いに独立して、下記式(9a)又は式(10a)で表される芳香族基である[1]〜[3]のいずれかに記載の剥離層形成用組成物。
Figure 2018025953

Figure 2018025953

[5]上記Xにおいて、上記式(2b)で表される芳香族基が、下記式(7b)又は(8b)で表される芳香族基であり、上記Zが、互いに独立して、下記式(9b)又は式(10b)で表される芳香族基である[1]〜[3]のいずれかに記載の剥離層形成用組成物。
Figure 2018025953

Figure 2018025953

[6]上記有機溶媒が、下記式(S1)〜(S7)で表される構造を有するものから選ばれる少なくとも1種である[1]〜[5]のいずれかに記載の剥離層形成用組成物。
Figure 2018025953
(式中、R1〜R8は、互いに独立して、水素原子、又は炭素数1〜10のアルキル基を表し、R9及びR10は、互いに独立して、水素原子、炭素数1〜10のアルキル基、又は炭素数1〜10のアシル基を表し、b及びnは自然数を表す)
[7]上記有機溶媒が、プロピレングリコールモノメチルエーテル又はプロピレングリコールモノメチルエーテルアセテートである[6]記載の剥離層形成用組成物。
[8][1]〜[7]のいずれかに記載の剥離層形成用組成物を用いて形成される剥離層。
[9][8]記載の剥離層を用いる樹脂基板の製造方法。
[10]上記樹脂基板が、ポリイミド樹脂基板又は波長400nmの光透過率が80%以上である樹脂基板である[9]記載の製造方法。Accordingly, the present invention provides the following release layer-forming composition and release layer.
[1] A composition for forming a release layer, comprising a polyamic acid represented by the following formula (1) and an organic solvent.
Figure 2018025953
(Wherein, X represents an aromatic group represented by the following formula (2a) or (2b), Y represents a divalent aromatic group having a fluorine atom, and Z represents X having the formula (2a) When it is an aromatic group represented by), each of them independently represents an aromatic group represented by the following formula (3a) or (4a), and X is an aromatic group represented by the formula (2b) In some cases, each independently represents an aromatic group represented by the following formula (3b) or (4b), and m represents a natural number.)
Figure 2018025953
Figure 2018025953
[2] The composition for forming a release layer according to [1], wherein Y is an aromatic group represented by the following formula (5).
Figure 2018025953
[3] The composition for forming a release layer according to [2], wherein Y is an aromatic group represented by the following formula (6).
Figure 2018025953
[4] In the above X, the aromatic group represented by the above formula (2a) is an aromatic group represented by the following formula (7a) or (8a), and the above Z is independently from each other: The composition for peeling layer formation in any one of [1]-[3] which is an aromatic group represented by Formula (9a) or Formula (10a).
Figure 2018025953

Figure 2018025953

[5] In the above X, the aromatic group represented by the above formula (2b) is an aromatic group represented by the following formula (7b) or (8b), and the above Z is independently from each other: The composition for peeling layer formation in any one of [1]-[3] which is an aromatic group represented by Formula (9b) or Formula (10b).
Figure 2018025953

Figure 2018025953

[6] The release layer according to any one of [1] to [5], wherein the organic solvent is at least one selected from those having a structure represented by the following formulas (S1) to (S7) Composition.
Figure 2018025953
(Wherein, R 1 to R 8 each independently represent a hydrogen atom or an alkyl group having 1 to 10 carbon atoms, and R 9 and R 10 each independently represent a hydrogen atom or 1 to 4 carbon atoms 10 alkyl groups or C1-10 acyl groups, b and n represent natural numbers)
[7] The composition for forming a release layer according to [6], wherein the organic solvent is propylene glycol monomethyl ether or propylene glycol monomethyl ether acetate.
The peeling layer formed using the composition for peeling layer formation in any one of [8] [1]-[7].
The manufacturing method of the resin substrate using the peeling layer as described in [9] [8].
[10] The method according to [9], wherein the resin substrate is a polyimide resin substrate or a resin substrate having a light transmittance of 80% or more at a wavelength of 400 nm.

本発明の剥離層形成用組成物を用いることで、基体との優れた密着性及び樹脂基板との適度な密着性と適度な剥離性を有する剥離層を再現性よく得ることができる。特に、本発明で用いるポリアミック酸は、低粘度溶媒への溶解性に優れているため、低粘度溶媒を用いることでスリット塗布方式にも適用できる組成物を容易に調製でき、大面積の塗布面に均一に塗布することが容易となる。更に、フレキシブル電子デバイスの製造プロセスにおいて、基体上に形成された樹脂基板や、更にその上に設けられる回路等に損傷を与えることなく、当該回路等とともに当該樹脂基板を、当該基体から分離することが可能となる。従って、本発明の剥離層形成用組成物は、樹脂基板を備えるフレキシブル電子デバイスの製造プロセスの高速化やその歩留り向上等に寄与し得る。   By using the composition for release layer formation of the present invention, it is possible to obtain a release layer having excellent adhesion with a substrate, appropriate adhesion with a resin substrate, and appropriate release, with good reproducibility. In particular, since the polyamic acid used in the present invention is excellent in solubility in a low viscosity solvent, a composition that can be applied to a slit coating method can be easily prepared by using a low viscosity solvent, and a large area coated surface It is easy to apply it uniformly. Furthermore, in the process of manufacturing a flexible electronic device, the resin substrate is separated from the substrate together with the circuit without damaging the resin substrate formed on the substrate and the circuit further provided thereon. Is possible. Therefore, the composition for release layer formation of the present invention can contribute to speeding-up of the manufacturing process of a flexible electronic device provided with a resin substrate, improvement of the yield, and the like.

以下、本発明について、より詳細に説明する。
本発明の剥離層形成用組成物は、下記式(1)で表されるポリアミック酸と、有機溶媒とを含むものである。
Hereinafter, the present invention will be described in more detail.
The composition for release layer formation of the present invention contains a polyamic acid represented by the following formula (1) and an organic solvent.

本発明において、剥離層とは、樹脂基板が形成される基体(ガラス基体等)直上に設けられる層である。その典型例としては、フレキシブル電子デバイスの製造プロセスにおいて、上記基体と、ポリイミド樹脂やアクリル樹脂等で形成されるフレキシブル電子デバイスの樹脂基板との間に当該樹脂基板を所定のプロセス中において固定するために設けられ、かつ、当該樹脂基板上に電子回路等の形成した後において当該樹脂基板が当該基体から容易に剥離できるようにするために設けられる剥離層が挙げられる。   In the present invention, the release layer is a layer provided directly on a substrate (such as a glass substrate) on which a resin substrate is formed. As a typical example, in a process of manufacturing a flexible electronic device, the resin substrate is fixed in a predetermined process between the substrate and a resin substrate of the flexible electronic device formed of polyimide resin, acrylic resin or the like. And a peeling layer provided to allow the resin substrate to be easily peeled from the base after forming an electronic circuit or the like on the resin substrate.

Figure 2018025953
Figure 2018025953

式(1)において、Xは、下記式(2a)又は(2b)で表される芳香族基であり、Yは、フッ素原子を有する2価の芳香族基であり、Zは、Xが式(2a)である場合、互いに独立して、下記式(3a)又は(4a)で表される芳香族基であり、Xが式(2b)である場合、互いに独立して、下記式(3b)又は(4b)で表される芳香族基であり、mは、自然数を表す。

Figure 2018025953
Figure 2018025953
In the formula (1), X is an aromatic group represented by the following formula (2a) or (2b), Y is a divalent aromatic group having a fluorine atom, and Z is a formula of X When (2a) is an aromatic group represented by the following formula (3a) or (4a) independently of each other, and X is the formula (2b), they are each independently represented by the following formula (3b) Or an aromatic group represented by (4b), and m represents a natural number.
Figure 2018025953
Figure 2018025953

上記Xにおいて、上記式(2a)で表される芳香族基は、下記式(7a)又は(8a)で表される芳香族基が好ましく、上記式(2b)で表される芳香族基は、下記式(7b)又は(8b)で表される芳香族基が好ましい。   In the above-mentioned X, the aromatic group represented by the above formula (2a) is preferably an aromatic group represented by the following formula (7a) or (8a), and the aromatic group represented by the above formula (2b) is And the aromatic group represented by following formula (7b) or (8b) is preferable.

Figure 2018025953
Figure 2018025953
Figure 2018025953
Figure 2018025953

また、上記Zにおいて、上記式(3a)又は(4a)で表される芳香族基は、下記式(9a)又は(10a)で表される芳香族基が好ましく、上記式(3b)又は(4b)で表される芳香族基は、下記式(9b)又は(10b)で表される芳香族基が好ましい。   In the above Z, the aromatic group represented by the above formula (3a) or (4a) is preferably an aromatic group represented by the following formula (9a) or (10a), and the above formula (3b) or The aromatic group represented by 4b) is preferably an aromatic group represented by the following formula (9b) or (10b).

Figure 2018025953
Figure 2018025953
Figure 2018025953
Figure 2018025953

上記Yは、フッ素原子を有し、かつベンゼン環を1〜5個含む芳香族基が好ましく、下記式(5)から選ばれる芳香族基がより好ましく、下記式(6)から選ばれる芳香族基が更に好ましい。   Y is preferably an aromatic group having a fluorine atom and containing 1 to 5 benzene rings, more preferably an aromatic group selected from the following formula (5), and an aromatic group selected from the following formula (6) Groups are more preferred.

Figure 2018025953
Figure 2018025953

Figure 2018025953
Figure 2018025953

上記mは、自然数であればよいが、100以下の自然数が好ましく、2〜100の自然数がより好ましい。   Although said m should just be a natural number, 100 or less natural numbers are preferable, and 2-100 natural numbers are more preferable.

上記式(1)で表されるポリアミック酸は、所定のテトラカルボン酸二無水物成分とジアミン成分とを反応させることにより得られるものである。
上記テトラカルボン酸二無水物成分としては、ベンゼンテトラカルボン酸二無水物又はビフェニルテトラカルボン酸二無水物を使用する。上記ジアミン成分としては、フッ素原子を有するものであれば、脂鎖、脂環、芳香族、芳香脂環族のいずれでもよいが、本発明では、特に低粘度溶媒に対する溶解性を向上させると共に、得られる膜の剥離層としての機能を向上させる観点から、上記ベンゼンテトラカルボン酸二無水物又はビフェニルテトラカルボン酸二無水物と、上記芳香族ジアミンを含むジアミン成分とを反応させて得られるポリアミック酸が好ましく、上記テトラカルボン酸二無水物と芳香族ジアミンとを反応させて得られる全芳香族ポリアミック酸がより好ましい。
以下、上記式(1)で表される構造を有するポリアミック酸の合成に使用できるベンゼンテトラカルボン酸二無水物成分、ビフェニルテトラカルボン酸二無水物及びジアミン成分について詳述する。
The polyamic acid represented by the said Formula (1) is obtained by making a predetermined tetracarboxylic dianhydride component and a diamine component react.
As the tetracarboxylic acid dianhydride component, benzenetetracarboxylic acid dianhydride or biphenyltetracarboxylic acid dianhydride is used. The diamine component may be any of an aliphatic chain, an alicyclic, an aromatic, and an aromatic alicyclic group as long as it has a fluorine atom, but in the present invention, the solubility in a low viscosity solvent is particularly improved. From the viewpoint of improving the function as a release layer of the obtained film, a polyamic acid obtained by reacting the above-mentioned benzenetetracarboxylic acid dianhydride or biphenyltetracarboxylic acid dianhydride with a diamine component containing the above-mentioned aromatic diamine Is preferable, and a wholly aromatic polyamic acid obtained by reacting the above-mentioned tetracarboxylic acid dianhydride with an aromatic diamine is more preferable.
Hereinafter, the benzene tetracarboxylic acid dianhydride component which can be used for the synthesis of the polyamic acid which has a structure represented by the said Formula (1), biphenyl tetracarboxylic acid dianhydride, and a diamine component are explained in full detail.

ベンゼンテトラカルボン酸二無水物としては、分子内に2個のジカルボン酸無水物部位を有し、かつ、ベンゼン環を有する限り特に限定されるものではない。その具体例としては、ピロメリット酸二無水物、ベンゼン−1,2,3,4−テトラカルボン酸二無水物等が挙げられ、本発明においては、ピロメリット酸二無水物が好ましい。これらは1種を単独で用いても、2種以上を組み合わせて用いてもよい。   The benzenetetracarboxylic acid dianhydride is not particularly limited as long as it has two dicarboxylic acid anhydride sites in the molecule and has a benzene ring. Specific examples thereof include pyromellitic dianhydride, benzene-1,2,3,4-tetracarboxylic acid dianhydride, etc. In the present invention, pyromellitic dianhydride is preferable. One of these may be used alone, or two or more of these may be used in combination.

ビフェニルテトラカルボン酸二無水物としては、分子内に2個のジカルボン酸無水物部位を有し、かつ、ビフェニル基を有する限り特に限定されるものではない。その具体例としては、2,2’,3,3’−ビフェニルテトラカルボン酸二無水物、2,3,3’,4’−ビフェニルテトラカルボン酸二無水物、3,3’,4,4’−ビフェニルテトラカルボン酸二無水物等が挙げられ、本発明においては、3,3’,4,4’−ビフェニルテトラカルボン酸二無水物が好ましい。これらは1種を単独で用いても、2種以上を組み合わせて用いてもよい。   The biphenyltetracarboxylic acid dianhydride is not particularly limited as long as it has two dicarboxylic acid anhydride sites in the molecule and has a biphenyl group. Specific examples thereof include 2,2 ′, 3,3′-biphenyltetracarboxylic acid dianhydride, 2,3,3 ′, 4′-biphenyltetracarboxylic acid dianhydride, 3,3 ′, 4,4. Examples thereof include '-biphenyltetracarboxylic acid dianhydride and the like, and in the present invention, 3,3', 4,4'-biphenyltetracarboxylic acid dianhydride is preferable. One of these may be used alone, or two or more of these may be used in combination.

一方、芳香族ジアミンとしては、フッ素原子を有し、かつ分子内に芳香環に直結する2個のアミノ基を有していれば、特に限定されるものではないが、ベンゼン環を1〜5個、特に1〜2個、更には2個含む芳香族ジアミンが好ましい。また、フルオロアルキル基又はパーフルオロアルキル基を有するものがより好ましく、パーフルオロアルキル基が更に好ましい。上記パーフルオロアルキル基としては、例えば、トリフルオロメチル基、ペンタフルオロエチル基、n−ヘプタフルオロプロピル基及びi−ヘプタフルオロプロピル基等が挙げられる。   On the other hand, the aromatic diamine is not particularly limited as long as it has a fluorine atom and has two amino groups directly linked to the aromatic ring in the molecule, but it is not particularly limited. Preferred are aromatic diamines containing one, especially one or two, and even two. Further, those having a fluoroalkyl group or a perfluoroalkyl group are more preferable, and a perfluoroalkyl group is more preferable. Examples of the perfluoroalkyl group include trifluoromethyl group, pentafluoroethyl group, n-heptafluoropropyl group and i-heptafluoropropyl group.

上記芳香族ジアミンの具体例としては、5−トリフルオロメチルベンゼン−1,3−ジアミン、5−トリフルオロメチルベンゼン−1,2−ジアミン、2,2’−ビス(トリフルオロメチル)−4,4’−ジアミノビフェニル及び3,3’−ビス(トリフルオロメチル)ビフェニル−4,4’−ジアミン等を挙げることができるが、これらに限定されない。本発明では、これらの中でも特に2,2’−ビス(トリフルオロメチル)−4,4’−ジアミノビフェニルを好適に用いることができる。これらは1種を単独で用いても、2種以上を組み合わせて用いてもよい。   Specific examples of the above aromatic diamines include 5-trifluoromethylbenzene-1,3-diamine, 5-trifluoromethylbenzene-1,2-diamine, 2,2'-bis (trifluoromethyl) -4, 4′-Diaminobiphenyl and 3,3′-bis (trifluoromethyl) biphenyl-4,4′-diamine and the like can be mentioned, but it is not limited thereto. Among these, 2,2'-bis (trifluoromethyl) -4,4'-diaminobiphenyl can be preferably used in the present invention. One of these may be used alone, or two or more of these may be used in combination.

ジアミン成分とテトラカルボン酸二無水物成分の仕込み比は、目的とする分子量や分子量分布、ジアミンやテトラカルボン酸二無水物の種類の種類等を考慮して適宜決定されるため一概に規定できないが、上記式(1)のポリアミック酸を得るため、ジアミン成分のモル数に対してテトラカルボン酸二無水物成分のモル数を多めにすることが好ましい。具体的なモル比としては、ジアミン成分1モルに対して、テトラカルボン酸二無水物成分1.05〜2.5モルが好ましく、1.07〜1.5モルがより好ましく、1.1〜1.3モルがより一層好ましい。   The preparation ratio of the diamine component to the tetracarboxylic acid dianhydride component can not be generally specified because it is appropriately determined in consideration of the target molecular weight and molecular weight distribution, the type of diamine and tetracarboxylic acid dianhydride, etc. In order to obtain the polyamic acid of the above formula (1), it is preferable to increase the number of moles of the tetracarboxylic dianhydride component with respect to the number of moles of the diamine component. The specific molar ratio is preferably 1.05 to 2.5 moles of tetracarboxylic acid dianhydride component, more preferably 1.07 to 1.5 moles, and more preferably 1.1 to 1.5 moles per mole of the diamine component. Even more preferred is 1.3 moles.

以上説明したテトラカルボン酸二無水物成分とジアミン成分とを反応させることで、本発明の剥離層形成用組成物に含まれるポリアミック酸を得ることができる。   By reacting the tetracarboxylic acid dianhydride component and the diamine component described above, it is possible to obtain the polyamic acid contained in the release layer-forming composition of the present invention.

ポリアミック酸の合成において用いる有機溶媒は、反応に悪影響を及ぼさない限り特に限定されるものではないが、その具体例としては、m−クレゾール、2−ピロリドン、N−メチル−2−ピロリドン、N−エチル−2−ピロリドン、N−ビニル−2−ピロリドン、N,N−ジメチルアセトアミド、N,N−ジメチルホルムアミド、3−メトキシ−N,N−ジメチルプロピルアミド、3−エトキシ−N,N−ジメチルプロピルアミド、3−プロポキシ−N,N−ジメチルプロピルアミド、3−イソプロポキシ−N,N−ジメチルプロピルアミド、3−ブトキシ−N,N−ジメチルプロピルアミド、3−sec−ブトキシ−N,N−ジメチルプロピルアミド、3−tert−ブトキシ−N,N−ジメチルプロピルアミド、γ−ブチロラクトン、プロピレングリコールモノメチルエーテル及びプロピレングリコールモノメチルエーテルアセテート等が挙げられる。なお、有機溶媒は1種単独で又は2種以上を組み合わせて使用してもよい。   The organic solvent used in the synthesis of the polyamic acid is not particularly limited as long as it does not adversely affect the reaction, and specific examples thereof include m-cresol, 2-pyrrolidone, N-methyl-2-pyrrolidone, N- Ethyl-2-pyrrolidone, N-vinyl-2-pyrrolidone, N, N-dimethylacetamide, N, N-dimethylformamide, 3-methoxy-N, N-dimethylpropylamide, 3-ethoxy-N, N-dimethylpropyl Amide, 3-propoxy-N, N-dimethylpropylamide, 3-isopropoxy-N, N-dimethylpropylamide, 3-butoxy-N, N-dimethylpropylamide, 3-sec-butoxy-N, N-dimethyl Propylamide, 3-tert-butoxy-N, N-dimethylpropylamide, γ-butyrolactone Propylene glycol monomethyl ether and propylene glycol monomethyl ether acetate. In addition, you may use an organic solvent individually by 1 type or in combination of 2 or more types.

ポリアミック酸の合成時の反応温度は、用いる溶媒の融点から沸点までの範囲で適宜設定すればよく、通常0〜100℃程度であるが、得られるポリアミック酸の溶液中でのイミド化を防いでポリアミック酸単位の高含有量を維持する観点から、好ましくは0〜70℃程度、より好ましくは0〜60℃程度、更に好ましくは0〜50℃程度とすることができる。反応時間は、反応温度や原料物質の反応性に依存するため一概に規定できないが、通常1〜100時間程度である。   The reaction temperature at the time of synthesis of the polyamic acid may be appropriately set in the range from the melting point to the boiling point of the solvent used, and is usually about 0 to 100 ° C., but the imidization of the obtained polyamic acid in the solution is prevented. From the viewpoint of maintaining a high content of polyamic acid units, it is preferably about 0 to 70 ° C., more preferably about 0 to 60 ° C., and still more preferably about 0 to 50 ° C. The reaction time can not be generally defined because it depends on the reaction temperature and the reactivity of the raw material, but it is usually about 1 to 100 hours.

このようにして得られるポリアミック酸の重量平均分子量は、通常5,000〜500,000程度であるが、得られる膜の剥離層としての機能を向上させる観点から、好ましくは10,000〜200,000程度、より好ましくは10,000〜150,000程度である。なお、本発明において、重量平均分子量は、ゲルパーミエーションクロマトグラフィー(GPC)測定によるポリスチレン換算値である。   The weight average molecular weight of the polyamic acid thus obtained is usually about 5,000 to 500,000, but preferably 10,000 to 200, from the viewpoint of improving the function as a release layer of the obtained film. It is about 000, more preferably about 10,000 to 150,000. In the present invention, the weight average molecular weight is a polystyrene equivalent value determined by gel permeation chromatography (GPC).

本発明で好適に用いることのできるポリアミック酸の具体例としては、下記式で示されるものが挙げられるが、これに限定されるものではない。   Although the thing shown by a following formula is mentioned as a specific example of the polyamic acid which can be used suitably by this invention, It is not limited to this.

Figure 2018025953

(式中、m1及びm2は繰り返し単位の数を表し、m1とm2の合計は上記mと同じである。)
Figure 2018025953

(Wherein, m1 and m2 represent the number of repeating units, and the sum of m1 and m2 is the same as m above)

Figure 2018025953

(式中、m1及びm2は繰り返し単位の数を表し、m1とm2の合計は上記mと同じである。)
Figure 2018025953

(Wherein, m1 and m2 represent the number of repeating units, and the sum of m1 and m2 is the same as m above)

本発明の剥離層形成用組成物は、有機溶媒を含むものである。この有機溶媒としては、上記反応の反応溶媒の具体例と同様のものを使用し得るが、本発明のポリアミック酸をよく溶解し、均一性の高い組成物を調製しやすいことから、アミド類、アルコール類、エステル類、エーテル類及びケトン類からなる群より選ばれる有機溶媒が好ましく、特に下記式(S1)〜(S7)で表される構造を有する少なくとも1種を含むことが好ましい。   The composition for release layer formation of the present invention contains an organic solvent. As this organic solvent, although the same one as the specific example of the reaction solvent for the above reaction can be used, it is possible to dissolve the polyamic acid of the present invention well and to easily prepare a highly uniform composition. Organic solvents selected from the group consisting of alcohols, esters, ethers and ketones are preferable, and in particular, it is preferable to contain at least one type having a structure represented by the following formulas (S1) to (S7).

Figure 2018025953
Figure 2018025953

上記式中、R1〜R8は、互いに独立して、水素原子、又は炭素数1〜10、好ましくは1〜5のアルキル基を表す。R9及びR10は、互いに独立して、水素原子、炭素数1〜10、好ましくは1〜5のアルキル基、又は炭素数1〜10、好ましくは1〜5のアシル基を表す。bは自然数を表すが、1〜5の自然数が好ましく、1〜3の自然数がより好ましい。nは自然数を表すが、1〜5の自然数が好ましく、1〜3の自然数がより好ましい。In the above formulae, R 1 to R 8 each independently represent a hydrogen atom or an alkyl group having 1 to 10, preferably 1 to 5 carbon atoms. R 9 and R 10 each independently represent a hydrogen atom, an alkyl group having 1 to 10 carbon atoms, preferably 1 to 5 carbon atoms, or an acyl group having 1 to 10 carbon atoms, preferably 1 to 5 carbon atoms. Although b represents a natural number, a natural number of 1 to 5 is preferable, and a natural number of 1 to 3 is more preferable. Although n represents a natural number, a natural number of 1 to 5 is preferable, and a natural number of 1 to 3 is more preferable.

炭素数1〜10のアルキル基の具体例としては、直鎖状、分岐状、環状のいずれでもよく、メチル、エチル、n−プロピル、イソプロピル、シクロプロピル、n−ブチル、イソブチル、s−ブチル、t−ブチル、n−ペンチル、1−メチル−n−ブチル、2−メチル−n−ブチル、3−メチル−n−ブチル、1,1−ジメチル−n−プロピル、1,2−ジメチル−n−プロピル、2,2−ジメチル−n−プロピル、1−エチル−n−プロピル、シクロペンチル、n−ヘキシル、1−メチル−n−ペンチル、2−メチル−n−ペンチル、3−メチル−n−ペンチル、4−メチル−n−ペンチル、1,1−ジメチル−n−ブチル、1,2−ジメチル−n−ブチル、1,3−ジメチル−n−ブチル、2,2−ジメチル−n−ブチル、2,3−ジメチル−n−ブチル、3,3−ジメチル−n−ブチル、1−エチル−n−ブチル、2−エチル−n−ブチル、1,1,2−トリメチル−n−プロピル、1,2,2−トリメチル−n−プロピル、1−エチル−1−メチル−n−プロピル、1−エチル−2−メチル−n−プロピル、シクロヘキシル、n−ヘプチル、n−オクチル、n−ノニル及びn−デシル基等が挙げられる。   Specific examples of the alkyl group having 1 to 10 carbon atoms may be linear, branched or cyclic, and methyl, ethyl, n-propyl, isopropyl, cyclopropyl, n-butyl, isobutyl, s-butyl, t-Butyl, n-pentyl, 1-methyl-n-butyl, 2-methyl-n-butyl, 3-methyl-n-butyl, 1,1-dimethyl-n-propyl, 1,2-dimethyl-n- Propyl, 2,2-dimethyl-n-propyl, 1-ethyl-n-propyl, cyclopentyl, n-hexyl, 1-methyl-n-pentyl, 2-methyl-n-pentyl, 3-methyl-n-pentyl, 4-methyl-n-pentyl, 1,1-dimethyl-n-butyl, 1,2-dimethyl-n-butyl, 1,3-dimethyl-n-butyl, 2,2-dimethyl-n-butyl, 2, 3-Dimethy -N-butyl, 3,3-dimethyl-n-butyl, 1-ethyl-n-butyl, 2-ethyl-n-butyl, 1,1,2-trimethyl-n-propyl, 1,2,2-trimethyl -N-propyl, 1-ethyl-1-methyl-n-propyl, 1-ethyl-2-methyl-n-propyl, cyclohexyl, n-heptyl, n-octyl, n-nonyl and n-decyl groups etc. Be

炭素数1〜10のアシル基の具体例としては、ホルミル基、アセチル基、プロピオニル基、ブチリル基、イソブチリル基、バレリル基、イソバレリル基、ヘキサノイル基、イソヘキサノイル基、ヘプタノイル基、イソヘプタノイル基、オクタノイル基、イソオクタノイル基、ノナノイル基、イソノナノイル基、デカノイル基、イソデカノイル基及びベンゾイル基等が挙げられる。   Specific examples of the acyl group having 1 to 10 carbon atoms include formyl, acetyl, propionyl, butyryl, isobutyryl, valeryl, isovaleryl, hexanoyl, isohexanoyl, heptanoyl, isoheptanoyl and octanoyl. Groups, isooctanoyl group, nonanoyl group, isononanoyl group, decanoyl group, isodecanoyl group, benzoyl group and the like.

上記式(S1)〜(S7)で表される有機溶媒の具体例としては、以下のものが挙げられる。
式(S1):3−メトキシ−N,N−ジメチルプロピルアミド、3−エトキシ−N,N−ジメチルプロピルアミド、3−プロポキシ−N,N−ジメチルプロピルアミド、3−イソプロポキシ−N,N−ジメチルプロピルアミド、3−ブトキシ−N,N−ジメチルプロピルアミド、3−sec−ブトキシ−N,N−ジメチルプロピルアミド、3−tert−ブトキシ−N,N−ジメチルプロピルアミド
式(S2):2−ピロリドン、N−メチル−2−ピロリドン、N−エチル−2−ピロリドン
式(S3):N,N−ジメチルホルムアミド、N,N−ジメチルアセトアミド、N,N−ジメチルプロピルアミド、N,N−ジメチルブタンアミド
式(S4):γ−ブチロラクトン
式(S5):シクロペンタノン、シクロヘキサノン、シクロヘプタノン
式(S6):乳酸メチル、乳酸エチル、乳酸n−プロピル、乳酸n−ブチル、乳酸イソアミル、2−ヒドロキシイソ酪酸メチル、2−ヒドロキシイソ酪酸エチル、2−ヒドロキシイソ酪酸プロピル、2−ヒドロキシイソ酪酸ブチル
式(S7):エチルセロソルブ、ブチルセロソルブ、エチレングリコール、1−メトキシ−2−プロパノール、1−エトキシ−2−プロパノール、1−ブトキシ−2−プロパノール、プロピレングリコールモノメチルエーテル、プロピレングリコール−1−モノメチルエーテル−2−アセテート、プロピレングリコール−1−モノエチルエーテル−2−アセテート
Specific examples of the organic solvent represented by the above formulas (S1) to (S7) include the following.
Formula (S1): 3-methoxy-N, N-dimethylpropylamide, 3-ethoxy-N, N-dimethylpropylamide, 3-propoxy-N, N-dimethylpropylamide, 3-isopropoxy-N, N- Dimethylpropylamide, 3-butoxy-N, N-dimethylpropylamide, 3-sec-butoxy-N, N-dimethylpropylamide, 3-tert-butoxy-N, N-dimethylpropylamide formula (S2): 2- Pyrrolidone, N-methyl-2-pyrrolidone, N-ethyl-2-pyrrolidone Formula (S3): N, N-dimethylformamide, N, N-dimethylacetamide, N, N-dimethylpropylamide, N, N-dimethylbutane Amide formula (S4): γ-butyrolactone formula (S5): cyclopentanone, cyclohexanone, cycloheptanone (S6): methyl lactate, ethyl lactate, n-propyl lactate, n-butyl lactate, isoamyl lactate, methyl 2-hydroxyisobutyrate, ethyl 2-hydroxyisobutyrate, propyl 2-hydroxyisobutyrate, butyl 2-hydroxyisobutyrate Formula (S7): ethyl cellosolve, butyl cellosolve, ethylene glycol, 1-methoxy-2-propanol, 1-ethoxy-2-propanol, 1-butoxy-2-propanol, propylene glycol monomethyl ether, propylene glycol-1-monomethyl ether 2-acetate, propylene glycol-1-monoethyl ether-2-acetate

本発明では、これらの中でも、N−メチル−2−ピロリドン、ブチルセロソルブ、プロピレングリコールモノメチルエーテル及びプロピレングリコールモノメチルエーテルアセテートが好ましく、プロピレングリコールモノメチルエーテル及びプロピレングリコールモノメチルエーテルアセテートがより好ましく、プロピレングリコールモノメチルエーテルが更に好ましい。これらの有機溶媒は、1種単独で又は2種以上を組み合わせて使用してもよい。   In the present invention, among these, N-methyl-2-pyrrolidone, butyl cellosolve, propylene glycol monomethyl ether and propylene glycol monomethyl ether acetate are preferable, propylene glycol monomethyl ether and propylene glycol monomethyl ether acetate are more preferable, and propylene glycol monomethyl ether is more preferable. More preferable. These organic solvents may be used alone or in combination of two or more.

特に上記有機溶媒として、プロピレングリコールモノメチルエーテル及びプロピレングリコールモノメチルエーテルアセテートといった、いわゆる低粘度溶媒を使用した場合には、スリット塗装にも好適に適用できる低粘度の剥離層形成用組成物を得ることができる。なお、本発明の剥離層形成用組成物をスリット塗装に使用する場合、溶媒全体に占める上記低粘度溶媒の割合は、60質量%以上が好ましく、70質量%以上がより好ましく、80質量%以上が最も好ましい。   In particular, when a so-called low viscosity solvent such as propylene glycol monomethyl ether and propylene glycol monomethyl ether acetate is used as the organic solvent, it is possible to obtain a low viscosity composition for forming a release layer suitable for slit coating. it can. In addition, when using the composition for peeling layer formation of this invention for slit coating, 60 mass% or more is preferable, and, as for the ratio of the said low viscosity solvent which occupies the whole solvent, 70 mass% or more is more preferable, 80 mass% or more Is most preferred.

なお、単独ではポリアミック酸を溶解させない溶媒であっても、ポリアミック酸が析出しない範囲であれば、組成物の調製に用いることができる。特に、エチルカルビトール、ブチルカルビトール、エチルカルビトールアセテート、1−フェノキシ−2−プロパノール、プロピレングリコールモノアセテート、プロピレングリコールジアセテート、ジプロピレングリコール、2−(2−エトキシプロポキシ)プロパノール等の低表面張力を有する溶媒を適度に混在させることができる。これにより、基板への塗布時に塗膜均一性が向上することが知られており、本発明においても好適に用いることができる。   In addition, even if it is a solvent which does not dissolve polyamic acid by itself, it can be used for preparation of a composition if it is a range which polyamic acid does not precipitate. In particular, low surfaces such as ethyl carbitol, butyl carbitol, ethyl carbitol acetate, 1-phenoxy-2-propanol, propylene glycol monoacetate, propylene glycol diacetate, dipropylene glycol, 2- (2-ethoxypropoxy) propanol and the like A solvent having tension can be mixed appropriately. Thereby, it is known that the coating film uniformity is improved at the time of application to a substrate, and can be suitably used in the present invention.

本発明の剥離層形成用組成物は通常の方法で調製することができる。調製方法の好ましい一例としては、上記で説明した方法によって得られた目的とするポリアミック酸を含む反応溶液をろ過し、得られたろ液の濃度を上述した有機溶媒を用いて所定の濃度とすればよい。このような方法を採用することで、得られる組成物から製造される剥離層の密着性、剥離性等の悪化の原因となり得る不純物の混入を低減できるだけでなく、効率よく剥離層形成用組成物を得ることができる。   The composition for release layer formation of the present invention can be prepared by a conventional method. As a preferable example of the preparation method, the reaction solution containing the target polyamic acid obtained by the method described above is filtered, and the concentration of the obtained filtrate is made to be a predetermined concentration using the above-mentioned organic solvent. Good. By adopting such a method, it is possible not only to reduce the contamination of impurities that may cause deterioration of the adhesiveness, peelability and the like of the peelable layer produced from the composition obtained, but also to efficiently form the composition for peelable layer formation. You can get

本発明の剥離層形成用組成物におけるポリアミック酸の濃度は、作製する剥離層の厚み、組成物の粘度等を勘案して適宜設定されものではあるが、通常1〜30質量%程度、好ましくは1〜20質量%程度である。このような濃度とすることで、0.05〜5μm程度の厚さの剥離層を再現性よく得ることができる。ポリアミック酸の濃度は、ポリアミック酸の原料であるジアミン成分とテトラカルボン酸二無水物成分及び芳香族モノアミンの使用量を調整する、単離したポリアミック酸を溶媒に溶解させる際にその量を調整する等して調節できる。   The concentration of the polyamic acid in the release layer-forming composition of the present invention is appropriately set in consideration of the thickness of the release layer to be produced, the viscosity of the composition, etc., but usually about 1 to 30% by mass, preferably It is about 1 to 20% by mass. By setting it as such a density | concentration, the peeling layer of thickness of about 0.05-5 micrometers can be obtained with sufficient reproducibility. The concentration of the polyamic acid adjusts the amounts of the diamine component, which is the raw material of the polyamic acid, the tetracarboxylic acid dianhydride component and the aromatic monoamine, and the amount when dissolving the isolated polyamic acid in a solvent It can be adjusted equally.

また、本発明の剥離層形成用組成物の粘度は、作製する剥離層の厚み等を勘案して適宜設定されるものではあるが、特に0.05〜5μm程度の厚さの膜を再現性よく得ることを目的とする場合、通常、25℃で10〜10,000mPa・s程度、好ましくは20〜5,000mPa・s程度である。また、本発明の剥離層形成用組成物をスリット塗装方式に使用する場合、その粘度は2〜100mPa・s程度がよく、生産性の観点から、2〜25mPa・s程度であることが好ましい。   The viscosity of the release layer-forming composition of the present invention is appropriately set in consideration of the thickness of the release layer to be produced, and in particular, the film having a thickness of about 0.05 to 5 μm is reproducible. When it is intended to be obtained well, it is usually about 10 to 10,000 mPa · s at 25 ° C., preferably about 20 to 5,000 mPa · s. Moreover, when using the composition for peeling layer formation of this invention for a slit coating system, the viscosity is good at about 2-100 mPa * s, and it is preferable from a viewpoint of productivity to be about 2-25 mPa * s.

ここで、粘度は、市販の液体の粘度測定用粘度計を使用して、例えば、JIS K7117−2に記載の手順を参照して、組成物の温度25℃の条件にて測定することができる。好ましくは、粘度計としては、円錐平板型(コーンプレート型)回転粘度計を使用し、好ましくは同型の粘度計で標準コーンロータとして1°34’×R24を使用して、組成物の温度25℃の条件にて測定することができる。このような回転粘度計としては、例えば、東機産業株式会社製TVE−25Lが挙げられる。   Here, the viscosity can be measured under the conditions of a temperature of 25 ° C. of the composition using, for example, a procedure described in JIS K7117-2 using a commercially available viscosity meter for viscosity measurement of liquid . Preferably, the temperature of the composition is 25 using a cone and plate type (cone plate type) rotational viscometer as the viscometer, preferably using 1 ° 34 ′ × R 24 as a standard cone rotor in the same type viscometer. It can measure on the conditions of ° C. As such a rotational viscometer, TVE-25L by Toki Sangyo Co., Ltd. is mentioned, for example.

なお、本発明の剥離層形成用組成物は、ポリアミック酸及び有機溶媒の他に、例えば膜強度を向上させるために、架橋剤等を含んでいてもよい。   In addition to the polyamic acid and the organic solvent, the composition for forming a release layer according to the present invention may contain, for example, a crosslinking agent or the like in order to improve film strength.

以上説明した本発明の剥離層形成用組成物を基体に塗布し、得られた塗膜を加熱してポリアミック酸を熱イミド化することで、基体との優れた密着性及び樹脂基板との適度な密着性と適度な剥離性を有する、ポリイミド膜からなる剥離層を得ることができる。   The composition for forming a release layer of the present invention described above is applied to a substrate, and the obtained coating film is heated to thermally imidize the polyamic acid, thereby achieving excellent adhesion with the substrate and appropriateness with the resin substrate. The peeling layer which consists of a polyimide film | membrane which has such adhesiveness and moderate peelability can be obtained.

このような本発明の剥離層を基体上に形成する場合、剥離層は基体表面の一部に形成されていてもよいし、全面に形成されていてもよい。基体表面の一部に剥離層を形成する態様としては、基体表面のうち所定の範囲にのみ剥離層を形成する態様、基体表面の全体にドットパターン、ラインアンドスペースパターン等のパターン状に剥離層を形成する態様等がある。なお、本発明において、基体とは、その表面に本発明の剥離層形成用組成物が塗られるものであって、フレキシブル電子デバイス等の製造に用いられるものを意味する。   When such a release layer of the present invention is formed on a substrate, the release layer may be formed on a part of the surface of the substrate or may be formed on the entire surface. As an embodiment in which the release layer is formed on a part of the substrate surface, an embodiment in which the release layer is formed only in a predetermined range of the substrate surface, a release layer in a pattern such as a dot pattern or line and space pattern all over the substrate surface And the like. In the present invention, the substrate means one to which the composition for forming a release layer of the present invention is applied on the surface and which is used for producing a flexible electronic device or the like.

基体(基材)としては、例えば、ガラス、プラスチック(ポリカーボネート、ポリメタクリレート、ポリスチレン、ポリエステル、ポリオレフィン、エポキシ、メラミン、トリアセチルセルロース、ABS、AS、ノルボルネン系樹脂等)、金属(シリコンウエハ等)、木材、紙、スレート等が挙げられる。本発明では、特に剥離層が十分な密着性を有することから、ガラス基体を好適に使用することができる。なお、基体表面は、単一の材料で構成されていても、2以上の材料で構成されていてもよい。2以上の材料で基体表面が構成される態様としては、基体表面のうちのある範囲が一の材料で構成され、その余の範囲が他の材料で構成されている態様、基体表面の全体にドットパターン、ラインアンドスペースパターン等のパターン状にある材料がその他の材料中に存在する態様等がある。   As the substrate (substrate), for example, glass, plastic (polycarbonate, polymethacrylate, polystyrene, polyester, polyolefin, epoxy, melamine, triacetylcellulose, ABS, AS, norbornene resin, etc.), metal (silicon wafer, etc.), Wood, paper, slate, etc. may be mentioned. In the present invention, a glass substrate can be suitably used, in particular, because the release layer has sufficient adhesion. The substrate surface may be composed of a single material or may be composed of two or more materials. As an embodiment in which the substrate surface is composed of two or more materials, an embodiment in which a certain range of the substrate surface is composed of one material and the other range is composed of another material, all over the substrate surface There is a mode in which a material in a pattern form such as a dot pattern or a line and space pattern is present in another material.

本発明の剥離層形成用組成物を基体に塗布する方法は、特に限定されるものではないが、例えば、キャストコート法、スピンコート法、スリットコート法、ブレードコート法、ディップコート法、ロールコート法、バーコート法、ダイコート法、インクジェット法、印刷法(凸版、凹版、平版、スクリーン印刷等)等が挙げられる。   The method for applying the release layer-forming composition of the present invention to a substrate is not particularly limited, and, for example, cast coating, spin coating, slit coating, blade coating, dip coating, roll coating Methods, bar coating methods, die coating methods, ink jet methods, printing methods (relief printing, intaglio printing, lithography, screen printing, etc.) and the like.

イミド化するための加熱温度は、通常50〜550℃の範囲内で適宜決定されるものではあるが、好ましくは150℃超〜510℃である。加熱温度をこのようにすることで、得られる膜の脆弱化を防ぎつつ、イミド化反応を十分に進行させることが可能となる。加熱時間は、加熱温度によって異なるため一概に規定できないが、通常5分〜5時間である。また、イミド化率は、50〜100%の範囲であればよい。   Although the heating temperature for imidation is suitably determined in the range of normally 50-550 degreeC, Preferably it is more than 150 degreeC-510 degreeC. By setting the heating temperature in this manner, it is possible to sufficiently advance the imidization reaction while preventing the resulting film from being weakened. The heating time is generally 5 minutes to 5 hours, although it can not be generally defined because it varies depending on the heating temperature. Moreover, the imidation ratio should just be 50 to 100% of range.

本発明における加熱態様の好ましい一例としては、50〜150℃で5分間〜2時間加熱した後に、そのまま段階的に加熱温度を上昇させて最終的に150℃超〜510℃で30分〜4時間加熱する手法が挙げられる。特に、50〜150℃で5分間〜2時間加熱した後に、150℃超〜350℃で5分間〜2時間、最後に350℃超〜450℃で30分〜4時間加熱することが好ましい。   As a preferable example of the heating aspect in the present invention, after heating at 50 to 150 ° C. for 5 minutes to 2 hours, the heating temperature is gradually raised as it is, and finally it is from 150 ° C. to 510 ° C. for 30 minutes to 4 hours The method of heating is mentioned. In particular, after heating at 50 to 150 ° C. for 5 minutes to 2 hours, heating is preferably performed at more than 150 ° C. to 350 ° C. for 5 minutes to 2 hours, and finally at more than 350 ° C. to 450 ° C. for 30 minutes to 4 hours.

加熱に用いる器具は、例えばホットプレート、オーブン等が挙げられる。加熱雰囲気は、空気下であっても不活性ガス下であってもよく、また、常圧下であっても減圧下であってもよい。   The apparatus used for heating includes, for example, a hot plate, an oven, and the like. The heating atmosphere may be under air or inert gas, and may be under normal pressure or under reduced pressure.

剥離層の厚さは、通常0.01〜50μm程度、生産性の観点から好ましくは0.05〜20μm程度である。なお、所望の厚さは、加熱前の塗膜の厚さを調整することによって実現する。   The thickness of the release layer is usually about 0.01 to 50 μm, and preferably about 0.05 to 20 μm from the viewpoint of productivity. The desired thickness is achieved by adjusting the thickness of the coating before heating.

以上説明した剥離層は、基体、特にガラス基体との優れた密着性及び樹脂基板との適度な密着性と適度な剥離性を有している。それ故、本発明の剥離層は、フレキシブル電子デバイスの製造プロセスにおいて、当該デバイスの樹脂基板に損傷を与えることなく、当該樹脂基板を、その樹脂基板上に形成された回路等とともに、基体から剥離させるために好適に用いることができる。   The release layer described above has excellent adhesion to a substrate, particularly to a glass substrate, moderate adhesion to a resin substrate, and moderate peelability. Therefore, in the manufacturing process of the flexible electronic device, the peeling layer of the present invention peels the resin substrate from the substrate together with the circuit and the like formed on the resin substrate without damaging the resin substrate of the device. It can be suitably used to

以下、本発明の剥離層を用いたフレキシブル電子デバイスの製造方法の一例について説明する。
本発明の剥離層形成用組成物を用いて、上述の方法によって、ガラス基体上に剥離層を形成する。この剥離層の上に、樹脂基板を形成するための樹脂溶液を塗布し、この塗膜を加熱することで、本発明の剥離層を介して、ガラス基体に固定された樹脂基板を形成する。この際、剥離層を全て覆うようにして、剥離層の面積と比較して大きい面積で、基板を形成する。樹脂基板としては、フレキシブル電子デバイスの樹脂基板として代表的なポリイミド樹脂やアクリル樹脂、シクロオレフィンポリマー樹脂からなる基板が挙げられ、それを形成するための樹脂溶液としては、ポリイミド溶液、ポリアミック酸溶液、アクリルポリマー溶液及びシクロオレフィンポリマー溶液等が挙げられる。当該樹脂基板の形成方法は、常法に従えばよい。また、透明性が高い樹脂基板としては、アクリル樹脂やシクロオレフィンポリマー樹脂で形成される樹脂基板を例示することができ、特に波長400nmの光透過率が80%以上であるものが好ましい。
Hereinafter, an example of the manufacturing method of the flexible electronic device using the peeling layer of this invention is demonstrated.
The composition for release layer formation of the present invention is used to form a release layer on a glass substrate by the method described above. A resin solution for forming a resin substrate is applied onto the release layer, and the coating film is heated to form a resin substrate fixed to the glass substrate via the release layer of the present invention. At this time, the substrate is formed with a large area as compared with the area of the release layer so as to cover the entire release layer. Examples of the resin substrate include substrates made of polyimide resin, acrylic resin, and cycloolefin polymer resin that are representative of resin substrates for flexible electronic devices, and resin solutions for forming the same include polyimide solution, polyamic acid solution, Acrylic polymer solutions and cycloolefin polymer solutions may, for example, be mentioned. The formation method of the said resin substrate should just follow a conventional method. Further, as a resin substrate having high transparency, a resin substrate formed of an acrylic resin or a cycloolefin polymer resin can be exemplified, and in particular, one having a light transmittance of wavelength 400 nm of 80% or more is preferable.

次に、本発明の剥離層を介して基体に固定された当該樹脂基板の上に、所望の回路を形成し、その後、例えば剥離層に沿って樹脂基板をカットし、この回路とともに樹脂基板を剥離層から剥離して、樹脂基板と基体とを分離する。この際、基体の一部を剥離層とともにカットしてもよい。   Next, a desired circuit is formed on the resin substrate fixed to the substrate via the release layer of the present invention, and then, for example, the resin substrate is cut along the release layer, and the resin substrate is It peels from a peeling layer and separates a resin substrate and a base. At this time, part of the substrate may be cut together with the release layer.

なお、特開2013−147599号公報では、これまで高輝度LEDや三次元半導体パッケージ等の製造において使用されてきたレーザーリフトオフ法(LLO法)をフレキシブルディスプレイの製造に適用することが報告されている。上記LLO法は、回路等が形成された面とは反対の面から、特定の波長の光線、例えば、波長308nmの光線をガラス基体側から照射することを特徴とするものである。照射された光線は、ガラス基体を透過し、ガラス基体近傍のポリマー(ポリイミド樹脂)のみがこの光線を吸収して蒸発(昇華)する。その結果、ディスプレイの性能を決定づけることとなる、樹脂基板上に設けられた回路等に影響を与えることなく、ガラス基体から樹脂基板を選択的に剥離することが可能となる。   In addition, in Unexamined-Japanese-Patent No. 2013-147599, applying the laser lift-off method (LLO method) used so far in manufacture of high-intensity LED, a three-dimensional semiconductor package, etc. to manufacture of a flexible display is reported. . The LLO method is characterized in that a light beam of a specific wavelength, for example, a light beam of a wavelength of 308 nm is irradiated from the side of the glass substrate from the surface opposite to the surface on which circuits and the like are formed. The irradiated light passes through the glass substrate, and only the polymer (polyimide resin) near the glass substrate absorbs the light and evaporates (sublimates). As a result, the resin substrate can be selectively peeled off from the glass substrate without affecting the circuits and the like provided on the resin substrate, which determines the performance of the display.

本発明の剥離層形成用組成物は、上記LLO法の適用が可能となる特定波長(例えば308nm)の光線を十分に吸収するという特徴を持つため、LLO法の犠牲層として用いることができる。そのため、本発明に組成物を用いて形成した剥離層を介してガラス基体に固定された樹脂基板の上に、所望の回路を形成し、その後、LLO法を実施して308nmの光線を照射すると、該剥離層のみがこの光線を吸収して蒸発(昇華)する。これにより、上記剥離層が犠牲となり(犠牲層として働く)、ガラス基体から樹脂基板を選択的に剥離することが可能となる。   The composition for forming a release layer of the present invention has a feature of sufficiently absorbing a light beam of a specific wavelength (for example, 308 nm) which enables the application of the LLO method, and therefore can be used as a sacrificial layer of the LLO method. Therefore, a desired circuit is formed on a resin substrate fixed to a glass substrate through a release layer formed using the composition of the present invention, and then an LLO method is performed to irradiate a light beam of 308 nm. Only the release layer absorbs this light beam and evaporates (sublimates). Thus, the release layer is sacrificed (functions as a sacrificial layer), and the resin substrate can be selectively removed from the glass substrate.

以下、実施例を挙げて本発明を更に詳細に説明するが、本発明は、これら実施例に限定されるものではない。
[1]化合物の略語
p−PDA:p−フェニレンジアミン
TPDA:4,4''−ジアミノ−p−ターフェニル
TFMB:2,2’−ビス(トリフルオロメチル)ベンジジン
BPDA:3,3’,4,4’−ビフェニルテトラカルボン酸二無水物
PMDA:ピロメリット酸二無水物
DMCBDA:1,3−ジメチルシクロブタン酸二無水物
CBDA:シクロブタン酸二無水物
MMA:メタクリル酸メチル
MAA:メタクリル酸
HEMA:メタクリル酸2−ヒドロキシエチル
AIBN:アゾビスイソブチロニトリル
CHMI:シクロヘキシルマレイミド
エポリード GT−401:ブタンテトラカルボン酸、テトラ(3,4−エポキシシクロヘキシルメチル)、修飾ε−カプロラクトン、(株)ダイセル製
セロキサイド 2021P:3’,4’−エポキシシクロヘキシルメチル 3,4−エポキシシクロヘキサンカルボキシレート、(株)ダイセル製
VESTAGON B 1530:エボニックジャパン(株)製
NMP:N−メチル−2−ピロリドン
BCS:ブチルセロソルブ
PGME:プロピレングリコールモノメチルエーテル
PGMEA:プロピレングリコールモノメチルエーテルアセテート
Hereinafter, the present invention will be described in more detail by way of examples, but the present invention is not limited to these examples.
[1] Abbreviation of compound p-PDA: p-phenylenediamine TPDA: 4,4′-diamino-p-terphenyl TFMB: 2,2′-bis (trifluoromethyl) benzidine BPDA: 3,3 ′, 4 4,4'-biphenyltetracarboxylic acid dianhydride PMDA: pyromellitic acid dianhydride DMCBDA: 1,3-dimethylcyclobutanoic acid dianhydride CBDA: cyclobutanoic acid dianhydride MMA: methyl methacrylate MAA: methacrylic acid HEMA: methacrylic Acid 2-Hydroxyethyl AIBN: Azobisisobutyro nitrile CHMI: Cyclohexylmaleimidopolyde GT-401: Butanetetracarboxylic acid, tetra (3,4-epoxycyclohexylmethyl), modified ε-caprolactone, Celoxide manufactured by Daicel Corporation 2021P: 3 ', 4'-epoxy Chlorohexyl methyl 3,4-epoxycyclohexane carboxylate, VESTAGON B 1530 manufactured by Daicel Co., Ltd. NMP: N-methyl-2-pyrrolidone BCS: butyl cellosolve PGME: propylene glycol monomethyl ether PGMEA: propylene glycol monomethyl Ether acetate

[2]重量平均分子量及び分子量分布の測定方法
ポリマーの重量平均分子量(以下Mwと略す)及び分子量分布の測定は、日本分光(株)製GPC装置(カラム:Shodex製 KD801及びKD805;溶離液:ジメチルホルムアミド/LiBr・H2O(29.6mM)/H3PO4(29.6mM)/THF(0.1質量%);流量:1.0mL/分;カラム温度:40℃;Mw:標準ポリスチレン換算値)を用いて行った。
[2] Measurement Method of Weight Average Molecular Weight and Molecular Weight Distribution Measurement of weight average molecular weight (hereinafter abbreviated as Mw) and molecular weight distribution of polymer is carried out by GPC apparatus manufactured by JASCO (column: KOD801 and KD805 manufactured by Shodex; eluent: Dimethylformamide / LiBr · H 2 O (29.6 mM) / H 3 PO 4 (29.6 mM) / THF (0.1% by mass); Flow rate: 1.0 mL / min; Column temperature: 40 ° C .; Mw: Standard It carried out using polystyrene conversion value).

[3]ポリマーの合成
以下の方法によって、実施例及び比較例で使用する各種ポリマーを合成した。
なお、得られたポリマー含有反応液からポリマーを単離せず、後述の通りに、反応液を希釈することで、樹脂基板形成用組成物又は剥離層形成用組成物を調製した。
[3] Synthesis of Polymer Various polymers used in Examples and Comparative Examples were synthesized by the following method.
In addition, the polymer was not isolated from the obtained polymer containing reaction liquid, but the composition for resin substrate formation or the composition for peeling layer formation was prepared by diluting a reaction liquid as mentioned later.

<合成例S1 ポリアミック酸(S1)の合成>
p−PDA3.218g(30mmol)をNMP88.2gに溶解させた。得られた溶液にBPDA8.581g(29mmol)を加え、窒素雰囲気下、23℃で24時間反応させた。得られたポリマーのMwは107,300、分子量分布は4.6であった。
Synthesis Example S1 Synthesis of Polyamic Acid (S1)
3.218 g (30 mmol) of p-PDA was dissolved in 88.2 g of NMP. To the resulting solution, 8.581 g (29 mmol) of BPDA was added, and allowed to react at 23 ° C. for 24 hours under a nitrogen atmosphere. The obtained polymer had a Mw of 107,300 and a molecular weight distribution of 4.6.

<合成例S2 ポリアミック酸(S2)の合成>
p−PDA20.261g(0.1875mol)とTPDA12.206g(0.0469mol)をNMP617.4gに溶解し、15℃に冷却後、PMDA50.112g(0.2298mol)を添加し、窒素雰囲気下、50℃で48時間反応させた。得られたポリマーのMwは82,100、分子量分布は2.7であった。
Synthesis Example S2 Synthesis of Polyamic Acid (S2)
20.261 g (0.1875 mol) of p-PDA and 12.206 g (0.0469 mol) of TPDA are dissolved in 617.4 g of NMP, and after cooling to 15 ° C., 50.112 g (0.2298 mol) of PMDA is added, and 50 in a nitrogen atmosphere The reaction was allowed to proceed for 48 hours at ° C. The Mw of the obtained polymer was 82, 100, and the molecular weight distribution was 2.7.

<合成例S3 アクリルポリマー(S3)の合成>
MMA7.20g(0.0719mol)、HEMA7.20g(0.0553mol)、CHMI10.8g(0.0603mol)、MAA4.32g(0.0502mol)、AIBN2.46g(0.0150mol)をPGMEA46.9gに溶解し、60〜100℃にて20時間反応させることによりアクリル重合体溶液(固形分濃度40質量%)を得た。得られたアクリル重合体のMnは3,800、Mwは7,300であった。
Synthesis Example S3 Synthesis of Acrylic Polymer (S3)
Dissolve 7.20 g (0.0719 mol) of MMA, 7.20 g (0.0553 mol) of HEMA, 10.8 g (0.0603 mol) of CHMI, 4.32 g (0.0502 mol) of MAA, 2.46 g (0.0150 mol) of AIBN in 46.9 g of PGMEA The reaction was carried out at 60 to 100 ° C. for 20 hours to obtain an acrylic polymer solution (solid content 40% by mass). Mn of the obtained acrylic polymer was 3,800, and Mw was 7,300.

<合成例L1 ポリアミック酸(L1)の合成>
TFMB2.73g(8.53mmol)をNMP38.5gに溶解させた。得られた溶液に、PMDA2.06g(9.47mmol)を加え、窒素雰囲気下、23℃で24時間反応させた。得られたポリマーのMwは17,100、分子量分布1.7であった。得られたポリマー溶液1gをPGME10gに添加した結果、特に析出は見られなかった。
Synthetic Example L1 Synthesis of Polyamic Acid (L1)
2.73 g (8.53 mmol) of TFMB was dissolved in 38.5 g of NMP. To the resulting solution, 2.06 g (9.47 mmol) of PMDA was added, and allowed to react at 23 ° C. for 24 hours under a nitrogen atmosphere. The Mw of the obtained polymer was 17,100, and the molecular weight distribution was 1.7. As a result of adding 1 g of the obtained polymer solution to 10 g of PGME, no particular precipitation was observed.

<合成例L2 ポリアミック酸(L2)の合成>
TFMB2.73g(8.53mmol)をPGME40gに溶解させた。得られた溶液に、PMDA2.06g(9.47mmol)を加え、窒素雰囲気下、23℃で24時間反応させた。得られたポリマーのMwは20,100、分子量分布1.8であった。
Synthesis Example Synthesis of L2 Polyamic Acid (L2)
2.73 g (8.53 mmol) of TFMB was dissolved in 40 g of PGME. To the resulting solution, 2.06 g (9.47 mmol) of PMDA was added, and allowed to react at 23 ° C. for 24 hours under a nitrogen atmosphere. The Mw of the obtained polymer was 20, 100, and the molecular weight distribution was 1.8.

<合成例L3 ポリアミック酸(L3)の合成>
TFMB23.7g(74.2mmol)をNMP352gに溶解させた。得られた溶液に、BPDA24.2g(82.5mmol)を加え、窒素雰囲気下、23℃で24時間反応させた。得られたポリマーのMwは16,500、分子量分布1.7であった。得られたポリマー溶液1gをPGME10gに添加した結果、特に析出は見られなかった。
Synthetic Example L3 Synthesis of Polyamic Acid (L3)
23.7 g (74.2 mmol) of TFMB were dissolved in 352 g of NMP. To the resulting solution, 24.2 g (82.5 mmol) of BPDA was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere. The Mw of the obtained polymer was 16,500, and the molecular weight distribution was 1.7. As a result of adding 1 g of the obtained polymer solution to 10 g of PGME, no particular precipitation was observed.

<合成例L4 ポリアミック酸(L4)の合成>
TFMB9.89g(30.9mmol)をPGME380gに溶解させた。得られた溶液に、BPDA10.0g(34.3mmol)を加え、窒素雰囲気下、50℃で72時間反応させた。得られたポリマーのMwは14,700、分子量分布1.7であった。
Synthetic Example L4 Synthesis of Polyamic Acid (L4)
9.89 g (30.9 mmol) of TFMB were dissolved in 380 g of PGME. To the resulting solution, 10.0 g (34.3 mmol) of BPDA was added and allowed to react at 50 ° C. for 72 hours under a nitrogen atmosphere. The Mw of the obtained polymer was 14,700, and the molecular weight distribution was 1.7.

<比較合成例HL1 ポリアミック酸(HL1)の合成>
p−PDA3.90g(3.60mmol)をNMP35.2gに溶解させた。得られた溶液に、DMCBDA9.27g(4.00mmol)を加え、窒素雰囲気下、23℃で24時間反応させた。得られたポリマーのMwは45,000、分子量分布3.9であった。得られたポリマー溶液1gをPGME10gに添加した結果、ポリアミック酸が析出した。
Comparative Synthesis Example Synthesis of HL1 Polyamic Acid (HL1)
3.90 g (3.60 mmol) of p-PDA was dissolved in 35.2 g of NMP. To the resulting solution, 9.27 g (4.00 mmol) of DMCBDA was added, and allowed to react at 23 ° C. for 24 hours under a nitrogen atmosphere. The Mw of the obtained polymer was 45,000, and the molecular weight distribution was 3.9. As a result of adding 1 g of the obtained polymer solution to 10 g of PGME, polyamic acid was precipitated.

<比較合成例HL2 ポリアミック酸(HL2)の合成>
TFMB2.86g(8.91mmol)をNMP35.2gに溶解させた。得られた溶液に、CBDA1.94g(9.91mmol)を加え、窒素雰囲気下、23℃で24時間反応させた。得られたポリマーのMwは69,200、分子量分布2.2であった。得られたポリマー溶液1gをPGME10gに添加した結果、特に析出は見られなかった。
Comparative Synthesis Example HL2 Synthesis of Polyamic Acid (HL2)>
2.86 g (8.91 mmol) of TFMB were dissolved in 35.2 g of NMP. To the resulting solution, 1.94 g (9.91 mmol) of CBDA was added, and allowed to react at 23 ° C. for 24 hours under a nitrogen atmosphere. The Mw of the obtained polymer was 69,200, and the molecular weight distribution was 2.2. As a result of adding 1 g of the obtained polymer solution to 10 g of PGME, no particular precipitation was observed.

[4]樹脂基板形成用組成物の調製
以下の方法によって、樹脂基板形成用組成物を調製した。
[4] Preparation of Composition for Forming Resin Substrate The composition for forming a resin substrate was prepared by the following method.

<調製例1 樹脂基板形成用組成物F1>
合成例S1で得られた反応液をそのまま樹脂基板形成用組成物F1として用いた。
Preparation Example 1 Composition F1 for Forming Resin Substrate
The reaction liquid obtained in Synthesis Example S1 was used as it is as a composition F1 for forming a resin substrate.

<調製例2 樹脂基板形成用組成物F2>
合成例S2で得られた反応液をそのまま樹脂基板形成用組成物F2として用いた。
Preparation Example 2 Composition F2 for Forming Resin Substrate
The reaction liquid obtained in Synthesis Example S2 was used as it is as a composition F2 for forming a resin substrate.

<調製例3 樹脂基板形成用組成物F3>
合成例S3得られた反応液10gにエポリードGT−401 0.60gとPGMEA11.8gを添加し、23℃で24時間撹拌して、樹脂基板形成用組成物F3を調製した。
Preparation Example 3 Composition F3 for Forming Resin Substrate
Synthesis Example S3 0.60 g of Epolide GT-401 and 11.8 g of PGMEA were added to 10 g of the reaction liquid obtained, and the mixture was stirred at 23 ° C. for 24 hours to prepare a composition F3 for forming a resin substrate.

<調製例4 樹脂基板形成用組成物F4>
合成例S3で得られた反応液10gにセロキサイド 2021P 0.80gとPGMEA11.8gを添加し、23℃で24時間撹拌して、樹脂基板形成用組成物F4を調製した。
Preparation Example 4 Composition F4 for Forming Resin Substrate
0.80 g of celloxide 2021P and 11.8 g of PGMEA were added to 10 g of the reaction liquid obtained in Synthesis Example S3, and the mixture was stirred at 23 ° C. for 24 hours to prepare a composition F4 for forming a resin substrate.

<調製例5 樹脂基板形成用組成物F5>
合成例S3で得られた反応液10gにVESTAGON B 1530 0.60gとPGMEA11.8gを添加し、23℃で24時間撹拌して、樹脂基板形成用組成物F5を調製した。
Preparation Example 5 Composition F5 for Forming Resin Substrate
0.60 g of VESTAGON B 1530 and 11.8 g of PGMEA were added to 10 g of the reaction liquid obtained in Synthesis Example S3, and the mixture was stirred at 23 ° C. for 24 hours to prepare a composition F5 for forming a resin substrate.

<調製例6 樹脂基板形成用組成物F6>
四塩化炭素100gを入れたナスフラスコに、ゼオノア(登録商標)1020R(日本ゼオン(株)製、シクロオレフィンポリマー樹脂)10g及びGT−401 3gを添加した。この溶液を、窒素雰囲気下、24時間攪拌して溶解し、樹脂基板形成用組成物F6を調製した。
Preparation Example 6 Composition F6 for Forming Resin Substrate
10 g of Zeonoa (registered trademark) 1020 R (manufactured by Nippon Zeon Co., Ltd., cycloolefin polymer resin) and 3 g of GT-401 were added to an eggplant flask containing 100 g of carbon tetrachloride. The solution was stirred and dissolved in a nitrogen atmosphere for 24 hours to prepare a composition F6 for forming a resin substrate.

<調製例7 樹脂基板形成用組成物F7>
四塩化炭素100gを入れたナスフラスコに、ゼオノア(登録商標)1060R(日本ゼオン(株)製、シクロオレフィンポリマー樹脂)10gを添加した。この溶液を、窒素雰囲気下、24時間攪拌して溶解し、樹脂基板形成用組成物F7を調製した。
Preparation Example 7 Composition F7 for Forming Resin Substrate
10 g of Zeonoa (registered trademark) 1060 R (manufactured by Nippon Zeon Co., Ltd., cycloolefin polymer resin) was added to an eggplant flask containing 100 g of carbon tetrachloride. The solution was dissolved by stirring under a nitrogen atmosphere for 24 hours to prepare a composition F7 for forming a resin substrate.

[5]剥離層形成用組成物の調製
[実施例1−1]
合成例L1で得られた反応液に、BCSとNMPを加え、ポリマー濃度が5質量%、BCSが20質量%となるように希釈し、剥離層形成用組成物を得た。
[5] Preparation of Release Layer-Forming Composition [Example 1-1]
BCS and NMP were added to the reaction liquid obtained in Synthesis Example L1, and diluted so that the polymer concentration was 5% by mass and BCS was 20% by mass, to obtain a composition for forming a release layer.

[実施例1−2]
合成例L2で得られた反応溶液をそのまま剥離層形成用組成物とした。
[Example 1-2]
The reaction solution obtained in Synthesis Example L2 was used as it was as a release layer-forming composition.

[実施例1−3]
合成例L3で得られた反応液に、BCSとNMPを加え、ポリマー濃度が5質量%、BCSが20質量%となるように希釈し、剥離層形成用組成物を得た。
[Example 1-3]
BCS and NMP were added to the reaction solution obtained in Synthesis Example L3, and diluted so that the polymer concentration was 5% by mass and BCS was 20% by mass, to obtain a composition for forming a release layer.

[実施例1−4]
合成例L4で得られた反応溶液をそのまま剥離層形成用組成物とした。
Example 1-4
The reaction solution obtained in Synthesis Example L4 was used as it was as a release layer-forming composition.

[比較例1−1]
比較合成例HL1で得られた反応液に、BCSとNMPを加え、ポリマー濃度が5質量%、BCSが20質量%となるように希釈し、剥離層形成用組成物を得た。
Comparative Example 1-1
BCS and NMP were added to the reaction solution obtained in Comparative Synthesis Example HL1, and diluted so that the polymer concentration was 5% by mass and BCS was 20% by mass, to obtain a release layer-forming composition.

[比較例1−2]
比較合成例HL2で得られた反応液に、BCSとNMPを加え、ポリマー濃度が5質量%、BCSが20質量%となるように希釈し、剥離層形成用組成物を得た。
Comparative Example 1-2
BCS and NMP were added to the reaction solution obtained in Comparative Synthesis Example HL2, and diluted so that the polymer concentration was 5% by mass and BCS was 20% by mass, to obtain a composition for forming a release layer.

[6]剥離層及び樹脂基板の作製
[実施例2−1]
スピンコータ(条件:回転数3,000rpmで約30秒)を用いて、実施例1−1で得られた剥離層形成用組成物L1を、ガラス基体としての100mm×100mmガラス基板(以下同様)の上に塗布した。
そして、得られた塗膜を、ホットプレートを用いて80℃で10分間加熱し、その後、オーブンを用いて、300℃で30分間加熱し、加熱温度を400℃まで昇温(10℃/分)し、更に400℃で30分間加熱し、ガラス基板上に厚さ約0.1μmの剥離層を形成し、剥離層付きガラス基板を得た。なお、昇温の間、膜付き基板をオーブンから取り出すことはせず、オーブン内で加熱した。
[6] Preparation of Peeling Layer and Resin Substrate [Example 2-1]
Composition L1 for release layer formation obtained in Example 1-1 using a spin coater (conditions: about 30 seconds at a rotation speed of 3,000 rpm) was prepared using a 100 mm × 100 mm glass substrate (same below) as a glass substrate Applied on top.
Then, the obtained coating film is heated at 80 ° C. for 10 minutes using a hot plate, and then heated for 30 minutes at 300 ° C. using an oven, and the heating temperature is raised to 400 ° C. (10 ° C./minute C. and further heated at 400.degree. C. for 30 minutes to form a release layer having a thickness of about 0.1 .mu.m on the glass substrate to obtain a glass substrate with a release layer. During the temperature rise, the film-coated substrate was heated in the oven without being taken out of the oven.

バーコーター(ギャップ:250μm)を用いて、上記で得られたガラス基板上の剥離層(樹脂薄膜)の上に樹脂基板形成用組成物F1を塗布した。そして、得られた塗膜を、ホットプレートを用いて80℃で30分間加熱し、その後、オーブンを用いて、140℃で30分間加熱し、加熱温度を210℃まで昇温(2℃/分、以下同様)し、210℃で30分間、加熱温度を300℃まで昇温し、300℃で30分間、加熱温度を400℃まで昇温し、400℃で60分間加熱し、剥離層上に厚さ約20μmの樹脂基板を形成し、樹脂基板・剥離層付きガラス基板を得た。昇温の間、膜付き基板をオーブンから取り出すことはせず、オーブン内で加熱した。   Composition F1 for resin substrate formation was apply | coated on the peeling layer (resin thin film) on the glass substrate obtained above using the bar coater (gap: 250 micrometers). Then, the obtained coating film is heated at 80 ° C. for 30 minutes using a hot plate, and then heated at 140 ° C. for 30 minutes using an oven, and the heating temperature is raised to 210 ° C. (2 ° C./minute And so on), heating temperature to 300 ° C. for 30 minutes at 210 ° C., heating temperature to 400 ° C. for 30 minutes at 300 ° C., heating for 60 minutes at 400 ° C., on release layer A resin substrate having a thickness of about 20 μm was formed to obtain a glass substrate with a resin substrate and a release layer. The film-coated substrate was not removed from the oven during heating, but was heated in the oven.

[実施例2−2]
実施例2−1で用いた樹脂基板形成用組成物F1の代わりに、樹脂基板形成用組成物F2を用いた以外は、実施例2−1と同様の方法で、剥離層及び樹脂基板を作製し、剥離層付きガラス基板及び樹脂基板・剥離層付きガラス基板を得た。
[Example 2-2]
A release layer and a resin substrate were produced in the same manner as in Example 2-1 except that the composition F2 for forming a resin substrate was used instead of the composition F1 for forming a resin substrate used in Example 2-1. A glass substrate with a release layer and a glass substrate with a resin substrate and a release layer were obtained.

[実施例2−3]
実施例1−1で得られた剥離層形成用組成物L1の代わりに、実施例1−2で得られた剥離層形成用組成物L2を用いた以外は、実施例2−1と同様の方法で、剥離層及び樹脂基板を作製し、剥離層付きガラス基板及び樹脂基板・剥離層付きガラス基板を得た。
Embodiment 2-3
Example 2-1 is the same as Example 2-1 except that the composition L2 for forming the release layer obtained in Example 1-2 is used instead of the composition L1 for forming the release layer obtained in Example 1-1. The peeling layer and the resin substrate were produced by the method, and the glass substrate with a peeling layer and the glass substrate with a resin substrate and a peeling layer were obtained.

[実施例2−4]
剥離層形成用組成物として、実施例1−2で得られた剥離層形成用組成物L2を用い、樹脂基板形成用組成物として、実施例2−2で用いた樹脂基板形成用組成物F2を用いて、実施例2−1と同様の方法で、剥離層及び樹脂基板を作製し、剥離層付きガラス基板及び樹脂基板・剥離層付きガラス基板を得た。
Example 2-4
Composition F2 for resin substrate formation used in Example 2-2 as a composition for resin substrate formation using composition L2 for peeling layer formation obtained in Example 1-2 as a composition for peeling layer formation The peeling layer and the resin substrate were produced using the same method as in Example 2-1, to obtain a glass substrate with a peeling layer and a glass substrate with a resin substrate and a peeling layer.

[実施例2−5]
剥離層形成用組成物として、実施例1−1で得られた剥離層形成用組成物L1を用い、樹脂基板形成用組成物として、樹脂基板形成用組成物F4を用いて、実施例2−1と同様の方法で、剥離層及び樹脂基板を作製し、剥離層付きガラス基板及び樹脂基板・剥離層付きガラス基板を得た。
[Example 2-5]
Example 2- Using the composition L1 for release layer formation obtained in Example 1-1 as the composition for release layer formation and the composition F4 for resin substrate formation as the composition for resin substrate formation, Example 2- The peeling layer and the resin substrate were produced by the method similar to 1, and the glass substrate with a peeling layer and the glass substrate with a resin substrate and peeling layer were obtained.

[実施例2−6]
剥離層形成用組成物として、実施例1−1で得られた剥離層形成用組成物L1を用い、樹脂基板形成用組成物として、樹脂基板形成用組成物F5を用いて、実施例2−1と同様の方法で、剥離層及び樹脂基板を作製し、剥離層付きガラス基板及び樹脂基板・剥離層付きガラス基板を得た。
Example 2-6
Example 2- Using the composition L1 for release layer formation obtained in Example 1-1 as the composition for release layer formation and the composition F5 for resin substrate formation as the composition for resin substrate formation, Example 2- The peeling layer and the resin substrate were produced by the method similar to 1, and the glass substrate with a peeling layer and the glass substrate with a resin substrate and peeling layer were obtained.

[実施例2−7]
剥離層形成用組成物として、実施例1−2で得られた剥離層形成用組成物L2を用い、樹脂基板形成用組成物として、樹脂基板形成用組成物F5を用いて、実施例2−1と同様の方法で、剥離層及び樹脂基板を作製し、剥離層付きガラス基板及び樹脂基板・剥離層付きガラス基板を得た。
[Example 2-7]
Example 2- Using the composition L2 for release layer formation obtained in Example 1-2 as the composition for release layer formation and the composition F5 for resin substrate formation as the composition for resin substrate formation, Example 2- The peeling layer and the resin substrate were produced by the method similar to 1, and the glass substrate with a peeling layer and the glass substrate with a resin substrate and peeling layer were obtained.

[実施例2−8]
実施例1−1で得られた剥離層形成用組成物L1を用いて、実施例2−1と同様の方法で剥離層を形成し、剥離層付きガラス基板を得た。
その後、すぐにスピンコータ(条件:回転数200rpmで約15秒)を用いて、前記ガラス基板上の剥離層(樹脂薄膜)の上に樹脂基板形成用組成物F6を塗布した。得られた塗膜を、ホットプレートを用いて80℃で2分間加熱し、その後、ホットプレートを用いて230℃で30分間加熱し、剥離層上に厚さ約3μmの樹脂基板を形成し、樹脂基板・剥離層付きガラス基板を得た。その後、紫外可視分光光度計((株)島津製作所製UV−2600)を用いて光透過率を測定した結果、樹脂基板は、400nmで80%以上の透過率を示した。
[Example 2-8]
The peeling layer was formed by the method similar to Example 2-1 using the composition L1 for peeling layer formation obtained in Example 1-1, and the glass substrate with a peeling layer was obtained.
Thereafter, using a spin coater (conditions: rotation speed: 200 rpm for about 15 seconds), the composition F6 for forming a resin substrate was applied on the release layer (resin thin film) on the glass substrate. The resulting coated film is heated at 80 ° C. for 2 minutes using a hot plate, and then heated at 230 ° C. for 30 minutes using a hot plate to form a resin substrate having a thickness of about 3 μm on the release layer, A resin substrate and a glass substrate with a release layer were obtained. Thereafter, the light transmittance was measured using a UV-visible spectrophotometer (UV-2600 manufactured by Shimadzu Corporation), and as a result, the resin substrate exhibited a transmittance of 80% or more at 400 nm.

[実施例2−9]
実施例1−1で得られた剥離層形成用組成物L1の代わりに、実施例1−2で得られた剥離層形成用組成物L2を用いた以外は、実施例2−8と同様の方法で、剥離層及び樹脂基板を作製し、剥離層付きガラス基板及び樹脂基板・剥離層付きガラス基板を得た。
[Example 2-9]
Example 2-8 is similar to Example 2-8 except that composition L2 for forming release layer obtained in Example 1-2 is used instead of composition L1 for forming release layer obtained in Example 1-1. The peeling layer and the resin substrate were produced by the method, and the glass substrate with a peeling layer and the glass substrate with a resin substrate and a peeling layer were obtained.

[実施例2−10]
実施例1−1で得られた剥離層形成用組成物L1を用いて、実施例2−1と同様の方法で剥離層を形成し、剥離層付きガラス基板を得た。
その後、すぐにスピンコータ(条件:回転数200rpmで約15秒)を用いて、前記ガラス基板上の剥離層(樹脂薄膜)の上に樹脂基板形成用組成物F7を塗布した。得られた塗膜を、ホットプレートを用いて80℃で2分間加熱し、その後、ホットプレートを用いて230℃で30分間加熱し、剥離層上に厚さ約3μmの樹脂基板を形成し、樹脂基板・剥離層付きガラス基板を得た。その後、紫外可視分光光度計((株)島津製作所製UV−2600)を用いて光透過率を測定した結果、樹脂基板は、400nmで80%以上の透過率を示した。
Embodiment 2-10
The peeling layer was formed by the method similar to Example 2-1 using the composition L1 for peeling layer formation obtained in Example 1-1, and the glass substrate with a peeling layer was obtained.
Thereafter, using a spin coater (conditions: rotation speed: 200 rpm for about 15 seconds), the composition F7 for forming a resin substrate was applied on the release layer (resin thin film) on the glass substrate. The resulting coated film is heated at 80 ° C. for 2 minutes using a hot plate, and then heated at 230 ° C. for 30 minutes using a hot plate to form a resin substrate having a thickness of about 3 μm on the release layer, A resin substrate and a glass substrate with a release layer were obtained. Thereafter, the light transmittance was measured using a UV-visible spectrophotometer (UV-2600 manufactured by Shimadzu Corporation), and as a result, the resin substrate exhibited a transmittance of 80% or more at 400 nm.

[実施例2−11]
実施例1−1で得られた剥離層形成用組成物L1の代わりに、実施例1−2で得られた剥離層形成用組成物L2を用いた以外は、実施例2−10と同様の方法で、剥離層及び樹脂基板を作製し、剥離層付きガラス基板及び樹脂基板・剥離層付きガラス基板を得た。
Example 2-11
Example 2-10 is the same as Example 2-10 except that composition L2 for forming a release layer obtained in Example 1-2 is used instead of composition L1 for forming a release layer obtained in Example 1-1. The peeling layer and the resin substrate were produced by the method, and the glass substrate with a peeling layer and the glass substrate with a resin substrate and a peeling layer were obtained.

[比較例2−1〜2−4]
実施例1−1で得られた剥離層形成用組成物の代わりに、比較例1−1〜1−2で得られた剥離層形成用組成物を用いた以外は、上記実施例と同様の方法で、剥離層及び樹脂基板を作製し、剥離層付きガラス基板及び樹脂基板・剥離層付きガラス基板を得た。剥離層と樹脂基板の組み合わせは表1に示した通りである。
[Comparative Examples 2-1 to 2-4]
Example 11 is the same as the above example except that the composition for forming a release layer obtained in Comparative Examples 1-1 to 1-2 is used instead of the composition for forming a release layer obtained in Example 1-1. The peeling layer and the resin substrate were produced by the method, and the glass substrate with a peeling layer and the glass substrate with a resin substrate and a peeling layer were obtained. The combinations of the release layer and the resin substrate are as shown in Table 1.

[実施例2−12]
スピンコーター(条件:回転数3,000rpmで約30秒)を用いて、実施例1−3で得られた剥離層形成用組成物L3を、ガラス基体としての100mm×100mmガラス基板(以下同様)の上に塗布した。
そして、得られた塗膜を、ホットプレートを用いて80℃で10分間加熱し、その後、オーブンを用いて、300℃で30分間加熱し、加熱温度を400℃まで昇温(10℃/分)し、更に400℃で30分間加熱し、ガラス基板上に厚さ約0.1μmの剥離層を形成し、剥離層付きガラス基板を得た。なお、昇温の間、膜付き基板をオーブンから取り出すことはせず、オーブン内で加熱した。
Example 2-12
A composition L3 for release layer formation obtained in Example 1-3 using a spin coater (conditions: about 30 seconds at a rotation speed of 3,000 rpm) was subjected to 100 mm × 100 mm glass substrate as glass substrate (the same applies to the following) On top of the
Then, the obtained coating film is heated at 80 ° C. for 10 minutes using a hot plate, and then heated for 30 minutes at 300 ° C. using an oven, and the heating temperature is raised to 400 ° C. (10 ° C./minute C. and further heated at 400.degree. C. for 30 minutes to form a release layer having a thickness of about 0.1 .mu.m on the glass substrate to obtain a glass substrate with a release layer. During the temperature rise, the film-coated substrate was heated in the oven without being taken out of the oven.

スピンコーター(条件:回転数800rpmで約10秒)を用いて、上記で得られたガラス基板上の剥離層(樹脂薄膜)の上に樹脂基板形成用組成物F3を塗布した。そして、得られた塗膜を、ホットプレートを用いて80℃で30分間加熱し、その後、オーブンを用いて230℃で30分間加熱し、剥離層上に厚さ約3μmのアクリル基板を形成した。昇温の間、膜付き基板をオーブンから取り出すことはせず、オーブン内で加熱した。   The composition F3 for resin substrate formation was applied on the release layer (resin thin film) on the glass substrate obtained above using a spin coater (conditions: about 10 seconds at a rotation speed of 800 rpm). Then, the obtained coated film was heated at 80 ° C. for 30 minutes using a hot plate, and then heated at 230 ° C. for 30 minutes using an oven to form an acrylic substrate having a thickness of about 3 μm on the release layer. . The film-coated substrate was not removed from the oven during heating, but was heated in the oven.

[実施例2−13]
実施例2−12で用いた樹脂基板形成用組成物F3の代わりに、樹脂基板形成用組成物F4を用いた以外は、実施例2−12と同様の方法で、剥離層及び樹脂基板を作製し、剥離層付きガラス基板及び樹脂基板・剥離層付きガラス基板を得た。
[Example 2-13]
A release layer and a resin substrate were produced in the same manner as in Example 2-12 except that the composition F4 for forming a resin substrate was used instead of the composition F3 for forming a resin substrate used in Example 2-12. A glass substrate with a release layer and a glass substrate with a resin substrate and a release layer were obtained.

[実施例2−14]
実施例2−12で用いた樹脂基板形成用組成物F3の代わりに、樹脂基板形成用組成物F5を用いた以外は、実施例2−12と同様の方法で、剥離層及び樹脂基板を作製し、剥離層付きガラス基板及び樹脂基板・剥離層付きガラス基板を得た。
Example 2-14
A release layer and a resin substrate were produced in the same manner as in Example 2-12 except that the composition F5 for forming a resin substrate was used instead of the composition F3 for forming a resin substrate used in Example 2-12. A glass substrate with a release layer and a glass substrate with a resin substrate and a release layer were obtained.

[実施例2−15]
実施例1−3で得られた剥離層形成用組成物L3の代わりに、実施例1−4で得られた剥離層形成用組成物L4を用いた以外は、実施例2−12と同様の方法で、剥離層及び樹脂基板を作製し、剥離層付きガラス基板及び樹脂基板・剥離層付きガラス基板を得た。
[Example 2-15]
Example 2-12 is similar to Example 2-12 except that composition L4 for forming release layer obtained in Example 1-4 is used instead of composition L3 for forming release layer obtained in Example 1-3. The peeling layer and the resin substrate were produced by the method, and the glass substrate with a peeling layer and the glass substrate with a resin substrate and a peeling layer were obtained.

[実施例2−16]
剥離層形成用組成物として、実施例1−4で得られた剥離層形成用組成物L4を用い、樹脂基板形成用組成物として、実施例2−14で用いた樹脂基板形成用組成物F5を用いて、実施例2−12と同様の方法で、剥離層及び樹脂基板を作製し、剥離層付きガラス基板及び樹脂基板・剥離層付きガラス基板を得た。
[Example 2-16]
Composition F4 for resin substrate formation used in Example 2-14 as the composition for resin substrate formation using composition L4 for peeling layer formation obtained in Example 1-4 as a composition for peeling layer formation A peeling layer and a resin substrate were produced using the same method as in Example 2-12, to obtain a glass substrate with a peeling layer and a glass substrate with a resin substrate and a peeling layer.

[実施例2−17]
実施例1−3で得られた剥離層形成用組成物L3を用いて、実施例2−12と同様の方法で剥離層を形成し、剥離層付きガラス基板を得た。
その後、すぐにスピンコータ(条件:回転数200rpmで約15秒)を用いて、前記ガラス基板上の剥離層(樹脂薄膜)の上に樹脂基板形成用組成物F6を塗布した。得られた塗膜を、ホットプレートを用いて80℃で2分間加熱し、その後、ホットプレートを用いて230℃で30分間加熱し、剥離層上に厚さ約3μmの樹脂基板を形成し、樹脂基板・剥離層付きガラス基板を得た。その後、紫外可視分光光度計((株)島津製作所製UV−2600)を用いて光透過率を測定した結果、樹脂基板は、400nmで80%以上の透過率を示した。
[Example 2-17]
Using the composition L3 for release layer formation obtained in Example 1-3, a release layer was formed in the same manner as in Example 2-12, to obtain a glass substrate with a release layer.
Thereafter, using a spin coater (conditions: rotation speed: 200 rpm for about 15 seconds), the composition F6 for forming a resin substrate was applied on the release layer (resin thin film) on the glass substrate. The resulting coated film is heated at 80 ° C. for 2 minutes using a hot plate, and then heated at 230 ° C. for 30 minutes using a hot plate to form a resin substrate having a thickness of about 3 μm on the release layer, A resin substrate and a glass substrate with a release layer were obtained. Thereafter, the light transmittance was measured using a UV-visible spectrophotometer (UV-2600 manufactured by Shimadzu Corporation), and as a result, the resin substrate exhibited a transmittance of 80% or more at 400 nm.

[実施例2−18]
実施例1−3で得られた剥離層形成用組成物L3の代わりに、実施例1−4で得られた剥離層形成用組成物L4を用いた以外は、実施例2−17と同様の方法で、剥離層及び樹脂基板を作製し、剥離層付きガラス基板及び樹脂基板・剥離層付きガラス基板を得た。
[Example 2-18]
Example 2-17 is the same as Example 2-17 except that the composition L4 for forming a peeling layer obtained in Example 1-4 is used instead of the composition L3 for forming a peeling layer obtained in Example 1-3. The peeling layer and the resin substrate were produced by the method, and the glass substrate with a peeling layer and the glass substrate with a resin substrate and a peeling layer were obtained.

[実施例2−19]
実施例1−3で得られた剥離層形成用組成物L3を用いて、実施例2−12と同様の方法で剥離層を形成し、剥離層付きガラス基板を得た。
その後、すぐにスピンコータ(条件:回転数200rpmで約15秒)を用いて、前記ガラス基板上の剥離層(樹脂薄膜)の上に樹脂基板形成用組成物F7を塗布した。得られた塗膜を、ホットプレートを用いて80℃で2分間加熱し、その後、ホットプレートを用いて230℃で30分間加熱し、剥離層上に厚さ約3μmの樹脂基板を形成し、樹脂基板・剥離層付きガラス基板を得た。その後、紫外可視分光光度計((株)島津製作所製UV−2600)を用いて光透過率を測定した結果、樹脂基板は、400nmで80%以上の透過率を示した。
[Example 2-19]
Using the composition L3 for release layer formation obtained in Example 1-3, a release layer was formed in the same manner as in Example 2-12, to obtain a glass substrate with a release layer.
Thereafter, using a spin coater (conditions: rotation speed: 200 rpm for about 15 seconds), the composition F7 for forming a resin substrate was applied on the release layer (resin thin film) on the glass substrate. The resulting coated film is heated at 80 ° C. for 2 minutes using a hot plate, and then heated at 230 ° C. for 30 minutes using a hot plate to form a resin substrate having a thickness of about 3 μm on the release layer, A resin substrate and a glass substrate with a release layer were obtained. Thereafter, the light transmittance was measured using a UV-visible spectrophotometer (UV-2600 manufactured by Shimadzu Corporation), and as a result, the resin substrate exhibited a transmittance of 80% or more at 400 nm.

[実施例2−20]
実施例1−3で得られた剥離層形成用組成物L3の代わりに、実施例1−4で得られた剥離層形成用組成物L4を用いた以外は、実施例2−19と同様の方法で、剥離層及び樹脂基板を作製し、剥離層付きガラス基板及び樹脂基板・剥離層付きガラス基板を得た。
[Example 2-20]
Example 2-19 is the same as Example 2-19 except that the composition L4 for forming a release layer obtained in Example 1-4 is used instead of the composition L3 for forming a release layer obtained in Example 1-3. The peeling layer and the resin substrate were produced by the method, and the glass substrate with a peeling layer and the glass substrate with a resin substrate and a peeling layer were obtained.

[比較例2−5]
実施例1−3で得られた剥離層形成用組成物L3の代わりに、比較例1−1で得られた剥離層形成用組成物HL1を用いた以外は、実施例2−12と同様の方法で、剥離層及び樹脂基板を作製し、剥離層付きガラス基板及び樹脂基板・剥離層付きガラス基板を得た。剥離層と樹脂基板の組み合わせは表2に示した通りである。
[Comparative Example 2-5]
Example 2-12 is the same as Example 2-12 except that the composition for forming a release layer HL1 obtained in Comparative Example 1-1 is used instead of the composition L3 for forming a release layer obtained in Example 1-3. The peeling layer and the resin substrate were produced by the method, and the glass substrate with a peeling layer and the glass substrate with a resin substrate and a peeling layer were obtained. The combination of the release layer and the resin substrate is as shown in Table 2.

[比較例2−6]
剥離層形成用組成物として、比較例1−2で得られた剥離層形成用組成物HL2を用い、樹脂基板形成用組成物として、実施例2−13で用いた樹脂基板形成用組成物F4を用いて、実施例2−12と同様の方法で、剥離層及び樹脂基板を作製し、剥離層付きガラス基板及び樹脂基板・剥離層付きガラス基板を得た。
Comparative Example 2-6
Composition F4 for resin substrate formation used in Example 2-13 as a composition for resin substrate formation using composition HL2 for release layer formation obtained in Comparative Example 1-2 as a composition for peeling layer formation A peeling layer and a resin substrate were produced using the same method as in Example 2-12, to obtain a glass substrate with a peeling layer and a glass substrate with a resin substrate and a peeling layer.

[7]剥離層の溶剤耐性の評価
得られた実施例2−1〜2−20、比較例2−1〜2−6で作製した剥離層付きガラス基板の剥離層上にNMPとPGMEをピペットを用いて0.1ml滴下した。1分後、該剥離層を純水で洗浄した後、溶剤を滴下した部分の剥離層の状態を目視で観察して、剥離層の溶剤耐性を評価した。判定基準は以下の通りである。結果を表1及び表2に示す。
<判定基準>
○:特に液滴の跡も見られず、溶解がみられない。
△:液滴の跡がみられるが、残膜がみられる。
×:溶解している。
剥離層が、滴下した溶媒に溶解しないことは、剥離層上に樹脂基板を形成した際に、樹脂基板形成用組成物に含まれる有機溶剤に溶解しないことを意味し、ガラス基板から樹脂基板を損傷することなく剥離できることを意味する。
[7] Evaluation of Solvent Resistance of Release Layer A pipette of NMP and PGME on the release layer of the release layer-provided glass substrate prepared in Examples 2-1 to 2-20 and Comparative Examples 2-1 to 2-6 obtained 0.1 ml was dripped using. After one minute, the release layer was washed with pure water, and the state of the release layer in the portion to which the solvent was dropped was visually observed to evaluate the solvent resistance of the release layer. The judgment criteria are as follows. The results are shown in Tables 1 and 2.
<Judgment criteria>
:: No trace of droplets was observed, and no dissolution was observed.
Δ: Traces of droplets are observed, but residual film is observed.
X: dissolved
The fact that the release layer is not dissolved in the dropped solvent means that when the resin substrate is formed on the release layer, it does not dissolve in the organic solvent contained in the composition for forming a resin substrate, and from the glass substrate to the resin substrate It means that it can be peeled off without being damaged.

[8]剥離性の評価
上記実施例2−1〜2−20及び比較例2−1〜2−6で得られた樹脂基板・剥離層付きガラス基板について、剥離層とガラス基板との剥離性を、下記手法にて確認した。なお、下記の試験は、同一のガラス基板で行った。
[8] Evaluation of releasability The releasability between the release layer and the glass substrate for the resin substrate / release layer-attached glass substrate obtained in Examples 2-1 to 2-20 and Comparative Examples 2-1 to 2-6. Were confirmed by the following method. In addition, the following test was done with the same glass substrate.

<剥離層とガラス基板との剥離性評価>
実施例2−1〜2−20及び比較例2−1〜2−6で得られた剥離層付きガラス基板上の剥離層をクロスカット(縦横1mm間隔、以下同様)し、100マスカットを行った。すなわち、このクロスカットにより、1mm四方のマス目を100個形成した。
そして、この100マスカット部分に粘着テープを張り付けて、そのテープを剥がし、以下の基準(5B〜0B,B,A,AA)に基づき、剥離の程度を評価した。
更に、全て剥離した基板のうち、実施例2−5〜2−20で作製した樹脂基板・剥離層付きガラス基板を用いて、剥離力評価試験を実施した。試験方法は、樹脂基板・剥離層付きガラス基板の樹脂基板を25mm×50mm幅の長方形に、カッターナイフにて樹脂基板の背面まで貫通するように切り込みを入れ、短冊を作製した。更に、作製した短冊上に、セロハンテープ(ニチバンCT−24)をはった後、オートグラフAG−500N((株)島津製作所製)を用いて、基板の面に対して90度で、すなわち、垂直方向に剥離し、剥離力を測定し、100%剥離(すべて剥離)で、なおかつ剥離力が0.1N/25mm未満のものをAAAとした。
以上の結果を表1及び表2に示す。
<判定基準>
5B:0%剥離(剥離なし)
4B:5%未満の剥離
3B:5〜15%未満の剥離
2B:15〜35%未満の剥離
1B:35〜65%未満の剥離
0B:65%〜80%未満の剥離
B:80%〜95%未満の剥離
A:95%〜100%未満の剥離
AA:100%剥離(すべて剥離)
AAA:100%剥離で剥離力が0.1N/25mm未満
<Evaluation of peelability between peelable layer and glass substrate>
The release layers on the release layer-provided glass substrates obtained in Examples 2-1 to 2-20 and Comparative Examples 2-1 to 2-6 were cross cut (at intervals of 1 mm in length and width, the same applies hereinafter), and 100 mass cut was performed. . That is, 100 squares of 1 mm square were formed by this cross cut.
Then, a pressure-sensitive adhesive tape was attached to the 100 mass cut portion, the tape was peeled off, and the degree of peeling was evaluated based on the following criteria (5B to 0B, B, A, AA).
Furthermore, the peeling force evaluation test was implemented using the resin substrate * glass substrate with a peeling layer produced in Example 2-5-2-20 among the board | substrates which peeled completely. In the test method, a resin substrate of a resin substrate and a peeling substrate with a peeling layer was cut into a rectangle of 25 mm × 50 mm width so as to penetrate to the back surface of the resin substrate with a cutter knife to produce a strip. Furthermore, after putting cellophane tape (Nichiban CT-24) on the produced strip, an autograph AG-500N (manufactured by Shimadzu Corp.) is used, and it is at 90 degrees to the surface of the substrate, that is, The peeling was measured in the vertical direction, and the peeling force was measured, and the one having 100% peeling (all peeling) and having a peeling force of less than 0.1 N / 25 mm was taken as AAA.
The above results are shown in Tables 1 and 2.
<Judgment criteria>
5B: 0% peeling (without peeling)
4B: less than 5% peeling 3B: less than 5-15% peeling 2B: 15-35% peeling 1B: less than 35-65% peeling 0B: 65% to less than 80% peeling B: 80% to 95 % Peeling A: 95% to 100% peeling AA: 100% peeling (all peeling)
AAA: Peeling force less than 0.1 N / 25 mm at 100% peeling

<剥離層と樹脂基板との剥離性評価>
実施例2−1〜2−20及び比較例2−1〜2−6で得られた樹脂基板・剥離層付きガラス基板について、上記の剥離性評価と同様の手順でその剥離性を評価した。結果を表1及び表2に示す。
<Evaluation of peelability between peelable layer and resin substrate>
The peelability of the glass substrates with resin substrates and peelable layers obtained in Examples 2-1 to 2-20 and Comparative Examples 2-1 to 2-6 was evaluated in the same manner as the above-described peelability evaluation. The results are shown in Tables 1 and 2.

Figure 2018025953
Figure 2018025953

Figure 2018025953
Figure 2018025953

表1及び表2に示される通り、実施例2−1〜2−20の剥離層は、ガラス基板との密着性にすぐれており、樹脂膜とは容易にはがれることが確認された。また、溶解性試験の結果から、樹脂基板形成用組成物に含まれる有機溶媒に溶解することもないことも確認された。
一方、比較例2−1〜2−6の剥離層は、ガラス基板との密着性に優れるが、樹脂基板との剥離性に劣っていることが確認された。
As shown in Tables 1 and 2, it was confirmed that the peeling layers of Examples 2-1 to 2-20 were excellent in the adhesion to the glass substrate and easily peeled off with the resin film. Moreover, it was also confirmed from the result of the solubility test that it did not melt | dissolve in the organic solvent contained in the composition for resin substrate formation.
On the other hand, although the peeling layer of Comparative Examples 2-1 to 2-6 is excellent in the adhesiveness with a glass substrate, it was confirmed that it is inferior to the peelability with a resin substrate.

従って、本発明は下記の剥離層形成用組成物及び剥離層を提供する。
[1]下記式(1)で表されるポリアミック酸と有機溶媒とを含むことを特徴とする剥離層形成用組成物。

Figure 2018025953
(式中、Xは、下記式(2a)又は(2b)で表される芳香族基を表し、Yは、フッ素原子を有する2価の芳香族基を表し、Zは、Xが式(2a)で表される芳香族基である場合、互いに独立して、下記式(3a)又は(4a)で表される芳香族基を表し、Xが式(2b)で表される芳香族基である場合、互いに独立して、下記式(3b)又は(4b)で表される芳香族基を表し、mは、自然数を表す。)
Figure 2018025953
Figure 2018025953
[2]上記Yが、下記式(5)で表される芳香族基である[1]記載の剥離層形成用組成物。
Figure 2018025953
[3]上記Yが、下記式(6)で表される芳香族基である[2]記載の剥離層形成用組成物。
Figure 2018025953
[4]上記Xにおいて、上記式(2a)で表される芳香族基が、下記式(7a)又は(8a)で表される芳香族基であり、上記Zが、互いに独立して、下記式(9a)又は式(10a)で表される芳香族基である[1]〜[3]のいずれかに記載の剥離層形成用組成物。
Figure 2018025953

Figure 2018025953

[5]上記Xにおいて、上記式(2b)で表される芳香族基が、下記式(7b)又は(8b)で表される芳香族基であり、上記Zが、互いに独立して、下記式(9b)又は式(10b)で表される芳香族基である[1]〜[3]のいずれかに記載の剥離層形成用組成物。
Figure 2018025953

Figure 2018025953

[6]上記有機溶媒が、下記式(S1)〜(S7)で表される構造を有するものから選ばれる少なくとも1種である[1]〜[5]のいずれかに記載の剥離層形成用組成物。
Figure 2018025953
(式中、R1〜R8は、互いに独立して、水素原子、又は炭素数1〜10のアルキル基を表し、R9及びR10は、互いに独立して、水素原子、炭素数1〜10のアルキル基、又は炭素数1〜10のアシル基を表し、b及びnは自然数を表す)
[7]上記有機溶媒が、プロピレングリコールモノメチルエーテル又はプロピレングリコールモノメチルエーテルアセテートである[6]記載の剥離層形成用組成物。
[8][1]〜[7]のいずれかに記載の剥離層形成用組成物を用いて形成される剥離層。
[9][8]記載の剥離層を用いる樹脂基板の製造方法。
[10]上記樹脂基板が、ポリイミド樹脂基板又は波長400nmの光透過率が80%以上である樹脂基板である[9]記載の製造方法。 Accordingly, the present invention provides the following release layer-forming composition and release layer.
[1] A composition for forming a release layer, comprising a polyamic acid represented by the following formula (1) and an organic solvent.
Figure 2018025953
(Wherein, X represents an aromatic group represented by the following formula (2a) or (2b), Y represents a divalent aromatic group having a fluorine atom, and Z represents X having the formula (2a) When it is an aromatic group represented by), each of them independently represents an aromatic group represented by the following formula (3a) or (4a), and X is an aromatic group represented by the formula (2b) In some cases, each independently represents an aromatic group represented by the following formula (3b) or (4b), and m represents a natural number.)
Figure 2018025953
Figure 2018025953
[2] The composition for forming a release layer according to [1], wherein Y is an aromatic group represented by the following formula (5).
Figure 2018025953
[3] The composition for forming a release layer according to [2], wherein Y is an aromatic group represented by the following formula (6).
Figure 2018025953
[4] In the above X, the aromatic group represented by the above formula (2a) is an aromatic group represented by the following formula (7a) or (8a), and the above Z is independently from each other: The composition for peeling layer formation in any one of [1]-[3] which is an aromatic group represented by Formula (9a) or Formula (10a).
Figure 2018025953

Figure 2018025953

[5] In the above X, the aromatic group represented by the above formula (2b) is an aromatic group represented by the following formula (7b) or (8b), and the above Z is independently from each other: The composition for peeling layer formation in any one of [1]-[3] which is an aromatic group represented by Formula (9b) or Formula (10b).
Figure 2018025953

Figure 2018025953

[6] The release layer according to any one of [1] to [5], wherein the organic solvent is at least one selected from those having a structure represented by the following formulas (S1) to (S7) Composition.
Figure 2018025953
(Wherein, R 1 to R 8 each independently represent a hydrogen atom or an alkyl group having 1 to 10 carbon atoms, and R 9 and R 10 each independently represent a hydrogen atom or 1 to 4 carbon atoms 10 alkyl groups or C1-10 acyl groups, b and n represent natural numbers)
[7] The composition for forming a release layer according to [6], wherein the organic solvent is propylene glycol monomethyl ether or propylene glycol monomethyl ether acetate.
The peeling layer formed using the composition for peeling layer formation in any one of [8] [1]-[7].
The manufacturing method of the resin substrate using the peeling layer as described in [9] [8].
[10] The method according to [9], wherein the resin substrate is a polyimide resin substrate or a resin substrate having a light transmittance of 80% or more at a wavelength of 400 nm.

Figure 2018025953
Figure 2018025953

Claims (10)

下記式(1)で表されるポリアミック酸と有機溶媒とを含むことを特徴とする剥離層形成用組成物。
Figure 2018025953
(式中、Xは、下記式(2a)又は(2b)で表される芳香族基を表し、Yは、フッ素原子を有する2価の芳香族基を表し、Zは、Xが式(2a)で表される芳香族基である場合、互いに独立して、下記式(3a)又は(4a)で表される芳香族基を表し、Xが式(2b)で表される芳香族基である場合、互いに独立して、下記式(3b)又は(4b)で表される芳香族基を表し、mは、自然数を表す。)
Figure 2018025953
Figure 2018025953
The composition for peeling layer formation characterized by including the polyamic acid and organic solvent which are represented by following formula (1).
Figure 2018025953
(Wherein, X represents an aromatic group represented by the following formula (2a) or (2b), Y represents a divalent aromatic group having a fluorine atom, and Z represents X having the formula (2a) When it is an aromatic group represented by), each of them independently represents an aromatic group represented by the following formula (3a) or (4a), and X is an aromatic group represented by the formula (2b) In some cases, each independently represents an aromatic group represented by the following formula (3b) or (4b), and m represents a natural number.)
Figure 2018025953
Figure 2018025953
上記Yが、下記式(5)で表される芳香族基である請求項1記載の剥離層形成用組成物。
Figure 2018025953
The composition for release layer formation according to claim 1, wherein Y is an aromatic group represented by the following formula (5).
Figure 2018025953
上記Yが、下記式(6)で表される芳香族基である請求項2記載の剥離層形成用組成物。
Figure 2018025953
The composition for release layer formation according to claim 2, wherein Y is an aromatic group represented by the following formula (6).
Figure 2018025953
上記Xにおいて、上記式(2a)で表される芳香族基が、下記式(7a)又は(8a)で表される芳香族基であり、上記Zが、互いに独立して、下記式(9a)又は式(10a)で表される芳香族基である請求項1〜3のいずれか1項記載の剥離層形成用組成物。
Figure 2018025953
Figure 2018025953
In the above-mentioned X, the aromatic group represented by the above-mentioned formula (2a) is an aromatic group represented by the following formula (7a) or (8a), and the above-mentioned Z are independently from each other: The composition for forming a release layer according to any one of claims 1 to 3, which is an aromatic group represented by the formula (10a) or (10a).
Figure 2018025953
Figure 2018025953
上記Xにおいて、上記式(2b)で表される芳香族基が、下記式(7b)又は(8b)で表される芳香族基であり、上記Zが、互いに独立して、下記式(9b)又は式(10b)で表される芳香族基である請求項1〜3のいずれか1項記載の剥離層形成用組成物。
Figure 2018025953
Figure 2018025953
In the above-mentioned X, the aromatic group represented by the above-mentioned formula (2b) is an aromatic group represented by the following formula (7b) or (8b), and the above-mentioned Z are independently from each other: The composition for forming a release layer according to any one of claims 1 to 3, which is an aromatic group represented by the formula (10b) or (10b).
Figure 2018025953
Figure 2018025953
上記有機溶媒が、下記式(S1)〜(S7)で表される構造を有するものから選ばれる少なくとも1種である請求項1〜5のいずれか1項記載の剥離層形成用組成物。
Figure 2018025953
(式中、R1〜R8は、互いに独立して、水素原子、又は炭素数1〜10のアルキル基を表し、R9及びR10は、互いに独立して、水素原子、炭素数1〜10のアルキル基、又は炭素数1〜10のアシル基を表し、b及びnは自然数を表す)
The composition according to any one of claims 1 to 5, wherein the organic solvent is at least one selected from those having a structure represented by the following formulas (S1) to (S7).
Figure 2018025953
(Wherein, R 1 to R 8 each independently represent a hydrogen atom or an alkyl group having 1 to 10 carbon atoms, and R 9 and R 10 each independently represent a hydrogen atom or 1 to 4 carbon atoms 10 alkyl groups or C1-10 acyl groups, b and n represent natural numbers)
上記有機溶媒が、プロピレングリコールモノメチルエーテル又はプロピレングリコールモノメチルエーテルアセテートである請求項6記載の剥離層形成用組成物。   The composition according to claim 6, wherein the organic solvent is propylene glycol monomethyl ether or propylene glycol monomethyl ether acetate. 請求項1〜7のいずれか1項記載の剥離層形成用組成物を用いて形成される剥離層。   The peeling layer formed using the composition for peeling layer formation of any one of Claims 1-7. 請求項8記載の剥離層を用いる樹脂基板の製造方法。   The manufacturing method of the resin substrate using the peeling layer of Claim 8. 上記樹脂基板が、ポリイミド樹脂基板又は波長400nmの光透過率が80%以上である樹脂基板である請求項9記載の製造方法。   10. The method according to claim 9, wherein the resin substrate is a polyimide resin substrate or a resin substrate having a light transmittance of 80% or more at a wavelength of 400 nm.
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