JPWO2017174391A5 - - Google Patents

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Publication number
JPWO2017174391A5
JPWO2017174391A5 JP2018552191A JP2018552191A JPWO2017174391A5 JP WO2017174391 A5 JPWO2017174391 A5 JP WO2017174391A5 JP 2018552191 A JP2018552191 A JP 2018552191A JP 2018552191 A JP2018552191 A JP 2018552191A JP WO2017174391 A5 JPWO2017174391 A5 JP WO2017174391A5
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JP
Japan
Prior art keywords
transmit
probe
inspection
receive
initial
Prior art date
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Application number
JP2018552191A
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English (en)
Japanese (ja)
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JP7122973B2 (ja
JP2019516093A5 (ko
JP2019516093A (ja
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Priority claimed from DE102016205548.8A external-priority patent/DE102016205548A1/de
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Publication of JP2019516093A publication Critical patent/JP2019516093A/ja
Publication of JP2019516093A5 publication Critical patent/JP2019516093A5/ja
Publication of JPWO2017174391A5 publication Critical patent/JPWO2017174391A5/ja
Application granted granted Critical
Publication of JP7122973B2 publication Critical patent/JP7122973B2/ja
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JP2018552191A 2016-04-04 2017-03-27 超音波プローブおよび超音波検査システム Active JP7122973B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102016205548.8 2016-04-04
DE102016205548.8A DE102016205548A1 (de) 2016-04-04 2016-04-04 Ultraschall-Prüfkopf und Ultraschall-Prüfanlage
PCT/EP2017/057227 WO2017174391A1 (de) 2016-04-04 2017-03-27 Ultraschall-prüfkopf und ultraschall-prüfanlage

Publications (4)

Publication Number Publication Date
JP2019516093A JP2019516093A (ja) 2019-06-13
JP2019516093A5 JP2019516093A5 (ko) 2021-05-13
JPWO2017174391A5 true JPWO2017174391A5 (ko) 2022-03-10
JP7122973B2 JP7122973B2 (ja) 2022-08-22

Family

ID=58448525

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018552191A Active JP7122973B2 (ja) 2016-04-04 2017-03-27 超音波プローブおよび超音波検査システム

Country Status (7)

Country Link
EP (1) EP3440458A1 (ko)
JP (1) JP7122973B2 (ko)
KR (1) KR102339444B1 (ko)
CN (1) CN109196349A (ko)
DE (1) DE102016205548A1 (ko)
RU (1) RU2732102C2 (ko)
WO (1) WO2017174391A1 (ko)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102019211479A1 (de) * 2019-07-31 2021-02-04 Institut Dr. Foerster Gmbh & Co. Kg Prüfkopfanordnung für eine Prüfanlage sowie Prüfanlage
KR20210086323A (ko) 2019-12-31 2021-07-08 주식회사 에스아이웨어 비파괴 검사체 결함 검사장치 및 이를 이용한 결함 검사방법
KR102437221B1 (ko) 2020-08-26 2022-08-29 한국표준과학연구원 휴대용 판상소재 내부 균열 영상화장치

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE521715A (ko) * 1952-07-25
DE2421429C2 (de) * 1974-05-03 1988-06-16 Krautkrämer, GmbH, 5000 Köln Ultraschallprüfkopf für die zerstörungsfreie Materialprüfung von Blechen nach dem Impulsecho-Laufzeitverfahren
JPS547998Y2 (ko) * 1974-05-10 1979-04-13
JPS52137390A (en) * 1976-05-12 1977-11-16 Nippon Steel Corp Compound searching contacter
JPS598189Y2 (ja) * 1979-06-19 1984-03-13 三菱電機株式会社 超音波探触子ユニット
DE3048710A1 (de) * 1980-12-23 1982-07-15 GAO Gesellschaft für Automation und Organisation mbH, 8000 München "verfahren zur pruefung des flaechengewichts von duennem material"
DE3442751A1 (de) * 1984-11-23 1986-06-05 Gerhard Dipl.-Ing. 3352 Einbeck Meurer Mit ultraschall arbeitende pruefanlage fuer flachliegend auf einem rollgang gefoerderte bleche unterschiedlicher breite
DE3720574A1 (de) * 1987-06-22 1989-01-05 Deutsch Pruef Messgeraete Ultraschall-mehrfachpruefkopf
JPH0467857A (ja) * 1990-07-06 1992-03-03 Toshiba Corp 超音波診断装置
DE19533466A1 (de) * 1995-09-11 1996-09-12 Siemens Ag Ultraschallprüfkopf für die zerstörungsfreie Werkstoffprüfung
JP3282472B2 (ja) * 1995-11-27 2002-05-13 三菱電機株式会社 複合型探触子装置
US6666825B2 (en) * 2001-07-05 2003-12-23 General Electric Company Ultrasound transducer for improving resolution in imaging system
US7415881B2 (en) * 2004-08-19 2008-08-26 Fife Corporation Ultrasonic sensor system for web-guiding apparatus
JP2007047092A (ja) * 2005-08-11 2007-02-22 Non-Destructive Inspection Co Ltd 超音波探触子並びにこれを有する超音波試験装置及びこれを用いた超音波試験方法
CN2938089Y (zh) * 2006-07-28 2007-08-22 卢明熙 中厚钢板超声波探伤专用双晶直探头
DE102008002859A1 (de) * 2008-05-28 2009-12-03 Ge Inspection Technologies Gmbh Vorrichtung und Verfahren zur zerstörungsfreien Prüfung von Gegenständen mittels Ultraschall sowie Verwendung von Matrix-Phased-Array-Prüfköpfen
CN101413927A (zh) * 2008-09-02 2009-04-22 周南岐 双斜换能器
JP5419424B2 (ja) * 2008-11-14 2014-02-19 三菱重工業株式会社 非破壊検査装置および非破壊検査方法
FR2947633B1 (fr) * 2009-07-02 2012-04-13 Snecma Dispositif de controle non destructif d'une piece

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