JPWO2017014194A1 - 光検査システム及び画像処理アルゴリズム設定方法 - Google Patents
光検査システム及び画像処理アルゴリズム設定方法 Download PDFInfo
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- JPWO2017014194A1 JPWO2017014194A1 JP2017529884A JP2017529884A JPWO2017014194A1 JP WO2017014194 A1 JPWO2017014194 A1 JP WO2017014194A1 JP 2017529884 A JP2017529884 A JP 2017529884A JP 2017529884 A JP2017529884 A JP 2017529884A JP WO2017014194 A1 JPWO2017014194 A1 JP WO2017014194A1
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- 230000003287 optical effect Effects 0.000 title claims description 30
- 238000000034 method Methods 0.000 title claims description 12
- 230000005540 biological transmission Effects 0.000 claims abstract description 31
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- 239000000463 material Substances 0.000 claims description 10
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
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Abstract
Description
Claims (6)
- 物品に光を照射する光照射部と、
前記物品を透過した光を検出する光検出部と、
前記光検出部から出力された信号に基づいて光透過画像を生成し、前記光透過画像に画像処理を施して処理画像を生成し、前記処理画像に基づいて前記物品の検査を行う検査部と、
検査条件を指標として分類された複数の画像処理アルゴリズムのうち、オペレータによって指定された前記検査条件に対応する少なくとも1つの前記画像処理アルゴリズムを提示するアルゴリズム提示部と、
前記アルゴリズム提示部によって提示された少なくとも1つの前記画像処理アルゴリズムのうち、前記オペレータによって選択された前記画像処理アルゴリズムを設定するアルゴリズム設定部と、を備え、
前記検査部は、前記アルゴリズム設定部によって設定された前記画像処理アルゴリズムに基づいて前記光透過画像に前記画像処理を施して前記処理画像を生成する、光検査システム。 - 前記検査条件は、前記物品の種類、前記物品に含まれ得る異物の種類、前記光透過画像における濃淡、及び前記光照射部の光照射出力の少なくとも1つを含む、請求項1記載の光検査システム。
- 前記物品の種類は、前記物品の材料、形状及び大きさの少なくとも1つの種類を含む、請求項2記載の光検査システム。
- 前記異物の種類は、前記異物の材料、形状及び大きさの少なくとも1つの種類を含む、請求項2又は3記載の光検査システム。
- 前記処理画像を表示する表示部を更に備える、請求項1〜4のいずれか一項記載の光検査システム。
- 光検査システムにおいて実施される画像処理アルゴリズム設定方法であって、
検査条件を指標として分類された複数の画像処理アルゴリズムのうち、オペレータによって指定された前記検査条件に対応する少なくとも1つの前記画像処理アルゴリズムを提示するステップと、
提示された少なくとも1つの前記画像処理アルゴリズムのうち、前記オペレータによって選択された前記画像処理アルゴリズムを設定するステップと、を含む、画像処理アルゴリズム設定方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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JP2015143161 | 2015-07-17 | ||
JP2015143161 | 2015-07-17 | ||
PCT/JP2016/071030 WO2017014194A1 (ja) | 2015-07-17 | 2016-07-15 | 光検査システム及び画像処理アルゴリズム設定方法 |
Publications (2)
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JPWO2017014194A1 true JPWO2017014194A1 (ja) | 2018-04-26 |
JP6746142B2 JP6746142B2 (ja) | 2020-08-26 |
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EP3754594A4 (en) * | 2018-02-14 | 2021-11-17 | ISHIDA CO., Ltd. | INSPECTION DEVICE |
JP6863326B2 (ja) * | 2018-03-29 | 2021-04-21 | 日本電気株式会社 | 選別支援装置、選別支援システム、選別支援方法及びプログラム |
JP2021012098A (ja) * | 2019-07-05 | 2021-02-04 | 株式会社イシダ | 検査装置 |
US12046446B2 (en) * | 2019-09-04 | 2024-07-23 | Hitachi High-Tech Corporation | Charged particle beam device |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
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US7012256B1 (en) * | 2001-12-21 | 2006-03-14 | National Recovery Technologies, Inc. | Computer assisted bag screening system |
JP2012137387A (ja) * | 2010-12-27 | 2012-07-19 | Anritsu Sanki System Co Ltd | X線検査装置 |
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JP6480171B2 (ja) * | 2014-12-12 | 2019-03-06 | アンリツインフィビス株式会社 | X線検査装置 |
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Patent Citations (2)
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US7012256B1 (en) * | 2001-12-21 | 2006-03-14 | National Recovery Technologies, Inc. | Computer assisted bag screening system |
JP2012137387A (ja) * | 2010-12-27 | 2012-07-19 | Anritsu Sanki System Co Ltd | X線検査装置 |
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