JPWO2017002670A1 - シリコン材料の切断補助装置、切断方法、切断システム - Google Patents
シリコン材料の切断補助装置、切断方法、切断システム Download PDFInfo
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- JPWO2017002670A1 JPWO2017002670A1 JP2017526299A JP2017526299A JPWO2017002670A1 JP WO2017002670 A1 JPWO2017002670 A1 JP WO2017002670A1 JP 2017526299 A JP2017526299 A JP 2017526299A JP 2017526299 A JP2017526299 A JP 2017526299A JP WO2017002670 A1 JPWO2017002670 A1 JP WO2017002670A1
- Authority
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- Prior art keywords
- cutting
- silicon material
- silicon
- electrolyzed water
- gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005520 cutting process Methods 0.000 title claims abstract description 136
- 239000002210 silicon-based material Substances 0.000 title claims abstract description 76
- 238000000034 method Methods 0.000 title claims description 22
- 239000002173 cutting fluid Substances 0.000 claims abstract description 79
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 59
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 89
- 229910052710 silicon Inorganic materials 0.000 claims description 89
- 239000010703 silicon Substances 0.000 claims description 89
- 239000007788 liquid Substances 0.000 claims description 58
- 239000007864 aqueous solution Substances 0.000 claims description 20
- 239000000203 mixture Substances 0.000 claims description 14
- 239000003792 electrolyte Substances 0.000 claims description 13
- 239000007789 gas Substances 0.000 claims description 13
- 150000003839 salts Chemical class 0.000 claims description 12
- FAPWRFPIFSIZLT-UHFFFAOYSA-M Sodium chloride Chemical compound [Na+].[Cl-] FAPWRFPIFSIZLT-UHFFFAOYSA-M 0.000 claims description 10
- 150000003863 ammonium salts Chemical class 0.000 claims description 5
- 150000004649 carbonic acid derivatives Chemical class 0.000 claims description 5
- 150000003841 chloride salts Chemical class 0.000 claims description 5
- 150000002823 nitrates Chemical class 0.000 claims description 5
- 229910052708 sodium Inorganic materials 0.000 claims description 5
- 239000011780 sodium chloride Substances 0.000 claims description 5
- LSNNMFCWUKXFEE-UHFFFAOYSA-L sulfite Chemical class [O-]S([O-])=O LSNNMFCWUKXFEE-UHFFFAOYSA-L 0.000 claims description 5
- 150000003467 sulfuric acid derivatives Chemical class 0.000 claims description 5
- 239000011261 inert gas Substances 0.000 claims description 4
- 239000011259 mixed solution Substances 0.000 claims 1
- 239000002699 waste material Substances 0.000 description 35
- BWHMMNNQKKPAPP-UHFFFAOYSA-L potassium carbonate Chemical compound [K+].[K+].[O-]C([O-])=O BWHMMNNQKKPAPP-UHFFFAOYSA-L 0.000 description 11
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 9
- 239000002826 coolant Substances 0.000 description 9
- 238000003825 pressing Methods 0.000 description 8
- 239000000463 material Substances 0.000 description 6
- 239000011734 sodium Substances 0.000 description 6
- 229920000049 Carbon (fiber) Polymers 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical group O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
- 239000004917 carbon fiber Substances 0.000 description 5
- 150000002334 glycols Chemical class 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 5
- 229910052814 silicon oxide Inorganic materials 0.000 description 5
- 239000007787 solid Substances 0.000 description 5
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 4
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 4
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 4
- 239000002131 composite material Substances 0.000 description 4
- 239000001257 hydrogen Substances 0.000 description 4
- 229910052739 hydrogen Inorganic materials 0.000 description 4
- 239000002101 nanobubble Substances 0.000 description 4
- 230000033116 oxidation-reduction process Effects 0.000 description 4
- 229910000027 potassium carbonate Inorganic materials 0.000 description 4
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 3
- 229910004298 SiO 2 Inorganic materials 0.000 description 3
- 239000000853 adhesive Substances 0.000 description 3
- 230000001070 adhesive effect Effects 0.000 description 3
- MTHSVFCYNBDYFN-UHFFFAOYSA-N diethylene glycol Chemical compound OCCOCCO MTHSVFCYNBDYFN-UHFFFAOYSA-N 0.000 description 3
- 238000003754 machining Methods 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 230000001590 oxidative effect Effects 0.000 description 3
- 239000002994 raw material Substances 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- BVKZGUZCCUSVTD-UHFFFAOYSA-L Carbonate Chemical compound [O-]C([O-])=O BVKZGUZCCUSVTD-UHFFFAOYSA-L 0.000 description 2
- 238000001069 Raman spectroscopy Methods 0.000 description 2
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 2
- 239000003513 alkali Substances 0.000 description 2
- 150000001721 carbon Chemical class 0.000 description 2
- 239000004918 carbon fiber reinforced polymer Substances 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 2
- 239000010687 lubricating oil Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 2
- 239000003921 oil Substances 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 2
- 238000011084 recovery Methods 0.000 description 2
- 238000004611 spectroscopical analysis Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- QGZKDVFQNNGYKY-UHFFFAOYSA-O Ammonium Chemical compound [NH4+] QGZKDVFQNNGYKY-UHFFFAOYSA-O 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 1
- 229910017082 Fe-Si Inorganic materials 0.000 description 1
- 229910000519 Ferrosilicon Inorganic materials 0.000 description 1
- 229910017133 Fe—Si Inorganic materials 0.000 description 1
- 239000002202 Polyethylene glycol Substances 0.000 description 1
- NPYPAHLBTDXSSS-UHFFFAOYSA-N Potassium ion Chemical compound [K+] NPYPAHLBTDXSSS-UHFFFAOYSA-N 0.000 description 1
- FKNQFGJONOIPTF-UHFFFAOYSA-N Sodium cation Chemical compound [Na+] FKNQFGJONOIPTF-UHFFFAOYSA-N 0.000 description 1
- QAOWNCQODCNURD-UHFFFAOYSA-L Sulfate Chemical compound [O-]S([O-])(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-L 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 239000002585 base Substances 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000005553 drilling Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 238000005868 electrolysis reaction Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-M hydroxide Chemical compound [OH-] XLYOFNOQVPJJNP-UHFFFAOYSA-M 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 150000002484 inorganic compounds Chemical class 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920001223 polyethylene glycol Polymers 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 229910001414 potassium ion Inorganic materials 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910000029 sodium carbonate Inorganic materials 0.000 description 1
- 229910001415 sodium ion Inorganic materials 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D7/00—Accessories specially adapted for use with machines or devices of the preceding groups
- B28D7/02—Accessories specially adapted for use with machines or devices of the preceding groups for removing or laying dust, e.g. by spraying liquids; for cooling work
-
- C—CHEMISTRY; METALLURGY
- C10—PETROLEUM, GAS OR COKE INDUSTRIES; TECHNICAL GASES CONTAINING CARBON MONOXIDE; FUELS; LUBRICANTS; PEAT
- C10M—LUBRICATING COMPOSITIONS; USE OF CHEMICAL SUBSTANCES EITHER ALONE OR AS LUBRICATING INGREDIENTS IN A LUBRICATING COMPOSITION
- C10M173/00—Lubricating compositions containing more than 10% water
- C10M173/02—Lubricating compositions containing more than 10% water not containing mineral or fatty oils
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25B—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES FOR THE PRODUCTION OF COMPOUNDS OR NON-METALS; APPARATUS THEREFOR
- C25B1/00—Electrolytic production of inorganic compounds or non-metals
- C25B1/01—Products
- C25B1/14—Alkali metal compounds
- C25B1/16—Hydroxides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- General Physics & Mathematics (AREA)
- Metallurgy (AREA)
- Electrochemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Materials Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Lubricants (AREA)
- Processing Of Stones Or Stones Resemblance Materials (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015130265 | 2015-06-29 | ||
JP2015130265 | 2015-06-29 | ||
PCT/JP2016/068396 WO2017002670A1 (ja) | 2015-06-29 | 2016-06-21 | シリコン材料の切断補助装置、切断方法、切断システム |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2020004285U Continuation JP3229903U (ja) | 2015-06-29 | 2020-10-02 | シリコン材料の切断補助装置および切断システム |
Publications (1)
Publication Number | Publication Date |
---|---|
JPWO2017002670A1 true JPWO2017002670A1 (ja) | 2018-07-19 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2017526299A Pending JPWO2017002670A1 (ja) | 2015-06-29 | 2016-06-21 | シリコン材料の切断補助装置、切断方法、切断システム |
Country Status (3)
Country | Link |
---|---|
JP (1) | JPWO2017002670A1 (zh) |
CN (1) | CN107851566B (zh) |
WO (1) | WO2017002670A1 (zh) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
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CN109652193B (zh) * | 2019-01-25 | 2021-10-08 | 广州科卢斯流体科技有限公司 | 一种亚稳定型半导体金刚线切割液 |
JP7165079B2 (ja) * | 2019-03-12 | 2022-11-02 | 日本タングステン株式会社 | 加工用クーラント供給機構、および、加工用クーラントの供給方法 |
CN113784828A (zh) * | 2019-06-06 | 2021-12-10 | 株式会社德山 | 多晶硅棒的切断方法、多晶硅棒的短棒的制造方法、多晶硅棒的硅粒的制造方法及多晶硅棒的切断装置 |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02262955A (ja) * | 1988-12-15 | 1990-10-25 | Nippon Steel Corp | Siインゴットのワイヤソーによる切断法 |
JP2003068677A (ja) * | 2001-08-21 | 2003-03-07 | Sony Corp | ダイシング装置およびダイシング方法 |
JP2005088394A (ja) * | 2003-09-18 | 2005-04-07 | Mitsubishi Electric Corp | シリコンインゴット切削用スラリーおよびそれを用いるシリコンインゴットの切断方法 |
JP2009107050A (ja) * | 2007-10-29 | 2009-05-21 | Covalent Materials Corp | ワイヤソーによるワーク切断方法 |
JP2010172993A (ja) * | 2009-01-28 | 2010-08-12 | Toyo Advanced Technologies Co Ltd | ワーク切断方法及びワイヤソー |
JP2012092205A (ja) * | 2010-10-26 | 2012-05-17 | Nisshin Seiki Kk | 機械加工用油剤 |
JP2013052493A (ja) * | 2011-09-06 | 2013-03-21 | Nagaoka Univ Of Technology | 機械加工装置およびそれを用いた機械加工方法 |
JP2013111713A (ja) * | 2011-11-29 | 2013-06-10 | Tokyo Seimitsu Co Ltd | 切削水の供給装置及び供給方法 |
JP2013248582A (ja) * | 2012-06-01 | 2013-12-12 | Tech Corporation:Kk | 電子材料用基板等の被洗浄物の洗浄装置およびその洗浄方法 |
JP2015098079A (ja) * | 2013-11-20 | 2015-05-28 | 日藤ポリゴン株式会社 | 工作機械の冷却装置および冷却方法 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5289833B2 (ja) * | 2008-06-19 | 2013-09-11 | 野村マイクロ・サイエンス株式会社 | 電子部品用シリコンの加工方法及び再生方法 |
WO2014034924A1 (ja) * | 2012-09-03 | 2014-03-06 | 学校法人早稲田大学 | スラッジ回収方法及び粉粒体 |
-
2016
- 2016-06-21 JP JP2017526299A patent/JPWO2017002670A1/ja active Pending
- 2016-06-21 CN CN201680037975.9A patent/CN107851566B/zh active Active
- 2016-06-21 WO PCT/JP2016/068396 patent/WO2017002670A1/ja active Application Filing
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02262955A (ja) * | 1988-12-15 | 1990-10-25 | Nippon Steel Corp | Siインゴットのワイヤソーによる切断法 |
JP2003068677A (ja) * | 2001-08-21 | 2003-03-07 | Sony Corp | ダイシング装置およびダイシング方法 |
JP2005088394A (ja) * | 2003-09-18 | 2005-04-07 | Mitsubishi Electric Corp | シリコンインゴット切削用スラリーおよびそれを用いるシリコンインゴットの切断方法 |
JP2009107050A (ja) * | 2007-10-29 | 2009-05-21 | Covalent Materials Corp | ワイヤソーによるワーク切断方法 |
JP2010172993A (ja) * | 2009-01-28 | 2010-08-12 | Toyo Advanced Technologies Co Ltd | ワーク切断方法及びワイヤソー |
JP2012092205A (ja) * | 2010-10-26 | 2012-05-17 | Nisshin Seiki Kk | 機械加工用油剤 |
JP2013052493A (ja) * | 2011-09-06 | 2013-03-21 | Nagaoka Univ Of Technology | 機械加工装置およびそれを用いた機械加工方法 |
JP2013111713A (ja) * | 2011-11-29 | 2013-06-10 | Tokyo Seimitsu Co Ltd | 切削水の供給装置及び供給方法 |
JP2013248582A (ja) * | 2012-06-01 | 2013-12-12 | Tech Corporation:Kk | 電子材料用基板等の被洗浄物の洗浄装置およびその洗浄方法 |
JP2015098079A (ja) * | 2013-11-20 | 2015-05-28 | 日藤ポリゴン株式会社 | 工作機械の冷却装置および冷却方法 |
Also Published As
Publication number | Publication date |
---|---|
CN107851566A (zh) | 2018-03-27 |
WO2017002670A1 (ja) | 2017-01-05 |
CN107851566B (zh) | 2021-08-31 |
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