JPWO2016158873A1 - 溶融めっき鋼板の表面欠陥検査装置および表面欠陥検査方法 - Google Patents
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- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
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- G01N21/88—Investigating the presence of flaws or contamination
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- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/20—Metals
- G01N33/204—Structure thereof, e.g. crystal structure
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- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
- G01N2021/8427—Coatings
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8822—Dark field detection
- G01N2021/8825—Separate detection of dark field and bright field
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
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- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
- G01N2021/8918—Metal
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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Abstract
Description
2 溶融亜鉛めっき鋼板(溶融めっき鋼板)
3 照明部
4 正反射光撮像部
5 乱反射光撮像部
6 画像信号処理部
8 撮像対象部位
T1 正反射画像信号
T2 乱反射画像信号
Claims (4)
- 溶融めっき鋼板の表面上にある撮像対象部位を照明する照明部と、
前記撮像対象部位からの正反射光を撮像する正反射光撮像部と、
同撮像対象部位からの乱反射光を撮像する乱反射光撮像部と、
前記正反射光撮像部が撮像して得られた正反射画像信号と、前記乱反射光撮像部が撮像して得られた乱反射画像信号とを処理する画像信号処理部と、
を備える溶融めっき鋼板の表面欠陥検査装置において、
前記正反射光撮像部と前記乱反射光撮像部とは同時に前記撮像対象部位からの反射光を撮像するものであり、
前記画像信号処理部は、
前記正反射光撮像部が撮像して得られた正反射画像信号のうち、所定の閾値より低輝度の部位を表面欠陥部位として抽出し、
抽出された前記表面欠陥部位に対応する部位に関し、前記乱反射光撮像部が撮像して得られた乱反射画像信号に対し、閾値処理を行うことにより、抽出された前記表面欠陥部位の欠陥種類を分類判定する、
ことを特徴とする溶融めっき鋼板の表面欠陥検査装置。 - 請求項1に記載の溶融めっき鋼板の表面欠陥検査装置において、
前記画像信号処理部は、前記乱反射光撮像部が地合を撮像して得られる乱反射画像信号の移動平均値を算出し、算出された移動平均値を前記閾値処理の閾値として使用し、当該閾値より高輝度の部位と当該閾値より低輝度の部位とを互いに異なる種類の表面欠陥として分類判定する、
ことを特徴とする溶融めっき鋼板の表面欠陥検査装置。 - 溶融めっき鋼板の表面を照明し、
前記溶融めっき鋼板上の撮像対象部位からの正反射光および乱反射光をそれぞれ撮像し、
撮像してそれぞれ得られた正反射画像信号と乱反射画像信号とを処理する、
溶融めっき鋼板の表面欠陥検査方法において、
前記撮像対象部位からの正反射光の撮像と乱反射光の撮像は同時に行われるものであり、
前記処理は、
撮像して得られた正反射画像信号のうち、所定の閾値より低輝度の部位を表面欠陥部位として抽出し、
抽出された前記表面欠陥部位に対応する部位に関し、撮像して得られた乱反射画像信号に対し、閾値処理を行うことにより、抽出された前記表面欠陥部位の欠陥種類を分類判定するものである、
ことを特徴とする溶融めっき鋼板の表面欠陥検査方法。 - 請求項3に記載の溶融めっき鋼板の表面欠陥検査方法において、
前記処理において、地合を撮像して得られる乱反射画像信号の移動平均値を算出し、算出された移動平均値を前記閾値処理の閾値として使用し、当該閾値より高輝度の部位と当該閾値より低輝度の部位とを互いに異なる種類の表面欠陥として分類判定する、
ことを特徴とする溶融めっき鋼板の表面欠陥検査方法。
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JP2015070692 | 2015-03-31 | ||
JP2015070692 | 2015-03-31 | ||
PCT/JP2016/059963 WO2016158873A1 (ja) | 2015-03-31 | 2016-03-28 | 溶融めっき鋼板の表面欠陥検査装置および表面欠陥検査方法 |
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JP6027295B1 JP6027295B1 (ja) | 2016-11-16 |
JPWO2016158873A1 true JPWO2016158873A1 (ja) | 2017-04-27 |
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JP2016526949A Active JP6027295B1 (ja) | 2015-03-31 | 2016-03-28 | 溶融めっき鋼板の表面欠陥検査装置および表面欠陥検査方法 |
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Country | Link |
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US (1) | US10041888B2 (ja) |
EP (1) | EP3279645A4 (ja) |
JP (1) | JP6027295B1 (ja) |
KR (1) | KR101800597B1 (ja) |
CN (1) | CN107533012B (ja) |
BR (1) | BR112017021163A2 (ja) |
MX (1) | MX360696B (ja) |
MY (1) | MY165130A (ja) |
TW (1) | TWI627399B (ja) |
WO (1) | WO2016158873A1 (ja) |
Cited By (1)
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US10041888B2 (en) | 2015-03-31 | 2018-08-07 | Nisshin Steel Co., Ltd. | Surface defect inspecting device and method for hot-dip coated steel sheets |
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TWI630366B (zh) * | 2017-04-28 | 2018-07-21 | 中國鋼鐵股份有限公司 | 鋼板寬度量測系統及其方法 |
EP3678143B1 (en) * | 2018-10-01 | 2023-08-16 | Sumitomo Electric Toyama Co., Ltd. | Method and device for manufacturing plated wire |
CN109557084A (zh) * | 2019-01-17 | 2019-04-02 | 南通市产品质量监督检验所 | 以镀层铁元素含量鉴定制绳镀锌钢丝镀锌方式的检测方法 |
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DE102019210727A1 (de) * | 2019-07-19 | 2021-01-21 | Thyssenkrupp Steel Europe Ag | Verfahren zum Bestimmen eines Reinigungszustands einer Oberfläche eines Flachprodukts und Flachprodukt |
CN110738237A (zh) * | 2019-09-16 | 2020-01-31 | 深圳新视智科技术有限公司 | 缺陷分类的方法、装置、计算机设备和存储介质 |
CN112345555A (zh) * | 2020-10-30 | 2021-02-09 | 凌云光技术股份有限公司 | 外观检查机高亮成像光源系统 |
JP7495163B1 (ja) | 2023-03-08 | 2024-06-04 | 株式会社ヒューテック | 欠点撮像装置およびそこで用いられる詳細撮像装置 |
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2016
- 2016-03-28 EP EP16772754.4A patent/EP3279645A4/en not_active Withdrawn
- 2016-03-28 WO PCT/JP2016/059963 patent/WO2016158873A1/ja active Application Filing
- 2016-03-28 MY MYPI2017703620A patent/MY165130A/en unknown
- 2016-03-28 MX MX2017012698A patent/MX360696B/es active IP Right Grant
- 2016-03-28 KR KR1020177027720A patent/KR101800597B1/ko active IP Right Grant
- 2016-03-28 BR BR112017021163-7A patent/BR112017021163A2/ja not_active Application Discontinuation
- 2016-03-28 JP JP2016526949A patent/JP6027295B1/ja active Active
- 2016-03-28 CN CN201680008920.5A patent/CN107533012B/zh not_active Expired - Fee Related
- 2016-03-30 TW TW105110026A patent/TWI627399B/zh not_active IP Right Cessation
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10041888B2 (en) | 2015-03-31 | 2018-08-07 | Nisshin Steel Co., Ltd. | Surface defect inspecting device and method for hot-dip coated steel sheets |
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Publication number | Publication date |
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EP3279645A4 (en) | 2018-09-26 |
MX2017012698A (es) | 2018-01-11 |
CN107533012B (zh) | 2019-07-19 |
TW201640101A (zh) | 2016-11-16 |
KR20170117600A (ko) | 2017-10-23 |
MX360696B (es) | 2018-11-14 |
US20180017503A1 (en) | 2018-01-18 |
BR112017021163A2 (ja) | 2018-07-17 |
EP3279645A1 (en) | 2018-02-07 |
US10041888B2 (en) | 2018-08-07 |
JP6027295B1 (ja) | 2016-11-16 |
KR101800597B1 (ko) | 2017-11-22 |
MY165130A (en) | 2018-02-28 |
WO2016158873A1 (ja) | 2016-10-06 |
TWI627399B (zh) | 2018-06-21 |
CN107533012A (zh) | 2018-01-02 |
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