JPWO2014080958A1 - Copper foil with carrier, method for producing copper foil with carrier, printed wiring board, printed circuit board, copper-clad laminate, and method for producing printed wiring board - Google Patents

Abstract

While the adhesion between the carrier and the ultrathin copper foil is high before the lamination process to the insulating substrate, there is no extreme increase or decrease in the adhesion between the carrier and the ultrathin copper foil due to the lamination process to the insulation substrate. Provided is a copper foil with a carrier that can be easily peeled off at the interface of an ultrathin copper foil, can suppress the occurrence of migration of a circuit formed on the surface, and has excellent etching properties of the ultrathin copper foil. In the copper foil with a carrier, the average value of Rz measured on the surface of the ultrathin copper layer with a contact roughness meter according to JIS B0601-1982 is 1.5 μm or less, and the standard deviation of Rz is 0.00. 1 μm or less is satisfied. The intermediate layer contains Ni. When the insulating substrate is thermocompression bonded to the ultrathin copper layer and the ultrathin copper layer is peeled off, in the section [0, 1.0] in the depth direction analysis from the surface of the intermediate layer side of the ultrathin copper layer, g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) satisfies 20.0% or less.

Description

  The present invention relates to a copper foil with a carrier, a method for producing a copper foil with a carrier, a printed wiring board, a printed circuit board, a copper clad laminate, and a method for producing a printed wiring board, and in particular, a printed wiring board for fine patterns. The present invention relates to a carrier-attached copper foil, a method for producing a carrier-attached copper foil, a printed wiring board, a printed circuit board, a copper-clad laminate, and a method for producing a printed wiring board.

  Printed wiring boards have made great progress over the last half century and are now used in almost all electronic devices. In recent years, with the increasing needs for miniaturization and higher performance of electronic devices, higher density mounting of components and higher frequency of signals have progressed, and conductor patterns have become finer (fine pitch) and higher frequency than printed circuit boards. In particular, when an IC chip is mounted on a printed wiring board, a fine pitch of L (line) / S (space) = 20 μm / 20 μm or less is required.

  A printed wiring board is first manufactured as a copper clad laminate in which an insulating substrate mainly composed of a copper foil and a glass epoxy substrate, BT resin, polyimide film or the like is bonded. Bonding is performed by laminating an insulating substrate and a copper foil and applying heat and pressure (laminating method), or by applying a varnish, which is a precursor of the insulating substrate material, to the surface having the copper foil coating layer, A heating / curing method (casting method) is used.

  Along with the fine pitch, the thickness of the copper foil used for the copper clad laminate is also 9 μm, and further, 5 μm or less. However, when the foil thickness is 9 μm or less, the handleability when forming a copper clad laminate by the above-described lamination method or casting method is extremely deteriorated. Therefore, a copper foil with a carrier has appeared, in which a thick metal foil is used as a carrier, and an ultrathin copper layer is formed on the metal foil via a release layer. A common method of using a copper foil with a carrier is to bond the surface of an ultrathin copper layer to an insulating substrate, thermocompression bond, and then peel the carrier through a peeling layer.

  Conventionally, a diffusion prevention layer, a release layer, and an electrolytic copper plating are formed in this order on the surface of the carrier foil, and a Cr or Cr hydrated oxide layer is used as the release layer, and Ni, Co, Fe, Cr, Patent Document 1 discloses a method for maintaining good peelability after hot pressing by using a single element or alloy of Mo, Ta, Cu, Al, and P.

  Alternatively, it is known that the release layer is formed of Cr, Ni, Co, Fe, Mo, Ti, W, P, alloys thereof, or hydrates thereof. Furthermore, it is described in Patent Documents 2 and 3 that it is effective to provide Ni, Fe or an alloy layer thereof on the base of the release layer in order to stabilize the peelability in a high temperature use environment such as a hot press. Has been.

JP 2006-022406 A JP 2010-006071 A JP 2007-007937 A

  In copper foil with carrier, the ultrathin copper foil must not be easily peeled off from the carrier before the lamination process on the insulating substrate, while the carrier from the ultrathin copper foil is easily peeled off after the lamination process on the insulation substrate. It is necessary to peel off. In addition, after peeling the carrier from the ultra-thin copper foil after lamination, a circuit is formed on the ultra-thin copper foil by a semi-additive method, so that organic substances and metal and metal oxides that are difficult to etch are maintained in order to maintain good etching properties. It is necessary to reduce the amount of metal hydrated oxide present.

  Regarding Patent Document 1, the peelability after hot pressing is good, but the state of the ultrathin copper foil surface is not mentioned.

  Further, in the same patent document, it is described that the order of the diffusion prevention layer and the release layer may be either, but the examples described are all in the order of carrier foil, release layer, diffusion prevention layer, electrolytic copper plating, At the time of peeling, the peeling layer / diffusion prevention layer interface may peel off. If it becomes so, a diffusion prevention layer will remain on the surface of electrolytic copper plating (ultra-thin copper layer), and it will lead to the etching failure at the time of forming a circuit.

  In Patent Documents 2 and 3, there is no description that can be considered that the properties such as the peel strength between the carrier and the ultrathin copper foil are sufficiently examined, and there is still room for improvement.

  Therefore, the present invention has a high adhesion between the carrier and the ultrathin copper foil before the lamination process to the insulating substrate, while the adhesion between the carrier and the ultrathin copper foil is extremely increased due to the lamination process to the insulation substrate. Copper with carrier that can be easily peeled off at the carrier / ultra-thin copper foil interface, can prevent the migration of circuits formed on the surface, and has excellent etching properties for ultra-thin copper foil It is an object to provide a foil.

  In order to achieve the above object, the present inventor conducted extensive research and found that the ultrathin copper layer was peeled from the carrier-attached copper foil after the insulating substrate was thermocompression bonded to the ultrathin copper layer under predetermined conditions. It has been found that controlling the amount of Ni on the peel side surface of the ultrathin copper layer is extremely effective in improving the peelability at the carrier / ultrathin copper foil interface and the etchability of the ultrathin copper foil. It was.

The present invention has been completed on the basis of the above knowledge, and in one aspect, a carrier-attached copper foil having a carrier, an intermediate layer, and an ultrathin copper layer in this order, wherein the surface of the ultrathin copper layer is contact-type roughened The average value of Rz measured according to JIS B0601-1982 is 1.5 μm or less, and the standard deviation of Rz satisfies 0.1 μm or less. The intermediate layer contains Ni, and the ultrathin When an insulating substrate is thermocompression bonded to the copper layer in the atmosphere under the conditions of pressure: 20 kgf / cm ² and 220 ° C. × 2 hours, and the ultrathin copper layer is peeled off in accordance with JIS C 6471, the surface from XPS The atomic concentration (%) of chromium in the depth direction (x: unit nm) obtained from the depth direction analysis of e is x (e), the atomic concentration (%) of zinc is f (x), and nickel atoms Concentration (%) is g (x), copper atomic concentration (%) is h (x), oxygen When the total atomic concentration (%) of i is i (x), the atomic concentration (%) of carbon is j (x), and the other atomic concentration (%) is k (x), the ultrathin copper layer区間 g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx in the interval [0, 1.0] of the depth direction analysis from the surface on the intermediate layer side + ∫h (x) dx + + i (x) dx + ∫j (x) dx + ∫k (x) dx) is a copper foil with a carrier satisfying 20.0% or less.

Another aspect of the present invention is a copper foil with a carrier having a carrier, an intermediate layer, and an ultrathin copper layer in this order, and the surface of the ultrathin copper layer conforms to JIS B0601-2001 with a contact-type roughness meter. The average value of Rt measured in this way is 2.0 μm or less, the standard deviation of Rt satisfies 0.1 μm or less, the intermediate layer contains Ni, and the insulating substrate is placed on the ultrathin copper layer in the atmosphere. : 20 kgf / cm ² , 220 ° C. × 2 hours of thermocompression bonding, and when the ultrathin copper layer was peeled off according to JIS C 6471, the depth obtained from the depth direction analysis from the surface by XPS E (x) is the atomic concentration (%) of chromium in the vertical direction (x: unit nm), f (x) is the atomic concentration (%) of zinc, and g (x) is the atomic concentration (%) of nickel. , The atomic concentration (%) of copper is h (x), the total atomic concentration (%) of oxygen is i (x), When the atomic concentration (%) is j (x) and the other atomic concentration (%) is k (x), the interval of the depth direction analysis from the surface on the intermediate layer side of the ultrathin copper layer [0, 1.0], ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫ j (x) dx + ∫k (x) dx) is a copper foil with a carrier satisfying 20.0% or less.

According to still another aspect of the present invention, there is provided a copper foil with a carrier having a carrier, an intermediate layer, and an ultrathin copper layer in this order, and the ultrathin copper layer surface conforms to JIS B0601-1982 with a contact-type roughness meter. The average value of Ra measured in this manner is 0.2 μm or less, and the standard deviation of Ra satisfies 0.03 μm or less, the intermediate layer contains Ni, and the insulating substrate is placed on the ultrathin copper layer in the atmosphere. When pressure bonded: 20 kgf / cm ² , 220 ° C. × 2 hours under thermocompression bonding and the ultrathin copper layer was peeled off according to JIS C 6471, it was obtained from depth direction analysis from the surface by XPS. E (x) is the atomic concentration (%) of chromium in the depth direction (x: unit nm), f (x) is the atomic concentration (%) of zinc, and g (x) is the atomic concentration (%) of nickel. And the atomic concentration (%) of copper as h (x), the total atomic concentration (%) of oxygen as i (x), When the atomic concentration (%) of carbon is j (x) and the other atomic concentration (%) is k (x), the interval of the depth direction analysis from the surface on the intermediate layer side of the ultrathin copper layer [ 0, 1.0], ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + J (x) dx + (k) (x) dx) is a copper foil with a carrier satisfying 20.0% or less.

In one embodiment of the copper foil with a carrier according to the present invention, an insulating substrate is thermocompression bonded to the ultrathin copper layer under the conditions of pressure: 20 kgf / cm ² and 220 ° C. × 2 hours in accordance with JIS C 6471. Then, when the ultrathin copper layer is peeled off, in the section [1.0, 4.0] of the depth direction analysis from the surface on the intermediate layer side of the ultrathin copper layer, ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) Satisfies 10.0% or less.

  In another embodiment of the copper foil with a carrier of the present invention, the average value of Rt measured based on JIS B0601-2001 with the contact type roughness meter on the surface of the ultrathin copper layer is 2.0 μm or less, In addition, the standard deviation of Rt is 0.1 μm or less.

  In yet another embodiment of the copper foil with a carrier according to the present invention, an average value of Ra measured by measuring the surface of the ultrathin copper layer with a contact roughness meter according to JIS B0601-1982 is 0.2 μm or less. The standard deviation of Ra is 0.03 μm or less.

  In yet another embodiment, the carrier-attached copper foil of the present invention has a roughened layer on the surface of the ultrathin copper layer.

In still another embodiment of the copper foil with a carrier according to the present invention, an insulating substrate is thermocompression bonded to the ultrathin copper layer under the conditions of pressure: 20 kgf / cm ² , 220 ° C. × 2 hours in JIS C. When the ultrathin copper layer is peeled off in accordance with 6471, in the interval [0, 1.0] in the depth direction analysis from the surface on the intermediate layer side of the ultrathin copper layer, ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) Is 1.0% or more and 20.0% or less, and in the interval [1.0, 4.0], ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) satisfies 1.0% to 10.0%.

In still another embodiment of the copper foil with a carrier according to the present invention, an insulating substrate is thermocompression bonded to the ultrathin copper layer under the conditions of pressure: 20 kgf / cm ² , 220 ° C. × 2 hours in JIS C. When the ultrathin copper layer is peeled according to 6471, in the interval [0, 1.0] of the depth direction analysis from the surface by XPS on the intermediate layer side of the ultrathin copper layer, ∫e (x ) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) satisfies 3.0% or less.

In still another embodiment of the copper foil with a carrier according to the present invention, an insulating substrate is thermocompression bonded to the ultrathin copper layer under the conditions of pressure: 20 kgf / cm ² , 220 ° C. × 2 hours in JIS C. When the ultrathin copper layer is peeled off in accordance with 6471, in the interval [0, 1.0] in the depth direction analysis from the surface on the intermediate layer side of the ultrathin copper layer, ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) Satisfies 11.0% or less.

In still another embodiment of the copper foil with a carrier according to the present invention, an insulating substrate is thermocompression bonded to the ultrathin copper layer under the conditions of pressure: 20 kgf / cm ² , 220 ° C. × 2 hours in JIS C. When the ultrathin copper layer is peeled in accordance with 6471, in the section [1.0, 4.0] of the depth direction analysis from the surface of the ultrathin copper layer on the intermediate layer side, ∫g (x ) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) satisfies 7.0% or less.

  In still another embodiment of the copper foil with a carrier of the present invention, the average value of Rz on the surface of the ultrathin copper layer is 1.0 μm or less.

  In still another embodiment of the copper foil with a carrier of the present invention, the average value of Rz on the surface of the ultrathin copper layer is 0.5 μm or less.

  In yet another embodiment, the carrier-attached copper foil of the present invention has a depth direction obtained from a depth direction analysis from the surface by XPS when the ultrathin copper layer is peeled off in accordance with JIS C 6471 ( x (unit: nm), the atomic concentration (%) of chromium is e (x), the atomic concentration (%) of zinc is f (x), the atomic concentration (%) of nickel is g (x), The atomic concentration (%) is h (x), the total atomic concentration (%) of oxygen is i (x), the atomic concentration (%) of carbon is j (x), and the other atomic concentration (%) is k. (X), 区間 g (x) dx / (∫e (x) dx + in the depth direction analysis section [0, 1.0] from the surface on the intermediate layer side of the ultrathin copper layer ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) satisfies 5.0% or less.

  In yet another embodiment, the carrier-attached copper foil of the present invention has a depth direction obtained from a depth direction analysis from the surface by XPS when the ultrathin copper layer is peeled off in accordance with JIS C 6471 ( x (unit: nm), the atomic concentration (%) of chromium is e (x), the atomic concentration (%) of zinc is f (x), the atomic concentration (%) of nickel is g (x), The atomic concentration (%) is h (x), the total atomic concentration (%) of oxygen is i (x), the atomic concentration (%) of carbon is j (x), and the other atomic concentration (%) is k. (X), 区間 g (x) dx / (∫e (x) in the section [1.0, 4.0] of the depth direction analysis from the surface on the intermediate layer side of the ultrathin copper layer dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) Fulfill.

  In still another embodiment, the carrier-attached copper foil of the present invention has a depth direction from the surface on the intermediate layer side of the ultrathin copper layer when the ultrathin copper layer is peeled in accordance with JIS C 6471. In the analysis interval [0, 1.0], ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) is 0.1% to 5.0%, and 区間 g (x) dx in the interval [1.0, 4.0] / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) Satisfies 0.1% or more and 1.0% or less.

  In still another embodiment, the carrier-attached copper foil of the present invention has a depth direction from the surface on the intermediate layer side of the ultrathin copper layer when the ultrathin copper layer is peeled in accordance with JIS C 6471. In the analysis interval [0, 1.0], ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) satisfies 3.0% or less.

  In yet another embodiment of the copper foil with a carrier according to the present invention, when the ultrathin copper layer is peeled off in accordance with JIS C 6471, the depth from the surface by XPS on the intermediate layer side of the ultrathin copper layer is as follows. In the interval [0, 1.0] of the directional analysis, ∫e (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) satisfies 2.0% or less.

  In still another embodiment of the copper foil with a carrier according to the present invention, the intermediate layer includes any one layer of nickel or an alloy containing nickel on the carrier, and any one of chromium, a chromium alloy, and an oxide of chromium. A layer containing one or more kinds is laminated in this order.

  In yet another embodiment of the copper foil with a carrier of the present invention, the layer containing at least one of chromium, a chromium alloy, and an oxide of chromium includes a chromate treatment layer.

  In yet another embodiment of the copper foil with a carrier according to the present invention, the intermediate layer contains zinc.

  In yet another embodiment of the copper foil with a carrier according to the present invention, the intermediate layer includes any one layer of nickel, a nickel-zinc alloy, a nickel-phosphorus alloy, and a nickel-cobalt alloy on the carrier, and Any one of a zinc chromate treatment layer, a pure chromate treatment layer, and a chromium plating layer is laminated in this order.

In yet another embodiment of the copper foil with a carrier according to the present invention, the intermediate layer is formed by laminating a nickel layer or a nickel-zinc alloy layer and a zinc chromate treatment layer in this order on the carrier. Or a nickel-zinc alloy layer and a pure chromate treatment layer or a zinc chromate treatment layer are laminated in this order, and the amount of nickel deposited on the intermediate layer is 100 to 40000 μg / dm ² , The adhesion amount of chromium is 5 to 100 μg / dm ² , and the adhesion amount of zinc is 1 to 70 μg / dm ² .

In yet another embodiment of the copper foil with a carrier of the present invention, the intermediate layer is a nickel layer on the carrier, and an organic material layer containing any of a nitrogen-containing organic compound, a sulfur-containing organic compound, and a carboxylic acid. The intermediate layer has a nickel adhesion amount of 100 to 40,000 μg / dm ² .

In another embodiment of the copper foil with a carrier according to the present invention, the intermediate layer comprises an organic material layer containing any one of a nitrogen-containing organic compound, a sulfur-containing organic compound and a carboxylic acid on the carrier, and a nickel layer. The intermediate layer has a nickel adhesion amount of 100 to 40,000 μg / dm ² .

  In another embodiment of the copper foil with a carrier of the present invention, the intermediate layer contains an organic substance in a thickness of 25 nm or more and 80 nm or less.

In still another embodiment of the copper foil with a carrier according to the present invention, the intermediate layer includes at least one of a nickel layer or an alloy layer containing nickel and molybdenum, cobalt, and a molybdenum cobalt alloy on the carrier. The layers are laminated in the order of layers, the adhesion amount of nickel in the intermediate layer is 100 to 40000 μg / dm ² , and when molybdenum is included, the adhesion amount of molybdenum is 10 to 1000 μg / dm ² , cobalt Is included, the adhesion amount of cobalt is 10 to 1000 μg / dm ² .

  In another embodiment of the copper foil with a carrier of the present invention, the carrier is formed of an electrolytic copper foil or a rolled copper foil.

  In another embodiment of the carrier-attached copper foil of the present invention, the roughening treatment layer is any one selected from the group consisting of copper, nickel, cobalt, phosphorus, tungsten, arsenic, molybdenum, chromium, and zinc. It is a layer made of a single substance or an alloy containing one or more of them.

  In yet another embodiment, the carrier-attached copper foil of the present invention is one type selected from the group consisting of a heat-resistant layer, a rust-proof layer, a chromate-treated layer, and a silane coupling-treated layer on the surface of the roughened layer. It has the above layers.

  In yet another embodiment, the carrier-attached copper foil of the present invention is one type selected from the group consisting of a heat-resistant layer, a rust-proof layer, a chromate treatment layer, and a silane coupling treatment layer on the surface of the ultrathin copper layer. It has the above layers.

  In yet another embodiment, the carrier-attached copper foil of the present invention is a resin layer on one or more layers selected from the group consisting of the heat-resistant layer, the rust-proof layer, the chromate-treated layer, and the silane coupling-treated layer. Is provided.

  In yet another embodiment, the carrier-attached copper foil of the present invention includes a resin layer on the roughening treatment layer.

  In still another embodiment, the carrier-attached copper foil of the present invention includes a resin layer on the ultrathin copper layer.

  In another embodiment of the carrier-attached copper foil of the present invention, the resin layer is an adhesive resin.

  In yet another embodiment of the copper foil with a carrier according to the present invention, the resin layer is a resin in a semi-cured state.

  In another aspect of the present invention, after forming any one layer of nickel or an alloy containing nickel on a carrier, a layer containing any one or more of chromium, a chromium alloy, or an oxide of chromium is formed. An intermediate in which zinc is contained in at least one layer of nickel or an alloy containing nickel, or a layer containing any one or more of chromium, a chromium alloy, or an oxide of chromium It is a manufacturing method of the copper foil with a carrier of this invention including the process of forming a layer, and the process of forming an ultra-thin copper layer by electrolytic plating on the said intermediate | middle layer.

  In one embodiment of the method for producing a copper foil with a carrier according to the present invention, after forming a plating layer containing nickel and zinc on a carrier, an intermediate layer is formed by forming a plating layer containing chromium or a chromate treatment layer. And a step of forming an ultrathin copper layer on the intermediate layer by electrolytic plating.

  In another embodiment of the method for producing a copper foil with a carrier according to the present invention, after forming a plating layer containing nickel on a carrier, an intermediate layer is formed by forming a plating layer containing chromium and zinc or a zinc chromate treatment layer. Forming a layer and forming an ultrathin copper layer on the intermediate layer by electrolytic plating.

  In still another embodiment of the method for producing a copper foil with a carrier according to the present invention, a plating layer containing nickel and zinc is formed on a carrier, and then a plating layer containing chromium and zinc or a zinc chromate treatment layer is formed. A step of forming an intermediate layer, and a step of forming an ultrathin copper layer on the intermediate layer by electrolytic plating.

  In yet another embodiment of the method for producing a copper foil with a carrier according to the present invention, after forming a nickel plating layer on the carrier, an intermediate layer is formed by forming a zinc chromate treatment layer with electrolytic chromate, or After forming the nickel-zinc alloy plating layer, a step of forming an intermediate layer by forming a pure chromate treatment layer or a zinc chromate treatment layer by electrolytic chromate, and an ultrathin copper layer by electrolytic plating on the intermediate layer Forming.

  The manufacturing method of the copper foil with a carrier of this invention in another one Embodiment further includes the process of forming a roughening process layer on the said ultra-thin copper layer.

  In still another aspect, the present invention is a printed wiring board manufactured using the carrier-attached copper foil of the present invention.

  In still another aspect, the present invention is a printed circuit board manufactured using the carrier-attached copper foil of the present invention.

  In yet another aspect, the present invention is a copper clad laminate produced using the carrier-attached copper foil of the present invention.

  In yet another aspect of the present invention, the step of preparing the copper foil with carrier and the insulating substrate of the present invention, the step of laminating the copper foil with carrier and the insulating substrate, the copper foil with carrier and the insulating substrate, After the lamination, a copper-clad laminate is formed through a step of peeling the carrier of the copper foil with carrier, and then the circuit is formed by any of the semi-additive method, the subtractive method, the partial additive method, or the modified semi-additive method. It is a manufacturing method of a printed wiring board including the process of forming.

  According to the present invention, the adhesion between the carrier and the ultrathin copper foil is high before the laminating process to the insulating substrate, while the adhesion between the carrier and the ultrathin copper foil due to the laminating process to the insulating substrate is extremely increased. There is no deterioration, it can be easily peeled off at the carrier / ultra thin copper foil interface, the migration of the circuit formed on the surface can be better suppressed, and the etching property of the ultra thin copper foil is good. Copper foil can be provided.

AC is a schematic diagram of the wiring board cross section in the process to circuit plating and the resist removal based on the specific example of the manufacturing method of the printed wiring board using the copper foil with a carrier of this invention. DF is a schematic diagram of a cross section of a wiring board in a process from lamination of a resin and copper foil with a second layer carrier to laser drilling according to a specific example of a method for producing a printed wiring board using a copper foil with a carrier of the present invention. It is. GI is a schematic diagram of the wiring board cross section in the process from the via fill formation to the first layer carrier peeling according to a specific example of the method for manufacturing a printed wiring board using the carrier-attached copper foil of the present invention. J to K are schematic views of a cross section of a wiring board in steps from flash etching to bump / copper pillar formation according to a specific example of a method of manufacturing a printed wiring board using the carrier-attached copper foil of the present invention. It is the schematic of the cross section of the width direction of the circuit pattern in an Example, and the outline of the calculation method of the etching factor (EF) using this schematic diagram. It is the profile of the depth direction of the ultra-thin thin copper surface (before board | substrate crimping | compression-bonding) of Example 5. FIG. It is the profile of the depth direction of the ultra-thin thin copper surface (after board | substrate crimping | compression-bonding) of Example 5. FIG. It is the profile of the depth direction of the ultra-thin thin copper surface (after board | substrate crimping | compression-bonding) of Example 14. FIG. It is the profile of the depth direction of the ultra-thin thin copper surface (before board | substrate crimping | compression-bonding) of the comparative example 5. It is a schematic diagram which shows the conveyance method using a drum. It is a schematic diagram which shows the carrying system by 99 folds. It is the schematic for demonstrating the integration method of atomic concentration. It is a schematic diagram which shows the measurement location of the sample sheet | seat in an Example.

<Copper foil with carrier>
The copper foil with a carrier of this invention has a carrier, an intermediate | middle layer, and an ultra-thin copper layer in this order. The method of using the copper foil with carrier itself is well known to those skilled in the art. For example, the surface of the ultra-thin copper layer is made of paper base phenol resin, paper base epoxy resin, synthetic fiber cloth base epoxy resin, glass cloth / paper composite. Ultra-thin bonded to an insulating substrate, bonded to an insulating substrate such as a base epoxy resin, glass cloth / glass nonwoven fabric composite epoxy resin and glass cloth base epoxy resin, polyester film, polyimide film, etc. A copper layer is etched into the intended conductor pattern, and finally a printed wiring board, a printed circuit board, a copper clad laminate, or the like can be produced.

After the insulating substrate is thermocompression bonded to the ultrathin copper layer, when the ultrathin copper layer is peeled off from the copper foil with carrier, if the amount of Ni remaining on the intermediate layer side surface of the ultrathin copper layer is large, A thin copper layer becomes difficult to etch and it becomes difficult to form a fine pitch circuit. For this reason, the copper foil with a carrier of the present invention is obtained by thermocompression bonding an insulating substrate to an ultrathin copper layer under the conditions of pressure: 20 kgf / cm ² and 220 ° C. × 2 hours in accordance with JIS C 6471. When the ultrathin copper layer is peeled, e (x) is the atomic concentration of chromium (%) in the depth direction (x: unit nm) obtained from the depth direction analysis from the surface by XPS, and the atomic concentration of zinc (%) Is f (x), nickel atomic concentration (%) is g (x), copper atomic concentration (%) is h (x), and oxygen total atomic concentration (%) is i (x) ), Where j (x) is the atomic concentration (%) of carbon, and k (x) is the other atomic concentration (%), the depth direction analysis interval from the surface on the intermediate layer side of the ultrathin copper layer In [0, 1.0], ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + + i (x) dx + ∫j (x) dx + ∫k (x) dx) is controlled to 20.0% or less and to 18.0% or less Is preferably controlled to 16.0% or less, preferably controlled to 14.1% or less, and preferably controlled to 12.0% or less, It is preferably controlled to 11.0% or less, preferably controlled to 10.0% or less, and preferably controlled to 5.0% or less. A copper foil with a carrier is bonded to an insulating substrate, the carrier is peeled off after thermocompression bonding, and the ultrathin copper layer adhered to the insulating substrate is etched into the intended conductor pattern. When the amount of Ni remaining on the surface is large, the ultrathin copper layer becomes difficult to be etched, and it becomes difficult to form a fine pitch circuit. For this reason, as for the copper foil with a carrier of this invention, the amount of Ni of the surface of the ultra-thin copper layer after peeling as described above is controlled. In the interval [0, 1.0], the Ni amount is ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + (g (x) dx + 、 １h (x) dx + ∫i (x) dx + (j (x) dx + ∫k (x) dx) exceeds 20.0%, the ultrathin copper layer is etched and is finer than L / S = 20 μm / 20 μm It may be difficult to form a wiring, for example, a fine wiring of L / S = 15 μm / 15 μm, and the etching property of the ultrathin copper foil may be deteriorated. The above-mentioned “thermocompression bonding under the condition of 220 ° C. × 2 hours” indicates a typical heating condition in the case where the carrier-attached copper foil is bonded to the insulating substrate and thermocompression bonded.

The copper foil with a carrier of the present invention is obtained by thermocompression bonding an insulating substrate to an ultrathin copper layer under the conditions of pressure: 20 kgf / cm ² , 220 ° C. × 2 hours in accordance with JIS C 6471. When the layer is peeled off, the atomic concentration (%) of chromium in the depth direction (x: unit nm) obtained from the depth direction analysis from the surface by XPS is defined as e (x), and the atomic concentration of zinc (%) F (x), nickel atomic concentration (%) as g (x), copper atomic concentration (%) as h (x), oxygen total atomic concentration (%) as i (x), When the atomic concentration (%) of carbon is j (x) and the other atomic concentration (%) is k (x), the interval of the depth direction analysis from the surface on the intermediate layer side of the ultrathin copper layer [1. 0, 4.0], ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) is preferably controlled to satisfy 10.0% or less More preferably, it is 8.0% or less, More preferably, it is 7.0% or less, More preferably, it is 6.0% or less, More preferably, it is 5.0% or less, More preferably, it is 4.0% or less, More preferably, it is 2 It is preferably controlled to satisfy 0.0% or less, more preferably 1.0% or less. According to such a configuration, the etching property becomes better.

  If the amount of Ni on the surface of the ultra-thin copper layer after peeling the ultra-thin copper layer from the thermo-compressed copper foil with carrier as described above is too small, the carrier Cu may diffuse to the ultra-thin copper layer side. . In such a case, the degree of bonding between the carrier and the ultrathin copper layer becomes too strong, and pinholes are easily generated in the ultrathin copper layer when the ultrathin copper layer is peeled off. Therefore, the Ni amount is Ｎｉg (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h () in the interval [0, 1.0]. x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) is 1.0% or more and 20.0% or less and / or interval [1.0, 4.0] ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) It is preferable that dx + ∫k (x) dx) be controlled to satisfy 1.0% to 10.0%. Further, the Ni amount is 当 該 g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) in the interval [0, 1.0]. ) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) is 2.0% or more and 18.0% or less and / or in the interval [1.0, 4.0] , ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + More preferably, ∫k (x) dx) is controlled so as to satisfy 2.0% or more and 8.0% or less. Further, the Ni amount is ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) in the interval [0, 1.0]. ) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) is 3.0% or more and 15.0% or less and / or in the interval [1.0, 4.0] , ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + It is more preferable that (k (x) dx) is controlled so as to satisfy 3.0% or more and 7.0% or less. Further, the Ni amount is 当 該 g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) in the interval [0, 1.0]. ) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) is 11.0% or less and / or in the interval [1.0, 4.0], ∫g (x ) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) It is preferable that dx) be controlled to satisfy 7.0% or less.

In addition, when the insulating substrate is thermocompression bonded to the ultrathin copper layer under the conditions of pressure: 20 kgf / cm ² and 220 ° C. × 2 hours in the atmosphere, and the ultrathin copper layer is peeled off in accordance with JIS C 6471, In the section [0, 1.0] of the depth direction analysis from the surface by XPS on the intermediate layer side of the ultrathin copper layer, ∫e (x) dx / (∫e (x) dx + ∫f (x ) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) preferably satisfies 3.0% or less. It is more preferable to satisfy 0.0% or less, and it is even more preferable to satisfy 1.0% or less. Further, if the amount of Cr on the surface of the ultrathin copper layer is too small, the surface of the ultrathin copper foil may be oxidized and discolored. Therefore, the insulating substrate is placed on the ultrathin copper layer in the atmosphere, pressure: 20 kgf / cm ² , 220. Section of depth direction analysis from the surface by XPS on the intermediate layer side of the ultrathin copper layer when the ultrathin copper layer is peeled in accordance with JIS C 6471 by thermocompression bonding under the condition of ° C x 2 hours [0 1.0], ∫e (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + More preferably, xj (x) dx + xk (x) dx) satisfies 0.1% or more and 2.0% or less, and more preferably satisfies 0.2% or more and 1.5% or less.

  Moreover, the copper foil with a carrier of the present invention is not subjected to thermocompression bonding with an insulating substrate as described above, and when the ultrathin copper layer is peeled off in accordance with JIS C 6471 as it is, the depth direction from the surface by XPS The atomic concentration (%) of chromium in the depth direction (x: unit nm) obtained from the analysis is e (x), the atomic concentration (%) of zinc is f (x), and the atomic concentration of nickel (%) Is g (x), the atomic concentration (%) of copper is h (x), the total atomic concentration (%) of oxygen is i (x), the atomic concentration (%) of carbon is j (x), Assuming that the other atomic concentration (%) is k (x), in the interval [0, 1.0] in the depth direction analysis from the surface on the intermediate layer side of the ultrathin copper layer, ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) It is preferable to control to satisfy 5.0% or less. In the interval [0, 1.0], the Ni amount is ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + (g (x) dx + 、 １h (x) dx + ∫i (x) dx + (j (x) dx + (k (x) dx) exceeds 5.0%, the ultrathin copper layer is etched and is finer than L / S = 20 μm / 20 μm It may be difficult to form a wiring, for example, a fine wiring with L / S = 15 μm / 15 μm, and the etching property of the ultrathin copper foil may be poor. In the interval [0, 1.0], ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx +) j (x) dx + ∫k (x) dx) is preferably controlled to satisfy 3.0% or less. According to such a configuration, the etching property is further improved.

  When the ultrathin copper layer is peeled off in accordance with JIS C 6471, the carrier-attached copper foil of the present invention [1.0, section of depth direction analysis from the surface of the intermediate layer side of the ultrathin copper layer. 4.0], ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫ j (x) dx +) k (x) dx) is preferably controlled to satisfy 1.0% or less. According to such a configuration, the etching property is further improved.

  If the amount of Ni on the surface of the ultrathin copper layer after peeling the ultrathin copper layer from the copper foil with a carrier as described above is too small, the carrier Cu may diffuse toward the ultrathin copper layer. In such a case, the degree of bonding between the carrier and the ultrathin copper layer becomes too strong, and pinholes are easily generated in the ultrathin copper layer when the ultrathin copper layer is peeled off. Therefore, the Ni amount is Ｎｉg (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h () in the interval [0, 1.0]. x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) is 0.1% to 5.0% and / or interval [1.0, 4.0] ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) It is preferable that dx + ∫k (x) dx) be controlled to satisfy 0.1% to 1.0%. Further, the Ni amount is 当 該 g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) in the interval [0, 1.0]. ) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) is 0.2% to 4.0% and / or in the interval [1.0, 4.0] , ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + More preferably, ∫k (x) dx) is controlled so as to satisfy 0.2% or more and 0.8% or less. Further, the Ni amount is ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) in the interval [0, 1.0]. ) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) is 0.5% to 3.0% and / or in the interval [1.0, 4.0] , ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + More preferably, ∫k (x) dx) is controlled so as to satisfy 0.3% or more and 0.7% or less.

  Further, when the ultrathin copper layer is peeled off according to JIS C 6471, if the amount of Cr on the surface of the ultrathin copper layer is too small, the surface of the ultrathin copper foil may be oxidized and discolored.区間 e (x) dx / (∫e (x) dx + ∫f (x) dx in the section [0, 1.0] of the depth direction analysis from the surface by XPS on the intermediate layer side of the ultrathin copper layer + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) preferably satisfies 2.0% or less. Furthermore, when the ultra-thin copper layer is peeled in accordance with JIS C 6471, in the section [0, 1.0] in the depth direction analysis from the surface by XPS on the intermediate layer side of the ultra-thin copper layer, ∫e ( x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x ) dx) is more preferably 0.1% or more and 2.0% or less, and further preferably 0.2% or more and 1.0% or less.

In addition, the integrated value of the concentration of each element was obtained by a trapezoidal formula.
The concentration integration method using the trapezoidal formula will be described below. Here, an example in which the atomic concentration of nickel is integrated in the interval [0.0, 4.0] of the depth direction analysis from the intermediate layer surface will be described. For the sake of brevity, a case where six points are measured in the section [0.0, 4.0] will be described as an example. FIG. 12 shows a schematic diagram for explaining an atomic concentration integration method.
FIG. 12 is a graph in which the horizontal axis represents the depth x (nm) from the intermediate layer surface and the vertical axis represents the nickel atom concentration (at%). Points a, b, c, d, e, and f indicate the measurement results of the nickel atom concentration at depths l, k, j, i, h, and g (nm) from the surface of the intermediate layer, respectively.
As shown in FIG. 12, the atomic concentration of nickel is measured by XPS at a predetermined depth (l to g) at several points in a section [0.0, 4.0] in the depth direction analysis from the intermediate layer surface. To do. Then, an area S1 of the trapezoid abkl, an area S2 of the trapezoid bcjk, an area S3 of the trapezoid cdij, an area S4 of the trapezoid dehi, and an area S5 of the trapezoid efgh are obtained. The total area value from S1 to S5 is the integrated value ∫g (x) dx of the atomic concentration of nickel in the section [0.0, 4.0] in the depth direction analysis from the intermediate layer surface. That is, it was calculated as ∫g (x) dx = S1 + S2 + S3 + S4 + S5 in the section [0.0, 4.0] of the depth direction analysis from the intermediate layer surface.
Here, for example, the area S1 of the trapezoid abkl is {(atomic concentration of nickel at point a (at%)) + (atomic concentration of nickel at point b (at%))} × (depth between points a and b) x1 (nm)) / 2. Similarly, the area S2 of the trapezoid bcjk, the area S3 of the trapezoid cdij, the area S4 of the trapezoid dehi, and the area S5 of the trapezoid efgh are obtained.
Point a is the measurement result of the nickel atom concentration at the depth l closest to the depth of 0.0 nm from the surface of the intermediate layer, and point f is the depth g closest to the depth of 4.0 nm from the surface of the intermediate layer. It is a measurement result of nickel atom concentration.
A preferable value of the measurement interval of each point (x1, x2, x3, x4, x5 in FIG. 12) is 0.10 to 0.30 nm (in terms of SiO ₂ ).
Therefore, in the case of section [0.0, 4.0], the depth at which the integration is started is 0.0 nm (in terms of SiO ₂ ) (that is, the surface of the analysis object), and the depth at which the integration is finished is 4 It means 0.0 nm (SiO ₂ conversion) (depth of 4.0 nm from the surface). Similarly, in the case of section [4.0, 12.0], the integration start depth is 4.0 nm (in terms of SiO ₂ ) (4.0 nm depth from the surface), and the integration end depth is reached. Is 12.0 nm (in terms of SiO ₂ ) (depth of 12.0 nm from the surface).

<Career>
Carriers that can be used in the present invention are typically metal foils or resin films, such as copper foil, copper alloy foil, nickel foil, nickel alloy foil, iron foil, iron alloy foil, stainless steel foil, aluminum foil, aluminum. It is provided in the form of alloy foil, insulating resin film, polyimide film, LCD film.
Carriers that can be used in the present invention are typically provided in the form of rolled copper foil or electrolytic copper foil. In general, the electrolytic copper foil is produced by electrolytic deposition of copper from a copper sulfate plating bath onto a drum of titanium or stainless steel, and the rolled copper foil is produced by repeating plastic working and heat treatment with a rolling roll. Examples of copper foil materials include high-purity copper such as tough pitch copper (JIS H3100 alloy number C1100) and oxygen-free copper (JIS H3100 alloy number C1020 or JIS H3510 alloy number C1011), for example, Sn-containing copper, Ag-containing copper, Cr A copper alloy such as a copper alloy added with Zr or Mg, or a Corson copper alloy added with Ni, Si or the like can also be used. In addition, when the term “copper foil” is used alone in this specification, a copper alloy foil is also included.

  The thickness of the carrier that can be used in the present invention is not particularly limited, but may be appropriately adjusted to a thickness suitable for serving as a carrier, for example, 12 μm or more. However, if it is too thick, the production cost becomes high, so generally it is preferably 35 μm or less. Accordingly, the thickness of the carrier is typically 12-70 μm, more typically 18-35 μm.

<Intermediate layer>
An intermediate layer containing Ni is provided on one side or both sides of the carrier. Note that another layer may be provided between the carrier and the intermediate layer.
The intermediate layer is formed by laminating any one layer of nickel or an alloy containing nickel on the carrier and a layer containing any one or more of chromium, a chromium alloy, and an oxide of chromium in this order. It is preferable. In addition, it is preferable that zinc is contained in any one layer of nickel or an alloy containing nickel and / or a layer containing any one or more of chromium, a chromium alloy, and an oxide of chromium. Here, the alloy containing nickel is composed of nickel and one or more elements selected from the group consisting of cobalt, iron, chromium, molybdenum, zinc, tantalum, copper, aluminum, phosphorus, tungsten, tin, arsenic, and titanium. An alloy. The alloy containing nickel may be an alloy composed of three or more elements. A chromium alloy is an alloy composed of chromium and one or more elements selected from the group consisting of cobalt, iron, nickel, molybdenum, zinc, tantalum, copper, aluminum, phosphorus, tungsten, tin, arsenic, and titanium. Say. The chromium alloy may be an alloy composed of three or more elements. Further, the layer containing any one or more of chromium, a chromium alloy, and a chromium oxide may be a chromate treatment layer. Here, the chromate-treated layer refers to a layer treated with a liquid containing chromate or dichromate. The chromate treatment layer may contain a metal such as cobalt, iron, nickel, molybdenum, zinc, tantalum, copper, aluminum, phosphorus, tungsten, tin, arsenic, and titanium. In the present invention, a chromate treatment layer treated with an anhydrous chromic acid or potassium dichromate aqueous solution is referred to as a pure chromate treatment layer. In the present invention, a chromate treatment layer treated with a treatment liquid containing chromic anhydride or potassium dichromate and zinc is referred to as a zinc chromate treatment layer.
The intermediate layer is any one of nickel, nickel-zinc alloy, nickel-phosphorus alloy and nickel-cobalt alloy on the carrier, and any of zinc chromate treatment layer, pure chromate treatment layer and chromium plating layer. It is preferable that one kind of layer is laminated in this order, and the intermediate layer is constituted by laminating a nickel layer or a nickel-zinc alloy layer and a zinc chromate treatment layer in this order on the carrier. More preferably, the nickel-zinc alloy layer and the pure chromate treatment layer or the zinc chromate treatment layer are laminated in this order. Since the adhesive force between nickel and copper is higher than the adhesive force between chromium and copper, when the ultrathin copper layer is peeled off, it peels at the interface between the ultrathin copper layer and the chromate treatment layer. Further, the nickel of the intermediate layer is expected to have a barrier effect that prevents the copper component from diffusing from the carrier into the ultrathin copper layer. Further, it is preferable to form a chromate treatment layer on the intermediate layer instead of chrome plating. Since chromium plating forms a dense chromium oxide layer on the surface, when an ultrathin copper foil is formed by electroplating, the electrical resistance increases and pinholes are likely to occur. The surface on which the chromate treatment layer is formed has a chromium oxide layer that is less dense than chrome plating, so resistance to formation of ultrathin copper foil by electroplating is less likely to reduce pinholes. it can. Here, by forming a zinc chromate treatment layer as a chromate treatment layer, the resistance when forming an ultrathin copper foil by electroplating is lower than that of a normal chromate treatment layer, and the generation of pinholes is further suppressed. be able to.
When using electrolytic copper foil as a carrier, it is preferable to provide an intermediate layer on the shiny surface from the viewpoint of reducing pinholes.

  Among the intermediate layers, the chromate treatment layer is thinly present at the interface of the ultrathin copper layer, while the ultrathin copper layer does not peel off from the carrier before the laminating process on the insulating substrate, while after the laminating process on the insulating substrate It is preferable for obtaining the property that the ultrathin copper layer can be peeled from the carrier. When the chromate treatment layer is present at the boundary between the carrier and the ultrathin copper layer without providing a nickel layer or an alloy layer containing nickel (for example, a nickel-zinc alloy layer), the peelability is hardly improved, and the chromate treatment layer When the nickel layer or the nickel-containing alloy layer (for example, nickel-zinc alloy layer) and the ultrathin copper layer are directly laminated, the nickel amount in the nickel layer or the nickel-containing alloy layer (for example, nickel-zinc alloy layer) Accordingly, the peel strength is too strong or too weak to obtain an appropriate peel strength.

  Further, if the chromate treatment layer is present at the boundary between the carrier and the nickel layer or nickel-containing alloy layer (for example, nickel-zinc alloy layer), the intermediate layer is also peeled along with the peeling of the ultrathin copper layer, that is, the carrier. And the intermediate layer is undesirably peeled off. Such a situation may occur not only when the chromate treatment layer is provided at the interface with the carrier, but also when the amount of chromium is excessive even if the chromate treatment layer is provided at the interface with the ultrathin copper layer. This is because copper and nickel are likely to be in solid solution, so if they are in contact with each other, the adhesive force increases due to mutual diffusion and is difficult to peel off, while chromium and copper are less likely to dissolve and cause mutual diffusion. It is considered that the adhesion between the chromium and copper interface is weak and easy to peel off. Further, when the nickel amount in the intermediate layer is insufficient, there is only a very small amount of chromium between the carrier and the ultrathin copper layer, so that they are in close contact with each other and are difficult to peel off.

The intermediate nickel layer or nickel-containing alloy layer (for example, nickel-zinc alloy layer) is formed by wet plating such as electroplating, electroless plating and immersion plating, or dry plating such as sputtering, CVD and PDV. can do. Electroplating is preferable from the viewpoint of cost. When the carrier is a resin film, the intermediate layer can be formed by dry plating such as CVD and PDV or wet plating such as electroless plating and immersion plating.
In addition, the chromate treatment layer can be formed with, for example, electrolytic chromate or immersion chromate, but the chromium concentration can be increased, and the peel strength of the ultra-thin copper layer from the carrier is improved. Preferably formed.
Further, the amount of adhered 100~40000μg / dm ² of nickel in the intermediate layer, the adhesion amount of chromium 5~100μg / dm ^2, the amount of deposition of zinc is preferably 1~70μg / dm ^2. As described above, in the copper foil with carrier of the present invention, the amount of Ni on the surface of the ultrathin copper layer after the ultrathin copper layer is peeled from the copper foil with carrier is controlled. In order to control the amount of Ni on the surface of the ultra-thin copper layer, the intermediate layer is made of a metal species (Cr, Zn) that suppresses the diffusion of Ni to the ultra-thin copper layer side while reducing the amount of Ni deposited on the intermediate layer. Is preferably included. From this point of view, Ni content of the intermediate layer is preferably from 100~40000μg / dm ^2, more preferably not less 200 [mu] g / dm ² or more 20000μg / dm ² or less, 500 [mu] g / dm ² or more 10000 / more preferably at dm ² or less, and even more preferably 700 [mu] g / dm ² or more 5000 [mu] g / dm ² or less. Further, Cr is preferably contained 5~100μg / dm ^2, more preferably not less 8 [mu] g / dm ² or more 50 [mu] g / dm ² or less, more preferably at 10 [mu] g / dm ² or more 40 [mu] g / dm ² or less, More preferably, it is 12 μg / dm ² or more and 30 μg / dm ² or less. Zn is preferably contained 1~70μg / dm ^2, more preferably not less 3 [mu] g / dm ² or more 30 [mu] g / dm ² or less, and even more preferably 5 [mu] g / dm ² or more 20 [mu] g / dm ² or less.

The intermediate layer of the carrier-attached copper foil of the present invention is formed by laminating a nickel layer on a carrier and an organic material layer containing any one of a nitrogen-containing organic compound, a sulfur-containing organic compound and a carboxylic acid, The adhesion amount of nickel in the intermediate layer may be 100 to 40,000 μg / dm ² . Further, the intermediate layer of the carrier-attached copper foil of the present invention is configured by laminating in order of a nitrogen-containing organic compound, a sulfur-containing organic compound and a carboxylic acid, and a nickel layer on the carrier. The adhesion amount of nickel in the intermediate layer may be 100 to 40,000 μg / dm ² . As described above, in the copper foil with carrier of the present invention, the amount of Ni on the surface of the ultrathin copper layer after the ultrathin copper layer is peeled from the copper foil with carrier is controlled. In order to control the amount of Ni on the surface of the ultrathin copper layer, a nitrogen-containing organic compound, a sulfur-containing organic compound that suppresses the diffusion of Ni to the ultrathin copper layer side while reducing the Ni adhesion amount of the intermediate layer and It is preferable that the intermediate layer includes an organic material layer containing any of carboxylic acids. From this point of view, Ni content of the intermediate layer is preferably from 100~40000μg / dm ^2, more preferably not less 200 [mu] g / dm ² or more 20000μg / dm ² or less, 300 [mu] g / dm ² or more 10000 / more preferably at dm ² or less, and even more preferably 500 [mu] g / dm ² or more 5000 [mu] g / dm ² or less. Moreover, BTA (benzotriazole), MBT (mercaptobenzothiazole), etc. are mentioned as an organic substance containing either the said nitrogen containing organic compound, sulfur containing organic compound, and carboxylic acid.

Moreover, as an organic substance which an intermediate | middle layer contains, it is preferable to use what consists of 1 type (s) or 2 or more types selected from a nitrogen containing organic compound, a sulfur containing organic compound, and carboxylic acid. Among the nitrogen-containing organic compound, the sulfur-containing organic compound, and the carboxylic acid, the nitrogen-containing organic compound includes a nitrogen-containing organic compound having a substituent. Specific nitrogen-containing organic compounds include 1,2,3-benzotriazole, carboxybenzotriazole, N ′, N′-bis (benzotriazolylmethyl) urea, 1H-1 which are triazole compounds having a substituent. 2,4-triazole, 3-amino-1H-1,2,4-triazole and the like are preferably used.
For the sulfur-containing organic compound, it is preferable to use mercaptobenzothiazole, 2-mercaptobenzothiazole sodium, thiocyanuric acid, 2-benzimidazolethiol, and the like.
As the carboxylic acid, it is particularly preferable to use a monocarboxylic acid, and it is particularly preferable to use oleic acid, linoleic acid, linolenic acid, or the like.
The organic material is preferably contained in a thickness of 25 nm to 80 nm, more preferably 30 nm to 70 nm. The intermediate layer may contain a plurality of types (one or more) of the aforementioned organic substances.
In addition, the thickness of organic substance can be measured as follows.

<Thickness of organic material in the intermediate layer>
After peeling off the ultrathin copper layer of the carrier-attached copper foil from the carrier, the surface of the exposed ultrathin copper layer on the intermediate layer side and the exposed surface of the intermediate layer side of the carrier are subjected to XPS measurement to create a depth profile. The depth at which the carbon concentration first becomes 3 at% or less from the surface on the intermediate layer side of the ultrathin copper layer is defined as A (nm), and the carbon concentration is initially 3 at% or less from the surface on the intermediate layer side of the carrier. The resulting depth can be defined as B (nm), and the sum of A and B can be defined as the thickness (nm) of the organic substance in the intermediate layer.
XPS operating conditions are shown below.
・ Device: XPS measuring device (ULVAC-PHI, Model 5600MC)
・ Achieving vacuum: 3.8 × 10 ⁻⁷ Pa
X-ray: Monochromatic AlKα or non-monochromatic MgKα, X-ray output 300 W, detection area 800 μmφ, angle between sample and detector 45 °
Ion beam: ion species Ar ⁺ , acceleration voltage 3 kV, sweep area 3 mm × 3 mm, sputtering rate 2.8 nm / min (SiO ₂ conversion)

The method for using the organic substance contained in the intermediate layer will be described below with reference to the method for forming the intermediate layer on the carrier foil. The intermediate layer is formed on the carrier by dissolving the above-mentioned organic substance in a solvent and immersing the carrier in the solvent, or showering, spraying method, dropping method and electrodeposition method on the surface on which the intermediate layer is to be formed. Etc., and there is no need to adopt a particularly limited method. At this time, the concentration of the organic agent in the solvent is preferably in the range of a concentration of 0.01 g / L to 30 g / L and a liquid temperature of 20 to 60 ° C. in all the organic substances described above. The concentration of the organic substance is not particularly limited, and there is no problem even if the concentration is originally high or low. In addition, the organic substance thickness of an intermediate | middle layer tends to become large, so that the density | concentration of organic substance is high, and the contact time of the carrier to the solvent which dissolved the organic substance mentioned above is long. And when the organic substance thickness of an intermediate | middle layer is thick, it exists in the tendency for the effect of organic substance to suppress the spreading | diffusion to the ultra-thin copper layer side of Ni to become large.
In addition, the intermediate layer is preferably configured by stacking nickel and molybdenum or cobalt or a molybdenum-cobalt alloy in this order on a carrier. Since the adhesion force between nickel and copper is higher than the adhesion force between molybdenum or cobalt and copper, when peeling the ultrathin copper layer, the interface between the ultrathin copper layer and molybdenum or cobalt or molybdenum-cobalt alloy It will come off. Further, the nickel of the intermediate layer is expected to have a barrier effect that prevents the copper component from diffusing from the carrier into the ultrathin copper layer.
The aforementioned nickel may be an alloy containing nickel. Here, the alloy containing nickel is composed of nickel and one or more elements selected from the group consisting of cobalt, iron, chromium, molybdenum, zinc, tantalum, copper, aluminum, phosphorus, tungsten, tin, arsenic, and titanium. An alloy. The molybdenum described above may be an alloy containing molybdenum. Here, the alloy containing molybdenum is composed of molybdenum and one or more elements selected from the group consisting of cobalt, iron, chromium, nickel, zinc, tantalum, copper, aluminum, phosphorus, tungsten, tin, arsenic, and titanium. An alloy. The cobalt described above may be an alloy containing cobalt. Here, the alloy containing cobalt is made of cobalt and one or more elements selected from the group consisting of molybdenum, iron, chromium, nickel, zinc, tantalum, copper, aluminum, phosphorus, tungsten, tin, arsenic, and titanium. An alloy.
Molybdenum-cobalt alloy is an element other than molybdenum and cobalt (for example, one or more elements selected from the group consisting of cobalt, iron, chromium, molybdenum, zinc, tantalum, copper, aluminum, phosphorus, tungsten, tin, arsenic, and titanium). May be included.
When using electrolytic copper foil as a carrier, it is preferable to provide an intermediate layer on the shiny surface from the viewpoint of reducing pinholes.
Among the intermediate layers, the molybdenum or cobalt or molybdenum-cobalt alloy layer is thinly present at the interface of the ultrathin copper layer, while the ultrathin copper layer does not peel off from the carrier before the lamination process to the insulating substrate, while the insulating substrate It is preferable for obtaining the property that the ultrathin copper layer can be peeled off from the carrier after the lamination step. If a molybdenum or cobalt or molybdenum-cobalt alloy layer is present at the boundary between the carrier and the ultrathin copper layer without providing a nickel layer, the peelability may be hardly improved, and the molybdenum or cobalt or molybdenum-cobalt alloy layer When the nickel layer and the ultrathin copper layer are directly laminated, the peel strength may be too strong or too weak depending on the amount of nickel in the nickel layer, and an appropriate peel strength may not be obtained.
In addition, if the molybdenum or cobalt or molybdenum-cobalt alloy layer is present at the boundary between the carrier and the nickel layer, the intermediate layer may be additionally peeled off when the ultrathin copper layer is peeled off, that is, between the carrier and the intermediate layer. May cause undesirable peeling. Such a situation is not only when a molybdenum or cobalt or molybdenum-cobalt alloy layer is provided at the interface with the carrier, but also when a molybdenum or cobalt or molybdenum-cobalt alloy layer is provided at the interface with the ultrathin copper layer. This can occur if the amount of molybdenum or cobalt is too high. This is because copper and nickel are likely to be in solid solution, so if they are in contact with each other, the adhesive force increases due to mutual diffusion and it is difficult to peel off, while molybdenum or cobalt and copper are less likely to dissolve and mutual diffusion. This is considered to be because the adhesive force is weak at the interface between the molybdenum or cobalt or molybdenum-cobalt alloy layer and copper and is easily peeled off. Further, when the amount of nickel in the intermediate layer is insufficient, since only a small amount of molybdenum or cobalt is present between the carrier and the ultrathin copper layer, they may be in close contact and difficult to peel off.
The intermediate layer nickel and cobalt or molybdenum-cobalt alloy can be formed by wet plating such as electroplating, electroless plating and immersion plating, or dry plating such as sputtering, CVD and PDV. Molybdenum can be formed only by dry plating such as CVD and PDV. Electroplating is preferable from the viewpoint of cost.
In the intermediate layer, the adhesion amount of nickel is 100 to 40000 μg / dm ² , the adhesion amount of molybdenum is 10 to 1000 μg / dm ² , and the adhesion amount of cobalt is 10 to 1000 μg / dm ² . As described above, in the copper foil with carrier of the present invention, the amount of Ni on the surface of the ultrathin copper layer after the ultrathin copper layer is peeled from the copper foil with carrier is controlled. In order to control the amount of Ni on the surface of the ultrathin copper layer, the intermediate layer is made of a metal species (Co, Mo) that suppresses the diffusion of Ni toward the ultrathin copper layer while reducing the amount of Ni deposited on the intermediate layer. Is preferably included. From this viewpoint, the amount of nickel deposited is preferably to 100~40000μg / dm ^2, preferably to 200~20000μg / dm ^2, more preferably to 300~15000μg / dm ^2, 300~10000μg / Dm ² is more preferable. If included molybdenum in the intermediate layer, a molybdenum deposition amount is preferably set to 10~1000μg / dm ^2, the molybdenum deposition amount is preferably set to 20~600μg / dm ^2, and 30~400μg / dm ² More preferably. If included cobalt in the intermediate layer, the cobalt coating weight is preferably set to 10~1000μg / dm ^2, cobalt deposition amount is preferably set to 20~600μg / dm ^2, and 30~400μg / dm ² More preferably.
As described above, the intermediate layer is plated for providing a molybdenum, cobalt, or molybdenum-cobalt alloy layer when nickel and molybdenum, cobalt, or a molybdenum-cobalt alloy are stacked in this order on a carrier. When the current density in the treatment is lowered and the carrier conveyance speed is lowered, the density of the molybdenum, cobalt, or molybdenum-cobalt alloy layer tends to increase. When the density of the layer containing molybdenum and / or cobalt increases, nickel in the nickel layer becomes difficult to diffuse, and the amount of Ni on the surface of the ultrathin copper layer after peeling can be controlled. Note that the release layer may be provided on both sides of the carrier.

<Strike plating>
An ultrathin copper layer is provided on the intermediate layer. Before that, strike plating with a copper-phosphorus alloy may be performed in order to reduce pinholes in the ultrathin copper layer. Examples of the strike plating include a copper pyrophosphate plating solution.

<Ultrathin copper layer>
An ultrathin copper layer is provided on the intermediate layer. Other layers may be provided between the intermediate layer and the ultrathin copper layer.
The ultra-thin copper layer can be formed by electroplating using an electrolytic bath such as copper sulfate, copper pyrophosphate, copper sulfamate, copper cyanide, etc., and is used in general electrolytic copper foil with high current density. Since a copper foil can be formed, a copper sulfate bath is preferable. The thickness of the ultrathin copper layer is not particularly limited, but is generally thinner than the carrier, for example, 12 μm or less. Typically, it is 0.5 to 12 μm, more typically 1.5 to 5 μm, and more typically 2 to 5 μm. The ultra thin copper layer may be provided on both sides of the carrier.

<Roughening treatment>
A roughening treatment layer may be provided on the surface of the ultrathin copper layer by performing a roughening treatment, for example, in order to improve the adhesion to the insulating substrate. The roughening treatment can be performed, for example, by forming roughened particles with copper or a copper alloy. The roughening process may be fine. The roughening treatment layer is a layer made of any single element selected from the group consisting of copper, nickel, cobalt, phosphorus, tungsten, arsenic, molybdenum, chromium and zinc, or an alloy containing one or more of them. Also good. Moreover, after forming the roughened particles with copper or a copper alloy, a roughening treatment can be performed in which secondary particles or tertiary particles are further formed of nickel, cobalt, copper, zinc alone or an alloy. Thereafter, a heat-resistant layer or a rust-preventing layer may be formed of nickel, cobalt, copper, zinc alone or an alloy, and the surface thereof may be further subjected to a treatment such as a chromate treatment or a silane coupling treatment. Alternatively, a heat-resistant layer or a rust-preventing layer may be formed from nickel, cobalt, copper, zinc alone or an alloy without roughening, and the surface may be subjected to a treatment such as chromate treatment or silane coupling treatment. Good. That is, one or more layers selected from the group consisting of a heat resistant layer, a rust preventive layer, a chromate treated layer and a silane coupling treated layer may be formed on the surface of the roughened treated layer. One or more layers selected from the group consisting of a heat-resistant layer, a rust prevention layer, a chromate treatment layer, and a silane coupling treatment layer may be formed on the surface. In addition, the above-mentioned heat-resistant layer, rust prevention layer, chromate treatment layer, and silane coupling treatment layer may each be formed of a plurality of layers (for example, 2 layers or more, 3 layers or more, etc.). These surface treatments hardly affect the surface roughness of the ultrathin copper layer.

  The roughening treatment can be performed, for example, by forming roughened particles with copper or a copper alloy. The roughening treatment layer is preferably composed of fine particles from the viewpoint of fine pitch formation. Regarding the electroplating conditions for forming the roughened particles, if the current density is increased, the copper concentration in the plating solution is decreased, or the amount of coulomb is increased, the particles tend to become finer.

  In order to improve the in-plane uniformity of the surface roughness on the surface treatment surface, it is effective to keep the anode-cathode distance constant when the roughening treatment layer is formed. Although not limited, a method of ensuring a certain distance between the electrodes by a foil carrying method using a drum or the like as a supporting medium is effective from the viewpoint of industrial production. FIG. 10 is a schematic diagram showing the foil handling method. A roughened particle layer is formed on the surface of the ultrathin copper layer by electrolytic plating while supporting the carrier copper foil conveyed by the conveyance roll with a drum. The treated surface of the carrier copper foil supported by the drum also serves as the cathode, and each electrolytic plating is performed in a plating solution between this drum and an anode provided so as to face the drum. On the other hand, FIG. 11 is a schematic diagram showing a conventional foil handling method using ninety-nine folds. In this method, there is a problem that it is difficult to keep the distance between the anode and the cathode constant due to the influence of the electrolytic solution and the foil carrying tension. In order to keep the anode-cathode distance at the time of the roughening treatment layer formation constant by the foil handling method by 99-fold, the tension for carrying the foil is made higher than the conventional, and the distance between the transport rolls. It is effective to shorten the length.

  As shown in FIG. 10, the foil carrying method using a drum can be used not only for roughening treatment but also for forming a release layer and an ultrathin copper layer. This is because it is possible to improve the thickness accuracy of the release layer and the ultrathin copper layer by adopting the drum carrying method. In order to maintain a constant distance between the anode and the cathode when forming the peeling layer or the ultrathin copper layer by the carrying method using the 99-fold method, the tension for carrying the foil is made higher than before, and the carrying roll It is effective to shorten the distance between them.

  The distance between the electrodes is not limited, but if it is too long, the production cost increases. On the other hand, if it is too short, the in-plane variation tends to increase, so generally 3 to 100 mm is preferable, and 5 to 80 mm is more preferable.

  The surface of the ultrathin copper layer after various surface treatments such as roughening treatment (also referred to as “surface treated surface”) is Rz when measured according to JIS B0601-1982 with a contact-type roughness meter. By setting the average value of (ten-point average roughness) to 1.5 μm or less, it is possible to satisfactorily suppress the occurrence of migration of circuits formed on the surface, which is extremely advantageous from the viewpoint of fine pitch formation. The average value of Rz is preferably 1.4 μm or less, more preferably 1.3 μm or less, more preferably 1.2 μm or less, more preferably 1.0 μm or less, and more preferably 0.8 μm. It is as follows. However, the average value of Rz is preferably 0.01 μm or more, more preferably 0.1 μm or more, and more preferably 0.3 μm or more because the adhesive strength with the resin decreases if the average value becomes too small. More preferably 0.5 μm or more. In the present invention, the average value of Rz employs the average value of each Rz obtained when the standard deviation of Rz is obtained by the method described below.

  In the present invention, by setting the standard deviation of Rz on the surface-treated surface to 0.1 μm or less, it is possible to better suppress the occurrence of migration of circuits formed on the surface, which is extremely advantageous from the viewpoint of fine pitch formation. It becomes. The standard deviation of Rz can be preferably 0.05 μm or less, for example, 0.01 to 0.7 μm. The standard deviation of Rz on the surface-treated surface is obtained from in-plane 100-point measurement data. In addition, the measurement data of 100 points in the plane can be obtained by dividing a 550 mm square sheet into 10 parts in the vertical direction and the horizontal direction, and measuring each central part of 100 divided areas. In this case, this method is used to maintain in-plane uniformity, but the verification method is not limited to this. For example, the same data can be collected even if a sample having a size of 550 mm × 440 mm to 400 mm × 200 mm, which is generally used, is divided into 100 planes (vertically and horizontally 10 sections).

  The surface-treated surface is formed on the surface by setting the average value of Rt (maximum cross-sectional height) to 2.0 μm or less when measured according to JIS B0601-2001 with a contact-type roughness meter. The occurrence of circuit migration can be satisfactorily suppressed, which is extremely advantageous from the viewpoint of fine pitch formation. The average value of Rt is preferably 1.8 μm or less, preferably 1.5 μm or less, preferably 1.3 μm or less, preferably 1.1 μm or less from the viewpoint of fine pitch formation. However, if the average value of Rt becomes too small, the adhesive strength with the resin is lowered, so that it is preferably 0.5 μm or more, more preferably 0.6 μm or more, and even more preferably 0.8 μm or more. is there. In the present invention, the average value of Rt is the average value of each Rt obtained when the standard deviation of Rt is obtained by the method described below.

  In the present invention, when the standard deviation of Rt on the surface-treated surface is 0.1 μm or less, the occurrence of migration of the circuit formed on the surface can be suppressed more favorably, which is extremely advantageous from the viewpoint of fine pitch formation. It becomes. The standard deviation of Rt can be preferably 0.05 μm or less, for example, 0.01 to 0.6 μm. The standard deviation of Rt on the surface-treated surface is obtained from the measurement data at 100 points in the surface in the same manner as Rz.

  The surface-treated surface is formed on the surface by setting the average value of Ra (arithmetic mean roughness) to 0.2 μm or less when measured according to JIS B0601-1982 with a contact-type roughness meter. Generation of circuit migration can be satisfactorily suppressed, which is desirable from the viewpoint of fine pitch formation. The average value of Ra is more preferably 0.18 μm or less, and preferably 0.15 μm or less. However, if the average value of Ra becomes too small, the adhesive strength with the resin is lowered, so that it is preferably 0.01 μm or more, more preferably 0.05 μm or more, and even more preferably 0.12 μm or more. And most preferably 0.13 μm or more. In the present invention, the average value of Ra is adopted as the average value of each Ra obtained when the standard deviation of Ra is obtained by the method described below.

  In the present invention, by setting the standard deviation of Ra on the surface-treated surface to 0.03 μm or less, the occurrence of migration of circuits formed on the surface can be suppressed more favorably, which is extremely advantageous from the viewpoint of fine pitch formation. It becomes. The standard deviation of Ra can be preferably 0.02 μm or less, for example, 0.001 to 00.3 μm. The standard deviation of Ra on the surface-treated surface is obtained from measurement data at 100 points in the surface in the same manner as Rz.

  In the present invention, the surface roughness of the ultrathin copper layer indicates the surface roughness of the surface treated side when the ultrathin copper layer is surface treated. In addition, in the case where an insulating substrate such as a resin is bonded to the surface of an ultrathin copper layer, such as a printed wiring board or a copper clad laminate, by melting and removing the insulating substrate, the copper circuit or copper foil surface, The aforementioned surface roughness (Ra, Rt, Rz) can be measured.

<Printed wiring boards, printed circuit boards, and copper-clad laminates>
A copper clad laminate can be produced by attaching a copper foil with a carrier to the insulating resin plate from the ultrathin copper layer side, thermocompression bonding, and peeling the carrier. Thereafter, a copper circuit of a printed wiring board or a printed circuit board can be formed by etching the ultrathin copper layer portion. The insulating resin plate used here is not particularly limited as long as it has characteristics applicable to a printed wiring board or a printed circuit board. For example, a paper base phenolic resin, a paper base epoxy resin for rigid PWB, Use synthetic fiber cloth base epoxy resin, glass cloth / paper composite base epoxy resin, glass cloth / glass non-woven composite base epoxy resin, glass cloth base epoxy resin, etc., polyester film or polyimide film etc. for FPC Can be used. The printed wiring board, printed circuit board, and copper-clad laminate produced in this manner can be mounted on various electronic components that require high-density mounting of the mounted components.

Moreover, the copper foil with a carrier provided with the copper foil carrier and the ultrathin copper layer laminated on the intermediate layer on the copper foil carrier is roughened on the ultrathin copper layer. A layer may be provided, and one or more layers selected from the group consisting of a heat-resistant layer, a rust prevention layer, a chromate treatment layer, and a silane coupling treatment layer may be provided on the roughening treatment layer.
Further, a roughening treatment layer may be provided on the ultrathin copper layer, a heat resistant layer and a rust prevention layer may be provided on the roughening treatment layer, and a chromate treatment is performed on the heat resistance layer and the rust prevention layer. A layer may be provided, and a silane coupling treatment layer may be provided on the chromate treatment layer.
The carrier-attached copper foil includes a resin layer on the ultrathin copper layer, the roughened layer, the heat-resistant layer, the rust-proof layer, the chromate-treated layer, or the silane coupling-treated layer. May be.

  The resin layer may be an adhesive resin, that is, an adhesive, or an adhesive semi-cured (B stage state) insulating resin layer. The semi-cured state (B stage state) is a state in which there is no sticky feeling even if the surface is touched with a finger, the insulating resin layer can be stacked and stored, and a curing reaction occurs when subjected to heat treatment. Including that.

  The resin layer may contain a thermosetting resin or may be a thermoplastic resin. The resin layer may include a thermoplastic resin. The resin layer may contain a known resin, resin curing agent, compound, curing accelerator, dielectric, reaction catalyst, crosslinking agent, polymer, prepreg, skeleton material, and the like. The resin layer may be, for example, International Publication No. WO2008 / 004399, International Publication No. WO2008 / 053878, International Publication No. WO2009 / 084533, JP-A-11-5828, JP-A-11-140281, Patent 3184485, International Publication. No. WO 97/02728, Japanese Patent No. 3676375, Japanese Patent Laid-Open No. 2000-43188, Japanese Patent No. 3612594, Japanese Patent Laid-Open No. 2002-179722, Japanese Patent Laid-Open No. 2002-359444, Japanese Patent Laid-Open No. 2003-302068, Japanese Patent No. 3992225, Japanese Patent Laid-Open No. 2003 No. 249739, Japanese Patent No. 4136509, Japanese Patent Application Laid-Open No. 2004-82687, Japanese Patent No. 4025177, Japanese Patent Application Laid-Open No. 2004-349654, Japanese Patent No. 4286060, Japanese Patent Application Laid-Open No. 2005-262506, Japanese Patent No. 4570070, Japanese Patent Application Laid-Open No. No. 5-53218, Japanese Patent No. 3949676, Japanese Patent No. 4178415, International Publication No. WO2004 / 005588, Japanese Patent Application Laid-Open No. 2006-257153, Japanese Patent Application Laid-Open No. 2007-326923, Japanese Patent Application Laid-Open No. 2008-11169, and Japanese Patent No. 5024930. No. WO2006 / 028207, Japanese Patent No. 4828427, JP 2009-67029, International Publication No. WO 2006/134868, Japanese Patent No. 5046927, JP 2009-173017, International Publication No. WO 2007/105635, Patent No. 5180815, International Publication Number WO2008 / 114858, International Publication Number WO2009 / 008471, Japanese Patent Application Laid-Open No. 2011-14727, International Publication Number WO2009 / 001850, International Publication Number WO2009 / 145179, International Publication Number Nos. WO2011 / 068157, JP-A-2013-19056 (resins, resin curing agents, compounds, curing accelerators, dielectrics, reaction catalysts, crosslinking agents, polymers, prepregs, skeletal materials, etc.) and / or You may form using the formation method and formation apparatus of a resin layer.

  The type of the resin layer is not particularly limited. For example, epoxy resin, polyimide resin, polyfunctional cyanate ester compound, maleimide compound, polymaleimide compound, maleimide resin, aromatic maleimide resin , Polyvinyl acetal resin, urethane resin, polyethersulfone (also referred to as polyethersulfone or polyethersulfone), polyethersulfone (also referred to as polyethersulfone or polyethersulfone) resin, aromatic polyamide resin, aromatic Polyamide resin polymer, rubber resin, polyamine, aromatic polyamine, polyamideimide resin, rubber modified epoxy resin, phenoxy resin, carboxyl group-modified acrylonitrile-butadiene resin, polyphenylene oxide, bismaleimide triazine tree Fat, thermosetting polyphenylene oxide resin, cyanate ester resin, carboxylic acid anhydride, polyvalent carboxylic acid anhydride, linear polymer having crosslinkable functional group, polyphenylene ether resin, 2,2-bis (4 -Cyanatophenyl) propane, phosphorus-containing phenol compound, manganese naphthenate, 2,2-bis (4-glycidylphenyl) propane, polyphenylene ether-cyanate resin, siloxane-modified polyamideimide resin, cyanoester resin, phosphazene resin, Select from the group of rubber-modified polyamide-imide resin, isoprene, hydrogenated polybutadiene, polyvinyl butyral, phenoxy, polymer epoxy, aromatic polyamide, fluororesin, bisphenol, block copolymerized polyimide resin, and cyanoester resin It can be mentioned resins containing one or more kinds as suitable to be.

The epoxy resin has two or more epoxy groups in the molecule and can be used without any problem as long as it can be used for electric / electronic materials. The epoxy resin is preferably an epoxy resin epoxidized using a compound having two or more glycidyl groups in the molecule. Also, bisphenol A type epoxy resin, bisphenol F type epoxy resin, bisphenol S type epoxy resin, bisphenol AD type epoxy resin, novolac type epoxy resin, cresol novolac type epoxy resin, alicyclic epoxy resin, brominated (brominated) epoxy Resin, phenol novolac type epoxy resin, naphthalene type epoxy resin, brominated bisphenol A type epoxy resin, orthocresol novolac type epoxy resin, rubber modified bisphenol A type epoxy resin, glycidylamine type epoxy resin, triglycidyl isocyanurate, N, N -Glycidyl amine compounds such as diglycidyl aniline, glycidyl ester compounds such as diglycidyl tetrahydrophthalate, phosphorus-containing epoxy resins, biphenyl type epoxy resins, One or two or more types selected from the group of phenyl novolac type epoxy resin, trishydroxyphenylmethane type epoxy resin, tetraphenylethane type epoxy resin can be used, or a hydrogenated product of the epoxy resin or Halogenated substances can be used.
As the phosphorus-containing epoxy resin, a known epoxy resin containing phosphorus can be used. The phosphorus-containing epoxy resin is, for example, an epoxy resin obtained as a derivative from 9,10-dihydro-9-oxa-10-phosphaphenanthrene-10-oxide having two or more epoxy groups in the molecule. Is preferred.

  The epoxy resin obtained as a derivative from 9,10-dihydro-9-oxa-10-phosphaphenanthrene-10-oxide is converted to 9,10-dihydro-9-oxa-10-phosphaphenanthrene-10-oxide. After reacting naphthoquinone or hydroquinone to obtain a compound represented by the following chemical formula 1 (HCA-NQ) or chemical formula 2 (HCA-HQ), an epoxy resin is reacted with the OH group portion to obtain a phosphorus-containing epoxy resin. Is.

  The phosphorus-containing epoxy resin, which is the E component obtained using the above-mentioned compound as a raw material, is used by mixing one or two kinds of compounds having the structural formula shown in any of the following chemical formulas 3 to 5. Is preferred. This is because the resin quality in a semi-cured state is excellent in stability, and at the same time the flame retardant effect is high.

また、前記ブロム化（臭素化）エポキシ樹脂として、公知のブロム化（臭素化）されているエポキシ樹脂を用いることができる。例えば、前記ブロム化（臭素化）エポキシ樹脂は分子内に２以上のエポキシ基を備えるテトラブロモビスフェノールＡからの誘導体として得られる化６に示す構造式を備える臭素化エポキシ樹脂、以下に示す化７に示す構造式を備える臭素化エポキシ樹脂の１種又は２種を混合して用いることが好ましい。

Further, as the brominated (brominated) epoxy resin, a known brominated (brominated) epoxy resin can be used. For example, the brominated (brominated) epoxy resin is a brominated epoxy resin having the structural formula shown in Chemical formula 6 obtained as a derivative from tetrabromobisphenol A having two or more epoxy groups in the molecule. It is preferable to use one or two brominated epoxy resins having the structural formula shown in FIG.

前記マレイミド系樹脂または芳香族マレイミド樹脂またはマレイミド化合物またはポリマレイミド化合物としては、公知のマレイミド系樹脂または芳香族マレイミド樹脂またはマレイミド化合物またはポリマレイミド化合物を用いることができる。例えばマレイミド系樹脂または芳香族マレイミド樹脂またはマレイミド化合物またはポリマレイミド化合物としては４，４’−ジフェニルメタンビスマレイミド、ポリフェニルメタンマレイミド、ｍ−フェニレンビスマレイミド、ビスフェノールＡジフェニルエーテルビスマレイミド、３，３’−ジメチル−５，５’−ジエチル−４，４’−ジフェニルメタンビスマレイミド、４−メチル−１，３−フェニレンビスマレイミド、４，４’−ジフェニルエーテルビスマレイミド、４，４’−ジフェニルスルフォンビスマレイミド、１，３−ビス（３−マレイミドフェノキシ）ベンゼン、１，３−ビス（４−マレイミドフェノキシ）ベンゼン並びに上記化合物と、上記化合物またはその他の化合物とを重合させたポリマー等の使用が可能である。また、前記マレイミド系樹脂は、分子内に２個以上のマレイミド基を有する芳香族マレイミド樹脂であってもよく、分子内に２個以上のマレイミド基を有する芳香族マレイミド樹脂とポリアミンまたは芳香族ポリアミンとを重合させた重合付加物であってもよい。
前記ポリアミンまたは芳香族ポリアミンとしては、公知のポリアミンまたは芳香族ポリアミンを用いることができる。例えば、ポリアミンまたは芳香族ポリアミンとして、ｍ−フェニレンジアミン、ｐ−フェニレンジアミン、４，４’−ジアミノジシクロヘキシルメタン、１，４−ジアミノシクロヘキサン、２，６−ジアミノピリジン、４，４’−ジアミノジフェニルメタン、２，２−ビス（４−アミノフェニル）プロパン、４，４’−ジアミノジフェニルエーテル、４，４’−ジアミノ−３−メチルジフェニルエーテル、４，４’−ジアミノジフェニルスルフィド、４，４’−ジアミノベンゾフェノン、４，４’−ジアミノジフェニルスルホン、ビス（４−アミノフェニル）フェニルアミン、ｍ−キシレンジアミン、ｐ−キシレンジアミン、１，３−ビス［４−アミノフェノキシ］ベンゼン、３−メチル−４，４’−ジアミノジフェニルメタン、３，３’−ジエチル−４，４’−ジアミノジフェニルメタン、３，３’−ジクロロ−４，４’−ジアミノジフェニルメタン、２，２’，５，５’−テトラクロロ−４，４’−ジアミノジフェニルメタン、２，２−ビス（３−メチル−４−アミノフェニル）プロパン、２，２−ビス（３−エチル−４−アミノフェニル）プロパン、２，２−ビス（２，３−ジクロロ−４−アミノフェニル）プロパン、ビス（２，３−ジメチル−４−アミノフェニル）フェニルエタン、エチレンジアミンおよびヘキサメチレンジアミン、２，２−ビス（４−（４−アミノフェノキシ）フェニル）プロパン並びに上記化合物と、上記化合物またはその他の化合物とを重合させたポリマー等を用いることができる。また、公知のポリアミンおよび／または芳香族ポリアミンまたは前述のポリアミンまたは芳香族ポリアミンを一種または二種以上用いることができる。
前記フェノキシ樹脂としては公知のフェノキシ樹脂を用いることができる。また、前記フェノキシ樹脂として、ビスフェノールと２価のエポキシ樹脂との反応により合成されるものを用いることができる。エポキシ樹脂としては、公知のエポキシ樹脂および／または前述のエポキシ樹脂を用いることができる。
前記ビスフェノールとしては、公知のビスフェノールを使用することができ、またビスフェノールＡ、ビスフェノールＦ、ビスフェノールＳ、テトラブロモビスフェノールＡ、４，４’−ジヒドロキシビフェニル、ＨＣＡ（９，１０−Ｄｉｈｙｄｒｏ−９−Ｏｘａ−１０−Ｐｈｏｓｐｈａｐｈｅｎａｎｔｈｒｅｎｅ−１０−Ｏｘｉｄｅ）とハイドロキノン、ナフトキノン等のキノン類との付加物として得られるビスフェノール等を使用することができる。
前記架橋可能な官能基を有する線状ポリマーとしては、公知の架橋可能な官能基を有する線状ポリマーを用いることができる。例えば、前記架橋可能な官能基を有する線状ポリマーは水酸基、カルボキシル基等のエポキシ樹脂の硬化反応に寄与する官能基を備えることが好ましい。そして、この架橋可能な官能基を有する線状ポリマーは、沸点が５０℃〜２００℃の温度の有機溶剤に可溶であることが好ましい。ここで言う官能基を有する線状ポリマーを具体的に例示すると、ポリビニルアセタール樹脂、フェノキシ樹脂、ポリエーテルスルホン樹脂、ポリアミドイミド樹脂等である。
前記樹脂層は架橋剤を含んでもよい。架橋剤には、公知の架橋剤を用いることができる。架橋剤として例えばウレタン系樹脂を用いることができる。
前記ゴム性樹脂は公知のゴム性樹脂を用いることができる。例えば前記ゴム性樹脂とは、天然ゴム及び合成ゴムを含む概念として記載しており、後者の合成ゴムにはスチレン−ブタジエンゴム、ブタジエンゴム、ブチルゴム、エチレン−プロピレンゴム、アクリロニトリルブタジエンゴム、アクリルゴム（アクリル酸エステル共重合体）、ポリブタジエンゴム、イソプレンゴム等がある。更に、形成する樹脂層の耐熱性を確保する際には、ニトリルゴム、クロロプレンゴム、シリコンゴム、ウレタンゴム等の耐熱性を備えた合成ゴムを選択使用することも有用である。これらのゴム性樹脂に関しては、芳香族ポリアミド樹脂またはポリアミドイミド樹脂と反応して共重合体を製造するようにするため、両末端に種々の官能基を備えるものであることが望ましい。特に、ＣＴＢＮ（カルボキシ基末端ブタジエンニトリル）を用いることが有用である。また、アクリロニトリルブタジエンゴムの中でも、カルボキシル変性体であると、エポキシ樹脂と架橋構造を取り、硬化後の樹脂層のフレキシビリティを向上させることができる。カルボキシル変性体としては、カルボキシ基末端ニトリルブタジエンゴム（ＣＴＢＮ）、カルボキシ基末端ブタジエンゴム（ＣＴＢ）、カルボキシ変性ニトリルブタジエンゴム（Ｃ‐ＮＢＲ）を用いることができる。
前記ポリアミドイミド樹脂としては公知のポリイミドアミド樹脂を用いることができる。また、前記ポリイミドアミド樹脂としては例えば、トリメリット酸無水物、ベンゾフェノンテトラカルボン酸無水物及びビトリレンジイソシアネートをＮ−メチル−２−ピロリドン又は／及びＮ，Ｎ−ジメチルアセトアミド等の溶剤中で加熱することで得られる樹脂や、トリメリット酸無水物、ジフェニルメタンジイソシアネート及びカルボキシル基末端アクリロニトリル−ブタジエンゴムをＮ−メチル−２−ピロリドン又は／及びＮ，Ｎ−ジメチルアセトアミド等の溶剤中で加熱することで得られるものを用いることができる。
前記ゴム変成ポリアミドイミド樹脂として、公知のゴム変成ポリアミドイミド樹脂を用いることができる。ゴム変成ポリアミドイミド樹脂は、ポリアミドイミド樹脂とゴム性樹脂とを反応させて得られるものである。ポリアミドイミド樹脂とゴム性樹脂とを反応させて用いるのは、ポリアミドイミド樹脂そのものの柔軟性を向上させる目的で行う。すなわち、ポリアミドイミド樹脂とゴム性樹脂とを反応させ、ポリアミドイミド樹脂の酸成分（シクロヘキサンジカルボン酸等）の一部をゴム成分に置換するのである。ポリアミドイミド樹脂には公知のポリアミドイミド樹脂を用いることができる。また、ゴム性樹脂には公知のゴム性樹脂または前述のゴム性樹脂を用いることができる。ゴム変成ポリアミドイミド樹脂を重合させる際に、ポリアミドイミド樹脂とゴム性樹脂との溶解に使用する溶剤には、ジメチルホルムアミド、ジメチルアセトアミド、Ｎ−メチル−２−ピロリドン、ジメチルスルホキシド、ニトロメタン、ニトロエタン、テトラヒドロフラン、シクロヘキサノン、メチルエチルケトン、アセトニトリル、γ−ブチロラクトン等を、１種又は２種以上を混合して用いることが好ましい。
前記フォスファゼン系樹脂として、公知のフォスファゼン系樹脂を用いることができる。フォスファゼン系樹脂は、リン及び窒素を構成元素とする二重結合を持つフォスファゼンを含む樹脂である。フォスファゼン系樹脂は、分子中の窒素とリンの相乗効果により、難燃性能を飛躍的に向上させることができる。また、９，１０−ジヒドロ−９−オキサ−１０−ホスファフェナントレン−１０−オキサイド誘導体と異なり、樹脂中で安定して存在し、マイグレーションの発生を防ぐ効果が得られる。
前記フッ素樹脂として、公知のフッ素樹脂を用いることができる。また、フッ素樹脂として例えばＰＴＦＥ（ポリテトラフルオロエチレン（４フッ化））、ＰＦＡ（テトラフルオロエチレン・パーフルオロアルキルビニルエーテル共重合体）、ＦＥＰ（テトラフルオロエチレン・ヘキサフルオロプロピレン共重合体（４．６フッ化））、ＥＴＦＥ（テトラフルオロエチレン・エチレン共重合体）、ＰＶＤＦ（ポリビニリデンフルオライド（２フッ化））、ＰＣＴＦＥ（ポリクロロトリフルオロエチレン（３フッ化））、ポリアリルスルフォン、芳香族ポリスルフィドおよび芳香族ポリエーテルの中から選ばれるいずれか少なくとも１種の熱可塑性樹脂とフッ素樹脂とからなるフッ素樹脂等を用いてもよい。
また、前記樹脂層は樹脂硬化剤を含んでもよい。樹脂硬化剤としては公知の樹脂硬化剤を用いることができる。例えば樹脂硬化剤としてはジシアンジアミド、イミダゾール類、芳香族アミン等のアミン類、ビスフェノールＡ、ブロム化ビスフェノールＡ等のフェノール類、フェノールノボラック樹脂及びクレゾールノボラック樹脂等のノボラック類、無水フタル酸等の酸無水物、ビフェニル型フェノール樹脂、フェノールアラルキル型フェノール樹脂等を用いることができる。また、前記樹脂層は前述の樹脂硬化剤の１種又は２種以上を含んでもよい。これらの硬化剤はエポキシ樹脂に特に有効である。
前記ビフェニル型フェノール樹脂の具体例を化８に示す。

As the maleimide resin, aromatic maleimide resin, maleimide compound or polymaleimide compound, known maleimide resins, aromatic maleimide resins, maleimide compounds or polymaleimide compounds can be used. For example, as maleimide resin or aromatic maleimide resin or maleimide compound or polymaleimide compound, 4,4′-diphenylmethane bismaleimide, polyphenylmethane maleimide, m-phenylene bismaleimide, bisphenol A diphenyl ether bismaleimide, 3,3′-dimethyl -5,5'-diethyl-4,4'-diphenylmethane bismaleimide, 4-methyl-1,3-phenylene bismaleimide, 4,4'-diphenyl ether bismaleimide, 4,4'-diphenylsulfone bismaleimide, 1, It is possible to use 3-bis (3-maleimidophenoxy) benzene, 1,3-bis (4-maleimidophenoxy) benzene and a polymer obtained by polymerizing the above compound with the above compound or other compounds. The maleimide resin may be an aromatic maleimide resin having two or more maleimide groups in the molecule, and an aromatic maleimide resin having two or more maleimide groups in the molecule and a polyamine or aromatic polyamine. Polymerization adducts obtained by polymerizing and may be used.
As the polyamine or aromatic polyamine, known polyamines or aromatic polyamines can be used. For example, as polyamine or aromatic polyamine, m-phenylenediamine, p-phenylenediamine, 4,4′-diaminodicyclohexylmethane, 1,4-diaminocyclohexane, 2,6-diaminopyridine, 4,4′-diaminodiphenylmethane, 2,2-bis (4-aminophenyl) propane, 4,4′-diaminodiphenyl ether, 4,4′-diamino-3-methyldiphenyl ether, 4,4′-diaminodiphenyl sulfide, 4,4′-diaminobenzophenone, 4,4′-diaminodiphenylsulfone, bis (4-aminophenyl) phenylamine, m-xylenediamine, p-xylenediamine, 1,3-bis [4-aminophenoxy] benzene, 3-methyl-4,4 ′ -Diaminodiphenylmethane, 3,3'-diethyl-4 4'-diaminodiphenylmethane, 3,3'-dichloro-4,4'-diaminodiphenylmethane, 2,2 ', 5,5'-tetrachloro-4,4'-diaminodiphenylmethane, 2,2-bis (3- Methyl-4-aminophenyl) propane, 2,2-bis (3-ethyl-4-aminophenyl) propane, 2,2-bis (2,3-dichloro-4-aminophenyl) propane, bis (2,3 -Dimethyl-4-aminophenyl) phenylethane, ethylenediamine and hexamethylenediamine, 2,2-bis (4- (4-aminophenoxy) phenyl) propane and the above compound and the above compound or other compounds were polymerized. A polymer or the like can be used. Moreover, 1 type, or 2 or more types of well-known polyamine and / or aromatic polyamine or the above-mentioned polyamine or aromatic polyamine can be used.
A known phenoxy resin can be used as the phenoxy resin. Moreover, what is synthesize | combined by reaction of bisphenol and a bivalent epoxy resin can be used as said phenoxy resin. As an epoxy resin, a well-known epoxy resin and / or the above-mentioned epoxy resin can be used.
As the bisphenol, known bisphenols can be used, and bisphenol A, bisphenol F, bisphenol S, tetrabromobisphenol A, 4,4′-dihydroxybiphenyl, HCA (9,10-Dihydro-9-Oxa- Bisphenol obtained as an adduct of 10-phosphophenanthrene-10-oxide) and quinones such as hydroquinone and naphthoquinone can be used.
As the linear polymer having a crosslinkable functional group, a known linear polymer having a crosslinkable functional group can be used. For example, the linear polymer having a crosslinkable functional group preferably has a functional group that contributes to the curing reaction of an epoxy resin such as a hydroxyl group or a carboxyl group. And it is preferable that the linear polymer which has this crosslinkable functional group is soluble in the organic solvent of the temperature of 50 to 200 degreeC of boiling points. Specific examples of the linear polymer having a functional group mentioned here include polyvinyl acetal resin, phenoxy resin, polyethersulfone resin, polyamideimide resin, and the like.
The resin layer may contain a crosslinking agent. A known crosslinking agent can be used as the crosslinking agent. For example, a urethane-based resin can be used as the crosslinking agent.
A known rubber resin can be used as the rubber resin. For example, the rubber resin is described as a concept including natural rubber and synthetic rubber. The latter synthetic rubber includes styrene-butadiene rubber, butadiene rubber, butyl rubber, ethylene-propylene rubber, acrylonitrile butadiene rubber, acrylic rubber ( Acrylic ester copolymer), polybutadiene rubber, isoprene rubber and the like. Furthermore, when ensuring the heat resistance of the resin layer to be formed, it is also useful to select and use a synthetic rubber having heat resistance such as nitrile rubber, chloroprene rubber, silicon rubber, urethane rubber or the like. Regarding these rubber resins, it is desirable to have various functional groups at both ends in order to produce a copolymer by reacting with an aromatic polyamide resin or a polyamideimide resin. In particular, it is useful to use CTBN (carboxy group-terminated butadiene nitrile). Moreover, among acrylonitrile butadiene rubbers, a carboxyl-modified product can take a crosslinked structure with an epoxy resin and improve the flexibility of the cured resin layer. As the carboxyl-modified product, carboxy group-terminated nitrile butadiene rubber (CTBN), carboxy group-terminated butadiene rubber (CTB), and carboxy-modified nitrile butadiene rubber (C-NBR) can be used.
A known polyimide amide resin can be used as the polyamide imide resin. In addition, as the polyimide amide resin, for example, trimellitic anhydride, benzophenonetetracarboxylic anhydride and vitorylene diisocyanate are heated in a solvent such as N-methyl-2-pyrrolidone and / or N, N-dimethylacetamide. By heating the resin obtained by doing so, trimellitic anhydride, diphenylmethane diisocyanate and carboxyl group-terminated acrylonitrile-butadiene rubber in a solvent such as N-methyl-2-pyrrolidone and / or N, N-dimethylacetamide What is obtained can be used.
A known rubber-modified polyamideimide resin can be used as the rubber-modified polyamideimide resin. The rubber-modified polyamideimide resin is obtained by reacting a polyamideimide resin and a rubber resin. The reaction of the polyamide-imide resin and the rubber resin is performed for the purpose of improving the flexibility of the polyamide-imide resin itself. That is, the polyamideimide resin and the rubber resin are reacted to replace a part of the acid component (cyclohexanedicarboxylic acid or the like) of the polyamideimide resin with the rubber component. A known polyamideimide resin can be used as the polyamideimide resin. As the rubber resin, a known rubber resin or the aforementioned rubber resin can be used. Solvents used for dissolving the polyamideimide resin and the rubbery resin when polymerizing the rubber-modified polyamideimide resin include dimethylformamide, dimethylacetamide, N-methyl-2-pyrrolidone, dimethylsulfoxide, nitromethane, nitroethane, tetrahydrofuran , Cyclohexanone, methyl ethyl ketone, acetonitrile, γ-butyrolactone, and the like are preferably used alone or in combination.
A known phosphazene resin can be used as the phosphazene resin. The phosphazene resin is a resin containing phosphazene having a double bond having phosphorus and nitrogen as constituent elements. The phosphazene resin can dramatically improve the flame retardancy due to the synergistic effect of nitrogen and phosphorus in the molecule. In addition, unlike 9,10-dihydro-9-oxa-10-phosphaphenanthrene-10-oxide derivatives, it exists stably in the resin, and the effect of preventing the occurrence of migration is obtained.
A known fluororesin can be used as the fluororesin. Examples of the fluororesin include PTFE (polytetrafluoroethylene (tetrafluoroethylene)), PFA (tetrafluoroethylene / perfluoroalkyl vinyl ether copolymer), FEP (tetrafluoroethylene / hexafluoropropylene copolymer (4.6). Fluoride)), ETFE (tetrafluoroethylene / ethylene copolymer), PVDF (polyvinylidene fluoride (difluoride)), PCTFE (polychlorotrifluoroethylene (trifluoride)), polyallylsulfone, aromatic A fluororesin composed of at least one thermoplastic resin selected from polysulfide and aromatic polyether and a fluororesin may be used.
The resin layer may contain a resin curing agent. A known resin curing agent can be used as the resin curing agent. For example, resin curing agents include amines such as dicyandiamide, imidazoles and aromatic amines, phenols such as bisphenol A and brominated bisphenol A, novolaks such as phenol novolac resins and cresol novolac resins, and acid anhydrides such as phthalic anhydride. Products, biphenyl type phenol resins, phenol aralkyl type phenol resins and the like can be used. The resin layer may contain one or more of the aforementioned resin curing agents. These curing agents are particularly effective for epoxy resins.
A specific example of the biphenyl type phenol resin is shown in Chemical Formula 8.

  A specific example of the phenol aralkyl type phenol resin is shown in Chemical Formula 9.

イミダゾール類としては、公知のものを用いることができ、例えば、２−ウンデシルイミダゾール、２−ヘプタデシルイミダゾール、２−エチル−４−メチルイミダゾール、２−フェニル−４−メチルイミダゾール、１−シアノエチル−２−ウンデシルイミダゾール、１−シアノエチル−２−エチル−４−メチルイミダゾール、１−シアノエチル−２−フェニルイミダゾール、２−フェニル−４，５−ジヒドロキシメチルイミダゾール、２−フェニル−４−メチル−５−ヒドロキシメチルイミダゾールなどが挙げられ、これらを単独若しくは混合して用いることができる。
また、中でも、以下の化１０に示す構造式を備えるイミダゾール類を用いる事が好ましい。この化１０に示す構造式のイミダゾール類を用いることで、半硬化状態の樹脂層の耐吸湿性を顕著に向上でき、長期保存安定性に優れる。イミダゾール類は、エポキシ樹脂の硬化に際して触媒的な働きを行うものであり、硬化反応の初期段階において、エポキシ樹脂の自己重合反応を引き起こす反応開始剤として寄与するからである。

Known imidazoles can be used such as 2-undecylimidazole, 2-heptadecylimidazole, 2-ethyl-4-methylimidazole, 2-phenyl-4-methylimidazole, 1-cyanoethyl- 2-undecylimidazole, 1-cyanoethyl-2-ethyl-4-methylimidazole, 1-cyanoethyl-2-phenylimidazole, 2-phenyl-4,5-dihydroxymethylimidazole, 2-phenyl-4-methyl-5- Hydroxymethylimidazole etc. are mentioned, These can be used individually or in mixture.
Of these, imidazoles having the structural formula shown in Chemical Formula 10 below are preferably used. By using the imidazole having the structural formula shown in Chemical Formula 10, the moisture absorption resistance of the semi-cured resin layer can be remarkably improved, and the long-term storage stability is excellent. This is because imidazoles function as a catalyst during curing of the epoxy resin and contribute as a reaction initiator that causes a self-polymerization reaction of the epoxy resin in the initial stage of the curing reaction.

前記アミン類の樹脂硬化剤としては、公知のアミン類を用いることができる。また、前記アミン類の樹脂硬化剤としては例えば前述のポリアミンや芳香族ポリアミンを用いることが出来、また、芳香族ポリアミン、ポリアミド類及びこれらをエポキシ樹脂や多価カルボン酸と重合或いは縮合させて得られるアミンアダクト体の群から選ばれた１種又は２種以上を用いてもよい。また、前記アミン類の樹脂硬化剤としては、４，４’−ジアミノジフェニレンサルフォン、３，３’−ジアミノジフェニレンサルフォン、４，４−ジアミノジフェニレル、２，２−ビス［４−（４−アミノフェノキシ）フェニル］プロパンまたはビス［４−（４−アミノフェノキシ）フェニル］サルフォンのいずれか一種以上を用いることが好ましい。
前記樹脂層は硬化促進剤を含んでもよい。硬化促進剤としては公知の硬化促進剤を用いることができる。例えば、硬化促進剤としては、３級アミン、イミダゾール、尿素系硬化促進剤等を用いることができる。
前記樹脂層は反応触媒を含んでもよい。反応触媒としては公知の反応触媒を用いることができる。例えば反応触媒として微粉砕シリカ、三酸化アンチモン等を用いることができる。

As the amine resin curing agent, known amines can be used. As the amine resin curing agent, for example, the above-mentioned polyamines and aromatic polyamines can be used, and aromatic polyamines, polyamides, and these are obtained by polymerizing or condensing with epoxy resins or polyvalent carboxylic acids. One or more selected from the group of amine adducts to be used may be used. Examples of the resin curing agent for amines include 4,4′-diaminodiphenylenesulfone, 3,3′-diaminodiphenylenesulfone, 4,4-diaminodiphenylel, and 2,2-bis [4. It is preferable to use at least one of-(4-aminophenoxy) phenyl] propane and bis [4- (4-aminophenoxy) phenyl] sulfone.
The resin layer may contain a curing accelerator. A known curing accelerator can be used as the curing accelerator. For example, as the curing accelerator, tertiary amine, imidazole, urea curing accelerator and the like can be used.
The resin layer may include a reaction catalyst. A known reaction catalyst can be used as the reaction catalyst. For example, finely pulverized silica or antimony trioxide can be used as a reaction catalyst.

  The polyhydric carboxylic acid anhydride is preferably a component that contributes as a curing agent for the epoxy resin. The anhydride of the polyvalent carboxylic acid is phthalic anhydride, maleic anhydride, trimellitic anhydride, pyromellitic anhydride, tetrahydroxyphthalic anhydride, hexahydroxyphthalic anhydride, methylhexahydroxyphthalic anhydride, nadine. Acid and methyl nadic acid are preferred.

The thermoplastic resin may be a thermoplastic resin having a functional group other than an alcoholic hydroxyl group polymerizable with an epoxy resin.
The polyvinyl acetal resin may have a functional group polymerizable with an epoxy resin or a maleimide compound other than an acid group and a hydroxyl group. The polyvinyl acetal resin may have a carboxyl group, an amino group or an unsaturated double bond introduced into the molecule.
Examples of the aromatic polyamide resin polymer include those obtained by reacting an aromatic polyamide resin and a rubber resin. Here, the aromatic polyamide resin is synthesized by condensation polymerization of an aromatic diamine and a dicarboxylic acid. As the aromatic diamine at this time, 4,4′-diaminodiphenylmethane, 3,3′-diaminodiphenylsulfone, m-xylenediamine, 3,3′-oxydianiline and the like are used. As the dicarboxylic acid, phthalic acid, isophthalic acid, terephthalic acid, fumaric acid or the like is used.
As the rubber resin to be reacted with the aromatic polyamide resin, a known rubber resin or the aforementioned rubber resin can be used.
This aromatic polyamide resin polymer is used for the purpose of not being damaged by under-etching by an etchant when etching a copper foil after being processed into a copper-clad laminate.

  The resin layer is a cured resin layer (the “cured resin layer” means a cured resin layer) and a half in order from the copper foil side (that is, the ultrathin copper layer side of the copper foil with carrier). The resin layer which formed the cured resin layer sequentially may be sufficient. The cured resin layer may be composed of a resin component of any one of a polyimide resin, a polyamideimide resin, and a composite resin having a thermal expansion coefficient of 0 ppm / ° C. to 25 ppm / ° C.

  Moreover, you may provide the semi-hardened resin layer whose thermal expansion coefficient after hardening is 0 ppm / degrees C-50 ppm / degrees C on the said cured resin layer. In addition, the thermal expansion coefficient of the entire resin layer after the cured resin layer and the semi-cured resin layer are cured may be 40 ppm / ° C. or less. The cured resin layer may have a glass transition temperature of 300 ° C. or higher. The semi-cured resin layer may be formed using a maleimide resin or an aromatic maleimide resin. The resin composition for forming the semi-cured resin layer preferably contains a maleimide resin, an epoxy resin, and a linear polymer having a crosslinkable functional group. As the epoxy resin, a known epoxy resin or an epoxy resin described in this specification can be used. In addition, as maleimide resins, aromatic maleimide resins, linear polymers having crosslinkable functional groups, known maleimide resins, aromatic maleimide resins, linear polymers having crosslinkable functional groups, or the aforementioned maleimide resins. An aromatic maleimide resin or a linear polymer having a crosslinkable functional group can be used.

Moreover, when providing the copper foil with a carrier which has a resin layer suitable for a three-dimensional molded printed wiring board manufacture use, it is preferable that the said cured resin layer is a polymeric polymer layer which has hardened | cured flexibility. The polymer layer is preferably made of a resin having a glass transition temperature of 150 ° C. or higher so that it can withstand the solder mounting process. The polymer polymer layer is preferably made of one or a mixture of two or more of a polyamide resin, a polyether sulfone resin, an aramid resin, a phenoxy resin, a polyimide resin, a polyvinyl acetal resin, and a polyamideimide resin. The thickness of the polymer layer is preferably 3 μm to 10 μm.
Moreover, it is preferable that the said high molecular polymer layer contains any 1 type, or 2 or more types of an epoxy resin, a maleimide-type resin, a phenol resin, and a urethane resin. The semi-cured resin layer is preferably composed of an epoxy resin composition having a thickness of 10 μm to 50 μm.

Moreover, it is preferable that the said epoxy resin composition contains each component of the following A component-E component.
Component A: An epoxy resin having one or more selected from the group consisting of a bisphenol A type epoxy resin, a bisphenol F type epoxy resin, and a bisphenol AD type epoxy resin that have an epoxy equivalent of 200 or less and are liquid at room temperature.
B component: High heat-resistant epoxy resin.
Component C: Phosphorus-containing flame-retardant resin, which is any one of phosphorus-containing epoxy resin and phosphazene-based resin, or a resin obtained by mixing these.
Component D: A rubber-modified polyamide-imide resin modified with a liquid rubber component having a property that is soluble in a solvent having a boiling point in the range of 50 ° C. to 200 ° C.
E component: Resin curing agent.

The B component is a “high heat resistant epoxy resin” having a high so-called glass transition point Tg. The “high heat-resistant epoxy resin” referred to here is preferably a polyfunctional epoxy resin such as a novolac-type epoxy resin, a cresol novolac-type epoxy resin, a phenol novolac-type epoxy resin, or a naphthalene-type epoxy resin.
As the phosphorus-containing epoxy resin of component C, the aforementioned phosphorus-containing epoxy resin can be used. The phosphazene resin described above can be used as the C component phosphazene resin.
The rubber-modified polyamide-imide resin described above can be used as the rubber-modified polyamide-imide resin of component D. The resin curing agent described above can be used as the E component resin curing agent.

  A solvent is added to the resin composition shown above and used as a resin varnish, and a thermosetting resin layer is formed as an adhesive layer of a printed wiring board. The resin varnish is prepared by adding a solvent to the above resin composition so that the resin solid content is in the range of 30 wt% to 70 wt%, and the resin flow when measured in accordance with MIL-P-13949G in the MIL standard. A semi-cured resin film in the range of 5% to 35% can be formed. As the solvent, a known solvent or the aforementioned solvent can be used.

  The resin layer is a resin layer having a first thermosetting resin layer and a second thermosetting resin layer located on the surface of the first thermosetting resin layer in order from the copper foil side, The curable resin layer is formed of a resin component that does not dissolve in chemicals during desmear processing in the wiring board manufacturing process, and the second thermosetting resin layer dissolves in chemicals during desmear processing in the wiring board manufacturing process. Then, it may be formed using a resin that can be washed and removed. The first thermosetting resin layer may be formed using a resin component obtained by mixing one or more of polyimide resin, polyethersulfone, and polyphenylene oxide. The second thermosetting resin layer may be formed using an epoxy resin component. The thickness t1 (μm) of the first thermosetting resin layer is Rz (μm) of the roughened surface roughness of the copper foil with carrier, and the thickness of the second thermosetting resin layer is t2 (μm). Then, t1 is preferably a thickness that satisfies the condition of Rz <t1 <t2.

  The resin layer may be a prepreg in which a skeleton material is impregnated with a resin. The resin impregnated in the skeleton material is preferably a thermosetting resin. The prepreg may be a known prepreg or a prepreg used for manufacturing a printed wiring board.

The skeleton material may include aramid fibers, glass fibers, or wholly aromatic polyester fibers. The skeleton material is preferably an aramid fiber, a glass fiber, or a nonwoven fabric or woven fabric of wholly aromatic polyester fibers. The wholly aromatic polyester fiber is preferably a wholly aromatic polyester fiber having a melting point of 300 ° C. or higher. The wholly aromatic polyester fiber having a melting point of 300 ° C. or higher is a fiber produced using a resin called a so-called liquid crystal polymer, and the liquid crystal polymer contains 2-hydroxyl-6-naphthoic acid and p-hydroxybenzoic acid. The main component is an acid polymer. Since this wholly aromatic polyester fiber has a low dielectric constant and low dielectric loss tangent, it has excellent performance as a constituent material of an electrically insulating layer and can be used in the same manner as glass fiber and aramid fiber. is there.
In addition, in order to improve the wettability with the resin of the surface, it is preferable to perform the silane coupling agent process for the fiber which comprises the said nonwoven fabric and woven fabric. As the silane coupling agent at this time, a known amino-based or epoxy-based silane coupling agent or the aforementioned silane coupling agent can be used depending on the purpose of use.

  The prepreg is a prepreg obtained by impregnating a thermosetting resin into a nonwoven fabric using an aramid fiber or glass fiber having a nominal thickness of 70 μm or less, or a skeleton material made of glass cloth having a nominal thickness of 30 μm or less Also good.

(When the resin layer contains a dielectric (dielectric filler))
The resin layer may include a dielectric (dielectric filler).
In the case where a dielectric (dielectric filler) is included in any of the above resin layers or resin compositions, it can be used for the purpose of forming the capacitor layer and increase the capacitance of the capacitor circuit. Examples of the dielectric (dielectric filler) include BaTiO ₃ , SrTiO ₃ , Pb (Zr—Ti) O ₃ (common name PZT), PbLaTiO ₃ · PbLaZrO (common name PLZT), SrBi ₂ Ta ₂ O ₉ (common name SBT), and the like. A composite oxide dielectric powder having a perovskite structure is used.

The dielectric (dielectric filler) may be powdery. When the dielectric (dielectric filler) is in the form of powder, the powder characteristics of the dielectric (dielectric filler) are as follows. Must be in range. The particle size referred to here is indirect in which the average particle size is estimated from the measured values of the laser diffraction scattering type particle size distribution measurement method and the BET method because the particles form a certain secondary aggregation state. It cannot be used because the accuracy is inferior in measurement, and it refers to the average particle diameter obtained by directly observing a dielectric (dielectric filler) with a scanning electron microscope (SEM) and image analysis of the SEM image. It is. In this specification, the particle size at this time is indicated as DIA. The image analysis of the dielectric (dielectric filler) powder observed using a scanning electron microscope (SEM) in this specification is performed using IP-1000PC manufactured by Asahi Engineering Co., Ltd. Circular particle analysis was performed with a threshold value of 10 and an overlapping degree of 20, and the average particle diameter DIA was obtained.
According to the above-described embodiment, the resin layer containing the dielectric for forming the capacitor circuit layer having a low dielectric loss tangent is improved by improving the adhesion between the inner layer circuit surface of the inner layer core material and the resin layer containing the dielectric. The copper foil with a carrier which has can be provided.

Examples of the resin and / or resin composition and / or compound contained in the resin layer include methyl ethyl ketone (MEK), cyclopentanone, dimethylformamide, dimethylacetamide, N-methylpyrrolidone, toluene, methanol, ethanol, propylene glycol monomethyl ether , Dimethylformamide, dimethylacetamide, cyclohexanone, ethyl cellosolve, N-methyl-2-pyrrolidone, N, N-dimethylacetamide, N, N-dimethylformamide and the like to obtain a resin liquid (resin varnish). On the ultrathin copper layer, or on the heat-resistant layer, rust-preventing layer, chromate-treated layer, or silane coupling agent layer, for example, it is applied by a roll coater method or the like, and then heat-dried as necessary. Removing the solvent Te and to B-stage. For example, a hot air drying furnace may be used for drying, and the drying temperature may be 100 to 250 ° C, preferably 130 to 200 ° C. The composition of the resin layer is dissolved using a solvent, and the resin solid content is 3 wt% to 70 wt%, preferably 3 wt% to 60 wt%, preferably 10 wt% to 40 wt%, more preferably 25 wt% to 40 wt%. It is good also as a resin liquid. In addition, it is most preferable at this stage from an environmental standpoint to dissolve using a mixed solvent of methyl ethyl ketone and cyclopentanone. In addition, it is preferable to use the solvent whose boiling point is the range of 50 to 200 degreeC as a solvent.
The resin layer is preferably a semi-cured resin film having a resin flow in the range of 5% to 35% when measured according to MIL-P-13949G in the MIL standard.
In this specification, the resin flow is based on MIL-P-13949G in the MIL standard. Four 10 cm square samples are sampled from a resin-coated copper foil with a resin thickness of 55 μm. It is a value calculated based on Equation 1 from the result of measuring the resin outflow weight at the time of laminating under the conditions of a press temperature of 171 ° C., a press pressure of 14 kgf / cm ² and a press time of 10 minutes in a stacked state (laminate). .

  The copper foil with a carrier provided with the resin layer (copper foil with a carrier with resin) is superposed on the base material, and the whole is thermocompression bonded to thermally cure the resin layer, and then the carrier is peeled off. Thus, the ultrathin copper layer is exposed (which is naturally the surface on the intermediate layer side of the ultrathin copper layer), and a predetermined wiring pattern is formed thereon.

  If this resin-attached copper foil with a carrier is used, the number of prepreg materials used when manufacturing a multilayer printed wiring board can be reduced. In addition, the copper-clad laminate can be manufactured even if the resin layer is made thick enough to ensure interlayer insulation or no prepreg material is used. At this time, the surface smoothness can be further improved by undercoating the surface of the substrate with an insulating resin.

In addition, when the prepreg material is not used, the material cost of the prepreg material is saved and the laminating process is simplified, which is economically advantageous. Moreover, the multilayer printed wiring board manufactured by the thickness of the prepreg material is used. The thickness is reduced, and there is an advantage that an extremely thin multilayer printed wiring board in which the thickness of one layer is 100 μm or less can be manufactured.
The thickness of the resin layer is preferably 0.1 to 120 μm.

When the thickness of the resin layer is less than 0.1 μm, the adhesive strength is reduced, and when the copper foil with a carrier with the resin is laminated on the base material provided with the inner layer material without interposing the prepreg material, the circuit of the inner layer material It may be difficult to ensure interlayer insulation between the two. On the other hand, if the thickness of the resin layer is greater than 120 μm, it is difficult to form a resin layer having a target thickness in a single coating process, which may be economically disadvantageous because of extra material costs and man-hours.
In addition, when the copper foil with a carrier having a resin layer is used for manufacturing an extremely thin multilayer printed wiring board, the thickness of the resin layer is 0.1 μm to 5 μm, more preferably 0.5 μm to 5 μm, More preferably, the thickness is 1 μm to 5 μm in order to reduce the thickness of the multilayer printed wiring board.
When the resin layer includes a dielectric, the thickness of the resin layer is preferably 0.1 to 50 μm, preferably 0.5 μm to 25 μm, and more preferably 1.0 μm to 15 μm. preferable.
The total resin layer thickness with the cured resin layer and the semi-cured resin layer is preferably 0.1 μm to 120 μm, more preferably 5 μm to 120 μm, and preferably 10 μm to 120 μm, 10 μm to 60 μm. Are more preferred. The thickness of the cured resin layer is preferably 2 μm to 30 μm, preferably 3 μm to 30 μm, and more preferably 5 to 20 μm. Moreover, it is preferable that the thickness of a semi-hardened resin layer is 3 micrometers-55 micrometers, it is preferable that they are 7 micrometers-55 micrometers, and it is more desirable that it is 15-115 micrometers. If the total resin layer thickness exceeds 120 μm, it may be difficult to produce a thin multilayer printed wiring board. If the total resin layer thickness is less than 5 μm, it is easy to form a thin multilayer printed wiring board, but an insulating layer between inner layer circuits This is because the resin layer may become too thin and the insulation between the circuits of the inner layer tends to become unstable. Moreover, when the cured resin layer thickness is less than 2 μm, it may be necessary to consider the surface roughness of the roughened copper foil surface. Conversely, if the cured resin layer thickness exceeds 20 μm, the effect of the cured resin layer may not be particularly improved, and the total insulating layer thickness becomes thick.

When the thickness of the resin layer is 0.1 μm to 5 μm, a heat resistant layer and / or a rust preventive layer is formed on the ultrathin copper layer in order to improve the adhesion between the resin layer and the carrier-attached copper foil. After providing the chromate treatment layer and / or the silane coupling treatment layer, it is preferable to form a resin layer on the heat-resistant layer, rust prevention layer, chromate treatment layer or silane coupling treatment layer.
In addition, the thickness of the above-mentioned resin layer says the average value of the thickness measured by cross-sectional observation in arbitrary 10 points | pieces.

  Furthermore, as another product form of this copper foil with a carrier with a resin, on the ultra-thin copper layer, or on the heat-resistant layer, rust-preventing layer, chromate-treated layer, or silane coupling-treated layer After coating with a resin layer and making it into a semi-cured state, the carrier can then be peeled off and manufactured in the form of a copper foil with resin without the carrier.

  Furthermore, as another product form of this copper foil with a carrier with a resin, on the ultra-thin copper layer, or on the heat-resistant layer, rust-preventing layer, chromate-treated layer, or silane coupling-treated layer After coating with a resin layer and making it into a semi-cured state, the carrier can then be peeled off and manufactured in the form of a copper foil with resin without the carrier.

<Method for manufacturing printed wiring board>
In one embodiment of a method for producing a printed wiring board according to the present invention, a step of preparing a copper foil with a carrier and an insulating substrate according to the present invention, a step of laminating the copper foil with a carrier and an insulating substrate, the carrier After laminating the attached copper foil and the insulating substrate so that the ultrathin copper layer side faces the insulating substrate, a copper-clad laminate is formed through a step of peeling the carrier of the copper foil with carrier, and then a semi-additive method, The method includes a step of forming a circuit by any one of the modified semi-additive method, the partly additive method, and the subtractive method. It is also possible for the insulating substrate to contain an inner layer circuit.

  In the present invention, the semi-additive method refers to a method in which a thin electroless plating is performed on an insulating substrate or a copper foil seed layer, a pattern is formed, and then a conductive pattern is formed using electroplating and etching.

Therefore, in one embodiment of a method for producing a printed wiring board according to the present invention using a semi-additive method, a step of preparing a copper foil with a carrier and an insulating substrate according to the present invention,
Laminating the copper foil with carrier and an insulating substrate;
After laminating the copper foil with carrier and the insulating substrate, the step of peeling the carrier of the copper foil with carrier,
Removing all of the ultrathin copper layer exposed by peeling the carrier by a method such as etching or plasma using a corrosive solution such as acid,
Providing a through hole or / and a blind via in the resin exposed by removing the ultrathin copper layer by etching;
Performing a desmear process on the region including the through hole or / and the blind via,
Providing an electroless plating layer for the region including the resin and the through hole or / and the blind via;
Providing a plating resist on the electroless plating layer;
Exposing the plating resist, and then removing the plating resist in a region where a circuit is formed;
Providing an electrolytic plating layer in a region where the circuit from which the plating resist has been removed is formed;
Removing the plating resist;
Removing the electroless plating layer in a region other than the region where the circuit is formed by flash etching or the like;
including.

In another embodiment of the method for producing a printed wiring board according to the present invention using a semi-additive method, a step of preparing a copper foil with a carrier and an insulating substrate according to the present invention,
Laminating the copper foil with carrier and an insulating substrate;
After laminating the copper foil with carrier and the insulating substrate, the step of peeling the carrier of the copper foil with carrier,
Removing all of the ultrathin copper layer exposed by peeling the carrier by a method such as etching or plasma using a corrosive solution such as acid,
Providing an electroless plating layer on the surface of the resin exposed by removing the ultrathin copper layer by etching;
Providing a plating resist on the electroless plating layer;
Exposing the plating resist, and then removing the plating resist in a region where a circuit is formed;
Providing an electrolytic plating layer in a region where the circuit from which the plating resist has been removed is formed;
Removing the plating resist;
Removing the electroless plating layer and the ultrathin copper layer in a region other than the region where the circuit is formed by flash etching or the like;
including.

  In the present invention, the modified semi-additive method is a method in which a metal foil is laminated on an insulating layer, a non-circuit forming portion is protected by a plating resist, and the copper is thickened in the circuit forming portion by electrolytic plating, and then the resist is removed. Then, a method of forming a circuit on the insulating layer by removing the metal foil other than the circuit forming portion by (flash) etching is indicated.

Therefore, in one embodiment of the method for producing a printed wiring board according to the present invention using the modified semi-additive method, the step of preparing the copper foil with carrier and the insulating substrate according to the present invention,
Laminating the copper foil with carrier and an insulating substrate;
After laminating the copper foil with carrier and the insulating substrate, the step of peeling the carrier of the copper foil with carrier,
Providing a through hole or / and a blind via on the insulating substrate and the ultrathin copper layer exposed by peeling the carrier;
Performing a desmear process on the region including the through hole or / and the blind via,
Providing an electroless plating layer for the region including the through hole or / and the blind via;
Providing a plating resist on the surface of the ultrathin copper layer exposed by peeling the carrier,
Forming a circuit by electrolytic plating after providing the plating resist;
Removing the plating resist;
Removing the ultra-thin copper layer exposed by removing the plating resist by flash etching;
including.

In another embodiment of the method for producing a printed wiring board according to the present invention using the modified semi-additive method, the step of preparing the carrier-attached copper foil and the insulating substrate according to the present invention,
Laminating the copper foil with carrier and an insulating substrate;
After laminating the copper foil with carrier and the insulating substrate, the step of peeling the carrier of the copper foil with carrier,
Providing a plating resist on the exposed ultrathin copper layer by peeling off the carrier;
Exposing the plating resist, and then removing the plating resist in a region where a circuit is formed;
Providing an electrolytic plating layer in a region where the circuit from which the plating resist has been removed is formed;
Removing the plating resist;
Removing the electroless plating layer and the ultrathin copper layer in a region other than the region where the circuit is formed by flash etching or the like;
including.

  In the present invention, the partial additive method means that a catalyst circuit is formed on a substrate provided with a conductor layer, and if necessary, a substrate provided with holes for through holes or via holes, and etched to form a conductor circuit. Then, after providing a solder resist or a plating resist as necessary, it refers to a method of manufacturing a printed wiring board by thickening through holes, via holes, etc. on the conductor circuit by electroless plating.

Therefore, in one embodiment of the method for producing a printed wiring board according to the present invention using a partly additive method, a step of preparing the copper foil with carrier and the insulating substrate according to the present invention,
Laminating the copper foil with carrier and an insulating substrate;
After laminating the copper foil with carrier and the insulating substrate, the step of peeling the carrier of the copper foil with carrier,
Providing a through hole or / and a blind via on the insulating substrate and the ultrathin copper layer exposed by peeling the carrier;
Performing a desmear process on the region including the through hole or / and the blind via,
Applying catalyst nuclei to the region containing the through-holes and / or blind vias;
Providing an etching resist on the surface of the ultrathin copper layer exposed by peeling the carrier,
Exposing the etching resist to form a circuit pattern;
Removing the ultrathin copper layer and the catalyst nucleus by a method such as etching or plasma using a corrosive solution such as an acid to form a circuit;
Removing the etching resist;
A step of providing a solder resist or a plating resist on the surface of the insulating substrate exposed by removing the ultrathin copper layer and the catalyst core by a method such as etching or plasma using a corrosive solution such as acid
Providing an electroless plating layer in a region where the solder resist or plating resist is not provided,
including.

  In the present invention, the subtractive method refers to a method of forming a conductor pattern by selectively removing unnecessary portions of a copper foil on a copper clad laminate by etching or the like.

Therefore, in one embodiment of the method for producing a printed wiring board according to the present invention using a subtractive method, a step of preparing the carrier-attached copper foil and the insulating substrate according to the present invention,
Laminating the copper foil with carrier and an insulating substrate;
After laminating the copper foil with carrier and the insulating substrate, the step of peeling the carrier of the copper foil with carrier,
Providing a through hole or / and a blind via on the insulating substrate and the ultrathin copper layer exposed by peeling the carrier;
Performing a desmear process on the region including the through hole or / and the blind via,
Providing an electroless plating layer for the region including the through hole or / and the blind via;
Providing an electroplating layer on the surface of the electroless plating layer;
A step of providing an etching resist on the surface of the electrolytic plating layer or / and the ultrathin copper layer;
Exposing the etching resist to form a circuit pattern;
Removing the ultrathin copper layer and the electroless plating layer and the electrolytic plating layer by a method such as etching or plasma using a corrosive solution such as an acid to form a circuit;
Removing the etching resist;
including.

In another embodiment of the method for producing a printed wiring board according to the present invention using a subtractive method, a step of preparing the carrier-attached copper foil and the insulating substrate according to the present invention,
Laminating the copper foil with carrier and an insulating substrate;
After laminating the copper foil with carrier and the insulating substrate, the step of peeling the carrier of the copper foil with carrier,
Providing a through hole or / and a blind via on the insulating substrate and the ultrathin copper layer exposed by peeling the carrier;
Performing a desmear process on the region including the through hole or / and the blind via,
Providing an electroless plating layer for the region including the through hole or / and the blind via;
Forming a mask on the surface of the electroless plating layer;
Providing an electroplating layer on the surface of the electroless plating layer on which no mask is formed;
A step of providing an etching resist on the surface of the electrolytic plating layer or / and the ultrathin copper layer;
Exposing the etching resist to form a circuit pattern;
Removing the ultra-thin copper layer and the electroless plating layer by a method such as etching or plasma using a corrosive solution such as an acid to form a circuit;
Removing the etching resist;
including.

  The process of providing a through hole or / and a blind via and the subsequent desmear process may not be performed.

Here, the specific example of the manufacturing method of the printed wiring board using the copper foil with a carrier of this invention is demonstrated in detail using drawing.
First, as shown to FIG. 1-A, the copper foil with a carrier (1st layer) which has the ultra-thin copper layer in which the roughening process layer was formed on the surface is prepared.
Next, as shown in FIG. 1-B, a resist is applied onto the roughened layer of the ultrathin copper layer, exposed and developed, and etched into a predetermined shape.
Next, as shown in FIG. 1-C, after the plating for the circuit is formed, the resist is removed to form a circuit plating having a predetermined shape.
Next, as shown in FIG. 2-D, an embedding resin is provided on the ultrathin copper layer so as to cover the circuit plating (so that the circuit plating is buried), and then the resin layer is laminated, followed by another carrier. A copper foil (second layer) is bonded from the ultrathin copper layer side.
Next, as shown to FIG. 2-E, a carrier is peeled from the copper foil with a carrier of the 2nd layer.
Next, as shown in FIG. 2-F, laser drilling is performed at a predetermined position of the resin layer to expose the circuit plating and form a blind via.
Next, as shown in FIG. 3G, copper is embedded in the blind via to form a via fill.
Next, as shown in FIG. 3H, circuit plating is formed on the via fill as shown in FIGS. 1-B and 1-C.
Next, as shown to FIG. 3-I, a carrier is peeled from the copper foil with a carrier of the 1st layer.
Next, as shown in FIG. 4J, the ultrathin copper layers on both surfaces are removed by flash etching, and the surface of the circuit plating in the resin layer is exposed.
Next, as shown in FIG. 4K, bumps are formed on the circuit plating in the resin layer, and copper pillars are formed on the solder. Thus, the printed wiring board using the copper foil with a carrier of this invention is produced.

  As the another copper foil with a carrier (second layer), the copper foil with a carrier of the present invention may be used, a conventional copper foil with a carrier may be used, and a normal copper foil may be further used. Further, one or more circuits may be formed on the second layer circuit shown in FIG. 3H, and these circuits may be formed by a semi-additive method, a subtractive method, a partial additive method, or a modified semi-conductor method. You may carry out by any method of an additive method.

  The present invention will be described in more detail with reference to the following examples. However, the present invention is not limited to these examples.

1. Manufacture of copper foil with carrier As a carrier, long electrolytic copper foil (JTC made by JX Nippon Mining & Metals Co., Ltd.) and rolled copper foil (Tough pitch copper foil JIS H3100 alloy number C1100 made by JX Nippon Mining & Metals Co., Ltd.) having a thickness of 35 μm And an intermediate layer was formed on the surface. The formation of the intermediate layer was performed according to the processing order described in the item “Method for forming intermediate layer” in the table. That is, for example, what is described as “Ni / zinc chromate” indicates that “Ni” was first processed and then “Zinc chromate” was processed. In the “intermediate layer” item, “Ni” means that pure nickel plating was performed, and “Ni—Zn” means that nickel zinc alloy plating was performed. "Mo-Co" means that molybdenum cobalt alloy plating was performed, and "sputtered Ni" means that Ni plating was formed by sputtering. Meaning, “Chromate” means pure chromate treatment, “Zinc chromate” means zinc chromate treatment, “Sputtering Cr” The notation means that Cr plating was formed by sputtering, and the “BTA treatment” means that rust prevention treatment using benzotriazole was performed. Refers to, what is referred to as "MBT process" means that subjected to anti-rust treatment with mercaptobenzothiazole. Each processing condition is shown below. In addition, when increasing the adhesion amount of Ni, Zn, Cr, Mo, and Co, set the current density higher and / or set the plating time longer, and / or in the plating solution The concentration of each element was increased. Further, when reducing the amount of adhesion of Ni, Zn, Cr, Mo, and Co, the current density should be set low and / or the plating time should be set short and / or in the plating solution The concentration of each element was reduced. The balance of the liquid composition such as a plating solution is water.

"Ni": Nickel plating (Liquid composition) Nickel sulfate: 270-280 g / L, Nickel chloride: 35-45 g / L, Nickel acetate: 10-20 g / L, Trisodium citrate: 15-25 g / L, luster Agents: Saccharin, butynediol, etc. Sodium dodecyl sulfate: 55-75 ppm
(PH) 4-6
(Liquid temperature) 55-65 degreeC
(Current density) 1 to 11 A / dm ²
(Energization time) 1 to 20 seconds

- "Ni-Zn": in the formation conditions of the nickel-zinc alloy plating the nickel plating, was added in the form of zinc of zinc sulfate (ZnSO ₄₎ in the nickel plating solution, zinc concentration: 0.05-5 g / L range In this way, a nickel zinc alloy plating was formed.

"Ni-Mo": nickel molybdenum alloy plating In the above nickel plating formation conditions, molybdenum in the form of sodium molybdate is added to the nickel plating solution, and the molybdenum concentration is adjusted in the range of 0.1 to 10 g / L. Nickel molybdenum alloy plating was formed.

"Ni-Co": nickel cobalt alloy plating In the above nickel plating formation conditions, cobalt in the form of cobalt sulfate was added to the nickel plating solution, and the cobalt concentration was adjusted in the range of 0.1 to 10 g / L. Nickel cobalt alloy plating was formed.

"Ni-W": Nickel tungsten alloy plating In the above nickel plating formation conditions, add tungsten in the form of sodium tungstate to the nickel plating solution and adjust the tungsten concentration in the range of 0.1 to 10 g / L. Nickel tungsten alloy plating was formed.

-"Ni-Sn": Nickel tin alloy plating In the above nickel plating formation conditions, tin in the form of sodium stannate is added to the nickel plating solution, and the tin concentration is adjusted in the range of 0.1 to 10 g / L. Nickel tin alloy plating was formed.

- "Cr": chromium plating (liquid _{composition) CrO 3: 200~400g / L,} H 2 SO 4: 1.5~4g / L
(PH) 1-4
(Liquid temperature) 45-60 ° C
(Current density) 10-40 A / dm ²
(Energization time) 1 to 20 seconds

"Chromate": Electrolytic pure chromate treatment (Liquid composition) Potassium dichromate: 1-10 g / L, Zinc: 0 g / L
(PH) 2-4, 7-10
(Liquid temperature) 40-60 ° C
(Current density) 0.1-2.6 A / dm ²
(Coulomb amount) 0.5 to 90 As / dm ²
(Energization time) 1 to 30 seconds

-"Zinc chromate": Zinc chromate treatment In the above electrolytic pure chromate treatment conditions, zinc in the form of zinc sulfate (ZnSO ₄ ) is added to the solution, and the zinc concentration is adjusted in the range of 0.05 to 5 g / L. Zinc chromate treatment was performed.

-BTA treatment: rust prevention treatment using benzotriazole (Liquid composition) Benzotriazole: 0.1-20 g / L
(PH) 2-5
(Liquid temperature) 20-40 ° C
(Immersion time) 5-30s

MBT treatment: Rust prevention treatment using mercaptobenzothiazole (Liquid composition) 2-Mercaptobenzothiazole sodium: 0.1 to 20 g / L
(PH) 7-10
(Liquid temperature) 40-60 ° C
(Voltage) 1-5V
(Energization time) 1 to 30 seconds

"Sputtering Ni": Ni plating by sputtering Ni: A nickel layer was formed using a sputtering target having a composition of 99 mass%.
Target: Ni: 99 mass%
Equipment: Sputtering equipment manufactured by ULVAC, Inc. Output: DC50W
Argon pressure: 0.2 Pa

-"Sputtering Cr": Cr plating by sputtering Cr: A chromium layer was formed using a sputtering target having a composition of 99 mass%.
Target: Cr: 99 mass%
Equipment: Sputtering equipment manufactured by ULVAC, Inc. Output: DC50W
Argon pressure: 0.2 Pa

"Mo-Co": Molybdenum cobalt alloy plating (Liquid composition) Cobalt sulfate: 10-200 g / L, Sodium molybdate: 5-200 g / L, Sodium citrate: 2-240 g / L
(PH) 2-5
(Liquid temperature) 10-70 ° C
(Current density) 0.5 to 10 A / dm ²
(Energization time) 1 to 20 seconds

After forming the intermediate layer, an ultrathin copper layer having a thickness of 1 to 10 μm was formed on the intermediate layer by electroplating under the following conditions to produce a copper foil with a carrier.
-Ultrathin copper layer Copper concentration: 30-120 g / L
H ₂ SO ₄ concentration: 20 to 120 g / L
Electrolyte temperature: 20-80 ° C
Current density: 10 to 100 A / dm ²

Next, any of the following roughening treatments A, B, C, and D is performed on the surface of the ultrathin copper layer. Treatment, chromate treatment, and silane coupling treatment were performed in this order. In Examples 2 and 9 and Comparative Example 2, roughening treatment 1 and roughening treatment 2 were not performed.
<Roughening treatment A>
(Liquid composition 1)
Cu: 10-30 g / L
H ₂ SO _4: 10~150g / L
W: 0 to 50 mg / L
Sodium dodecyl sulfate: 0 to 50 mg / L
As: 0 to 200 mg / L
(Electroplating condition 1)
Temperature: 30-70 ° C
Current density: 25 to 110 A / dm ²
Roughening coulomb amount: 50 to 500 As / dm ²
Plating time: 0.5 to 20 seconds, roughening treatment 2
(Liquid composition 2)
Cu: 20-80 g / L
H ₂ SO ₄ : 50 to 200 g / L
(Electroplating condition 2)
Temperature: 30-70 ° C
Current density: 5 to 50 A / dm ²
Roughening coulomb amount: 50 to 300 As / dm ²
Plating time: 1 to 60 seconds, rust prevention treatment (liquid composition)
NaOH: 40-200 g / L
NaCN: 70 to 250 g / L
CuCN: 50-200 g / L
Zn (CN) ₂ : _{2 to} 100 g / L
As ₂ O ₃ : 0.01 to 1 g / L
(Liquid temperature)
40-90 ° C
(Current condition)
Current density: 1 to 50 A / dm ²
Plating time: 1 to 20 seconds, chromate treatment K ₂ Cr ₂ O ₇ (Na ₂ Cr ₂ O ₇ or CrO ₃ ): 2 to 10 g / L
NaOH or KOH: 10-50 g / L
ZnOH or ZnSO ₄ .7H ₂ O: 0.05 to 10 g / L
pH: 7-13
Bath temperature: 20-80 ° C
Current density: 0.05 to 5 A / dm ²
Time: 5 to 30 seconds Silane coupling treatment After 0.1 to 0.3 vol% of 3-glycidoxypropyltrimethoxysilane aqueous solution is spray-coated, 0.1 to 10 in air at 100 to 200 ° C Dry and heat for seconds.

<Roughening treatment B>
・ Roughening 1
Liquid composition: copper 10-20 g / L, sulfuric acid 50-100 g / L
Liquid temperature: 25-50 degreeC
Current density: 1 to 58 A / dm ²
Coulomb amount: 4 to 81 As / dm ²
・ Roughening 2
Liquid composition: copper 10-20 g / L, nickel 5-15 g / L, cobalt 5-15 g / L
pH: 2-3
Liquid temperature: 30-50 degreeC
Current density: 24 to 50 A / dm ²
Coulomb amount: 34 to 48 As / dm ²
・ Rust prevention treatment Liquid composition: Nickel 5-20g / L, Cobalt 1-8g / L
pH: 2-3
Liquid temperature: 40-60 degreeC
Current density: 5-20 A / dm ²
Coulomb amount: 10-20 As / dm ²
Chromate treatment Liquid composition: potassium dichromate 1-10 g / L, zinc 0-5 g / L
pH: 3-4
Liquid temperature: 50-60 degreeC
Current density: 0 to ^{2 A} / dm ² (can be electroless because of immersion chromate treatment)
Coulomb amount: 0 to ^{2 As} / dm ² (can also be electroless because of immersion chromate treatment)
Silane coupling treatment Application of diaminosilane aqueous solution (diaminosilane concentration: 0.1 to 0.5 wt%)

<Roughening treatment C>
・ Roughening 1
Liquid composition: Copper 10-20 g / L, nickel 2-20 g / L, cobalt 2-20 g / L
pH: 2-4
Liquid temperature: 30-50 degreeC
Current density: 24 to 50 A / dm ²
Coulomb amount: 30 to 48 As / dm ²
・ Rust prevention treatment Liquid composition: Nickel 5-20g / L, Cobalt 1-8g / L
pH: 2-3
Liquid temperature: 40-60 degreeC
Current density: 5-20 A / dm ²
Coulomb amount: 10-20 As / dm ²
Chromate treatment Liquid composition: potassium dichromate 1-10 g / L, zinc 0-5 g / L
pH: 3-4
Liquid temperature: 50-60 degreeC
Current density: 0 to ^{2 A} / dm ² (can be electroless because of immersion chromate treatment)
Coulomb amount: 0 to ^{2 As} / dm ² (can also be electroless because of immersion chromate treatment)
Silane coupling treatment Application of diaminosilane aqueous solution (diaminosilane concentration: 0.1 to 0.5 wt%)

<Roughening treatment D>
・ Roughening 1
(Liquid composition 1)
Cu: 31 to 45 g / L
H ₂ SO _4: 10~150g / L
As: 0.1-200 mg / L
(Electroplating condition 1)
Temperature: 30-70 ° C
Current density: 25 to 110 A / dm ²
Roughening coulomb amount: 50 to 500 As / dm ²
Plating time: 0.5 to 20 seconds, roughening treatment 2
(Liquid composition 2)
Cu: 20-80 g / L
H ₂ SO ₄ : 50 to 200 g / L
(Electroplating condition 2)
Temperature: 30-70 ° C
Current density: 5 to 50 A / dm ²
Roughening coulomb amount: 50 to 300 As / dm ²
Plating time: 1 to 60 seconds, rust prevention treatment (liquid composition)
NaOH: 40-200 g / L
NaCN: 70 to 250 g / L
CuCN: 50-200 g / L
Zn (CN) ₂ : _{2 to} 100 g / L
As ₂ O ₃ : 0.01 to 1 g / L
(Liquid temperature)
40-90 ° C
(Current condition)
Current density: 1 to 50 A / dm ²
Plating time: 1 to 20 seconds, chromate treatment K ₂ Cr ₂ O ₇ (Na ₂ Cr ₂ O ₇ or CrO ₃ ): 2 to 10 g / L
NaOH or KOH: 10-50 g / L
ZnOH or ZnSO ₄ .7H ₂ O: 0.05 to 10 g / L
pH: 7-13
Bath temperature: 20-80 ° C
Current density: 0.05 to 5 A / dm ²
Time: 5 to 30 seconds Silane coupling treatment After 0.1 to 0.3 vol% of 3-glycidoxypropyltrimethoxysilane aqueous solution is spray-coated, 0.1 to 10 in air at 100 to 200 ° C Dry and heat for seconds.

2. Evaluation of copper foil with carrier The copper foil with carrier obtained as described above was evaluated by the following methods.
<Metal adhesion amount of intermediate layer>
The amount of nickel, zinc, chromium, molybdenum, and cobalt adhering to each other is determined by dissolving the sample in a mixed solution of nitric acid and hydrochloric acid (nitric acid concentration: 20% by mass, hydrochloric acid concentration: 12% by mass). : SPS3100) by ICP emission analysis. Also, nickel, zinc, chromium, molybdenum, when the amount of deposition of any of cobalt is less than 50 [mu] g / dm ^2, for the amount of the adhesion 50 [mu] g / dm ² or less of the elements, VARIAN Corp. atomic absorption spectrophotometric Analysis was performed by atomic absorption using a meter (model: AA240FS). The measurement conditions were the conditions recommended for each measurement device. The nickel, zinc, chromium, molybdenum and cobalt adhesion amounts were measured as follows. First, after peeling an ultrathin copper layer from a copper foil with a carrier, only the vicinity of the surface on the intermediate layer side of the ultrathin copper layer is dissolved (only 0.5 μm thickness from the surface is dissolved. That is, as shown in the table below) Thus, 5% of the thickness of an ultrathin copper layer melt | dissolves about Examples 5 and 10 and Comparative Examples 1, 6, 11, and 14 whose thickness of an ultrathin copper layer is 10 micrometers. 10% of the thickness of the ultrathin copper layer is dissolved in Examples 6, 9, 16 and Comparative Examples 4, 5, and 7 in which the thickness of the ultrathin copper layer is 3 μm. About 4, 11, 12, 13, 15, 17 and Comparative Examples 3, 8 to 10, 13, and 15, 16.7% of the thickness of the ultrathin copper layer is dissolved, and the thickness of the ultrathin copper layer is 2 μm. In Examples 2, 3, 7, 8, and 14 and Comparative Examples 2 and 12, which are, 25% of the thickness of the ultrathin copper layer is dissolved. The amount of adhesion on the surface of the ultrathin copper layer on the intermediate layer side is measured. Further, after peeling off the ultrathin copper layer, only the vicinity of the surface on the intermediate layer side of the carrier is dissolved (only the thickness of 0.5 μm from the surface is dissolved), and the amount of adhesion on the surface of the carrier on the intermediate layer side is measured. And the value which totaled the adhesion amount of the surface by the side of the intermediate | middle layer of an ultra-thin copper layer and the adhesion amount of the surface by the side of the intermediate | middle layer of a carrier was made into the metal adhesion amount of an intermediate | middle layer.

<Surface roughness>
A straight line was drawn vertically and horizontally at a pitch of 55 mm from each copper foil with a carrier (550 mm × 550 mm square), and 100 square regions of 55 mm × 55 mm were assigned to each. Conforms to JIS B0601-1982 (Ra, Rz) and JIS B0601-2001 (Rt) using a contact-type roughness measuring device (contact roughness meter Surfcoder SE-3C manufactured by Kosaka Laboratory Ltd.) for each region. Then, the surface roughness (Ra, Rt, Rz) of the ultrathin copper layer was measured under the following measurement conditions, and the average value and standard deviation were measured.
(Measurement condition)
Cut-off: 0.25mm
Standard length: 0.8mm
Measurement ambient temperature: 23-25 ° C

<Ni, Cr amount (concentration) on the surface of the ultrathin copper layer on the intermediate layer side (measured by XPS)>
Heat the copper foil with a carrier to the BT resin (triazine-bismaleimide resin, manufactured by Mitsubishi Gas Chemical Co., Ltd.) in the atmosphere under pressure of 20 kgf / cm ² and 220 ° C. × 2 hours. Crimped and pasted. Thereafter, the ultrathin copper layer was peeled off from the carrier in accordance with JIS C 6471 (Method A). Subsequently, the atomic concentration of the metal in the depth direction (x: unit nm) was measured on the surface on the intermediate layer side of the ultrathin copper layer by the depth direction analysis from the surface by XPS under the following conditions. Similarly, for each sample before thermocompression bonding with the resin, the atomic concentration of the metal in the depth direction (x: unit nm) was similarly measured by analyzing the depth direction from the surface by XPS. The larger the value of x, the deeper (farther) the measurement position of the metal atomic concentration is from the surface. Note that the measurement interval of the atomic concentration of the metal in the depth direction (x: unit nm) is preferably 0.18 to 0.30 nm (in terms of SiO ₂ ). In the present invention, the atomic concentration of the metal in the depth direction was measured at intervals of 0.28 nm (SiO ₂ conversion) (measured every 0.1 minutes by sputtering time).
In addition, the depth profile of the concentration of each metal by the above XPS measurement is the sum of one location in the region within 50 mm from both ends and one location in the 50 mm × 50 mm region in the center in the long side direction of each sample sheet. Created for 3 locations. The three measurement locations are shown in FIG. Subsequently, from the depth profiles created for the three regions, ∫g (x) dx / (∫ in the section [0, 1.0] in the depth direction analysis from the surface on the intermediate layer side of the ultrathin copper layer e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) and ∫e (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k ( x) dx), and ∫g (x) dx / (∫e (x) in the section [1.0, 4.0] of the depth direction analysis from the surface on the intermediate layer side of the ultrathin copper layer dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) The arithmetic average of was calculated.
When the sample size is small, the above-mentioned region within 50 mm from both ends and the 50 mm × 50 mm region at the center may overlap.
XPS means X-ray photoelectron spectroscopy. The above-mentioned measurement and the measurement of the organic substance thickness of the intermediate layer described later were performed using an XPS measurement apparatus (model 5600MC) manufactured by ULVAC-PHI. In the present invention, it is assumed that an XPS measuring device (model 5600MC or an equivalent measuring device manufactured and sold by ULVAC-PHI) is used by ULVAC-PHI. If such a measuring device cannot be obtained, Other XPS measurements can be performed by setting the measurement interval of each element concentration in the depth direction to 0.10 to 0.30 nm (converted to SiO ₂ ) and the sputtering rate to 1.0 to 3.0 nm / min (converted to SiO ₂ ). An apparatus may be used.
(XPS analysis conditions)
・ Device: XPS measuring device (ULVAC-PHI, Model 5600MC)
・ Achieving vacuum: 3.8 × 10 ⁻⁷ Pa
X-ray: Monochromatic AlKα or non-monochromatic MgKα, X-ray output 300 W, detection area 800 μmφ, angle between sample and detector 45 °
Ion beam: ion species Ar ⁺ , acceleration voltage 3 kV, sweep area 3 mm × 3 mm, sputtering rate 2.8 nm / min (SiO ₂ conversion)

<Peel strength>
Heat the copper foil with a carrier to the BT resin (triazine-bismaleimide resin, manufactured by Mitsubishi Gas Chemical Co., Ltd.) in the atmosphere under pressure of 20 kgf / cm ² and 220 ° C. × 2 hours. Crimped and pasted. Subsequently, the carrier side was pulled with a load cell, and the peel strength was measured according to the 90 ° peel method (JIS C 6471 8.1). Also, the peel strength was measured in the same manner for each sample before thermocompression bonding with the resin.

<Etching property>
A copper foil with a carrier was attached to a polyimide substrate and heat-pressed at 220 ° C. for 2 hours, and then the ultrathin copper layer was peeled off from the carrier. Subsequently, after applying a photosensitive resist to the surface of the ultra-thin copper layer on the polyimide substrate, 50 L / S = 5 μm / 5 μm wide circuits are printed by an exposure process to remove unnecessary portions of the copper layer. The etching process was performed under the following spray etching conditions.
(Spray etching conditions)
Etching solution: Ferric chloride aqueous solution (Baume degree: 40 degrees)
Liquid temperature: 60 ° C
Spray pressure: 2.0 MPa
Etching was continued, the time until the circuit top width reached 4 μm was measured, and the circuit bottom width (the length of the base X) and the etching factor at that time were evaluated. The etching factor is the distance of the length of sagging from the intersection of the vertical line from the upper surface of the copper foil and the resin substrate, assuming that the circuit is etched vertically when sagging at the end (when sagging occurs) Is a ratio of a to the thickness b of the copper foil: b / a, and the larger the value, the larger the inclination angle, and the etching residue does not remain and the sagging is small. It means to become. FIG. 5 shows a schematic diagram of a cross section in the width direction of a circuit pattern and an outline of a method for calculating an etching factor using the schematic diagram. This X was measured by SEM observation from above the circuit, and the etching factor (EF = b / a) was calculated. In addition, it calculated by a = (X (μm) −4 (μm)) / 2. The etching factor is obtained by measuring 12 points in the circuit and taking an average value. Thereby, the quality of etching property can be determined easily. Also, by calculating the standard deviation of the 12 etching factors, it is possible to determine whether the linearity of the circuit formed by etching is good or bad.
In the present invention, an etching factor of 5 or more is etching property: ◯, 2.5 or more and less than 5 is etching property: Δ, less than 2.5 or calculation is impossible or circuit formation is impossible. -Evaluated. Moreover, it can be said that the smaller the standard deviation of the etching factor, the better the linearity of the circuit. When the standard deviation of the etching factor was less than 0.5, the linearity was evaluated as ◯, when 0.5 to less than 1.0 was determined as the linearity: Δ, and 1.0 or more was determined as the linearity: x.

<Thickness of organic material in the intermediate layer>
For each sample before thermocompression bonding with resin, after peeling the ultrathin copper layer of the carrier-attached copper foil from the carrier, the exposed surface of the intermediate layer side of the exposed ultrathin copper layer and the exposed surface of the intermediate layer side of the carrier Is measured by XPS, and a depth profile is created. The depth at which the carbon concentration first becomes 3 at% or less from the surface on the intermediate layer side of the ultrathin copper layer is A (nm), and the carbon concentration is 3 at% or less first from the surface on the intermediate layer side of the carrier. The resulting depth was defined as B (nm), and the sum of A and B was defined as the thickness (nm) of the organic substance in the intermediate layer. The larger the value of x, the deeper (farther) the measurement position of the metal atomic concentration is from the surface. Note that the measurement interval of the atomic concentration of the metal in the depth direction (x: unit nm) is preferably 0.18 to 0.30 nm (in terms of SiO ₂ ). In the present application, the atomic concentration of the metal in the depth direction was measured at intervals of 0.28 nm (in terms of SiO ₂ ) (measured every 0.1 minutes by sputtering time).
In addition, the depth profile of the carbon concentration by the above XPS measurement is obtained from both ends in the long side direction of each sample sheet on the surface on the intermediate layer side of the exposed ultrathin copper layer and the surface on the intermediate layer side of the exposed carrier, respectively. A total of three locations, one in each region within 50 mm and one in a 50 mm × 50 mm region at the center, that is, the surface on the intermediate layer side of the exposed ultrathin copper layer and the intermediate layer side of the exposed carrier A total of six locations were prepared for the surface. FIG. 13 shows three measurement points on the surface on the intermediate layer side of the exposed ultrathin copper layer and three measurement points on the surface on the intermediate layer side of the exposed carrier. Subsequently, from the depth profile created for each of the three regions on the exposed intermediate layer side surface of the exposed ultrathin copper layer and the exposed intermediate layer side of the carrier, on the intermediate layer side of the above described ultrathin copper layer, respectively. The depth at which the carbon concentration first became 3 at% or less from the surface was calculated as A (nm), and the depth at which the carbon concentration first became 3 at% or less from the surface on the intermediate layer side of the carrier was calculated as B (nm). The sum of the arithmetic average value of A (nm) and the arithmetic average value of B (nm) was defined as the thickness (nm) of the organic substance in the intermediate layer.
XPS operating conditions are shown below.
・ Device: XPS measuring device (ULVAC-PHI, Model 5600MC)
・ Achieving vacuum: 3.8 × 10 ⁻⁷ Pa
X-ray: Monochromatic AlKα or non-monochromatic MgKα, X-ray output 300 W, detection area 800 μmφ, angle between sample and detector 45 °
Ion beam: ion species Ar ⁺ , acceleration voltage 3 kV, sweep area 3 mm × 3 mm, sputtering rate 2.8 nm / min (SiO ₂ conversion)
As described above, as a result of measuring the organic material thickness of the intermediate layer, the organic material thickness of the intermediate layer of Example 6 is 39 nm, the organic material thickness of the intermediate layer of Example 7 is 40 nm, the organic material thickness of the intermediate layer of Example 14 is 30 nm, The organic layer thickness of the intermediate layer of Example 17 was 35 nm, the organic layer thickness of the intermediate layer of Comparative Example 11 was 16 nm, and the organic layer thickness of the intermediate layer of Comparative Example 12 was 11 nm.

<Migration>
Each copper foil with a carrier (550 mm × 550 mm square) before forming the resin layer was bonded to a bismuth resin, and then the carrier foil was peeled off. The thickness of the exposed ultrathin copper layer was set to 1.5 μm by soft etching. Then, after washing and drying, DF (manufactured by Hitachi Chemical Co., Ltd., trade name RY-3625) was laminated on the ultrathin copper layer. The film was exposed under the condition of 15 mJ / cm ^{2, and} the liquid jet rocking was performed for 1 minute at 38 ° C. using a developer (sodium carbonate) to form a resist pattern with line and space (L / S) = 15 μm / 15 μm. Next, after UP was plated by 15 μm using copper sulfate plating (CUBRITE 21 manufactured by Sugawara Eugleite), DF was peeled off with a peeling solution (sodium hydroxide). Thereafter, the ultrathin copper layer was removed by etching with a sulfuric acid-hydrogen peroxide etchant to form a wiring of L / S = 15 μm / 15 μm. From the obtained wiring board, 100 wiring boards were cut out according to the above-mentioned area of 55 mm × 55 mm.
With respect to each obtained wiring board, the presence or absence of insulation deterioration between wiring patterns was evaluated using a migration measuring machine (IMV MIG-9000) under the following measurement conditions. The number of substrates on which migration occurred on 100 wiring substrates was evaluated.

  In addition, in the third embodiment, the above-described migration is performed by forming a wiring having a line and space pitch of 20 μm (L / S = 8 μm / 12 μm, L / S = 10 μm / 10 μm, L / S = 12 μm / 8 μm). Was evaluated. In Example 17, the line and space pitch is further 20 μm (L / S = 8 μm / 12 μm, L / S = 10 μm / 10 μm, L / S = 12 μm / 8 μm), and the line and space pitch is 15 μm ( (L / S = 5 μm / 10 μm, L / S = 8 μm / 7 μm) was formed and the above-described migration was evaluated. When the line and space pitch was 15 μm, the thickness of the plating UP was 10 μm. As a result, when the wiring with L / S = 8 μm / 12 μm, L / S = 10 μm / 10 μm, L / S = 12 μm / 8 μm was formed using the copper foil with carrier of Example 3, the in-plane migration rate was They were 2/100, 2/100, and 3/100, respectively. Moreover, using the copper foil with a carrier of Example 17, L / S = 8 μm / 12 μm, L / S = 10 μm / 10 μm, L / S = 12 μm / 8 μm, L / S = 5 μm / 10 μm, L / S = 8 μm When / 7 μm wiring was formed, in-plane migration rates were 1/100, 1/100, 2/100, 1/100, and 3/100, respectively.

<Measurement conditions>
Threshold: Initial resistance 60% down Measurement time: 1000h
Voltage: 60V
Temperature: 85 ° C
Relative humidity: 85% RH
The results are shown in Tables 1-5.

In each of Examples 1 to 17, for the copper foil with carrier, an insulating substrate was thermocompression bonded to the ultrathin copper layer under the conditions of pressure: 20 kgf / cm ² , 220 ° C. × 2 hours in JIS C 6471. When the ultrathin copper layer was peeled off in accordance with (Method A), the amount of Ni on the intermediate layer side surface of the ultrathin copper layer was 20.0% or less in the interval [0, 1.0]. The peelability and etching properties of the thin copper layer were good.
Since Comparative Examples 1 and 2 did not form an intermediate layer, they could not be peeled after thermocompression bonding. In Comparative Examples 3 and 4, the ultrathin copper layer could not be peeled off because Ni was not present in the intermediate layer. In Comparative Example 5, since the intermediate layer was only Ni, it could not be peeled after thermocompression bonding. Comparative Examples 6 and 8 could not be peeled after thermocompression bonding because the amount of Cr deposited in the intermediate layer was small. Comparative Example 9 could not be peeled off after thermocompression bonding because the amount of Zn deposited on the intermediate layer was too large. In Comparative Examples 7 and 10 to 13, the concentration of Ni existing in the ultrathin copper layer after thermocompression bonding was high, and when etching was performed after thermocompression bonding, the linearity of the circuit deteriorated. In Comparative Examples 8, 11, 14, and 15, since the average value or standard deviation of Rz on the surface of the ultrathin copper layer was large, the etching factor and the straight line of the circuit were bad.

  FIG. 6 shows a profile in the depth direction of the ultrathin thin copper surface of Example 5 (before substrate pressing). FIG. 7 shows the profile in the depth direction of the ultrathin thin copper surface of Example 5 (after substrate pressure bonding). FIG. 8 shows the profile in the depth direction of the ultrathin thin copper surface of Example 14 (after substrate pressure bonding). FIG. 9 shows the profile in the depth direction of the ultrathin thin copper surface of Comparative Example 5 (before substrate pressure bonding).

Claims (46)

A carrier-attached copper foil having a carrier, an intermediate layer, and an ultrathin copper layer in this order,
The average value of Rz measured on the surface of the ultrathin copper layer according to JIS B0601-1982 with a contact-type roughness meter is 1.5 μm or less, and the standard deviation of Rz satisfies 0.1 μm or less,
The intermediate layer includes Ni;
When the insulating substrate is thermocompression bonded to the ultrathin copper layer in the atmosphere under the conditions of pressure: 20 kgf / cm ² and 220 ° C. × 2 hours, and the ultrathin copper layer is peeled off according to JIS C 6471, XPS E (x) is the atomic concentration (%) of chromium in the depth direction (x: unit nm), and f (x) is the atomic concentration (%) of zinc. The atomic concentration (%) of nickel is g (x), the atomic concentration (%) of copper is h (x), the total atomic concentration (%) of oxygen is i (x), and the atomic concentration of carbon (%) Is j (x) and other atomic concentration (%) is k (x),
In the section [0, 1.0] in the depth direction analysis from the surface on the intermediate layer side of the ultrathin copper layer, ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) satisfying 20.0% or less. A carrier-attached copper foil having a carrier, an intermediate layer, and an ultrathin copper layer in this order,
The average value of Rt measured on the surface of the ultrathin copper layer in accordance with JIS B0601-2001 with a contact-type roughness meter is 2.0 μm or less, and the standard deviation of Rt satisfies 0.1 μm or less,
The intermediate layer includes Ni;
When the insulating substrate is thermocompression bonded to the ultrathin copper layer in the atmosphere under the conditions of pressure: 20 kgf / cm ² and 220 ° C. × 2 hours, and the ultrathin copper layer is peeled off according to JIS C 6471, XPS E (x) is the atomic concentration (%) of chromium in the depth direction (x: unit nm), and f (x) is the atomic concentration (%) of zinc. The atomic concentration (%) of nickel is g (x), the atomic concentration (%) of copper is h (x), the total atomic concentration (%) of oxygen is i (x), and the atomic concentration of carbon (%) Is j (x) and other atomic concentration (%) is k (x),
In the section [0, 1.0] in the depth direction analysis from the surface on the intermediate layer side of the ultrathin copper layer, ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) satisfying 20.0% or less. A carrier-attached copper foil having a carrier, an intermediate layer, and an ultrathin copper layer in this order,
The average value of Ra measured on the surface of the ultrathin copper layer in accordance with JIS B0601-1982 with a contact type roughness meter is 0.2 μm or less, and the standard deviation of Ra satisfies 0.03 μm or less,
The intermediate layer includes Ni;
When the insulating substrate is thermocompression bonded to the ultrathin copper layer in the atmosphere under the conditions of pressure: 20 kgf / cm ² and 220 ° C. × 2 hours, and the ultrathin copper layer is peeled off according to JIS C 6471, XPS E (x) is the atomic concentration (%) of chromium in the depth direction (x: unit nm), and f (x) is the atomic concentration (%) of zinc. The atomic concentration (%) of nickel is g (x), the atomic concentration (%) of copper is h (x), the total atomic concentration (%) of oxygen is i (x), and the atomic concentration of carbon (%) Is j (x) and other atomic concentration (%) is k (x),
In the section [0, 1.0] in the depth direction analysis from the surface on the intermediate layer side of the ultrathin copper layer, ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) satisfying 20.0% or less. When the insulating substrate is thermocompression bonded to the ultrathin copper layer under the conditions of pressure: 20 kgf / cm ² , 220 ° C. × 2 hours in the atmosphere, and the ultrathin copper layer is peeled off in accordance with JIS C 6471, In the section [1.0, 4.0] of the depth direction analysis from the surface on the intermediate layer side of the ultrathin copper layer, ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + + h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) satisfying 10.0% or less The copper foil with a carrier as described in any one of Claims.   The average value of Rt measured on the surface of the ultrathin copper layer with a contact roughness meter in accordance with JIS B0601-2001 is 2.0 μm or less, and the standard deviation of Rt is 0.1 μm or less, Item 5. The copper foil with carrier according to Item 1 or 4.   The average value of Ra measured on the surface of the ultrathin copper layer with a contact roughness meter according to JIS B0601-1982 is 0.2 μm or less, and the standard deviation of Ra is 0.03 μm or less. Item 5. The copper foil with carrier according to Item 1 or 4.   The copper foil with a carrier as described in any one of Claims 1-6 which has a roughening process layer in the said ultra-thin copper layer surface. When the insulating substrate is thermocompression bonded to the ultrathin copper layer under the conditions of pressure: 20 kgf / cm ² , 220 ° C. × 2 hours in the atmosphere, and the ultrathin copper layer is peeled off in accordance with JIS C 6471, In the interval [0, 1.0] of the depth direction analysis from the surface on the intermediate layer side of the ultrathin copper layer, ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) is 1.0% or more and 20.0% or less, and the interval [ 1.0, 4.0], ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x The copper foil with a carrier according to any one of claims 1 to 7, wherein d) + dx + ∫j (x) dx + ∫k (x) dx) satisfies 1.0% or more and 10.0% or less. When the insulating substrate is thermocompression bonded to the ultrathin copper layer under the conditions of pressure: 20 kgf / cm ² , 220 ° C. × 2 hours in the atmosphere, and the ultrathin copper layer is peeled off in accordance with JIS C 6471, In the interval [0, 1.0] of the depth direction analysis from the surface by XPS on the intermediate layer side of the ultrathin copper layer, ∫e (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) satisfies 3.0% or less. The copper foil with a carrier as described in any one of Claims. When the insulating substrate is thermocompression bonded to the ultrathin copper layer under the conditions of pressure: 20 kgf / cm ² , 220 ° C. × 2 hours in the atmosphere, and the ultrathin copper layer is peeled off in accordance with JIS C 6471, In the interval [0, 1.0] of the depth direction analysis from the surface on the intermediate layer side of the ultrathin copper layer, ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + 10. (g) (x) dx + (h) x (x) dx + (i) (x) dx + (j) dx + (k) (x) dx) satisfy 11.0% or less The copper foil with a carrier according to one item. When the insulating substrate is thermocompression bonded to the ultrathin copper layer under the conditions of pressure: 20 kgf / cm ² , 220 ° C. × 2 hours in the atmosphere, and the ultrathin copper layer is peeled off in accordance with JIS C 6471, In the section [1.0, 4.0] of the depth direction analysis from the surface on the intermediate layer side of the ultrathin copper layer, ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) satisfies 7.0% or less. The copper foil with a carrier as described in any one of Claims.   The copper foil with a carrier according to claim 1, wherein an average value of Rz on the surface of the ultrathin copper layer is 1.0 μm or less.   The copper foil with a carrier according to claim 12, wherein an average value of Rz on the surface of the ultrathin copper layer is 0.5 μm or less. When the ultra-thin copper layer was peeled off according to JIS C 6471, the atomic concentration (%) of chromium in the depth direction (x: unit nm) obtained from the depth direction analysis from the surface by XPS was expressed as e ( x), the atomic concentration (%) of zinc is f (x), the atomic concentration (%) of nickel is g (x), the atomic concentration (%) of copper is h (x), and the total oxygen atoms If the concentration (%) is i (x), the carbon atomic concentration (%) is j (x), and the other atomic concentration (%) is k (x),
In the section [0, 1.0] in the depth direction analysis from the surface on the intermediate layer side of the ultrathin copper layer, ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + (G) (x) dx + (h) (x) dx + (i) (x) dx + (j) dx + (k) (x) dx) satisfies 5.0% or less. A copper foil with a carrier according to claim 1. When the ultra-thin copper layer was peeled off according to JIS C 6471, the atomic concentration (%) of chromium in the depth direction (x: unit nm) obtained from the depth direction analysis from the surface by XPS was expressed as e ( x), the atomic concentration (%) of zinc is f (x), the atomic concentration (%) of nickel is g (x), the atomic concentration (%) of copper is h (x), and the total oxygen atoms If the concentration (%) is i (x), the carbon atomic concentration (%) is j (x), and the other atomic concentration (%) is k (x),
In the section [1.0, 4.0] of the depth direction analysis from the surface on the intermediate layer side of the ultrathin copper layer, ∫g (x) dx / (∫e (x) dx + ∫f (x dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) satisfying 1.0% or less The copper foil with a carrier as described in any one of these.   When the ultra-thin copper layer is peeled in accordance with JIS C 6471, in the interval [0, 1.0] in the depth direction analysis from the surface on the intermediate layer side of the ultra-thin copper layer, ∫g (x ) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx) is not less than 0.1% and not more than 5.0%, and in the interval [1.0, 4.0], ∫g (x) dx / (∫e (x) dx + ∫f (x) dx + (1) (g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) dx)) satisfies 0.1% to 1.0%. The copper foil with a carrier as described in any one of -15.   When the ultra-thin copper layer is peeled in accordance with JIS C 6471, in the interval [0, 1.0] in the depth direction analysis from the surface on the intermediate layer side of the ultra-thin copper layer, ∫g (x ) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k (x) The copper foil with a carrier according to any one of claims 1 to 16, wherein dx) satisfies 3.0% or less.   When the ultra-thin copper layer is peeled in accordance with JIS C 6471, in the section [0, 1.0] in the depth direction analysis from the surface by XPS on the intermediate layer side of the ultra-thin copper layer, ∫e (x) dx / (∫e (x) dx + ∫f (x) dx + ∫g (x) dx + ∫h (x) dx + ∫i (x) dx + ∫j (x) dx + ∫k ( The copper foil with a carrier according to any one of claims 1 to 17, wherein x) dx) satisfies 2.0% or less.   The intermediate layer is configured by laminating any one layer of nickel or an alloy containing nickel on the carrier and a layer containing any one or more of chromium, a chromium alloy, and an oxide of chromium in this order. The copper foil with a carrier as described in any one of Claims 1-18.   The copper foil with a carrier according to claim 19, wherein the layer containing any one or more of chromium, a chromium alloy, and a chromium oxide includes a chromate treatment layer.   The said intermediate | middle layer is copper foil with a carrier in any one of Claims 1-15 containing zinc.   The intermediate layer is any one of nickel, nickel-zinc alloy, nickel-phosphorus alloy, nickel-cobalt alloy, zinc chromate treatment layer, pure chromate treatment layer, and chromium plating layer on the carrier. The copper foil with a carrier according to any one of claims 1 to 21, wherein one kind of layer is laminated in this order. The intermediate layer is on the carrier,
A nickel layer or a nickel-zinc alloy layer and a zinc chromate treatment layer are laminated in this order, or
A nickel-zinc alloy layer and a pure chromate treatment layer or a zinc chromate treatment layer are laminated in this order.
The amount of adhered 100~40000μg / dm ² of nickel in the intermediate layer, the adhesion amount of chromium 5~100μg / dm ^2, any one of claims 1 to 21 attached amount of zinc is 1~70μg / dm ² The copper foil with a carrier according to the item. The intermediate layer is formed by laminating a nickel layer on the carrier and an organic material layer containing any one of a nitrogen-containing organic compound, a sulfur-containing organic compound, and a carboxylic acid,
The copper foil with a carrier according to any one of claims 1 to 21, wherein an adhesion amount of nickel in the intermediate layer is 100 to 40000 µg / dm ² . The intermediate layer is configured by laminating an organic material layer containing any one of a nitrogen-containing organic compound, a sulfur-containing organic compound and a carboxylic acid on the carrier, and a nickel layer in this order.
The copper foil with a carrier according to any one of claims 1 to 21, wherein an adhesion amount of nickel in the intermediate layer is 100 to 40000 µg / dm ² .   The copper foil with a carrier according to any one of claims 1 to 18, 21 and 22, wherein the intermediate layer contains an organic substance in a thickness of 25 nm to 80 nm. The intermediate layer is formed by laminating a nickel layer or an alloy layer containing nickel on the carrier and a layer containing any one or more of molybdenum, cobalt, and a molybdenum cobalt alloy in this order.
The adhesion amount of nickel in the intermediate layer is 100 to 40000 μg / dm ² , and when molybdenum is included, the adhesion amount of molybdenum is 10 to 1000 μg / dm ² , and when cobalt is included, the adhesion amount of cobalt is 10 The copper foil with a carrier as described in any one of Claims 1-18 and 21-23 which are -1000microgram / dm < ² >.   The copper foil with a carrier according to any one of claims 1 to 27, wherein the carrier is formed of an electrolytic copper foil or a rolled copper foil.   The roughening treatment layer is a layer made of any single element selected from the group consisting of copper, nickel, cobalt, phosphorus, tungsten, arsenic, molybdenum, chromium, and zinc, or an alloy containing at least one kind. Item 29. The copper foil with a carrier according to any one of Items 7 to 28.   The surface of the said roughening process layer has 1 or more types of layers selected from the group which consists of a heat-resistant layer, a rust prevention layer, a chromate process layer, and a silane coupling process layer. The copper foil with a carrier of description.   The surface of the said ultra-thin copper layer has 1 or more types of layers selected from the group which consists of a heat-resistant layer, a rust preventive layer, a chromate treatment layer, and a silane coupling treatment layer as described in any one of Claims 1-30. The copper foil with a carrier of description.   The copper foil with a carrier according to claim 30 or 31, comprising a resin layer on one or more layers selected from the group consisting of the heat-resistant layer, the rust-proof layer, the chromate treatment layer, and the silane coupling treatment layer.   The copper foil with a carrier as described in any one of Claims 7-31 provided with a resin layer on the said roughening process layer.   The copper foil with a carrier as described in any one of Claims 1-31 provided with a resin layer on the said ultra-thin copper layer.   The said resin layer is resin for adhesion | attachment, Copper foil with a carrier as described in any one of Claims 32-34.   36. The copper foil with a carrier according to any one of claims 32 to 35, wherein the resin layer is a semi-cured resin.   On the carrier, after forming any one layer of nickel or an alloy containing nickel, forming a layer containing any one or more of chromium, a chromium alloy or an oxide of chromium, and at least the nickel or nickel A step of forming an intermediate layer containing zinc in any one layer of an alloy containing or any one of chromium, a chromium alloy, or a layer containing an oxide of chromium, and the intermediate The method for producing a copper foil with a carrier according to any one of claims 1 to 36, comprising a step of forming an ultrathin copper layer on the layer by electrolytic plating.   After forming a plating layer containing nickel and zinc on the carrier, forming an intermediate layer by forming a plating layer containing chromium or a chromate treatment layer, and an ultrathin copper layer by electrolytic plating on the intermediate layer The manufacturing method of the copper foil with a carrier as described in any one of Claims 1-3 including the process of forming.   After forming a plating layer containing nickel on the carrier, a step of forming an intermediate layer by forming a plating layer containing chromium and zinc or a zinc chromate treatment layer, and ultrathin copper by electrolytic plating on the intermediate layer The manufacturing method of the copper foil with a carrier as described in any one of Claims 1-3 including the process of forming a layer.   After forming a plating layer containing nickel and zinc on the carrier, forming a plating layer containing chromium and zinc or a zinc chromate treatment layer, and forming an intermediate layer on the intermediate layer by electrolytic plating The manufacturing method of the copper foil with a carrier as described in any one of Claims 1-3 including the process of forming a thin copper layer.   After forming a nickel plating layer on the carrier, an intermediate layer is formed by forming a zinc chromate treatment layer by electrolytic chromate, or after forming a nickel-zinc alloy plating layer, a pure chromate treatment layer by electrolytic chromate Or the process of forming an intermediate | middle layer by forming a zinc chromate process layer, and the process of forming an ultra-thin copper layer by electrolytic plating on the said intermediate | middle layer are included as described in any one of Claims 1-36. The manufacturing method of copper foil with a carrier.   The manufacturing method of the copper foil with a carrier as described in any one of Claims 37-41 further including the process of forming a roughening process layer on the said ultra-thin copper layer.   The printed wiring board manufactured using the copper foil with a carrier as described in any one of Claims 1-36.   The printed circuit board manufactured using the copper foil with a carrier as described in any one of Claims 1-36.   The copper clad laminated board manufactured using the copper foil with a carrier as described in any one of Claims 1-36. A step of preparing the carrier-attached copper foil according to any one of claims 1 to 36 and an insulating substrate;
Laminating the copper foil with carrier and an insulating substrate;
After laminating the carrier-attached copper foil and the insulating substrate, forming a copper-clad laminate through a step of peeling the carrier of the carrier-attached copper foil,
Then, the manufacturing method of a printed wiring board including the process of forming a circuit by any method of a semi-additive method, a subtractive method, a partly additive method, or a modified semi-additive method.

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