JPWO2009069189A1 - Insert, tray and electronic component testing equipment - Google Patents

Abstract

The insert (710) includes a latch member (731) movable between a closed position approaching the upper surface of the IC device accommodated in the insert and an open position retracted from the upper surface of the IC device accommodated in the insert. And a support member (733) that rotatably supports the latch member (731) on the insert body (720). The latch member (731) is a support member (at least in plan view of the insert (710)). 733) as a rotation center.

Description

  The present invention is provided so as to be finely movable on a tray conveyed in an electronic component testing apparatus, and can accommodate various electronic components such as semiconductor integrated circuit elements (hereinafter also referred to as IC devices), and The present invention relates to a tray and an electronic component testing apparatus including the same.

  In the process of manufacturing an electronic component such as an IC device, an electronic component testing apparatus is used to test the performance and function of the IC device.

  A handler (Handler) constituting the electronic component testing apparatus includes a tray (hereinafter referred to as a customer tray) for storing IC devices before or after the test, and a tray that is circulated and conveyed in the electronic component testing apparatus. (Hereinafter referred to as a test tray), there is a type in which the IC device is replaced.

  In this type of handler, in a test process in which an IC device is brought into contact with a test head and the IC device is tested, the IC device is pressed against the test head while the IC device is housed in the test tray.

  The test tray is provided with an insert for accommodating each IC device so as to be finely movable. 2. Description of the Related Art Conventionally, an insert that uses a latch mechanism is known as an insert that prevents an IC device from popping out (see, for example, Patent Documents 1 and 2).

  In such an insert, the latch member can move a predetermined amount, so that one insert can correspond to IC devices of different sizes.

  However, any of the above inserts has a structure in which the latch member rotates around an axis orthogonal to the IC device accommodation direction, and therefore the versatility of the IC device decreases as the IC device size further increases. was there.

Japanese Patent Laid-Open No. 2001-33518 International Publication No. 03/075024 Pamphlet

  The problem to be solved by the present invention is to provide an insert that is highly versatile with respect to the size of the electronic device under test, and a tray and an electronic device test apparatus including the same.

  (1) In order to achieve the above object, according to the first aspect of the present invention, the insert is provided so as to be finely movable on a tray conveyed in the electronic component testing apparatus and can accommodate the electronic device under test. The latch member is movable between a closed position approaching the upper surface of the electronic device under test accommodated in the insert and an open position retracted from the upper surface of the electronic device under test accommodated in the insert. And a support member that rotatably supports the latch member on the insert body, wherein the latch member rotates at least about the support member in a plan view of the insert. An insert is provided (see claim 1).

  Although not particularly limited in the above invention, the support member is arranged so that the axial direction of the support member is substantially parallel to the accommodation direction of the electronic device under test or with respect to the accommodation direction. It is preferable that the insert body is provided so as to be inclined (see claim 2).

  Although not particularly limited in the above invention, it is preferable that the latch member rotate about the support member on a plane inclined with respect to the main surface of the insert body (see claim 3).

  Although not particularly limited in the above invention, it is preferable that the position of the tip of the latch member in the accommodation direction of the electronic device under test changes as the latch member rotates (see claim 4).

  Although not particularly limited in the above invention, the latch member is preferably substantially along the longitudinal direction of the insert body in the open position (see claim 5).

  Although not particularly limited in the above invention, it is preferable that the insert main body has an accommodating recess in which the latch member is accommodated in the open position (see claim 6).

  Although not particularly limited in the above invention, it is preferable that the housing recess is provided along the longitudinal direction of the insert body (see claim 7).

  Although not particularly limited in the above invention, it is preferable to further include a first elastic body that biases the latch member to the closed position (see claim 8).

  Although not particularly limited in the above invention, it further includes a lever provided on the insert body so that the rear end of the latch member can be pressed, and the rotation center of the latch member is between the front end and the rear end of the latch member. Preferably, the rear end of the latch member is pressed via the lever so that the front end of the latch member rotates from the closed position to the open position (see claim 9). .

  Although not particularly limited in the above invention, it is preferable to include a second elastic body that urges the lever in a direction away from the insert body (see claim 10).

  Although not particularly limited in the above invention, it further includes a lever plate that is provided on the insert body and can press the lever, and an external force acts on the rear end of the latch member via the lever plate and the lever. Preferred (see claim 11).

  Although not particularly limited in the above invention, the electronic device further includes a carrier that holds the electronic device under test accommodated in the insert, and the latch member of the electronic device under test held by the carrier in the closed position is provided. It is preferable to approach the upper surface and retreat from the upper surface of the electronic device under test held by the carrier at the open position (see claim 12).

  Although not particularly limited in the above invention, the carrier preferably has a plurality of through holes into which the terminals of the electronic device under test are inserted (see claim 13).

  Although not particularly limited in the above invention, the carrier is preferably detachable from the insert main body (see claim 14).

  (2) In order to achieve the above object, according to a second aspect of the present invention, the tray is transported in an electronic component testing apparatus, and the insert and the frame member that holds the insert in a finely movable manner. A tray is provided (see claim 15).

  (3) In order to achieve the above object, according to a third aspect of the present invention, an electronic component testing apparatus that tests the electronic device under test by pressing a terminal of the electronic device under test against the contact portion of the test head A test unit that presses the electronic device under test against the contact part in a state where the electronic device under test is accommodated in the tray, and the test unit that accommodates the electronic device under test before the test. A loader unit to be carried in, and an unloader unit to carry out the tray containing the tested electronic components from the test unit, wherein the tray includes the loader unit, the test unit, and the unloader unit. An electronic component testing apparatus characterized by being conveyed in a circulating manner is provided (see claim 16).

  In the present invention, since the latch member is rotated at least in the plan view of the insert, the amount of movement of the tip of the latch member can be increased, and versatility with respect to the size of the electronic device under test is increased.

FIG. 1 is a schematic cross-sectional view showing an electronic component testing apparatus according to an embodiment of the present invention. FIG. 2 is a perspective view showing an electronic component testing apparatus according to an embodiment of the present invention. FIG. 3 is a conceptual diagram showing tray handling in the embodiment of the present invention. FIG. 4 is an exploded perspective view showing an IC stocker used in the electronic component testing apparatus according to the embodiment of the present invention. FIG. 5 is a perspective view showing a customer tray used in the electronic component testing apparatus according to the embodiment of the present invention. FIG. 6 is an exploded perspective view showing a test tray used in the electronic component testing apparatus according to the embodiment of the present invention. FIG. 7 is an exploded perspective view showing an insert used in the test tray shown in FIG. FIG. 8A is a plan view of the insert in the embodiment of the present invention, and shows a state in which the latch member is in the closed position. FIG. 8B is a plan view of the insert according to the embodiment of the present invention, showing a state where the latch member is in the open position. 9A is a cross-sectional view taken along line IXA-IXA in FIG. 8A. 9B is a cross-sectional view taken along line IXB-IXB in FIG. 8B. 10A is a cross-sectional view taken along line XA-XA in FIG. 8A. 10B is a cross-sectional view taken along line XB-XB in FIG. 8B. FIG. 11 is a cross-sectional view showing the structure of the pusher, insert, socket guide, and socket of the electronic device test apparatus according to the embodiment of the present invention.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 ... Handler 5 ... Test head 50 ... Socket 6 ... Tester TST ... Test tray 701 ... Frame member 710 ... Insert 720 ... Insert main body 721 ... Device accommodation part 722 ... Accommodation recessed part 731 ... Latch member
731a ... tip
731b ... Center of rotation
731c ... Rear end 732 ... Winding spring 733 ... Shaft 734 ... Lever 750 ... Lever plate 760 ... Device carrier

  Hereinafter, embodiments of the present invention will be described with reference to the drawings.

  FIG. 1 is a schematic sectional view showing an electronic component testing apparatus according to an embodiment of the present invention, FIG. 2 is a perspective view showing an electronic component testing apparatus according to an embodiment of the present invention, and FIG. FIG.

  FIG. 3 is a view for understanding the tray handling method in the electronic component testing apparatus, and there is actually a portion showing the members arranged in the vertical direction in plan view. Therefore, the mechanical (three-dimensional) structure will be described with reference to FIG.

  The electronic component test apparatus according to the present embodiment tests (inspects) whether or not the IC device operates properly using the test head 5 and the tester 6 in a state where a high-temperature or low-temperature thermal stress is applied to the IC device. The device classifies the IC devices based on the test results. An IC device test by this electronic component testing apparatus is performed from a customer tray KST (see FIG. 5) on which a large number of IC devices to be tested are mounted to a test tray TST (see FIG. 6) that is circulated and conveyed in the handler 1. Implemented by replacing IC devices. The IC device is indicated by a symbol IC in the drawing.

  As shown in FIG. 1, a space 8 is provided in the lower portion of the handler 1, and the test head 5 is disposed in this space 8 so as to be replaceable. A socket 50 is provided on the test head 5 and is connected to the tester 6 through the cable 7. Then, the IC device and the socket 50 on the test head 5 are brought into electrical contact through the opening formed in the handler 1, and the IC device can be tested by an electric signal from the tester 6. . When changing the type of IC device, it is replaced with a socket suitable for the shape and number of pins of the IC device of that type.

  As shown in FIGS. 2 and 3, the handler 1 according to the present embodiment includes a storage unit 200 that stores an IC device before and after a test, and a loader unit that sends an IC device sent from the storage unit 200 to the test unit 100. 300, a test unit 100 in which the socket 50 of the test head 5 faces, and an unloader unit 400 that classifies the tested IC devices that have been tested by the test unit 100.

  Below, each part of the handler 1 is demonstrated.

<Storage unit 200>
FIG. 4 is an exploded perspective view showing an IC stocker used in the electronic component testing apparatus in the embodiment of the present invention, and FIG. 5 is a perspective view showing a customer tray used in the electronic component testing apparatus in the embodiment of the present invention.

  The storage unit 200 stores a pre-test stocker 201 that stores a customer tray KST that stores a pre-test IC device, a tested stocker 202 that stores a customer tray KST that stores IC devices classified according to the test results, It has.

  As shown in FIG. 4, these stockers 201 and 202 include a frame-shaped tray support frame 203 and an elevator 204 that enters from the bottom of the tray support frame 203 and moves up and down. A plurality of customer trays KST are stacked on the tray support frame 203, and only the stacked customer trays KST are moved up and down by the elevator 204. In the customer tray KST in the present embodiment, as shown in FIG. 5, concave storage portions for storing IC devices are arranged in, for example, 14 rows × 13 columns.

  Since the pre-test stocker 201 and the tested stocker 202 have the same structure, the numbers of the pre-test stocker 201 and the tested stocker 202 can be appropriately set as necessary.

  In this embodiment, as shown in FIGS. 2 and 3, two stockers STK-B are provided in the pre-test stocker 201, and two empty tray stockers STK-E are provided next to the stocker. In each empty tray stocker STK-E, empty customer trays KST sent to the unloader unit 400 are stacked.

  Next to the empty tray stocker STK-E, eight stockers STK-1, STK-2,..., STK-8 are provided in the tested stocker 202, and classified into a maximum of eight categories according to the test results. And can be stored. In other words, in addition to non-defective products and defective products, it is possible to sort non-defective products into high-speed, medium-speed, low-speed, or defective products that require retesting. It has become.

<Loader unit 300>
The above-described customer tray KST is carried from the lower side of the apparatus base 101 to two windows 370 of the loader section 300 by a tray transfer arm 205 provided between the storage section 200 and the apparatus base 101. In the loader unit 300, the IC device loaded on the customer tray KST is once transferred to the precursor 360 by the device transport device 310, where the mutual positional relationship of the IC devices is corrected. Thereafter, the IC device transferred to the precursor 360 is moved again by the device transfer device 310 and loaded onto the test tray TST stopped at the loader unit 300.

  As described above, the loader unit 300 includes the device transfer device 310 that transfers IC devices from the customer tray KST to the test tray TST. As shown in FIG. 2, the device transport apparatus 310 includes two rails 311 installed on the apparatus base 101, and reciprocates between the test tray TST and the customer tray KST along the rails 311. A movable arm 312 capable of moving (this direction is referred to as a Y direction), and a movable head 320 supported by the movable arm 312 and movable in the X direction.

  A suction pad (not shown) is mounted downward on the movable head 320 of the device transport apparatus 310, and the suction head moves while sucking to hold an IC device from the customer tray KST. Transfer device to test tray TST. For example, about eight such suction pads are provided in one movable head 320, and eight IC devices can be transferred to the test tray TST at a time.

<Test unit 100>
The above-described test tray TST is loaded into the test unit 100 after the IC device is loaded by the loader unit 300, and the test of each IC device is executed in a state where the IC device is mounted on the test tray TST.

  As shown in FIGS. 2 and 3, the test unit 100 includes a soak chamber 110 that applies a target high or low temperature stress to an IC device mounted on the test tray TST, and the soak chamber 110 is subjected to thermal stress. The test chamber 120 is configured to press the IC device in a state of being applied to the test head 5 and the unsoak chamber 130 that removes thermal stress from the IC device tested in the test chamber 120.

  When a high temperature is applied to the IC device in the soak chamber 110, the IC device is cooled by blowing in the unsoak chamber 130 and returned to room temperature. On the other hand, when a low temperature is applied to the IC device in the soak chamber 110, the IC device is heated in the unsoak chamber 130 with warm air or a heater to return to a temperature at which condensation does not occur.

  As shown in FIG. 2, the soak chamber 110 and the unsoak chamber 130 of the test unit 100 protrude above the test chamber 120. Further, as conceptually shown in FIG. 3, the soak chamber 110 is provided with a vertical transfer device, and a plurality of test trays TST are supported by the vertical transfer device until the test chamber 120 is empty. Wait while. Mainly, high-temperature or low-temperature heat stress is applied to the IC device during this standby.

  In the test head 120, the test head 5 is arranged in the center, and the test tray TST is carried on the test head 5, and the input / output terminal HB (see FIG. 11) of the IC device is connected to the socket 50 of the test head 5. The test is performed by making electrical contact with the contact pin 51 (see FIG. 11). On the other hand, the test tray TST for which the test has been completed is removed by the unsoak chamber 130, and after the temperature of the IC device is returned to room temperature, it is carried out to the unloader unit 400.

  In the upper part of the soak chamber 110, an inlet for carrying the test tray TST from the apparatus base 101 is formed. Similarly, an outlet for carrying out the test tray TST to the apparatus base 101 is also formed in the upper part of the unsoak chamber 130. As shown in FIG. 2, the apparatus base 101 is provided with a tray transport device 102 for taking the test tray TST in and out from the test unit 100 through these inlets and outlets. The tray transport device 102 is constituted by, for example, a rotating roller.

  The test tray TST unloaded from the unsoak chamber 130 by the tray transport device 102 is loaded into the unloader unit 400 and the loader unit 300 after all mounted IC devices are reloaded by the device transport device 410 (described later). To the soak chamber 110.

  FIG. 6 is an exploded perspective view showing a test tray used in the electronic component testing apparatus according to the embodiment of the present invention.

  As shown in FIG. 6, the test tray TST protrudes at equal intervals from a rectangular frame member 701, bars 702 provided parallel to the frame member 701 at equal intervals, and sides 701 a of the bars 702 or the frame member 701. A plurality of mounting pieces 703. And the insert accommodating part 704 is comprised by the crosspiece 702, edge | side 701A, and the attachment piece 703. As shown in FIG.

  Each insert accommodating portion 704 accommodates one insert 710. At both ends of the insert 710, attachment holes 706 for attaching the insert 710 to the attachment piece 703 are formed, respectively. It is installed in a possible state). As shown in FIG. 6, 64 of these inserts 710 are attached to one test tray TST in an array of 4 rows and 16 columns, and an IC device is accommodated in the insert 710, so that an IC is mounted on the test tray TST. Devices will be loaded.

  7 is an exploded perspective view showing an insert used in the test tray shown in FIG. 6, FIGS. 8A and 8B are plan views of the insert in the embodiment of the present invention, and FIGS. 9A to 10B are sectional views of FIGS. 8A and 8B. It is.

  As shown in FIG. 7, the insert 710 in this embodiment includes an insert body 720, a lever plate 750, and a device carrier 760.

  As shown in FIG. 7, a device housing portion 721 for housing an IC device is provided at the approximate center of the insert body 720. As shown in FIGS. 9A to 10B, the device housing portion 721 has an entrance 721a into which an IC device enters, and an attachment port 721b into which the device carrier 740 is attached in the lower portion. The entrance port 721a and the mounting port 721b communicate with each other, and the IC device that has entered the device accommodating portion 721 from the entrance port 721a is guided to the device carrier 760 mounted in the mounting port 721b. In this embodiment, one IC device is accommodated in one insert 710. However, the present invention is not particularly limited to this, and a plurality of device accommodating portions 721 are formed in one insert body 720. A plurality of IC devices may be accommodated in the same insert 710.

  As shown in FIG. 7, the insert main body 720 has a latch mechanism including a latch member 731, a winding spring 732, a shaft 733, a lever 734, and a coil spring 735.

  As shown in FIGS. 9A and 9B, the latch member 731 has a tip 731a that approaches or separates from the upper surface of the IC device housed in the device housing portion 721, and a rear end 731c that is pressed by the lever 734. Have. Further, in the latch member 731, a through hole serving as a rotation center 731 b is formed between the front end 731 a and the rear end 731 c, and the shaft 733 is inserted into the through hole so that the latch member 731 is inserted into the latch member 731. The main body 720 is rotatably supported.

  The latch member 731 rotates around the shaft 733, thereby approaching the upper surface of the IC device housed in the device housing portion 721 and preventing the IC device from popping out (shown in FIGS. 8A, 9A, and 10A). And is hereinafter referred to simply as a closed position), and a position (FIGS. 8B, 9B, and 10B) that allows the IC device to be withdrawn / retracted from the upper surface of the IC device accommodated in the device accommodating portion 721. The tip 731a of the latch member 731 can be moved between the state shown in FIG.

In the present embodiment, since the tip 731a of the latch member 731 is rotated in a plan view of the insert 710 shown in FIGS. 8A and 8B, a large amount of movement of the tip 731a can be ensured. In particular, in the insert 710 of the present embodiment, the tip 731a of the latch member 731 can move to the vicinity of the center of the device housing portion 721. Therefore, the insert 710 has a relatively large size indicated by the symbol IC in FIGS. A small IC device can be accommodated, and an IC device having a relatively large size indicated by reference numeral IC _B in the figure can be accommodated, and versatility with respect to the size of the IC device is high.

  As shown in FIGS. 7, 10A, and 10B, the winding spring 732 is interposed between the latch member 731 and the insert main body 720 with the shaft 733 as the center of rotation, and the latch member 731 is closed by the elastic force thereof. Energizing position. Therefore, when the rear end 731c of the latch member 731 is pressed against the elastic force of the winding spring 732, the tip 731a of the latch member 731 moves to the open position. On the other hand, when the pressing of the rear end 731c of the latch member 731 is released, the leading end 731a of the latch member 731 is returned to the closed position by the elastic force of the winding spring 732.

  In this embodiment, as shown in FIGS. 10A and 10B, the shaft 733 is α degree (for example, about 45 °) toward the IC device with respect to the IC device accommodation direction (usually the vertical direction) in the insert 710. The shaft 733 is inserted into the insert body 720 in an inclined state. For this reason, the tip 731a of the shaft member 733 is rotated about the shaft 733 on the plane PL inclined with respect to the main surface of the insert body 720. For this reason, since the height of the tip 731a of the latch member 731 is variable in accordance with the rotation operation of the latch member 731, it is possible to cope with a change in the thickness of the IC device accompanying the product type change. .

  As shown in FIGS. 9A to 10B, a housing recess 722 for housing the latch member 731 is formed on the inner wall surface of the device housing portion 721 of the insert body 720 on the surface along the longitudinal direction of the insert body 720. ing. In the present embodiment, as shown in FIGS. 8B, 9B, and 10B, the latch member 731 is completely accommodated in the accommodating recess 722 in the open position, and the opening dimension of the device accommodating portion 721 is determined. It can be utilized to the maximum for the size of the IC device. In this embodiment, since the latch member 731 is substantially along the longitudinal direction of the insert body 720 in the open position, the distance from the rotation center 731b to the tip 731a can be increased in the latch member 731. The rotational movement amount of 731a can be increased.

  As shown in FIG. 7, the lever 734 is inserted into a lever insertion hole 723 formed in the insert body 720 via a coil spring 735. As shown in FIGS. 7, 9A, and 9B, a step portion 734a is formed in the lower portion of the lever 734, and the lever insertion hole 723 communicates with the housing recess 722, and the step portion 734a is the latch member 731. The rear end 731c can be contacted.

  When the lever 734 is not pushed, the leading end 731a of the latch member 731 is in the closed position. However, when the lever 734 is pushed, the rear end 731c of the latch member 731 is pushed via the lever 734, and the latch member 731 The tip 731a is rotationally moved to the open position. Since the lever 734 pushes down the rear end 731c of the latch member 731 and pushes it toward the inside of the insert body 720, the contact surface of the stepped portion 734a is not flat but inclined as shown in FIG.

  The coil spring 735 urges the lever 734 upward (in a direction away from the insert body 720). For this reason, when a downward pressing force (in a direction approaching the insert main body 720) is received, the lever 734 moves downward against the elastic force of the coil spring 735. On the other hand, when the pressing force to the lever 734 is released, the lever 734 is returned upward by the elastic force of the coil spring 735.

  As shown in FIGS. 7, 9A and 9B, a long hole 734b is formed in the lower portion of the lever 734, and a pin 736 is inserted into the long hole 734b from the outside of the insert body 720. Thereby, the upward movement of the lever 734 is restricted.

  Further, as shown in FIG. 7, the insert main body 720 has a clamp mechanism including a hook member 741, a shaft 742, and a coil spring 743.

  The hook member 741 has a hook 741 a that engages with the hook receiving portion 761 of the device carrier 760. The hook member 741 is housed in a clamp housing portion 724 of the insert body 720 together with a coil spring 742, and is rotatably supported by a shaft 743 inserted from the outside of the insert body 720. The hook member 741 is urged by a coil spring 742 so that the hook 741a faces the outside of the insert body 720. Two such clamping mechanisms are provided in the insert body 720, and the device carrier 760 can be detachably held. In the present invention, the number of clamp mechanisms is not particularly limited as long as it is plural, and for example, one insert body 720 may be provided with four clamp mechanisms.

  When removing the device carrier 760 from the insert body 720, although not particularly shown, first, a pin-shaped jig is inserted into the clamp housing portion 724 from above. Next, the hook 741a is rotated inward against the elastic force of the coil spring 742. Thereby, since the engagement of the hook 741a and the hook receiving part 761 is cancelled | released, the device carrier 760 can be removed from the insert main body 720. FIG.

  A lever plate 750 is attached to the upper side of the insert main body 720 via a coil spring 754 as shown in FIG. The coil spring 754 biases the lever plate 750 upward (in a direction away from the insert body 720). Therefore, when a downward pressing force (in the direction approaching the insert body 720) is received, the lever plate 750 moves downward against the elastic force of the coil spring 754, and when the pressing force is released, the coil spring 754 is released. The lever plate 750 is returned to the upper side by the elastic force. As shown in FIGS. 7, 10 </ b> A, and 10 </ b> B, the long side 751 of the lever plate 750 is engaged with the groove 725 formed on the side surface of the insert body 720, so that the lever plate 750 moves upward. Is limited.

  As shown in FIG. 7, an opening 752 is provided at the approximate center of the lever plate 750 so that the device housing portion 721 of the insert body 720 is exposed. The opening 752 is formed to be slightly larger than the entrance 721a so as not to hinder the entry / exit of the IC device to / from the device housing portion 721 via the entrance 721a.

  Further, as shown in FIG. 7, the lever plate 750 is provided with a through hole 753 at a position corresponding to the clamp housing portion 723 of the insert body 720. The through hole 753 is used when the device carrier 760 is attached to and detached from the insert body 720.

  A device carrier 760 is attached to the lower side of the insert body 720 as shown in FIG.

  The device carrier 760 is provided with a number of guide holes 762 penetrating the bottom surface thereof. In this embodiment, the IC device is positioned with respect to the device carrier 760 by fitting the terminal HB (see FIGS. 9A to 11) of the IC device into the guide holes 762. For this reason, even when the external shape of the IC device is changed by changing the type of the IC device, if the size and pitch of the terminals HB are the same, the device carrier 760 may not be replaced. It is high. In the present embodiment, one guide hole 762 is associated with one terminal HB. However, the present invention is not particularly limited to this, and one guide hole 762 is associated with a plurality of terminals HB. Also good.

  On the upper surface of the device carrier 760, hook receiving portions 761 with which the hooks 741a of the hook members 741 of the clamp mechanism are engaged are formed at two locations on the same diagonal line. For example, the device carrier 760 is replaced when the pitch between the terminals HB is changed by changing the type of IC device.

  FIG. 11 is a cross-sectional view showing the structure of the pusher, insert, socket guide, and socket of the electronic device test apparatus according to the embodiment of the present invention.

  As shown in FIG. 11, the pusher 121 is provided above the test head 5 in the test chamber 120 and moves up and down in the Z-axis direction by a Z-axis drive device (for example, a fluid cylinder) (not shown). The pushers 121 are attached to the Z-axis drive device in an array of 4 rows and 16 columns, for example, so as to correspond to the IC devices to be tested simultaneously.

  In the center of the pusher 121, a presser 122 for pressing the IC device is formed. Further, at both ends of the pusher 121, guide pins 123 inserted into the guide holes 726 of the insert 710 and the guide bushes 56 of the socket guide 55 are provided.

  In addition, guide holes 726 into which the guide pins 123 of the pusher 121 and the guide bushes 56 of the socket guide 55 are inserted from above and below are formed at both ends of the insert 710.

  On the other hand, guide bushes 56 into which the two guide pins 123 of the pusher 121 are inserted are provided at both ends of the socket guide 55 fixed to the test head 5.

  When the Z-axis driving device is lowered during the IC device test, the guide pin 123 of the pusher 121 is inserted into the guide hole 726 of the insert 710, and the guide bush 56 of the socket guide 55 is inserted into the guide hole 726 of the insert 710. At the same time, the guide pin 123 of the pusher 121 is inserted into the guide bush 56, whereby the pusher 121, the insert 710, and the socket 50 are positioned relative to each other.

  The test of the IC device is executed by the tester 6 in a state where the terminal HB of the IC device and the contact pin 51 of the socket 50 are in electrical contact. The test result of the IC device is stored at an address determined by, for example, an identification number assigned to the test tray TST and an IC device number assigned inside the test tray TST.

<Unloader unit 400>
Returning to FIG. 2, the unloader unit 400 is also provided with two device transport devices 410 having the same structure as the device transport device 310 provided in the loader unit 300. The device transport device 410 carries the device transport device 410 to the unloader unit 400. The tested IC devices are transferred from the test tray TST to the customer tray KST according to the test result.

  As shown in FIG. 2, the apparatus base 101 in the unloader unit 400 has a pair of windows arranged so that the customer tray KST carried from the storage unit 200 to the unloader unit 400 faces the upper surface of the apparatus base 101. Two sets of 470 are formed.

  In addition, although not shown in the drawings, an elevating table for elevating and lowering the customer tray KST is provided below the respective window portions 370 and 470. In the unloader unit 400, the customer tray KST that has been fully loaded with the tested IC devices is lowered, and the full tray is transferred to the tray transfer arm 205.

  Below, with reference to FIG. 8A-FIG. 10B, operation | movement of the insert in this embodiment is demonstrated.

  For example, a case where an IC device accommodated in the test tray TST is taken out using the device transport apparatus 410 will be described as an example. FIGS. 8A, 9A, and 10A show a state in which the IC device is accommodated in the test tray TST (a state where the tip 731a of the latch member 731 is in the closed position). When approaching the insert 710, the lever plate 750 is pushed down by a part of the suction head. As a result, the rear end 731c of the latch member 731 is pushed down by the lever 734, and the latch member 731 rotates about the shaft 733, and the front end 731a of the latch member 731 transitions to the open position.

  This state is shown in FIGS. 8B, 9B, and 10B. The latch member 731 is retracted from the upper surface of the IC device and completely accommodated in the accommodating recess 722 of the insert body 720, and the suction head is the IC device. Can be held.

  As described above, in the present embodiment, since the latch member 731 is rotated at least in the plan view of the insert 710, the amount of movement of the tip 731a of the latch member 731 can be increased, and versatility with respect to the size of the IC device is increased. be able to.

  The embodiment described above is described for facilitating the understanding of the present invention, and is not described for limiting the present invention. Therefore, each element disclosed in the above embodiment is intended to include all design changes and equivalents belonging to the technical scope of the present invention.

  In the above-described embodiment, the latch member 731 is described as being rotated on the plane PL inclined with respect to the main surface of the insert body 720. However, the present invention is not particularly limited to this. For example, the latch member 731 may be rotated on a plane that is substantially parallel to the main surface of the insert body 720. In this case, when the force is transmitted from the lever 734 to the latch member 731, the vertical force input from the lever may be converted into the horizontal direction using, for example, the wedge principle.

Claims (16)

An insert that can be finely moved on a tray conveyed in an electronic component testing apparatus and can accommodate an electronic device under test,
A latch member movable between a closed position approaching the upper surface of the electronic device under test accommodated in the insert and an open position retracted from the upper surface of the electronic device under test accommodated in the insert;
A support member that rotatably supports the latch member on the insert body,
The insert is characterized in that the latch member rotates at least about the support member in a plan view of the insert.   The support member is formed on the insert body such that an axial direction of the support member is substantially parallel to a housing direction of the electronic device under test or is inclined with respect to the housing direction. The insert according to claim 1, wherein the insert is provided.   The insert according to claim 1 or 2, wherein the latch member rotates around the support member on a plane inclined with respect to a main surface of the insert body.   The insert according to any one of claims 1 to 3, wherein the position of the tip of the latch member in the accommodation direction of the electronic device under test changes with the rotation of the latch member.   The insert according to any one of claims 1 to 4, wherein the latch member is substantially along a longitudinal direction of the insert body in the open position.   The insert according to any one of claims 1 to 5, wherein the insert body has an accommodation recess in which the latch member is accommodated in the open position.   The insert according to claim 6, wherein the receiving recess is provided along a longitudinal direction of the insert body.   The insert according to claim 1, further comprising a first elastic body that biases the latch member to the closed position. A lever provided on the insert body so that the rear end of the latch member can be pressed;
The rotation center of the latch member is located between the front end and the rear end of the latch member,
9. The rear end of the latch member is pressed through the lever, so that the front end of the latch member rotates from the closed position to the open position. Inserts.   The insert according to claim 9, further comprising a second elastic body that urges the lever in a direction away from the insert body. A lever plate provided on the insert body and capable of pressing the lever;
The insert according to claim 9 or 10, wherein an external force acts on a rear end of the latch member via the lever plate and the lever. A carrier for holding the electronic device under test housed in the insert;
The latch member approaches the upper surface of the electronic device under test held by the carrier in the closed position, and retracts from the upper surface of the electronic device under test held by the carrier in the open position. The insert according to any one of claims 1 to 11, wherein the insert is characterized.   The insert according to claim 12, wherein the carrier has a plurality of through holes into which terminals of the electronic device under test are inserted.   The insert according to claim 11 or 12, wherein the carrier is detachable from the insert body. A tray that is transported in an electronic component testing device,
The insert according to any one of claims 1 to 14,
And a frame member for holding the insert so as to be finely movable. An electronic component test apparatus for testing the electronic device under test by pressing a terminal of the electronic device under test against a contact portion of a test head,
In a state in which the electronic device under test is accommodated in the tray according to claim 15, a test unit that presses the electronic device under test against the contact portion;
A loader unit for carrying the tray containing the electronic device under test before the test into the test unit;
An unloader unit that unloads the tray containing the tested electronic components from the test unit,
The tray is circulated and conveyed through the loader unit, the test unit, and the unloader unit.

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