KR20210074934A - Test tray for handler to support test of electronic devices - Google Patents

Abstract

The present invention relates to a test tray for a handler which supports testing of electronic components. According to the present invention, the test tray for a handler which supports the testing of electronic components narrows width to prevent interference with an interface board of a tester in some parts of an outer frame, so that a test can be performed normally regardless of specification of the interface board. According to the present invention, even if the specification of the interface board is changed, the existing handler can be used as it is, thereby reducing operating costs.

Description

TEST TRAY FOR HANDLER TO SUPPORT TEST OF ELECTRONIC DEVICES

The present invention relates to a test tray for a handler that supports testing of electronic components.

Electronic components such as semiconductor devices are produced through numerous standardized processes in some cases. However, even if each process is performed under standardized conditions, it is virtually impossible to produce only good electronic components because minute variations in conditions affect the production of electronic components. Therefore, the produced electronic components are tested by testers and then divided into good products and defective products, and only good products are shipped.

Testing of electronic components is possible only when the electronic components are electrically connected to the tester. In this case, the equipment that electrically connects the test socket of the tester and the electronic component is a handler (hereinafter abbreviated as 'handler') that supports testing of the electronic component.

The types of electronic components are diverse, and the electrical connection structure of the electronic components is also diverse as much as the variety. So, there are various types of handlers.

Among the various types of handlers, there are those that electrically connect the electronic components to the tester while the electronic components are loaded on the test tray, and the present invention relates to these types of handlers.

The test handler to which the test tray is applied loads the electronic components to be tested into the test tray at the loading position, presses the electronic components loaded on the test tray at the test position with a pusher, and electrically connects them to the tester. In addition, it is necessary to perform the operation of unloading the electronic components for which the test has been completed from the test tray in the unloading position. To this end, the test tray is cyclically moved along a constant circulation path that passes through the loading position, the test position, and the unloading position and back to the loading position. At this time, for the normal and proper movement of the test tray, a plurality of support rails for guiding and supporting the movement of the test tray or a stepper configured to hold both ends of the test tray for stepwise movement of the test tray are provided on the circulation path. .

Such a test tray includes inserts and an installation frame as in Korean Patent Laid-Open No. 10-2008-0040251.

Inserts are installed through the installation frame, and electronic components can be loaded. Thus, the electronic components are electrically connected to the tester while being loaded into the inserts. To this end, the tester has an interface board having test sockets electrically connected to electronic components.

1 and 2 are schematic reference views for explaining a process in which a tester TESTER and electronic components D are electrically connected.

FIG. 1 shows a state in which the test tray 100 held at both ends by the current gripping rail GR and the interface board IB are spaced apart. In the state shown in FIG. 1 , as the test tray 100 moves toward the interface board IB, the test socket TS and the electronic component D are electrically connected as shown in FIG. 2 .

On the other hand, when the electronic components D to be tested are changed, the structure of the test socket TS needs to be changed.

For example, if there is a change in the number of terminals of the electronic component D to be tested or the distance between the terminals, it is necessary to be replaced with a test socket TS having a structure that can be properly electrically connected to the corresponding electronic component. That is, if the type of the electronic component D to be tested is changed, the test socket TS must also be changed accordingly.

So, as shown in (a) and (b) of Figure 3 _{, the height (H 1} , H ₂ ; H ₁ > H _{2 ) of the test sockets (TS 1} , TS ₂ ) protruding from the surface (F) of the interface board (IB) ) may be different. For example, it is necessary to change from the test socket (TS ₁ ) of the pogopin structure to the test socket (TS _{2 ) of the PCR socket structure.}

_{In the case of the test socket (TS 1} ) having a pogo pin structure, _{the height (H 1} ) is inevitably high because the springs must be installed in a line to advance and retreat the pogo pin, but the test socket (TS _{2) having a PCR socket structure} ), the height (H ₂ ) is relatively low.

Therefore, when the test tray 100 advances toward the interface board IB for electrical connection between the electronic component D and the test sockets TS ₁ , TS _{2 , the following difference occurs.}

The interface board (IB) having the pogo pin structure test socket (TS ₁ ) has a high protruding height (H _{1 ) of the test sockets (TS 1} , TS ₂ ) as shown in FIG. 2 , so the test socket (TS ₁ ) and The electronic component D may be properly electrically connected.

However, the interface board (IB) is a test socket because of test socket (TS ₂₎ the height (H ₂₎ the low protrusion (TS ₂₎ with a test socket (TS ₂₎ of the PCR socket structure, as shown in Figure 4 and the electronic component Before (D) is electrically connected, the outer frame of the test tray 100 first contacts the surface (F) of the interface board (IB), so that the test socket (TS ₂ ) and the electronic component (D) are spaced apart from each other and electrically Connection cannot be made. And the problem with this structure _{is that the number of inserts 110 is greater than the number of test sockets (TS 2} ), for example, after testing the electronic components (D) in odd rows first, the test tray 100 is moved by one step In the case of passing through a plurality of electrical connection steps in testing all the electronic components (D) loaded on a single test tray 100, as in the case where it is implemented to test the electronic components (D) of even rows in a state of Occurs. To solve this problem, you can consider the following methods.

First, the test tray 100 corresponding to _{the test socket TS 2} of the PCR socket structure is manufactured. For example, if the width (thickness, the width in the direction in which the test tray moves to connect the test socket and electronic components) of the outer frame of the test tray 100 is made narrow, the test socket (TS _{2) of the PCR socket structure} ), the outer frame does not come into contact with the surface F of the interface board IB even when the electronic component D comes into contact with it. However, in this case, in order to use the existing handler as it is, since the gripping width of the test tray 100 is different, all the various components for gripping the test tray 100 on the circulation path of the test tray 100 must be replaced. This entails a decrease in the utilization rate due to replacement work and waste of money due to replacement of manpower and parts. In addition, since the insert 100 may need to protrude more in the direction of the tester than the outer frame, in this case, the probability that the insert 100 interferes with other components of the handler increases, and such interference is prevented To do this, the design becomes more complicated.

However, if a handler dedicated to the test socket (TS ₂ ) of the PCR socket structure and a handler dedicated to the test socket (TS ₁ ) of the pogo pin structure are provided, respectively, the operation rate can be maintained, but the purchase cost and installation space are wasted accordingly. follows

Of course, the consumer of the handler wants to lower the production cost by using the existing handler even if the protruding height of the test socket TS is changed for reasons such as the type of electronic component D to be tested is changed. In other words, consumers of handlers prefer compatible products.

The present invention is a test that can be used interchangeably with test sockets with different protruding heights because the existing handler can be used without changing the overall gripping structure of the handler even if the protruding height of the test socket is changed for various reasons There is a motive in trying to find a technology for trays.

A test tray for a handler supporting a test of an electronic component according to the present invention includes inserts having a seating groove in which an electronic component can be seated; and an installation frame in which the inserts are installed in a matrix form to be able to move somewhat. Including, the installation frame is an outer frame forming an outer rim in the form of a square ring; and mounting stands vertically coupled to the outer frame as an inner region of the outer frame and provided to install the inserts. Including, wherein the outer frame comprises: a pair of grippers each gripped by a pair of gripping rails spaced apart from each other in an area where electronic components are tested; and the other pair of vertical bars that are perpendicular to the pair of grippers and complete the rectangular ring shape of the outer frame; Including, the vertical band is narrower than the width of the gripper in the direction toward the tester of some portion of the width.

The vertical bar has a evacuation groove formed in the remaining portions except for the portion connected to the gripper, and the evacuation groove is formed on a side facing the tester.

The evacuation groove is formed to be elongated in a direction perpendicular to the gripper, and the length of the evacuation groove is longer than the length of the interface board of the tester.

A distance between the pair of grippers is wider than a first width of the interface board, a distance between the pair of vertical bars is narrower than a second width of the interface board, and the first width is perpendicular to the gripper. refers to a width in a direction, and the second width refers to a width in a direction perpendicular to the vertical band.

The interval between the pair of grippers is wider than the first width of the interface board, the interval between the pair of vertical bars is wider than the second width of the interface board, and the number of inserts is provided in the interface board, More than the number of test sockets electrically connected to electronic components.

The evacuation groove prevents the vertical bar from first contacting the surface of the interface board before the electronic component is connected to the test socket, even if the protruding height of the test socket provided on the interface board is lowered, thereby holding the gripper. It is possible to use the general structure of the handler for this purpose as it is, so it can be used interchangeably with test sockets with different heights.

According to the present invention, regardless of the change in the protruding height of the test socket, since it can be used without changing the overall gripping structure of the existing handler, ultimately, it is possible to increase the operation rate of the handler and reduce the production cost.

1 to 4 are schematic reference diagrams for explaining the background art.
5 is a schematic plan view of a test tray according to an embodiment of the present invention.
6 is a reference diagram illustrating the installation frame of the test tray of FIG. 5 conceptually separated.
7 is an exaggerated and schematically illustrated perspective view of an outer frame constituting the installation frame of FIG. 6 .
8 to 12 are exaggerated and schematically illustrated reference views to explain the function of the test tray of FIG. 5 .

A preferred embodiment according to the present invention will be described with reference to the accompanying drawings, but for the sake of brevity of the description, descriptions of overlapping or substantially the same components are omitted or compressed as much as possible.

5 is a plan view of a test tray (200, hereinafter abbreviated as 'test tray') for a handler according to an embodiment of the present invention.

The test tray 200 includes inserts 210 and an installation frame 220 .

The inserts 210 each have a seating groove IG in which an electronic component can be mounted, and include a body 211 and a retainer 212 .

A seating groove IG is formed in the body 211 .

The retainer 212 holds the electronic component to prevent separation of the electronic component seated in the seating groove IG.

The inserts 210 are installed in the installation frame 220 in a matrix form to be able to move somewhat. Although the installation frame 220 is provided integrally, it includes an outer frame 221 and installation tables 222 as conceptually separated and illustrated in FIG. 6 .

The outer frame 221 forms an outer rim in the form of a square ring, and the present invention is characterized in this outer frame 221 . Accordingly, a detailed description of the outer frame 221 will be described in more detail later with reference to exaggerated and simplified drawings.

The mounting brackets 222 are vertically coupled to the outer frame 221 as an inner region of the outer frame 221 , and are provided to install the inserts 210 . That is, the inserts 210 are installed to be somewhat movable while being supported by the mounting brackets 222 by bolts or hooks formed on the mounting brackets 222 .

Next, the outer frame 221 will be further described with reference to the exaggerated and reduced drawings.

As shown in FIG. 7 , if the outer frame 221 is separated into detailed configurations, the outer frame 221 may be divided into a pair of grippers 221a and a pair of vertical bars 221b.

The pair of grippers (221a) form both sides facing each other in the form of a square ring, and are portions gripped by the gripping components of the handler. That is, as mentioned above, the handler has a number of configurations for moving the test tray 200 , changing the posture of the test tray 200 , or holding the test tray 200 when necessary. . A pair of gripping rails for gripping the test tray 200 in the area where electronic components are tested are also included in these general configurations.

8 shows a state in which the test tray 200 is gripped by a pair of gripping rails GR spaced apart from each other. Of course, since the gripping rail GR is coupled with the pressurizing device PA that presses the test tray 200 toward the tester TESTER, the test tray 200 is held by the gripping rail GR while the tester ( It is designed to advance or retreat toward the TESTER).

The pair of vertical bars 221b is perpendicular to the pair of grippers 221a and constitutes the other side of the outer frame 221, thereby completing a quadrangular ring shape. A retraction groove RG is formed in the rest of the vertical support 221b except for the portion connected to the gripper 221a. _{Therefore, the width (W 2} ) of the vertical bar (221b) in the region where the retraction groove (RG) is formed is narrower than _{the width (W 1} ; W ₂ < W ₁ ) of the gripper (221a). So, as referenced in FIG. 8, of course, the width W ₂ of the vertical bar 221b in the region where the retraction groove RG is formed is the gripping groove GG of the gripping rail GR for gripping the gripper 221a. narrower than the width of Of course, the width (W ₁ /W ₂ ) here refers to the width in the direction in which the test tray 200 advances or retreats toward the tester (TESTER). In addition, the evacuation groove RG is formed on the side of the surface F facing the tester TESTER. And it is preferable that the retraction groove (RG) is formed to be long in a direction perpendicular to the gripper (221a).

Subsequently, the function of the test tray 200 having the above configuration will be described.

8 shows, for example, a state in which the interface board IB having _{the test socket TS 1 having a pogo pin structure and the test tray 200 face each other.}

The test socket TS ₁ of FIG. 8 has a height protruding by _{H 1} from the surface (F, the surface facing the test tray) of the interface board IB. So, when the pressurizing device PA operates as shown in FIG. 9 , the electronic component D and the test socket TS ₁ are electrically connected without any interference while the test tray 200 advances toward the interface board IB. it is possible to be That is, due to the protruding height H _{1 of the test socket TS 1} , there is no reason for the face F of the interface board IB and the vertical bar 221b to interfere. In other words, since the virtual plane P including the surface F of the interface board IB does not interfere with the gripper 221a, it does not interfere with the vertical stand 221b.

Meanwhile, FIG. 10 shows, for example _{, the interface board IB having the test socket TS 2} having a PCR socket structure and the test tray 200 facing each other.

As can be seen from FIG. 10 , the test socket TS ₂ has a height protruding from the surface F of the interface board IB by H _{2 .} where H ₂ is less than _{H 1 .} So, as shown in FIG. 11, when the pressure device PA operates and the test tray 200 advances toward the interface board IB, the virtual plane P including the surface F of the interface board IB is It meets the gripper 221a. In the state of FIG. 11 , the test socket TS ₂ and the electronic component D are still spaced apart. Therefore, when the pressurizing device PA continues to operate and the test tray 200 advances further toward the interface board IB, the gripper 221a is a virtual device including the surface F of the interface board IB as shown in FIG. 12 . It crosses the plane (P) of However, even when the test socket TS ₂ and the electronic component D are connected due to the evacuation groove RG, the surface F of the interface board IB and the evacuation surface RF forming the evacuation groove RG do not interfere. won't Therefore, due to the retraction groove RG, the test socket TS ₂ and the electronic component D can be properly electrically connected without any interference.

And referring back to FIGS. 7 and 8 , in order to properly apply the above invention, the distance D ₁ between both grippers 221a should be wider than _{the first width B 1} of the interface board IB, _{The distance D 2} between the pair of vertical bars 221b should be narrower than _{the second width B 2} of the interface board IB. Here, the first width B ₁ means a width in a direction perpendicular to the gripper 221a, and the second width B ₂ means a width in a direction perpendicular to the vertical bar 221b. Of course, the length L of the retraction groove RG in the direction perpendicular to the gripper 221a should be longer than the length (first width) of the interface board IB. _{However, when the interval D 2} between the pair of vertical bars 221b _{is wider than the second width B 2} of the interface board IB, the meaning of forming the evacuation groove RG is faded. However, the description of the above embodiment has been made on the assumption that the electronic components D loaded on the test tray 200 are all _{electrically connected to the test sockets TS 1} and TS _{2 all at once.} Therefore, it seems that the importance of the present invention is fading, but consider the case of suppressing the size expansion of the handler as much as possible or electrically connecting the _{electronic components (D) loaded on the test tray 200 to the test socket (TS 2) in several steps} The importance of the present invention can be fully appreciated further.

In particular, in a general test site, it is necessary to reduce the number of _{test sockets TS 1} , TS _{2 according to the type of the electronic component D .} For example, if the number of terminals of the electronic component (D) to be newly tested increases, the contact points to be electrically connected to the _{test sockets (TS 1} , TS _{2 ) per electronic component (D) increase, the tester body} Since the transmission line for transmitting the electrical signal of and has already been established, it is necessary to reduce the number of _{test sockets (TS 1} , TS _{2 ).} In this case, all the electronic components D loaded on the test tray 200 cannot be electrically connected to the _{test sockets TS 1} and TS _{2 at once.} Therefore, the electronic components (D) must be electrically connected to the _{test sockets (TS 1} , TS _{2 ) over two or more times.} In this case, as an example, first, the electronic components (D) in odd rows _{are electrically connected to the test sockets (TS 1} , TS ₂ ) to conduct a test, and then, the test tray 200 is spaced between one row of the electronic components (D). The test is carried out by electrically connecting the electronic components (D) in the even rows to the test sockets (TS ₁ , TS _{2 ) by moving them as much as possible.} In this way, when the electronic components D are connected to the test sockets TS ₁ and TS _{2 through two or more steps, the distance D 2} between the two vertical bars 221b is wider than the second width B _{2 .} Even so, a case in which the vertical bar 221b faces the surface F of the interface board IB inevitably occurs. Even in this case, since the vertical stand 221b and the surface F of the interface board IB do not interfere due to the retraction groove RG, the test socket TS ₂ and the electronic component D may be properly electrically connected. .

A brief summary of the evacuation grooves (RG) by case is as follows.

1) When all electronic components are tested at once, the retraction groove (RG) may be unnecessary when _{B 2} < D _{2 .}

2) However, when testing is performed by dividing the electronic components D in one test tray 200 in several turns, a retraction groove RG may be required even when _{B 2} < D _{2 .}

3) In the case of B ₂ > D ₂ , if there is no space for the interface board (IB) to evacuate in any case, the connection between the electronic component (D) and the test socket (TS) is not possible, so the test cannot be performed. is essential to be provided.

According to the present invention as described above, since there is no change in the thickness of the gripper 221a, even if the protruding heights H ₁ , H _{2 of the test sockets TS 1} , TS ₂ change, all gripping components of the handler can be replaced. there will be no need That is, the retracted groove RG is the vertical stand 221 before the electronic component D _{is connected to the test socket TS 2} even if the protruding height H _{2 of the test socket TS 2 is lowered.} Since a change in the thickness of the gripper 221a is not required by preventing first contact with the surface F of the IF), the overall structure of the handler for gripping the gripper 221a can be used as it is. according to the test socket (TS _1, TS ₂₎ the height (H _1, H ₂₎ are different if even, different protruding heights (H _1, H ₂₎ the test socket with (TS _1, TS ₂₎ protrusion of the The existing handler and the test tray 200 according to the present invention can be used interchangeably as they are.

As described above, the detailed description of the present invention has been made by embodiments with reference to the accompanying drawings, but since the above-described embodiments have only been described with preferred examples of the present invention, the present invention is limited to the above embodiments only. It should not be construed as being limited, and the scope of the present invention should be understood as the following claims and their equivalents.

200: Test tray for handlers supporting testing of electronic components
210: insert
220: installation frame
221: outer frame
221a: gripper
221b: vertical bar
RG : Evacuation Home
222: mounting table

Claims (6)

inserts having seating grooves in which electronic components can be mounted; and
an installation frame in which the inserts are installed in a matrix form to be somewhat movable; including,
The installation frame is
an outer frame forming an outer border in the form of a square ring; and
Mounting stands vertically coupled to the outer frame as an inner region of the outer frame and provided to install the inserts; including,
The outer frame is
a pair of grippers respectively gripped by a pair of gripping rails GR spaced apart from each other in an area where electronic components are tested; and
the other pair of vertical bars that are perpendicular to the pair of grippers and complete the rectangular ring shape of the outer frame; includes,
The vertical bar is narrower than the width of the gripper in some parts in the direction toward the tester
Test tray for handlers that support testing of electronic components. According to claim 1,
The vertical bar has a evacuation groove formed in the rest of the area except for the area connected to the gripper,
The evacuation groove is formed on the side facing the tester.
Test tray for handlers that support testing of electronic components. 3. The method of claim 2,
The evacuation groove is formed elongated in a direction perpendicular to the gripper,
The length of the evacuation groove is longer than the length of the interface board of the tester.
Test tray for handlers that support testing of electronic components. 4. The method of claim 3,
The distance between the pair of grippers is wider than the first width of the interface board,
The distance between the pair of vertical bars is narrower than the second width of the interface board,
The first width refers to a width in a direction perpendicular to the gripper, and the second width refers to a width in a direction perpendicular to the vertical bar.
Test tray for handlers that support testing of electronic components. 4. The method of claim 3,
The distance between the pair of grippers is wider than the first width of the interface board,
The distance between the pair of vertical bars is wider than the second width of the interface board,
The number of the inserts is greater than the number of test sockets provided on the interface board and electrically connected to electronic components.
Test tray for handlers that support testing of electronic components. 3. The method of claim 2,
The evacuation groove prevents the vertical bar from first contacting the surface of the interface board before the electronic component is connected to the test socket, even if the protruding height of the test socket provided on the interface board is lowered, thereby holding the gripper. As it is possible to use the general structure of the handler for this purpose, it can be used interchangeably with test sockets with different heights.
Test tray for handlers that support testing of electronic components.

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