JPWO2007029558A1 - 成膜用材料及び成膜用材料の推定方法 - Google Patents
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Abstract
Description
V=(Ko/P)×e−Ea/kT
(但し、Koは定数(%・Torr)、Pは圧力(Torr)、Eaは活性化エネルギー(eV)、kはボルツマン定数、Tは絶対温度)であらわされる成膜用材料であって、前記定数Koの値と前記活性化エネルギーEaとの値によって特定されることを特徴とする成膜用材料が得られる。
V=(Ko/P)×e−Ea/kT
(但し、Koは定数(%・Torr)、Pは圧力(Torr)、Eaは活性化エネルギー(eV)、kはボルツマン定数、Tは絶対温度)中の活性化エネルギーEaをキャリアガス中の材料濃度の測定結果から得、更に、特定の温度における特定の材料濃度から、前記定数Koを算出し、算出された定数Koの値から未知の成膜用材料を推定することを特徴とする推定方法が得られる。
V=(Ko/P)×e−Ea/kT
(但し、Koは定数(%・Torr)、Pは圧力(Torr)、Eaは活性化エネルギー(eV)、kはボルツマン定数、Tは絶対温度)を満足するような活性化エネルギーEaおよび定数Koを有することを特徴とする成膜用材料が得られる。ここで、温度が250℃以上としたのは、材料の効率的な気化に必要な温度以上であることが要求されるからであり、500℃以下としたのは、それ以上の温度に耐えるガス供給・制御システムが存在しないためである。また、濃度を0.1%以上としたのは、それ以下では成膜が経済的に行えないためである。温度は、300℃乃至450℃とすることが好ましい。
V=(Ko/P)×e−Ea/kT (1)
(但し、Vは濃度(%)、Koは定数(%・Torr)、Pは圧力(Torr)、Eaは活性化エネルギー(eV)、kはボルツマン定数、Tは絶対温度)で表されると、判定する。
V=(Ko/P)×e−Ea/kT
(但し、Vは濃度(%)、Koは定数(%・Torr)、Pは圧力(Torr)、Eaは活性化エネルギー(eV)、kはボルツマン定数、Tは絶対温度)で表し、気化手段内の圧力を一定としたときの成膜用材料を気化する温度と濃度との関係から、上式のEaが同定され、Eaの値と気化手段内の圧力と濃度からKoを算出する。
V=(Ko/P)×e−Ea/kT
(但し、Vは濃度(%)、Koは定数(%・Torr)、Pは圧力(Torr)、Eaは活性化エネルギー(eV)、kはボルツマン定数、Tは絶対温度)
から定められる。
但し、Koは定数(%・Torr)、Pは圧力(Torr)、kはボルツマン定数(=8.617×10−5eV/K)、Eaは活性化エネルギー(eV)である。式(1)で表現されたH材料濃度は、図11から求められた式、即ち、y=6E+13e−21.965x、y=3E+13e−21.983x、及び、y=2E+13e−21.953x と等しい筈であるから、式(1)と図11から得られた式から、温度及びH材料濃度を与えることにより、定数Koを求めることができる。逆に、これらのパラメータEa、Koによって、H材料の蒸発特性を規定することができる。
Claims (12)
- 蒸発量V(%)が、
V=(Ko/P)×e−Ea/kT
(但し、Koは定数(%・Torr)、Pは圧力(Torr)、Eaは活性化エネルギー(eV)、kはボルツマン定数、Tは絶対温度)であらわされる成膜用材料であって、前記定数Koの値と前記活性化エネルギーEaとの値によって特定されることを特徴とする成膜用材料。 - 請求項1において、前記活性化エネルギーEaは、圧力Pを一定にした状態で、温度Tを変化させた場合におけるキャリアガス中の材料濃度をあらわす特性から得られ、且つ、前記定数Koは特定の温度における特定の材料濃度から決定されることを特徴とする成膜用材料。
- 請求項1又は2において、前記定数Koが5.700×1014 (%・Torr)〜6.220×1014(%・Torr)の範囲にあることを特徴とする成膜用材料。
- 請求項1又は2において、前記定数Koが2.600×1011 (%・Torr)〜3.640×1011(%・Torr)の範囲にあることを特徴とする成膜用材料。
- 未知の成膜用材料を推定する推定方法において、当該未知の材料の蒸発量V(%)をあらわす次式:
V=(Ko/P)×e−Ea/kT
(但し、Koは定数(%・Torr)、Pは圧力(Torr)、Eaは活性化エネルギー(eV)、kはボルツマン定数、Tは絶対温度)中の活性化エネルギーEaをキャリアガス中の材料濃度の測定結果から得、更に、特定の温度における特定の材料濃度から、前記定数Koを算出し、算出された定数Koの値から未知の成膜用材料を推定することを特徴とする推定方法。 - 温度を250℃乃至500℃とし、雰囲気中の濃度を0.1%乃至10%と、圧力を10のマイナス3乗Torr以上として、
蒸発量を雰囲気中の濃度V(%)であらわす次式:
V=(Ko/P)×e−Ea/kT
(但し、Koは定数(%・Torr)、Pは圧力(Torr)、Eaは活性化エネルギー(eV)、kはボルツマン定数、Tは絶対温度)を満足するような活性化エネルギーEaおよび定数Koを有することを特徴とする成膜用材料。 - 請求項6に記載された成膜用材料であって、温度を300℃乃至450℃としたことを特徴とする成膜用材料。
- 請求項6または7に記載された成膜用材料であって、気化しキャリアガスによって輸送することを特徴とする成膜用材料。
- 請求項6または7に記載された成膜用材料をキャリアガス中に0.1%乃至10%の濃度に蒸発させ、前記キャリアガスを基板近傍へ輸送して前記基板に前記成膜用材料の膜を形成することを特徴とする成膜方法。
- 気化手段内で気化してキャリアガスで基板近傍まで搬送し、前記基板上に成膜するための成膜用材料の解析方法であって、
前記成膜用材料を気化する温度を一定としたときの、前記気化手段内の圧力と前記キャリアガス内の前記成膜用材の濃度との関係を測定し、前記圧力の逆数をx、前記濃度をyとしたとき、xとyとが実質的に比例関係にあるかの第1の判定をし、
前記気化手段内の圧力を一定として、前記濃度と前記温度との関係を測定し、前記温度の逆数をx、前記濃度の対数をyとしたとき、x−y平面内の前記濃度と温度との関係を表すグラフの傾きが、前記圧力に依存せず実質的に一定であるかの第2の判定をし、
前記第1の判定、および前記第2の判定が共に肯定的であったとき、前記成膜用材料の前記キャリアガス内の濃度が次式:
V=(Ko/P)×e−Ea/kT
(但し、Vは濃度(%)、Koは定数(%・Torr)、Pは圧力(Torr)、Eaは活性化エネルギー(eV)、kはボルツマン定数、Tは絶対温度)で表されることに基づいて判定する解析方法。 - 気化手段内で気化してキャリアガスで基板近傍まで搬送し、前記基板上に成膜するための成膜用材料の解析方法であって、前記キャリアガス内の前記成膜用材料の濃度を次式:
V=(Ko/P)×e−Ea/kT
(但し、Vは濃度(%)、Koは定数(%・Torr)、Pは圧力(Torr)、Eaは活性化エネルギー(eV)、kはボルツマン定数、Tは絶対温度)で表したとき、
前記気化手段内の圧力を一定としたときの前記成膜用材料を気化する温度と前記濃度との関係から、前記式(1)のEaを同定し、当該Eaの値と前記気化手段内の圧力と前記濃度からKoを算出する解析方法。 - 気化手段内で成膜用材料を気化し、当該気化した成膜材料をキャリアガスで基板近傍まで搬送し、当該基板に成膜する成膜方法であって、
前記気化手段内の圧力をP、前記成膜用材料を気化するときの温度をT、前記キャリアガス内の前記成膜用材料の濃度をVとしたとき、P、T、Vのいずれか1つの値を、他の2つの値と、次式:
V=(Ko/P)×e−Ea/kT
(但し、Vは濃度(%)、Koは定数(%・Torr)、Pは圧力(Torr)、Eaは活性化エネルギー(eV)、kはボルツマン定数、Tは絶対温度)
に基づいて定めたことを特徴とする成膜方法。
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US (2) | US20090110823A1 (ja) |
EP (2) | EP2458029A1 (ja) |
JP (1) | JP5091678B2 (ja) |
KR (2) | KR20080041259A (ja) |
CN (1) | CN101258260B (ja) |
TW (1) | TWI415963B (ja) |
WO (1) | WO2007029558A1 (ja) |
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JP5620146B2 (ja) * | 2009-05-22 | 2014-11-05 | 三星ディスプレイ株式會社Samsung Display Co.,Ltd. | 薄膜蒸着装置 |
JP6026875B2 (ja) * | 2012-12-03 | 2016-11-16 | 日本エア・リキード株式会社 | 固体材料の気化量モニタリングシステムおよびモニタリング方法 |
US11220737B2 (en) | 2014-06-25 | 2022-01-11 | Universal Display Corporation | Systems and methods of modulating flow during vapor jet deposition of organic materials |
EP2960059B1 (en) | 2014-06-25 | 2018-10-24 | Universal Display Corporation | Systems and methods of modulating flow during vapor jet deposition of organic materials |
US11267012B2 (en) * | 2014-06-25 | 2022-03-08 | Universal Display Corporation | Spatial control of vapor condensation using convection |
US10566534B2 (en) | 2015-10-12 | 2020-02-18 | Universal Display Corporation | Apparatus and method to deliver organic material via organic vapor-jet printing (OVJP) |
US11088325B2 (en) | 2019-01-18 | 2021-08-10 | Universal Display Corporation | Organic vapor jet micro-print head with multiple gas distribution orifice plates |
DE102020122800A1 (de) * | 2020-09-01 | 2022-03-03 | Apeva Se | Vorrichtung zum Abscheiden von OLED-Schichten mit einer Run-/Vent-Leitung |
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JPH0793194B2 (ja) * | 1990-06-26 | 1995-10-09 | シャープ株式会社 | エレクトロルミネッセンス薄膜の製造方法 |
US6337102B1 (en) * | 1997-11-17 | 2002-01-08 | The Trustees Of Princeton University | Low pressure vapor phase deposition of organic thin films |
EP0935284A1 (en) | 1998-01-29 | 1999-08-11 | Chul-Ju Hwang | CVD of silicon containing film using Si2H6 |
CN1226079A (zh) * | 1998-02-12 | 1999-08-18 | 黄喆周 | 半导体器件成膜方法 |
KR100315123B1 (ko) * | 2000-01-10 | 2001-11-29 | 김순택 | 전자빔 장치용 음극 물질 |
DE10007059A1 (de) * | 2000-02-16 | 2001-08-23 | Aixtron Ag | Verfahren und Vorrichtung zur Herstellung von beschichteten Substraten mittels Kondensationsbeschichtung |
JP3783099B2 (ja) | 2000-05-16 | 2006-06-07 | 株式会社豊田中央研究所 | 有機電界発光素子 |
JP4239520B2 (ja) | 2002-08-21 | 2009-03-18 | ソニー株式会社 | 成膜装置およびその製造方法、並びにインジェクタ |
JP2005060767A (ja) | 2003-08-12 | 2005-03-10 | Sony Corp | 薄膜形成装置 |
JP2005110760A (ja) | 2003-10-03 | 2005-04-28 | Mitsubishi Electric Corp | 抗酸化剤放出装置および抗酸化剤放出方法 |
JP4911555B2 (ja) | 2005-04-07 | 2012-04-04 | 国立大学法人東北大学 | 成膜装置および成膜方法 |
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2006
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- 2006-08-29 EP EP12153972A patent/EP2458029A1/en not_active Withdrawn
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WO2007029558A1 (ja) | 2007-03-15 |
EP1930465A1 (en) | 2008-06-11 |
US20130189423A1 (en) | 2013-07-25 |
JP5091678B2 (ja) | 2012-12-05 |
EP1930465A4 (en) | 2010-04-07 |
KR20080041259A (ko) | 2008-05-09 |
CN101258260B (zh) | 2012-11-21 |
CN101258260A (zh) | 2008-09-03 |
TW200722549A (en) | 2007-06-16 |
US8679369B2 (en) | 2014-03-25 |
US20090110823A1 (en) | 2009-04-30 |
KR101431415B1 (ko) | 2014-08-18 |
EP2458029A1 (en) | 2012-05-30 |
TWI415963B (zh) | 2013-11-21 |
KR20130126754A (ko) | 2013-11-20 |
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