JPS649415A - Production of thin ferroelectric film element - Google Patents

Production of thin ferroelectric film element

Info

Publication number
JPS649415A
JPS649415A JP16454387A JP16454387A JPS649415A JP S649415 A JPS649415 A JP S649415A JP 16454387 A JP16454387 A JP 16454387A JP 16454387 A JP16454387 A JP 16454387A JP S649415 A JPS649415 A JP S649415A
Authority
JP
Japan
Prior art keywords
etching
phosphoric acid
film
substrate
diluting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16454387A
Other languages
Japanese (ja)
Inventor
Yoshihiro Tomita
Ryoichi Takayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP16454387A priority Critical patent/JPS649415A/en
Publication of JPS649415A publication Critical patent/JPS649415A/en
Pending legal-status Critical Current

Links

Landscapes

  • Inorganic Insulating Materials (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Radiation Pyrometers (AREA)

Abstract

PURPOSE:To enable uniform and rapid etching by diluting phosphoric acid with water and using such phosphoric acid in a stage for forming a diaphragm structure by removing a part of an MgO substrate by chemical etching with the phosphoric acid. CONSTITUTION:A thin ferroelectric film 2 is formed on the 100 face of the substrate 1 consisting of the MgO single crystal. An upper electrode 3 is then formed on the film 2. The part of the substrate corresponding to the part under a photodetecting part is removed by the hot phosphoric acid and thereafter, a photodetecting electrode 5 is formed on the rear face of the film 2. The etching is executed by diluting the phosphoric acid with water at the time of the etching of the substrate 1. The concd. phosphoric acid has a high viscosity and dissolved Mg ions are hardly diffusible therein so that the rate of the etching depends strongly on the flow rate of the liquid. Whereas, the viscosity decreases and the increased diffusion rate and the increased etching speed are obtd. if the etching is executed by diluting the phosphoric acid with water. The dependency of the speed on the flow rate is then decreased. As a result, the etching is uniformized and is progressed at a high speed. The dissolution and crack of the film 2 are thus prevented.
JP16454387A 1987-07-01 1987-07-01 Production of thin ferroelectric film element Pending JPS649415A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16454387A JPS649415A (en) 1987-07-01 1987-07-01 Production of thin ferroelectric film element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16454387A JPS649415A (en) 1987-07-01 1987-07-01 Production of thin ferroelectric film element

Publications (1)

Publication Number Publication Date
JPS649415A true JPS649415A (en) 1989-01-12

Family

ID=15795155

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16454387A Pending JPS649415A (en) 1987-07-01 1987-07-01 Production of thin ferroelectric film element

Country Status (1)

Country Link
JP (1) JPS649415A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61250226A (en) * 1985-04-30 1986-11-07 Nippon Kiso Gijutsu Kk Anchor and removal of stressing material from anchor
US5198158A (en) * 1990-11-23 1993-03-30 Gec-Marconi Limited Method of manufacturing free standing perovskite lead scandium tantalate film
JP2002217468A (en) * 2001-01-15 2002-08-02 Matsushita Electric Ind Co Ltd Method for manufacturing electronic component

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6230695A (en) * 1985-08-02 1987-02-09 Matsushita Electric Ind Co Ltd Dielectric thin film element and production thereof

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6230695A (en) * 1985-08-02 1987-02-09 Matsushita Electric Ind Co Ltd Dielectric thin film element and production thereof

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61250226A (en) * 1985-04-30 1986-11-07 Nippon Kiso Gijutsu Kk Anchor and removal of stressing material from anchor
US5198158A (en) * 1990-11-23 1993-03-30 Gec-Marconi Limited Method of manufacturing free standing perovskite lead scandium tantalate film
JP2002217468A (en) * 2001-01-15 2002-08-02 Matsushita Electric Ind Co Ltd Method for manufacturing electronic component

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