JPS6486023A - Highly repeated laser light measuring apparatus - Google Patents

Highly repeated laser light measuring apparatus

Info

Publication number
JPS6486023A
JPS6486023A JP24449987A JP24449987A JPS6486023A JP S6486023 A JPS6486023 A JP S6486023A JP 24449987 A JP24449987 A JP 24449987A JP 24449987 A JP24449987 A JP 24449987A JP S6486023 A JPS6486023 A JP S6486023A
Authority
JP
Japan
Prior art keywords
laser light
measured
measuring apparatus
light measuring
sweeping
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP24449987A
Other languages
Japanese (ja)
Other versions
JPH083442B2 (en
Inventor
Shinichiro Aoshima
Yutaka Tsuchiya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Priority to JP24449987A priority Critical patent/JPH083442B2/en
Publication of JPS6486023A publication Critical patent/JPS6486023A/en
Publication of JPH083442B2 publication Critical patent/JPH083442B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

PURPOSE:To achieve an accurate measurement free from effect of changes in the intensity of a laser light, by sweeping one axis of a double sweep streak camera at the same frequency as the repeated frequency of a laser light to be measured and by a stationary high frequency signal independent of the laser light being measured. CONSTITUTION:A sweep signal for controlling a deflection electrode of a double sweep streak pipe 1 is provided to a separate high frequency generator 14 independent of a laser light to be measured and a deflection electrode 6 is controlled by an output thereof 14 to perform a sweeping. This enables observation of variations in a repeated frequency of the laser light itself while permitting accurate measurement of a jitter free from effect of changes in the intensity of the laser light.
JP24449987A 1987-09-29 1987-09-29 High repeatability laser light measuring device Expired - Fee Related JPH083442B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24449987A JPH083442B2 (en) 1987-09-29 1987-09-29 High repeatability laser light measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24449987A JPH083442B2 (en) 1987-09-29 1987-09-29 High repeatability laser light measuring device

Publications (2)

Publication Number Publication Date
JPS6486023A true JPS6486023A (en) 1989-03-30
JPH083442B2 JPH083442B2 (en) 1996-01-17

Family

ID=17119578

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24449987A Expired - Fee Related JPH083442B2 (en) 1987-09-29 1987-09-29 High repeatability laser light measuring device

Country Status (1)

Country Link
JP (1) JPH083442B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04262213A (en) * 1990-05-18 1992-09-17 Sony Tektronix Corp Optical sampling system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04262213A (en) * 1990-05-18 1992-09-17 Sony Tektronix Corp Optical sampling system

Also Published As

Publication number Publication date
JPH083442B2 (en) 1996-01-17

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees