JPS648600A - Testing device for integrated storage circuit - Google Patents

Testing device for integrated storage circuit

Info

Publication number
JPS648600A
JPS648600A JP62164239A JP16423987A JPS648600A JP S648600 A JPS648600 A JP S648600A JP 62164239 A JP62164239 A JP 62164239A JP 16423987 A JP16423987 A JP 16423987A JP S648600 A JPS648600 A JP S648600A
Authority
JP
Japan
Prior art keywords
information
test
memory array
inspection
storage circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62164239A
Other languages
English (en)
Inventor
Makoto Urabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP62164239A priority Critical patent/JPS648600A/ja
Publication of JPS648600A publication Critical patent/JPS648600A/ja
Pending legal-status Critical Current

Links

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP62164239A 1987-06-30 1987-06-30 Testing device for integrated storage circuit Pending JPS648600A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62164239A JPS648600A (en) 1987-06-30 1987-06-30 Testing device for integrated storage circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62164239A JPS648600A (en) 1987-06-30 1987-06-30 Testing device for integrated storage circuit

Publications (1)

Publication Number Publication Date
JPS648600A true JPS648600A (en) 1989-01-12

Family

ID=15789314

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62164239A Pending JPS648600A (en) 1987-06-30 1987-06-30 Testing device for integrated storage circuit

Country Status (1)

Country Link
JP (1) JPS648600A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2006040900A1 (ja) * 2004-10-14 2008-05-15 株式会社アドバンテスト 試験装置及び試験方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2006040900A1 (ja) * 2004-10-14 2008-05-15 株式会社アドバンテスト 試験装置及び試験方法
JP4585520B2 (ja) * 2004-10-14 2010-11-24 株式会社アドバンテスト 試験装置及び試験方法
US7930614B2 (en) 2004-10-14 2011-04-19 Advantest Corporation Test apparatus and test method

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