JPS648600A - Testing device for integrated storage circuit - Google Patents
Testing device for integrated storage circuitInfo
- Publication number
- JPS648600A JPS648600A JP62164239A JP16423987A JPS648600A JP S648600 A JPS648600 A JP S648600A JP 62164239 A JP62164239 A JP 62164239A JP 16423987 A JP16423987 A JP 16423987A JP S648600 A JPS648600 A JP S648600A
- Authority
- JP
- Japan
- Prior art keywords
- information
- test
- memory array
- inspection
- storage circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Techniques For Improving Reliability Of Storages (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62164239A JPS648600A (en) | 1987-06-30 | 1987-06-30 | Testing device for integrated storage circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62164239A JPS648600A (en) | 1987-06-30 | 1987-06-30 | Testing device for integrated storage circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS648600A true JPS648600A (en) | 1989-01-12 |
Family
ID=15789314
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62164239A Pending JPS648600A (en) | 1987-06-30 | 1987-06-30 | Testing device for integrated storage circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS648600A (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPWO2006040900A1 (ja) * | 2004-10-14 | 2008-05-15 | 株式会社アドバンテスト | 試験装置及び試験方法 |
-
1987
- 1987-06-30 JP JP62164239A patent/JPS648600A/ja active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPWO2006040900A1 (ja) * | 2004-10-14 | 2008-05-15 | 株式会社アドバンテスト | 試験装置及び試験方法 |
JP4585520B2 (ja) * | 2004-10-14 | 2010-11-24 | 株式会社アドバンテスト | 試験装置及び試験方法 |
US7930614B2 (en) | 2004-10-14 | 2011-04-19 | Advantest Corporation | Test apparatus and test method |
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