JPS64766A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS64766A
JPS64766A JP6916988A JP6916988A JPS64766A JP S64766 A JPS64766 A JP S64766A JP 6916988 A JP6916988 A JP 6916988A JP 6916988 A JP6916988 A JP 6916988A JP S64766 A JPS64766 A JP S64766A
Authority
JP
Japan
Prior art keywords
hydrogen
fluorine
gas
concentration
polycrystalline silicon
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6916988A
Other languages
Japanese (ja)
Other versions
JPH01766A (en
Inventor
Shigeru Shirai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP6916988A priority Critical patent/JPS64766A/en
Publication of JPH01766A publication Critical patent/JPH01766A/en
Publication of JPS64766A publication Critical patent/JPS64766A/en
Pending legal-status Critical Current

Links

Landscapes

  • Thin Film Transistor (AREA)

Abstract

PURPOSE: To provide sufficient electric characteristics and adhesion, by providing a semiconductor layer comprising polycrystalline silicon on a substrate, including hydrogen and fluorine in the vicinity of the grain boundary of the polycrystalline silicon, and distributing either of the concentration of the hydrogen or the concentration of the fluorine in the direction of the thickness of the semiconductor layer.
CONSTITUTION: Hydrogen and fluorine are included in a semiconductor at the same time. The concentration of the hydrogen is distributed in the direction of a layer. As the method for including the hydrogen and the fluorine in the vicinity of the grain boundary of a polycrystalline thin film, heat treatment is performed in a plasma atmosphere of a gas, whose main component is the hydrogen or the fluorine, after the formation of the polycrystalline silicon thin film. Namely, plasma is yielded at substrate temperature of 100∼500°C, gas pressure of 10-5Torr∼10Torr, high frequency power of 10-3∼10-2W/m2 and high frequency of 5∼50GHz. At this time, the hydrogen and the fluorine are mainly used as the gas. Inactive gas such as Ar, He, Ne and the like can be added.
COPYRIGHT: (C)1989,JPO&Japio
JP6916988A 1987-03-23 1988-03-23 Semiconductor device Pending JPS64766A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6916988A JPS64766A (en) 1987-03-23 1988-03-23 Semiconductor device

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP62-68305 1987-03-23
JP6830587 1987-03-23
JP62-69776 1987-03-24
JP6916988A JPS64766A (en) 1987-03-23 1988-03-23 Semiconductor device

Publications (2)

Publication Number Publication Date
JPH01766A JPH01766A (en) 1989-01-05
JPS64766A true JPS64766A (en) 1989-01-05

Family

ID=26409522

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6916988A Pending JPS64766A (en) 1987-03-23 1988-03-23 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS64766A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4992839A (en) * 1987-03-23 1991-02-12 Canon Kabushiki Kaisha Field effect thin film transistor having a semiconductor layer formed from a polycrystal silicon film containing hydrogen atom and halogen atom and process for the preparation of the same
US7946592B2 (en) 2004-11-02 2011-05-24 Komatsu Corporation Bearing seal
JP2012019146A (en) * 2010-07-09 2012-01-26 Sony Corp Imaging device, display image device and electronic equipment

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4992839A (en) * 1987-03-23 1991-02-12 Canon Kabushiki Kaisha Field effect thin film transistor having a semiconductor layer formed from a polycrystal silicon film containing hydrogen atom and halogen atom and process for the preparation of the same
US7946592B2 (en) 2004-11-02 2011-05-24 Komatsu Corporation Bearing seal
JP2012019146A (en) * 2010-07-09 2012-01-26 Sony Corp Imaging device, display image device and electronic equipment

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