JPS6461653A - Method and device for detecting crack of translucent body - Google Patents

Method and device for detecting crack of translucent body

Info

Publication number
JPS6461653A
JPS6461653A JP21638487A JP21638487A JPS6461653A JP S6461653 A JPS6461653 A JP S6461653A JP 21638487 A JP21638487 A JP 21638487A JP 21638487 A JP21638487 A JP 21638487A JP S6461653 A JPS6461653 A JP S6461653A
Authority
JP
Japan
Prior art keywords
light
translucent body
fiber
photoelectric converting
detecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP21638487A
Other languages
English (en)
Inventor
Yoshikazu Miura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to JP21638487A priority Critical patent/JPS6461653A/ja
Publication of JPS6461653A publication Critical patent/JPS6461653A/ja
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP21638487A 1987-09-01 1987-09-01 Method and device for detecting crack of translucent body Pending JPS6461653A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21638487A JPS6461653A (en) 1987-09-01 1987-09-01 Method and device for detecting crack of translucent body

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21638487A JPS6461653A (en) 1987-09-01 1987-09-01 Method and device for detecting crack of translucent body

Publications (1)

Publication Number Publication Date
JPS6461653A true JPS6461653A (en) 1989-03-08

Family

ID=16687723

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21638487A Pending JPS6461653A (en) 1987-09-01 1987-09-01 Method and device for detecting crack of translucent body

Country Status (1)

Country Link
JP (1) JPS6461653A (ja)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02108951A (ja) * 1988-10-19 1990-04-20 Nok Corp アルコール混合率検出装置
JPH0416751A (ja) * 1990-05-11 1992-01-21 Advantest Corp セラミック検査方法
US6417879B2 (en) 1997-09-26 2002-07-09 Sumitomo Heavy Industries, Ltd. Method for making marks in a transparent material by using a laser
JP2005301065A (ja) * 2004-04-14 2005-10-27 Olympus Corp 観察装置
JP2009516841A (ja) * 2005-11-22 2009-04-23 ビーピー ケミカルズ リミテッド スペクトロスコピー分析のための方法および装置
JP2012037424A (ja) * 2010-08-09 2012-02-23 Tsubaki Nakashima Co Ltd セラミック球体検査装置
US8563902B2 (en) 2007-06-27 2013-10-22 Toyota Jidosha Kabushiki Kaisha Heater control device and method for exhaust gas sensor
US9316599B2 (en) 2010-01-07 2016-04-19 Nikkato Corporation Device for inspecting ceramic sphere

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5925972A (ja) * 1982-08-02 1984-02-10 Sumitomo Electric Ind Ltd 被覆硬質部材

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5925972A (ja) * 1982-08-02 1984-02-10 Sumitomo Electric Ind Ltd 被覆硬質部材

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02108951A (ja) * 1988-10-19 1990-04-20 Nok Corp アルコール混合率検出装置
JPH0416751A (ja) * 1990-05-11 1992-01-21 Advantest Corp セラミック検査方法
US6417879B2 (en) 1997-09-26 2002-07-09 Sumitomo Heavy Industries, Ltd. Method for making marks in a transparent material by using a laser
US6501499B2 (en) * 1997-09-26 2002-12-31 Sumitomo Heavy Industries, Ltd. Method for making marks in a transparent material by using a laser
US6587136B2 (en) 1997-09-26 2003-07-01 Sumitomo Heavy Industries Ltd. Method for making marks in a transparent material by using a laser
JP2005301065A (ja) * 2004-04-14 2005-10-27 Olympus Corp 観察装置
JP2009516841A (ja) * 2005-11-22 2009-04-23 ビーピー ケミカルズ リミテッド スペクトロスコピー分析のための方法および装置
US8563902B2 (en) 2007-06-27 2013-10-22 Toyota Jidosha Kabushiki Kaisha Heater control device and method for exhaust gas sensor
US9316599B2 (en) 2010-01-07 2016-04-19 Nikkato Corporation Device for inspecting ceramic sphere
JP2012037424A (ja) * 2010-08-09 2012-02-23 Tsubaki Nakashima Co Ltd セラミック球体検査装置

Similar Documents

Publication Publication Date Title
JPS5616802A (en) Method and unit for measuring electro-optically dimension,position and form of object
EP0296871A3 (en) Tunnelling scanning microscope
CA1220559A (en) Noncontact dynamic tester for integrated circuits
EP0350874A3 (en) Surface analysis method and apparatus
JPS6461653A (en) Method and device for detecting crack of translucent body
JPS6453418A (en) Wafer aligning system
JPS54114173A (en) Electronic probe device
JPS5355983A (en) Automatic micro defect detector
JPS5764153A (en) Bottle inspecting device
TW366439B (en) Glass substrate for an electron device, photomask blank and photomask using the same
JPS564004A (en) System for detecting minute defects of body
JPS6242537Y2 (ja)
JPS54148483A (en) Automatic detecting method for reference mark of exposure
JPS5614933A (en) Sample inspecting device
JPS567429A (en) Patterning device
JPS5794903A (en) Defect detector for disk surface
JPS5780730A (en) Semiconductor observing device
JPS55108937A (en) Optical recording and reproducing device
JPS566146A (en) Detector for defective pellet
JPS61207583A (ja) エツチングの終点検出方法
JPS5748638A (en) Processing method for data of laser nephelometer
JPS57128925A (en) Inspection for defect of reticle
JPS5485793A (en) Inspecting method of photo masks
JPS6449948A (en) Spectral device for fine area
Harvey et al. A study of techniques applicable to the automated assessment of alpha and proton-induced etch pits