JPS6453463A - Semiconductor nonvolatile storage element - Google Patents

Semiconductor nonvolatile storage element

Info

Publication number
JPS6453463A
JPS6453463A JP62210000A JP21000087A JPS6453463A JP S6453463 A JPS6453463 A JP S6453463A JP 62210000 A JP62210000 A JP 62210000A JP 21000087 A JP21000087 A JP 21000087A JP S6453463 A JPS6453463 A JP S6453463A
Authority
JP
Japan
Prior art keywords
gate
insulating film
substrate
trench
oxide film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62210000A
Other languages
Japanese (ja)
Inventor
Takashi Ono
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Priority to JP62210000A priority Critical patent/JPS6453463A/en
Publication of JPS6453463A publication Critical patent/JPS6453463A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B69/00Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices

Abstract

PURPOSE:To obtain a storage element sufficient in a write-in data property without increasing a cell area by a method wherein a trench provided to a substrate is utilized not only as an element isolation region but also as a region which increases capacitance between a control gate and a floating gate. CONSTITUTION:An insulating film 120, which is thicker than a gate insulating film 108, is formed on a wall face 118 of a trench 116 provided to a substrate 100 as a field oxide film, connecting with the gate insulating film 108. And, a floating gate electrode 110, an inter-electrode insulating film 112, and a control gate 114 are formed on the insulating film 120 of the sidewall of the trench 116, being extended from their own part on a channel region 106. In such an EPROM cell structure, a channel current flows through the substrate 100 under the gate oxide film 108. Channel hot electrons generated during the write-in of data are injected into the floating gate 110 passing through the gate oxide film 108.
JP62210000A 1987-08-24 1987-08-24 Semiconductor nonvolatile storage element Pending JPS6453463A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62210000A JPS6453463A (en) 1987-08-24 1987-08-24 Semiconductor nonvolatile storage element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62210000A JPS6453463A (en) 1987-08-24 1987-08-24 Semiconductor nonvolatile storage element

Publications (1)

Publication Number Publication Date
JPS6453463A true JPS6453463A (en) 1989-03-01

Family

ID=16582195

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62210000A Pending JPS6453463A (en) 1987-08-24 1987-08-24 Semiconductor nonvolatile storage element

Country Status (1)

Country Link
JP (1) JPS6453463A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5306941A (en) * 1991-10-09 1994-04-26 Ricoh Company, Ltd. Semiconductor memory device and production process thereof
US6417048B1 (en) * 2001-11-19 2002-07-09 Vanguard International Semiconductor Corporation Method for fabricating flash memory with recessed floating gates

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5306941A (en) * 1991-10-09 1994-04-26 Ricoh Company, Ltd. Semiconductor memory device and production process thereof
US6417048B1 (en) * 2001-11-19 2002-07-09 Vanguard International Semiconductor Corporation Method for fabricating flash memory with recessed floating gates

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