JPS6453463A - Semiconductor nonvolatile storage element - Google Patents
Semiconductor nonvolatile storage elementInfo
- Publication number
- JPS6453463A JPS6453463A JP62210000A JP21000087A JPS6453463A JP S6453463 A JPS6453463 A JP S6453463A JP 62210000 A JP62210000 A JP 62210000A JP 21000087 A JP21000087 A JP 21000087A JP S6453463 A JPS6453463 A JP S6453463A
- Authority
- JP
- Japan
- Prior art keywords
- gate
- insulating film
- substrate
- trench
- oxide film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B69/00—Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices
Abstract
PURPOSE:To obtain a storage element sufficient in a write-in data property without increasing a cell area by a method wherein a trench provided to a substrate is utilized not only as an element isolation region but also as a region which increases capacitance between a control gate and a floating gate. CONSTITUTION:An insulating film 120, which is thicker than a gate insulating film 108, is formed on a wall face 118 of a trench 116 provided to a substrate 100 as a field oxide film, connecting with the gate insulating film 108. And, a floating gate electrode 110, an inter-electrode insulating film 112, and a control gate 114 are formed on the insulating film 120 of the sidewall of the trench 116, being extended from their own part on a channel region 106. In such an EPROM cell structure, a channel current flows through the substrate 100 under the gate oxide film 108. Channel hot electrons generated during the write-in of data are injected into the floating gate 110 passing through the gate oxide film 108.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62210000A JPS6453463A (en) | 1987-08-24 | 1987-08-24 | Semiconductor nonvolatile storage element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62210000A JPS6453463A (en) | 1987-08-24 | 1987-08-24 | Semiconductor nonvolatile storage element |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6453463A true JPS6453463A (en) | 1989-03-01 |
Family
ID=16582195
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62210000A Pending JPS6453463A (en) | 1987-08-24 | 1987-08-24 | Semiconductor nonvolatile storage element |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6453463A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5306941A (en) * | 1991-10-09 | 1994-04-26 | Ricoh Company, Ltd. | Semiconductor memory device and production process thereof |
US6417048B1 (en) * | 2001-11-19 | 2002-07-09 | Vanguard International Semiconductor Corporation | Method for fabricating flash memory with recessed floating gates |
-
1987
- 1987-08-24 JP JP62210000A patent/JPS6453463A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5306941A (en) * | 1991-10-09 | 1994-04-26 | Ricoh Company, Ltd. | Semiconductor memory device and production process thereof |
US6417048B1 (en) * | 2001-11-19 | 2002-07-09 | Vanguard International Semiconductor Corporation | Method for fabricating flash memory with recessed floating gates |
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