JPS6450531A - Formation of fine pattern - Google Patents

Formation of fine pattern

Info

Publication number
JPS6450531A
JPS6450531A JP20872687A JP20872687A JPS6450531A JP S6450531 A JPS6450531 A JP S6450531A JP 20872687 A JP20872687 A JP 20872687A JP 20872687 A JP20872687 A JP 20872687A JP S6450531 A JPS6450531 A JP S6450531A
Authority
JP
Japan
Prior art keywords
film
solid phase
pattern
phase film
underlying structure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20872687A
Other languages
Japanese (ja)
Inventor
Hiroshi Matsumoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP20872687A priority Critical patent/JPS6450531A/en
Publication of JPS6450531A publication Critical patent/JPS6450531A/en
Pending legal-status Critical Current

Links

Landscapes

  • Electrodes Of Semiconductors (AREA)
  • Drying Of Semiconductors (AREA)
  • Weting (AREA)

Abstract

PURPOSE:To enable patterns smaller, than a minimum pattern size determined by essential characteristics of a used exposure technique to be formed as transfer patterns collectively and stably, by depositing and patterning a solid phase film whose volume expands by modification, and modifying the side faces of the pattern of the solid phase film before transferring the pattern on an underlying structure. CONSTITUTION:A solid phase film 6 is deposited on an underlying structure 1. The solid phase film 6 is such that when it is subjected to a certain modifying process, its modification progresses from the surface while causing expansion in volume. The solid phase film 6 is then patterned by a lithography process followed by an etching process. Then, the side faces of the solid phase film patterns are modified by said modifying process and the pattern in the solid phase film 6 is transferred to the underlying structure 1 by the subsequent etching process. According to an emobodiment, a polysilicon film 6 is formed on the underlying structure 1 through a CVD oxide film 5, and a nitride film 7 is formed thereon. After a blank pattern is formed in the films 6 and 7, a thermally oxidized film 9 is deposited on the side faces of the film 6. The blank pattern reduced in size by the oxide film 9 is then transferred on the CVD oxide film 5.
JP20872687A 1987-08-21 1987-08-21 Formation of fine pattern Pending JPS6450531A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20872687A JPS6450531A (en) 1987-08-21 1987-08-21 Formation of fine pattern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20872687A JPS6450531A (en) 1987-08-21 1987-08-21 Formation of fine pattern

Publications (1)

Publication Number Publication Date
JPS6450531A true JPS6450531A (en) 1989-02-27

Family

ID=16561065

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20872687A Pending JPS6450531A (en) 1987-08-21 1987-08-21 Formation of fine pattern

Country Status (1)

Country Link
JP (1) JPS6450531A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008053706A (en) * 2006-08-24 2008-03-06 Dongbu Hitek Co Ltd Semiconductor device and method for manufacturing it
JP2010106519A (en) * 2008-10-30 2010-05-13 Otis:Kk Rain chain
JP2016171355A (en) * 2010-02-26 2016-09-23 株式会社半導体エネルギー研究所 Manufacturing method for semiconductor device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61285725A (en) * 1985-06-13 1986-12-16 Oki Electric Ind Co Ltd Formation of fine pattern

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61285725A (en) * 1985-06-13 1986-12-16 Oki Electric Ind Co Ltd Formation of fine pattern

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008053706A (en) * 2006-08-24 2008-03-06 Dongbu Hitek Co Ltd Semiconductor device and method for manufacturing it
JP2010106519A (en) * 2008-10-30 2010-05-13 Otis:Kk Rain chain
JP2016171355A (en) * 2010-02-26 2016-09-23 株式会社半導体エネルギー研究所 Manufacturing method for semiconductor device

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