JPS6442824A - Wet etching - Google Patents

Wet etching

Info

Publication number
JPS6442824A
JPS6442824A JP20014887A JP20014887A JPS6442824A JP S6442824 A JPS6442824 A JP S6442824A JP 20014887 A JP20014887 A JP 20014887A JP 20014887 A JP20014887 A JP 20014887A JP S6442824 A JPS6442824 A JP S6442824A
Authority
JP
Japan
Prior art keywords
water solution
surface active
potassium hydroxide
active agent
concentration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20014887A
Other languages
Japanese (ja)
Inventor
Fumihiro Oshima
Tsutomu Nonaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KYUSHU ELECTRON METAL
KYUSHU ELECTRON METAL CO Ltd
Osaka Titanium Co Ltd
Original Assignee
KYUSHU ELECTRON METAL
KYUSHU ELECTRON METAL CO Ltd
Osaka Titanium Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by KYUSHU ELECTRON METAL, KYUSHU ELECTRON METAL CO Ltd, Osaka Titanium Co Ltd filed Critical KYUSHU ELECTRON METAL
Priority to JP20014887A priority Critical patent/JPS6442824A/en
Publication of JPS6442824A publication Critical patent/JPS6442824A/en
Pending legal-status Critical Current

Links

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  • Weting (AREA)

Abstract

PURPOSE:To obtain a silicon single crystal substrate without surface stains (attached foreign matters) free from fine wear over the surface thereof by using as a chemical solution a mixture of a certain water solution with an anionic surface active agent. CONSTITUTION:A mixture of a water solution containing more than 30wt.% of potassium hydroxide with an anionic surface active agent is used as a chemical solution. If the content of potassium hydroxide is less than 30wt.%, the etching effect thereof is small. If the concentration of the water solution is increased, a substance generated from the reaction between the potassium hydroxide water solution and a silicon single crystal is increased, thereby causing stains to adhere to the surface of the silicon. In order to remove the stains while increasing the concentration of the potassium hydroxide, a surface active agent is used. In a water solution where the concentration of alkali is high, however, many surface active agents cause a salting out, from which a poor stain removing effect results. In this case, an anionic surface active agent, which is free from such defect, is used. According to the constitution, a beautiful etching surface can be obtained.
JP20014887A 1987-08-11 1987-08-11 Wet etching Pending JPS6442824A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20014887A JPS6442824A (en) 1987-08-11 1987-08-11 Wet etching

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20014887A JPS6442824A (en) 1987-08-11 1987-08-11 Wet etching

Publications (1)

Publication Number Publication Date
JPS6442824A true JPS6442824A (en) 1989-02-15

Family

ID=16419588

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20014887A Pending JPS6442824A (en) 1987-08-11 1987-08-11 Wet etching

Country Status (1)

Country Link
JP (1) JPS6442824A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5972236A (en) * 1996-08-12 1999-10-26 Denso Corporation Etchant, etching method using the same, and related etching apparatus
WO2006046601A1 (en) * 2004-10-28 2006-05-04 Mimasu Semiconductor Industry Co., Ltd. Process for producing semiconductor substrate, semiconductor substrate for solar application and etching solution
WO2011145604A1 (en) * 2010-05-18 2011-11-24 株式会社新菱 Etching solution, and method for processing surface of silicon substrate
WO2012023613A1 (en) * 2010-08-20 2012-02-23 株式会社トクヤマ Texture-forming composition, method for producing silicon substrate, and kit for preparing texture-forming composition
WO2013168813A1 (en) 2012-05-11 2013-11-14 和光純薬工業株式会社 Etching fluid and production method for silicon-based substrate using same
US10249505B2 (en) * 2009-03-31 2019-04-02 Kurita Water Industries Ltd. Method for treating etching solution
CN111485290A (en) * 2020-05-14 2020-08-04 杭州聚力氢能科技有限公司 Texturing additive for single crystal silicon surface treatment, texturing agent and method for texturing single crystal silicon surface

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5972236A (en) * 1996-08-12 1999-10-26 Denso Corporation Etchant, etching method using the same, and related etching apparatus
WO2006046601A1 (en) * 2004-10-28 2006-05-04 Mimasu Semiconductor Industry Co., Ltd. Process for producing semiconductor substrate, semiconductor substrate for solar application and etching solution
US10249505B2 (en) * 2009-03-31 2019-04-02 Kurita Water Industries Ltd. Method for treating etching solution
WO2011145604A1 (en) * 2010-05-18 2011-11-24 株式会社新菱 Etching solution, and method for processing surface of silicon substrate
JP2012004528A (en) * 2010-05-18 2012-01-05 Shinryo Corp Etchant, and surface processing method of silicon substrate
CN102906863A (en) * 2010-05-18 2013-01-30 株式会社新菱 Etching solution, and method for processing surface of silicon substrate
KR101407988B1 (en) * 2010-05-18 2014-06-18 가부시키가이샤 신료 Etching solution, and method for processing surface of silicon substrate
WO2012023613A1 (en) * 2010-08-20 2012-02-23 株式会社トクヤマ Texture-forming composition, method for producing silicon substrate, and kit for preparing texture-forming composition
WO2013168813A1 (en) 2012-05-11 2013-11-14 和光純薬工業株式会社 Etching fluid and production method for silicon-based substrate using same
CN111485290A (en) * 2020-05-14 2020-08-04 杭州聚力氢能科技有限公司 Texturing additive for single crystal silicon surface treatment, texturing agent and method for texturing single crystal silicon surface

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