JPS6430225A - Plasma processor - Google Patents

Plasma processor

Info

Publication number
JPS6430225A
JPS6430225A JP18544787A JP18544787A JPS6430225A JP S6430225 A JPS6430225 A JP S6430225A JP 18544787 A JP18544787 A JP 18544787A JP 18544787 A JP18544787 A JP 18544787A JP S6430225 A JPS6430225 A JP S6430225A
Authority
JP
Japan
Prior art keywords
steam
oxygen
feeder means
pipe
gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18544787A
Other languages
Japanese (ja)
Other versions
JPH0748489B2 (en
Inventor
Keisuke Shinagawa
Shuzo Fujimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP18544787A priority Critical patent/JPH0748489B2/en
Publication of JPS6430225A publication Critical patent/JPS6430225A/en
Publication of JPH0748489B2 publication Critical patent/JPH0748489B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Drying Of Semiconductors (AREA)

Abstract

PURPOSE:To enable steam to be fed at low pressure in parallel with gasses fed at high pressure by a method wherein multiple pipes comprising gas feeder means respectively and directly opening into a plasma producing chamber are respectively and independently actuated without interfering with each other. CONSTITUTION:Multiple pipes 122 comprise gas feeder means 12; one pipe feeds oxygen and nitrogen or dinitrogen oxide; the other pipe feeds steam; and both pipes open into a plasma producing chamber 1. Furthermore, mass flows 121 as flow rate controllers are provided in respective pipes 122 comprising the gas feeder means 12; one pipe is provided with an oxygen source, nitrogen source, etc., in the upstream; the other pipe is provided with steam source 124 through the intermediary of a needle valve 123. When steam is added to a reactive gas in case down flow ashing process using oxygen gas is performed, the ashing rate is increased, however, oxygen and nitrogen or dinitrogen oxide as well as steam are smoothly and directly fed to the plasma producing chamber 1 by gas feeder means 12 to show the excellent ashing rate.
JP18544787A 1987-07-27 1987-07-27 Plasma processing device Expired - Lifetime JPH0748489B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18544787A JPH0748489B2 (en) 1987-07-27 1987-07-27 Plasma processing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18544787A JPH0748489B2 (en) 1987-07-27 1987-07-27 Plasma processing device

Publications (2)

Publication Number Publication Date
JPS6430225A true JPS6430225A (en) 1989-02-01
JPH0748489B2 JPH0748489B2 (en) 1995-05-24

Family

ID=16170954

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18544787A Expired - Lifetime JPH0748489B2 (en) 1987-07-27 1987-07-27 Plasma processing device

Country Status (1)

Country Link
JP (1) JPH0748489B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1992000601A1 (en) * 1990-06-27 1992-01-09 Fujitsu Limited Method of manufacturing semiconductor integrated circuit and equipment for the manufacture
WO1992006488A1 (en) * 1990-10-05 1992-04-16 Fujitsu Limited Vapor supplier and its control method
JP2510053B2 (en) * 1990-06-27 1996-06-26 富士通株式会社 Method of manufacturing semiconductor integrated circuit and manufacturing apparatus used therefor
JP2008028326A (en) * 2006-07-25 2008-02-07 Tokyo Electron Ltd Gas supply system, gas supply method, method of cleaning thin-film forming apparatus, method of forming thin film, and thin-film forming apparatus

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Publication number Priority date Publication date Assignee Title
US10224224B2 (en) 2017-03-10 2019-03-05 Micromaterials, LLC High pressure wafer processing systems and related methods
US10847360B2 (en) 2017-05-25 2020-11-24 Applied Materials, Inc. High pressure treatment of silicon nitride film
US10622214B2 (en) 2017-05-25 2020-04-14 Applied Materials, Inc. Tungsten defluorination by high pressure treatment
JP7190450B2 (en) 2017-06-02 2022-12-15 アプライド マテリアルズ インコーポレイテッド Dry stripping of boron carbide hardmask
CN111095513B (en) 2017-08-18 2023-10-31 应用材料公司 High-pressure high-temperature annealing chamber
US10276411B2 (en) 2017-08-18 2019-04-30 Applied Materials, Inc. High pressure and high temperature anneal chamber
CN111095524B (en) 2017-09-12 2023-10-03 应用材料公司 Apparatus and method for fabricating semiconductor structures using protective barrier layers
US10643867B2 (en) 2017-11-03 2020-05-05 Applied Materials, Inc. Annealing system and method
CN117936417A (en) 2017-11-11 2024-04-26 微材料有限责任公司 Gas delivery system for high pressure processing chamber
SG11202003438QA (en) 2017-11-16 2020-05-28 Applied Materials Inc High pressure steam anneal processing apparatus
WO2019099255A2 (en) 2017-11-17 2019-05-23 Applied Materials, Inc. Condenser system for high pressure processing system
CN111699549A (en) 2018-01-24 2020-09-22 应用材料公司 Seam closure using high pressure annealing
WO2019173006A1 (en) 2018-03-09 2019-09-12 Applied Materials, Inc. High pressure annealing process for metal containing materials
US10714331B2 (en) 2018-04-04 2020-07-14 Applied Materials, Inc. Method to fabricate thermally stable low K-FinFET spacer
US10950429B2 (en) 2018-05-08 2021-03-16 Applied Materials, Inc. Methods of forming amorphous carbon hard mask layers and hard mask layers formed therefrom
US10566188B2 (en) 2018-05-17 2020-02-18 Applied Materials, Inc. Method to improve film stability
US10704141B2 (en) 2018-06-01 2020-07-07 Applied Materials, Inc. In-situ CVD and ALD coating of chamber to control metal contamination
US10748783B2 (en) 2018-07-25 2020-08-18 Applied Materials, Inc. Gas delivery module
US10675581B2 (en) 2018-08-06 2020-06-09 Applied Materials, Inc. Gas abatement apparatus
JP7179172B6 (en) 2018-10-30 2022-12-16 アプライド マテリアルズ インコーポレイテッド Method for etching structures for semiconductor applications
WO2020117462A1 (en) 2018-12-07 2020-06-11 Applied Materials, Inc. Semiconductor processing system
US11901222B2 (en) 2020-02-17 2024-02-13 Applied Materials, Inc. Multi-step process for flowable gap-fill film

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1992000601A1 (en) * 1990-06-27 1992-01-09 Fujitsu Limited Method of manufacturing semiconductor integrated circuit and equipment for the manufacture
US5397432A (en) * 1990-06-27 1995-03-14 Fujitsu Limited Method for producing semiconductor integrated circuits and apparatus used in such method
JP2510053B2 (en) * 1990-06-27 1996-06-26 富士通株式会社 Method of manufacturing semiconductor integrated circuit and manufacturing apparatus used therefor
WO1992006488A1 (en) * 1990-10-05 1992-04-16 Fujitsu Limited Vapor supplier and its control method
JP2008028326A (en) * 2006-07-25 2008-02-07 Tokyo Electron Ltd Gas supply system, gas supply method, method of cleaning thin-film forming apparatus, method of forming thin film, and thin-film forming apparatus

Also Published As

Publication number Publication date
JPH0748489B2 (en) 1995-05-24

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