JPS6425466A - Semiconductor memory cell - Google Patents
Semiconductor memory cellInfo
- Publication number
- JPS6425466A JPS6425466A JP62181502A JP18150287A JPS6425466A JP S6425466 A JPS6425466 A JP S6425466A JP 62181502 A JP62181502 A JP 62181502A JP 18150287 A JP18150287 A JP 18150287A JP S6425466 A JPS6425466 A JP S6425466A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor
- bit line
- groove
- upper face
- film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title abstract 7
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 abstract 1
- 229910052782 aluminium Inorganic materials 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
- H10B12/30—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
- H10B12/39—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells the capacitor and the transistor being in a same trench
- H10B12/395—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells the capacitor and the transistor being in a same trench the transistor being vertical
Landscapes
- Semiconductor Memories (AREA)
- Dram (AREA)
Abstract
PURPOSE:To reduce a signal delay in a bit line by forming a word line and a semiconductor in parallel on the upper face of a storage electrode, forming the semiconductor on their upper face, and further forming a bit line on its upper face. CONSTITUTION:A dielectric film 3 is formed on the inner face of a groove 2 formed on a P<+> type substrate 1. An N<+> type storage electrode 4 and a P-type semiconductor 5 are formed in the groove 2 to form a groove 12. The interior of the groove 12 is oxidized to form a gate oxide film 7, a word line 6 is formed, and the upper face of the line 6 is oxidized. An N<+> type semiconductor 8 is formed on the semiconductor 5 and the film 7. An insulating film 10 is formed thereon, a bit line 9 is formed of an aluminum film, and the semiconductor 8 is contacted with a bit line contact 11. Thus, a signal delay in the bit line can be reduced.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62181502A JPS6425466A (en) | 1987-07-21 | 1987-07-21 | Semiconductor memory cell |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62181502A JPS6425466A (en) | 1987-07-21 | 1987-07-21 | Semiconductor memory cell |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6425466A true JPS6425466A (en) | 1989-01-27 |
Family
ID=16101879
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62181502A Pending JPS6425466A (en) | 1987-07-21 | 1987-07-21 | Semiconductor memory cell |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6425466A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5216266A (en) * | 1990-04-11 | 1993-06-01 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor memory device having memory cells formed in trench and manufacturing method therefor |
US5281837A (en) * | 1990-05-28 | 1994-01-25 | Kabushiki Kaisha Toshiba | Semiconductor memory device having cross-point DRAM cell structure |
JPH08213567A (en) * | 1994-11-21 | 1996-08-20 | Lg Semicon Co Ltd | Semiconductor memory device and its manufacture |
-
1987
- 1987-07-21 JP JP62181502A patent/JPS6425466A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5216266A (en) * | 1990-04-11 | 1993-06-01 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor memory device having memory cells formed in trench and manufacturing method therefor |
US5281837A (en) * | 1990-05-28 | 1994-01-25 | Kabushiki Kaisha Toshiba | Semiconductor memory device having cross-point DRAM cell structure |
JPH08213567A (en) * | 1994-11-21 | 1996-08-20 | Lg Semicon Co Ltd | Semiconductor memory device and its manufacture |
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