JPS6421308U - - Google Patents

Info

Publication number
JPS6421308U
JPS6421308U JP1988092540U JP9254088U JPS6421308U JP S6421308 U JPS6421308 U JP S6421308U JP 1988092540 U JP1988092540 U JP 1988092540U JP 9254088 U JP9254088 U JP 9254088U JP S6421308 U JPS6421308 U JP S6421308U
Authority
JP
Japan
Prior art keywords
sensor
component
threshold
counted
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1988092540U
Other languages
English (en)
Other versions
JPH0311683Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS6421308U publication Critical patent/JPS6421308U/ja
Application granted granted Critical
Publication of JPH0311683Y2 publication Critical patent/JPH0311683Y2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V8/00—Prospecting or detecting by optical means
    • G01V8/10—Detecting, e.g. by using light barriers
    • G01V8/12—Detecting, e.g. by using light barriers using one transmitter and one receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2433—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring outlines by shadow casting

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)

Description

【図面の簡単な説明】
第１図は本考案による加工物を検査するための
装置の概略図、第２図は第１図の装置の作動を説
明するためのパルスダイヤグラムである。 １……光源、２……遮光板、３，６……レンズ
、４……加工物、５……光路、７……センサ、８
……面取り部、９……第１の閾値、１０……第２
の閾値。

Claims (1)

    【実用新案登録請求の範囲】
  1. 光源および光に応答するセンサが設けられてお
    り、該光源とセンサとの間を部品が通過するよう
    になつており、前記光源と前記部品との間にレン
    ズおよび遮光板が設けられており、かつ前記部品
    と前記センサとの間に別のレンズが設けられてお
    り、その際前記センサから送出される信号が検査
    すべき部品の特性に対する尺度となる、面取り部
    を有する部品の検査をするための装置において、
    前記遮光板２におけるスリツトの寸法および形状
    が、前記部品４の検査すべき部分および前記部品
    ４の前記部分に関する局所的な分解能に整合され
    ておりかつ前記部品４の検査の際前記センサ７か
    ら送出される信号の評価のために、加算方向およ
    び減算方向に計数する計数装置が設けられており
    、その際該計数器は前記センサからの信号が第１
    の閾値９に達してから第２の閾値１０に達するま
    での時間を一方の方向に計数し１１、かつ次に上
    記第２の閾値１０を下回つてからさらに前記第１
    の閾値９に達するまでの時間を前記一方の方向と
    は逆の方向に計数し１２、上記第１の計数値１１
    と第２の計数値１２との差を形成する部品の検査
    装置。
JP1988092540U 1977-04-20 1988-07-14 Expired JPH0311683Y2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19772717507 DE2717507A1 (de) 1977-04-20 1977-04-20 Einrichtung und verfahren zur pruefung und erkennung von teilen

Publications (2)

Publication Number Publication Date
JPS6421308U true JPS6421308U (ja) 1989-02-02
JPH0311683Y2 JPH0311683Y2 (ja) 1991-03-20

Family

ID=6006804

Family Applications (3)

Application Number Title Priority Date Filing Date
JP4582678A Pending JPS53131862A (en) 1977-04-20 1978-04-18 Apparatus and method of inspection and discrimination for parts
JP1986060306U Expired JPS6344721Y2 (ja) 1977-04-20 1986-04-23
JP1988092540U Expired JPH0311683Y2 (ja) 1977-04-20 1988-07-14

Family Applications Before (2)

Application Number Title Priority Date Filing Date
JP4582678A Pending JPS53131862A (en) 1977-04-20 1978-04-18 Apparatus and method of inspection and discrimination for parts
JP1986060306U Expired JPS6344721Y2 (ja) 1977-04-20 1986-04-23

Country Status (5)

Country Link
US (1) US4217053A (ja)
JP (3) JPS53131862A (ja)
CH (1) CH633107A5 (ja)
DE (1) DE2717507A1 (ja)
GB (1) GB1599448A (ja)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2916862C2 (de) * 1979-04-26 1984-12-20 Robert Bosch Gmbh, 7000 Stuttgart Einrichtung zum Prüfen der richtigen Lage und/oder Maße eines sich bewegenden Teils
DE3017862A1 (de) * 1980-05-09 1981-11-12 Siemens AG, 1000 Berlin und 8000 München Vorrichtung zum erfassen von bewegungen
DE3117780A1 (de) * 1981-05-06 1982-11-25 Robert Bosch Gmbh, 7000 Stuttgart "einrichtung zum optischen erkennen der lage, masshaltigkeit, formgestalt usw. von werkstuecken
US4575637A (en) * 1983-07-28 1986-03-11 Polaroid Corporation Part positioning system employing a mask and photodetector array
US4911307A (en) * 1983-09-30 1990-03-27 Accupack Systems Photoelectric apparatus for sorting articles according to size
FR2553914B1 (fr) * 1983-10-25 1986-01-03 Sumitomo Electric Industries Procede d'inspection de bornes connectees par sertissage
US5009233A (en) * 1989-01-10 1991-04-23 Lasermike, Inc. Miniaturized hand-held laser scanning micrometer
DE69317985T2 (de) * 1992-11-20 1998-11-12 Nordson Corp Methode zum Überwachen und/oder abgeben von Material auf ein Substrat
US5774227A (en) * 1997-01-28 1998-06-30 The Whitaker Corporation Anomally detection machine for fabricated parts formed on a carrier strip and method of use

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE867757C (de) * 1941-05-04 1953-02-19 Siemens Ag Lichtelektrische Pruefeinrichtung
US2812685A (en) * 1953-12-08 1957-11-12 Carl A Vossberg Means for dimensional measurement of moving objects
CH446734A (de) * 1965-11-05 1967-11-15 Emhart Zuerich Sa Verfahren und Einrichtung zur Prüfung einer Kantenlinie eines Körpers
SE326569B (ja) * 1966-08-12 1970-07-27 Asea Ab
JPS514784B1 (ja) * 1971-05-17 1976-02-14
GB1366369A (en) * 1971-11-30 1974-09-11 Ferranti Ltd Detection of faults on surfaces
US3905705A (en) * 1972-01-31 1975-09-16 Techmet Co Optical measuring apparatus
JPS5842888Y2 (ja) * 1974-07-31 1983-09-28 日本電気株式会社 コウデンシキセンカソウチ
US4007992A (en) * 1975-06-02 1977-02-15 Techmet Company Light beam shape control in optical measuring apparatus
US4063820A (en) * 1975-11-10 1977-12-20 Rca Corporation Apparatus for measuring a dimension of an object

Also Published As

Publication number Publication date
JPS6344721Y2 (ja) 1988-11-21
JPS53131862A (en) 1978-11-17
DE2717507A1 (de) 1978-10-26
JPH0311683Y2 (ja) 1991-03-20
US4217053A (en) 1980-08-12
CH633107A5 (de) 1982-11-15
JPS6242007U (ja) 1987-03-13
GB1599448A (en) 1981-10-07

Similar Documents

Publication Publication Date Title
ES447690A1 (es) Perfeccionamientos en sistemas de verificacion del contorno superficial de objetos.
JPS6421308U (ja)
JPH03175308A (ja) ガラスのような透明材料から成る大面積の板の光学品質検査方法
ES480472A1 (es) Un dispositivo para determinar la distribucion de absorcion espacial en un objeto.
US3510664A (en) Automatic laser beam scanning film flaw detector
SE7405630L (sv) Anordning for skikttjockleksbestemning alternativt yttopografimetning
JPS5472094A (en) Bottle bottom inspecting machine
CH519699A (de) Vorrichtung zum Messen der Änderung einer optischen Weglänge mit Hilfe eines Interferometers
US4679932A (en) Method of and apparatus for measuring moving velocity of linear object moving and vibrating
US5255066A (en) Measuring device for track building machines
JPS57204409A (en) Intercar distance measuring device
JPS5734403A (en) Inspecting device for shape and defect of linear object
JPS5582006A (en) Measuring method for thickness
SU134884A1 (ru) Контактный прибор дл измерени деталей большого диаметра
JPS56120901A (en) Measuring device for position of hole edge
JPS598163Y2 (ja) 端縁位置検出装置
JPS51112235A (en) Recognizer unit
SU386241A1 (ru) Фотоэлектрическое устройство для контроля качества поверхности высокоточных деталей
SU504079A1 (ru) Устройство дл контрол отклонений поверхности от заданной формы
JPS5853861B2 (ja) 表面欠陥検出装置
SU655092A1 (ru) Телевизионное устройство дл измерени рассто ний между объектами
FR1527072A (fr) Perfectionnement aux procédés de mesure de dépointage d'un appareil optique et dispositif de mesure correspondant
SU108694A1 (ru) Устройство дл измерени линейных размеров изделий
SU470698A1 (ru) Устройство дл измерени линейных перемещений
FR1502160A (fr) Procédé et dispositif destinés à l'augmentation de la sensihilité, à l'amélioration des limites de détection et de la précision de mesure dans des spectromètres de masse