JPS5734403A - Inspecting device for shape and defect of linear object - Google Patents

Inspecting device for shape and defect of linear object

Info

Publication number
JPS5734403A
JPS5734403A JP10945480A JP10945480A JPS5734403A JP S5734403 A JPS5734403 A JP S5734403A JP 10945480 A JP10945480 A JP 10945480A JP 10945480 A JP10945480 A JP 10945480A JP S5734403 A JPS5734403 A JP S5734403A
Authority
JP
Japan
Prior art keywords
light
slit
mask
inspected
defects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10945480A
Other languages
Japanese (ja)
Other versions
JPS6312241B2 (en
Inventor
Yasuo Nakagawa
Hiroshi Makihira
Nobuyuki Akiyama
Noboru Haginome
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Cable Ltd
Original Assignee
Hitachi Cable Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Cable Ltd filed Critical Hitachi Cable Ltd
Priority to JP10945480A priority Critical patent/JPS5734403A/en
Publication of JPS5734403A publication Critical patent/JPS5734403A/en
Publication of JPS6312241B2 publication Critical patent/JPS6312241B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952Inspecting the exterior surface of cylindrical bodies or wires

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To detect defects with high speed and high accuracy, by projecting slit light from the periphery of a linear object to be inspected and detecting deviation of a light image generated at the time from a normal shape with an optical cutting detector having a particular mask for processing the signal. CONSTITUTION:The slit light is projected to a linear object from its periphery, and a slit image generated on the object to be inspected is detected with an optical cutting detector, further after being converted to an electric signal, defects are judged with use of a judging circuit. In this case, an optical mask is used that shields an optical cutting image of the normal part of an said object and transmits light from parts excepting said normal part. For example, rubber hose 31 to be inspected that is sent by a pulley 32 is irradiated with slit light by means of a lamp 33, a slit 34 and a lens 35, and the image is imaged on a mask 37 via the lens 36. Since the position of the mask is always adjusted by a differential transformer 42 and controlling mechanisms 43, 44, and only light deviated from the normal shape passes through, with measurement of the amount of light by a photoelectric tube 40, detection of defects is allowed.
JP10945480A 1980-08-09 1980-08-09 Inspecting device for shape and defect of linear object Granted JPS5734403A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10945480A JPS5734403A (en) 1980-08-09 1980-08-09 Inspecting device for shape and defect of linear object

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10945480A JPS5734403A (en) 1980-08-09 1980-08-09 Inspecting device for shape and defect of linear object

Publications (2)

Publication Number Publication Date
JPS5734403A true JPS5734403A (en) 1982-02-24
JPS6312241B2 JPS6312241B2 (en) 1988-03-18

Family

ID=14510639

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10945480A Granted JPS5734403A (en) 1980-08-09 1980-08-09 Inspecting device for shape and defect of linear object

Country Status (1)

Country Link
JP (1) JPS5734403A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61110714U (en) * 1984-12-26 1986-07-14
JPS62249005A (en) * 1986-04-22 1987-10-30 Bridgestone Corp Inspecting deice for abnormality of shape of object
AU606679B2 (en) * 1987-03-09 1991-02-14 Battelle Memorial Institute Optical inspection system for cylindrical objects
CN104297439A (en) * 2014-10-21 2015-01-21 南京农业大学 Computer vision-based automatic identification detection method for double-yolked duck eggs
CN105445285A (en) * 2014-09-26 2016-03-30 宝山钢铁股份有限公司 Visual detection device and method for wire rods without tension constraint

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5198298B2 (en) * 2009-01-20 2013-05-15 三菱電線工業株式会社 Measuring method for long body with protrusions

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61110714U (en) * 1984-12-26 1986-07-14
JPH0518416Y2 (en) * 1984-12-26 1993-05-17
JPS62249005A (en) * 1986-04-22 1987-10-30 Bridgestone Corp Inspecting deice for abnormality of shape of object
AU606679B2 (en) * 1987-03-09 1991-02-14 Battelle Memorial Institute Optical inspection system for cylindrical objects
CN105445285A (en) * 2014-09-26 2016-03-30 宝山钢铁股份有限公司 Visual detection device and method for wire rods without tension constraint
CN104297439A (en) * 2014-10-21 2015-01-21 南京农业大学 Computer vision-based automatic identification detection method for double-yolked duck eggs
CN104297439B (en) * 2014-10-21 2019-09-13 南京农业大学 A kind of double yellow duck egg automatic identification detection method based on computer vision

Also Published As

Publication number Publication date
JPS6312241B2 (en) 1988-03-18

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