JPS641977A - Tester - Google Patents
TesterInfo
- Publication number
- JPS641977A JPS641977A JP62156991A JP15699187A JPS641977A JP S641977 A JPS641977 A JP S641977A JP 62156991 A JP62156991 A JP 62156991A JP 15699187 A JP15699187 A JP 15699187A JP S641977 A JPS641977 A JP S641977A
- Authority
- JP
- Japan
- Prior art keywords
- tape carrier
- electrode terminal
- inspection
- probe pin
- tester
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE: To reduce the fraction defective in an after-process and improve the yield by positioning and connecting a terminal connected to a tester and the electrode terminal of a tape carrier mounted with an IC and inspecting the electric characteristics of the IC.
CONSTITUTION: An accommodating side reel and a sprocket 5 for feeding a tape carrier 4 are rotated and it is conveyed to a position where the electrode terminal 12 of the tape carrier 4 mounted with a semiconductor chip and a probe pin 14 provided on an inspecting unit can be connected to each other. At this time, the tape carrier 4 is positioned by the tractor 10 of the sprocket 5. The probe pin 14 is connected to the electrode terminal of the tape carrier 4. In this connection condition, an electric inspection is performed by a tester 13. After the inspection, the electrode terminal and the probe pin 14 are disconnected and the tape carrier 4 is conveyed by a predetermined amount for the inspection of the subsequent semiconductor chip.
COPYRIGHT: (C)1989,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62-156991A JPH011977A (en) | 1987-06-23 | Inspection equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62-156991A JPH011977A (en) | 1987-06-23 | Inspection equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS641977A true JPS641977A (en) | 1989-01-06 |
JPH011977A JPH011977A (en) | 1989-01-06 |
Family
ID=
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0312945A (en) * | 1989-06-09 | 1991-01-21 | Toshiba Corp | Tape carrier and testing method therefor |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6265500A (en) * | 1985-09-18 | 1987-03-24 | 三菱電機株式会社 | Conveying method for electric circuit element |
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6265500A (en) * | 1985-09-18 | 1987-03-24 | 三菱電機株式会社 | Conveying method for electric circuit element |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0312945A (en) * | 1989-06-09 | 1991-01-21 | Toshiba Corp | Tape carrier and testing method therefor |
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