JPS55113352A - Socket - Google Patents

Socket

Info

Publication number
JPS55113352A
JPS55113352A JP1980279A JP1980279A JPS55113352A JP S55113352 A JPS55113352 A JP S55113352A JP 1980279 A JP1980279 A JP 1980279A JP 1980279 A JP1980279 A JP 1980279A JP S55113352 A JPS55113352 A JP S55113352A
Authority
JP
Japan
Prior art keywords
socket
pin
conductor
plug
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1980279A
Other languages
Japanese (ja)
Inventor
Teruo Isobe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP1980279A priority Critical patent/JPS55113352A/en
Publication of JPS55113352A publication Critical patent/JPS55113352A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)

Abstract

PURPOSE: To reduce the reactance of the power source pin and at the same time facilitate the measurement and inspection of the characteristics by a method wherein the outer side of a socket is covered with a conductor, its part is connected to the socket plug and the outer side conductor is fixed to the ground.
CONSTITUTION: On IC socket plug 1 having IC socket connector pin 7 whose one end projects downward and other end extends upward being insulated by insulator 8, is placed conductor 2 having IC socket fixing plate 5 extending downward, and this is fixed to the ground substrate by means of fastening screw 8 or soldered to it. Next, of the plugs 4 connected to pin 7 provided on plug 1, the specified one is directly connected to conductor 2. By this, the length of the IC socket pin is reduced and the reactance component for the pin length decreases. As a result the effect of the high-frequency noise superposed on the power supply is reduced, so that the inspection is facilitated.
COPYRIGHT: (C)1980,JPO&Japio
JP1980279A 1979-02-23 1979-02-23 Socket Pending JPS55113352A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1980279A JPS55113352A (en) 1979-02-23 1979-02-23 Socket

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1980279A JPS55113352A (en) 1979-02-23 1979-02-23 Socket

Publications (1)

Publication Number Publication Date
JPS55113352A true JPS55113352A (en) 1980-09-01

Family

ID=12009467

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1980279A Pending JPS55113352A (en) 1979-02-23 1979-02-23 Socket

Country Status (1)

Country Link
JP (1) JPS55113352A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01291179A (en) * 1988-05-18 1989-11-22 Matsushita Electron Corp Measuring instrument for semiconductor device
JPH0636270U (en) * 1992-10-09 1994-05-13 日本電信電話株式会社 LSI socket

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01291179A (en) * 1988-05-18 1989-11-22 Matsushita Electron Corp Measuring instrument for semiconductor device
JPH0636270U (en) * 1992-10-09 1994-05-13 日本電信電話株式会社 LSI socket

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