JPS53110092A - Socket - Google Patents
SocketInfo
- Publication number
- JPS53110092A JPS53110092A JP2477477A JP2477477A JPS53110092A JP S53110092 A JPS53110092 A JP S53110092A JP 2477477 A JP2477477 A JP 2477477A JP 2477477 A JP2477477 A JP 2477477A JP S53110092 A JPS53110092 A JP S53110092A
- Authority
- JP
- Japan
- Prior art keywords
- socket
- sidewise
- connectors
- surrounds
- semiconductor devices
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Coupling Device And Connection With Printed Circuit (AREA)
Abstract
PURPOSE: To permit accurate measurement of characteristics to be obtained even in characteristics tests on high sensitivity or high frequency semiconductor devices by electrically connecting a shield member, which surrounds connectors sidewise and in an electrically insulated state, to grounding pins.
COPYRIGHT: (C)1978,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2477477A JPS53110092A (en) | 1977-03-09 | 1977-03-09 | Socket |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2477477A JPS53110092A (en) | 1977-03-09 | 1977-03-09 | Socket |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS53110092A true JPS53110092A (en) | 1978-09-26 |
Family
ID=12147508
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2477477A Pending JPS53110092A (en) | 1977-03-09 | 1977-03-09 | Socket |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS53110092A (en) |
-
1977
- 1977-03-09 JP JP2477477A patent/JPS53110092A/en active Pending
Similar Documents
Publication | Publication Date | Title |
---|---|---|
GB1542235A (en) | Test pin for testing electrical circuits | |
GB2041544B (en) | Testing electrical circuit components before insertion | |
ES468796A1 (en) | Electrical contacts | |
JPS53110092A (en) | Socket | |
JPS5378859A (en) | Automatic measuring and testing system | |
AU3529878A (en) | Electrical circuit test device | |
JPS5396740A (en) | Test system | |
JPS5247682A (en) | Integrated circuit | |
JPS534878A (en) | Measuring void in submarine coaxial cable | |
JPS51121267A (en) | Semiconductor wafer measuring device | |
JPS56138934A (en) | Testing device | |
JPS52154696A (en) | Ph measuring probe | |
JPS5441443A (en) | Integrated circuit device | |
JPS51138358A (en) | Electronic circuit testing apparatus | |
JPS5244673A (en) | Loss angle measuring instrument | |
JPS547877A (en) | Test method for electronic device | |
GB2038490B (en) | Electrical circuit testing | |
JPS53138377A (en) | Insulation testing method | |
JPS5353265A (en) | Prober | |
JPS534879A (en) | Measuring void in submarine coaxial cable | |
JPS533277A (en) | Partial discharge tester | |
JPS5211763A (en) | Socket for testing | |
JPS53145576A (en) | Measuring method of electrical characteristics of semiconductor wafers and probe card used in said method | |
JPS51139270A (en) | Power supply circuit for functional module circuit tester | |
JPS5486269A (en) | Semiconductor device |