GB2038490B - Electrical circuit testing - Google Patents

Electrical circuit testing

Info

Publication number
GB2038490B
GB2038490B GB7941127A GB7941127A GB2038490B GB 2038490 B GB2038490 B GB 2038490B GB 7941127 A GB7941127 A GB 7941127A GB 7941127 A GB7941127 A GB 7941127A GB 2038490 B GB2038490 B GB 2038490B
Authority
GB
United Kingdom
Prior art keywords
electrical circuit
circuit testing
testing
electrical
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB7941127A
Other versions
GB2038490A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Measurement Technology Ltd
Original Assignee
Measurement Technology Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Measurement Technology Ltd filed Critical Measurement Technology Ltd
Priority to GB7941127A priority Critical patent/GB2038490B/en
Publication of GB2038490A publication Critical patent/GB2038490A/en
Application granted granted Critical
Publication of GB2038490B publication Critical patent/GB2038490B/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836Fault-finding or characterising
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/14Measuring resistance by measuring current or voltage obtained from a reference source
GB7941127A 1978-12-21 1979-11-28 Electrical circuit testing Expired GB2038490B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB7941127A GB2038490B (en) 1978-12-21 1979-11-28 Electrical circuit testing

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB7849735 1978-12-21
GB7941127A GB2038490B (en) 1978-12-21 1979-11-28 Electrical circuit testing

Publications (2)

Publication Number Publication Date
GB2038490A GB2038490A (en) 1980-07-23
GB2038490B true GB2038490B (en) 1983-02-09

Family

ID=26270072

Family Applications (1)

Application Number Title Priority Date Filing Date
GB7941127A Expired GB2038490B (en) 1978-12-21 1979-11-28 Electrical circuit testing

Country Status (1)

Country Link
GB (1) GB2038490B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4779041A (en) * 1987-05-20 1988-10-18 Hewlett-Packard Company Integrated circuit transfer test device system
GB2309316A (en) * 1996-01-16 1997-07-23 Robert Graham Harris Method and means of detecting a shunt diode within an encapsulated circuit
US11879931B2 (en) * 2021-08-25 2024-01-23 Hamilton Sundstrand Corporation Circuit testing and diagnosis

Also Published As

Publication number Publication date
GB2038490A (en) 1980-07-23

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee