JPS6383645U - - Google Patents
Info
- Publication number
- JPS6383645U JPS6383645U JP17660986U JP17660986U JPS6383645U JP S6383645 U JPS6383645 U JP S6383645U JP 17660986 U JP17660986 U JP 17660986U JP 17660986 U JP17660986 U JP 17660986U JP S6383645 U JPS6383645 U JP S6383645U
- Authority
- JP
- Japan
- Prior art keywords
- test sample
- sample
- present
- holder
- guide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims description 3
- 238000002834 transmittance Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 4
- 230000004907 flux Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
第１図は本案の被検試料平面と測定光束の関係
を示す図、第２図は第１図の側面図、第３図は本
案の原理図、第４図は本案の一実施例の平面図、
第５図は第４図の側面図、第６図は第５図のスラ
イド部の部分断面図、第７図は本案のホールダを
使用するビームスプリツタ特性測定装置の光学系
統図、第８図は本案のホールダをセツトするビー
ムスプリツタ透過率及び反射率測定ユニツトを示
す図である。
１…試料(1)、２…試料(2)、３…移動ベース、
４…ダイ、５…指針、６…目盛、８…ねじ、９…
めねじ板、１１…ガイド板、１２…ガイド軸、１
３…ねじ、１４…ばね、１５…ガイド、１６…押
し軸、１７…ガイド付ベース、１８…スライド案
内、１９…スライドベース。
Figure 1 is a diagram showing the relationship between the plane of the test sample and the measurement light flux of the present invention, Figure 2 is a side view of Figure 1, Figure 3 is a diagram of the principle of the present invention, and Figure 4 is a plan view of an embodiment of the present invention. figure,
Fig. 5 is a side view of Fig. 4, Fig. 6 is a partial sectional view of the slide portion of Fig. 5, Fig. 7 is an optical system diagram of a beam splitter characteristic measuring device using the holder of the present invention, and Fig. 8 1 is a diagram showing a beam splitter transmittance and reflectance measurement unit in which the holder of the present invention is set; FIG. 1...Sample (1), 2...Sample (2), 3...Moving base,
4...Die, 5...Pointer, 6...Scale, 8...Screw, 9...
Female threaded plate, 11... Guide plate, 12... Guide shaft, 1
3...screw, 14...spring, 15...guide, 16...push shaft, 17...base with guide, 18...slide guide, 19...slide base.
Claims (1)
料ホールダにおいて、被検試料の大きさに応じ一
個所の目盛合せで被検試料の適正な測定位置に合
せることができることを特徴とした被検試料ホー
ルダ。 A sample holder for measuring the reflectance and transmittance characteristics of a test sample, which is characterized in that it can be adjusted to the appropriate measurement position of the test sample by adjusting the scale at one point depending on the size of the test sample. Sample holder.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17660986U JPS6383645U (en) | 1986-11-19 | 1986-11-19 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17660986U JPS6383645U (en) | 1986-11-19 | 1986-11-19 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6383645U true JPS6383645U (en) | 1988-06-01 |
Family
ID=31117016
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17660986U Pending JPS6383645U (en) | 1986-11-19 | 1986-11-19 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6383645U (en) |
-
1986
- 1986-11-19 JP JP17660986U patent/JPS6383645U/ja active Pending
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