JPS6167507U - - Google Patents
Info
- Publication number
- JPS6167507U JPS6167507U JP15184284U JP15184284U JPS6167507U JP S6167507 U JPS6167507 U JP S6167507U JP 15184284 U JP15184284 U JP 15184284U JP 15184284 U JP15184284 U JP 15184284U JP S6167507 U JPS6167507 U JP S6167507U
- Authority
- JP
- Japan
- Prior art keywords
- plane
- mirror surface
- mirror
- measuring instrument
- reflecting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Description
第１図は本考案の第１実施例を示した正面図、
第２図は第１図の二鏡面反射鏡の拡大正面図、第
３図は第１図のオートコリメータでの観測像の説
明図、第４図は本考案の第２実施例を示した正面
図、第５図は従来の測定方法の一例を示した正面
図である。
１…外側マイクロメータ、２…スピンドル、３
…アンビル、４…一方の平面、５…他方の平面、
６…基盤、９…平行平面反射鏡、１０…二鏡面反
射鏡、１１…第１鏡面、１２…第２鏡面、１３…
オートコリメータ、１８…外側マイクロメータ基
準棒。
FIG. 1 is a front view showing the first embodiment of the present invention;
Fig. 2 is an enlarged front view of the bispecular reflector shown in Fig. 1, Fig. 3 is an explanatory diagram of the observed image with the autocollimator shown in Fig. 1, and Fig. 4 is a front view showing the second embodiment of the present invention. 5 are front views showing an example of a conventional measuring method. 1...Outside micrometer, 2...Spindle, 3
...anvil, 4...one plane, 5...other plane,
6... Base, 9... Parallel plane reflecting mirror, 10... Bispecular reflecting mirror, 11... First mirror surface, 12... Second mirror surface, 13...
Autocollimator, 18...outer micrometer reference rod.
Claims (1)
測定器の前記両平面の平行度を測定する装置にお
いて、前記測定器の一方の平面を上位にして他方
の平面を下位にした状態で該測定器を搭載する基
盤と、マグネツトを内蔵していて該測定器の一方
の平面に密着する平行平面反射鏡と、該測定器の
他方の平面に対して直角な面の第１鏡面を有する
とともにこの第１鏡面に対して１３５度の方向に
第２鏡面を有する二鏡面反射鏡と、この二鏡面反
射鏡の第１鏡面側に位置して前記基盤に搭載され
て十字線を該第１鏡面で反射させて結像するとと
もに前記第２鏡面を介して前記平行平面反射鏡で
反射させて再び該第２鏡面で反射させて結像する
オートコリメータとからなる、長さ測定器の面の
平行度測定装置。 A device for measuring the parallelism of both planes of a measuring instrument that measures length between one plane and another plane, with one plane of the measuring instrument placed at the top and the other plane at the bottom. It has a base on which the measuring instrument is mounted, a parallel plane reflecting mirror that has a built-in magnet and is in close contact with one plane of the measuring instrument, and a first mirror surface that is perpendicular to the other plane of the measuring instrument. and a bi-specular reflecting mirror having a second mirror surface in a direction of 135 degrees with respect to the first mirror surface, and a bi-specular reflecting mirror mounted on the base and located on the first mirror surface side of the bi-specular reflecting mirror, and the crosshair is directed to the first mirror surface. an autocollimator that forms an image by reflecting it from a mirror surface, and also reflects it from the parallel plane reflecting mirror via the second mirror surface, and forms an image by reflecting it again from the second mirror surface. Parallelism measuring device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15184284U JPS6167507U (en) | 1984-10-09 | 1984-10-09 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15184284U JPS6167507U (en) | 1984-10-09 | 1984-10-09 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6167507U true JPS6167507U (en) | 1986-05-09 |
Family
ID=30709938
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15184284U Pending JPS6167507U (en) | 1984-10-09 | 1984-10-09 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6167507U (en) |
-
1984
- 1984-10-09 JP JP15184284U patent/JPS6167507U/ja active Pending
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