JPH03117749U - - Google Patents
Info
- Publication number
- JPH03117749U JPH03117749U JP2635490U JP2635490U JPH03117749U JP H03117749 U JPH03117749 U JP H03117749U JP 2635490 U JP2635490 U JP 2635490U JP 2635490 U JP2635490 U JP 2635490U JP H03117749 U JPH03117749 U JP H03117749U
- Authority
- JP
- Japan
- Prior art keywords
- atr
- crystal
- total reflection
- light
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000013078 crystal Substances 0.000 claims description 10
- 238000010521 absorption reaction Methods 0.000 claims description 3
- 238000000034 method Methods 0.000 claims description 3
- 230000003287 optical effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
第１図および第２図は本考案の一実施例を示し
、第１図は本考案に係るＡＴＲ法による吸収強度
測定装置の構成図、第２図はＡＴＲ結晶の構成例
を示す拡大図である。第３図および第４図はそれ
ぞれ本考案の他の実施例に係るＡＴＲ結晶の構成
例を示す図である。第５図は従来のＡＴＲ結晶の
構成を示す図である。
５……光源、１１……検出器、１２……ＡＴＲ
結晶、１３……全反射面、１５……試料。
Figures 1 and 2 show an embodiment of the present invention. Figure 1 is a block diagram of an absorption intensity measurement device using the ATR method according to the present invention, and Figure 2 is an enlarged view showing an example of the configuration of an ATR crystal. be. FIG. 3 and FIG. 4 are diagrams each showing a configuration example of an ATR crystal according to another embodiment of the present invention. FIG. 5 is a diagram showing the configuration of a conventional ATR crystal. 5...Light source, 11...Detector, 12...ATR
Crystal, 13... Total reflection surface, 15... Sample.
Claims (1)
け、前記光源からＡＴＲ結晶に入射した光がＡＴ
Ｒ結晶に接触するように配置された試料とＡＴＲ
結晶との接触面において全反射するようにしてな
るＡＴＲ法による吸収強度測定装置において、前
記ＡＴＲ結晶への光の入射側に全反射面を形成し
てこの全反射面に試料を接触させるように配置す
ると共に、ＡＴＲ結晶への入射光が前記全反射面
において収束するようにしたことを特徴とするＡ
ＴＲ法による吸収強度測定装置。 An ATR crystal is provided in the optical path between the light source and the detector, and the light incident on the ATR crystal from the light source is AT
Sample placed in contact with R crystal and ATR
In an absorption intensity measuring device using the ATR method, in which total reflection occurs at a contact surface with a crystal, a total reflection surface is formed on the incident side of light to the ATR crystal, and a sample is brought into contact with this total reflection surface. A characterized in that the ATR crystal is arranged so that the incident light to the ATR crystal is converged on the total reflection surface.
Absorption intensity measuring device using the TR method.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2635490U JPH03117749U (en) | 1990-03-15 | 1990-03-15 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2635490U JPH03117749U (en) | 1990-03-15 | 1990-03-15 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH03117749U true JPH03117749U (en) | 1991-12-05 |
Family
ID=31529255
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2635490U Pending JPH03117749U (en) | 1990-03-15 | 1990-03-15 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH03117749U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003083811A (en) * | 2001-09-13 | 2003-03-19 | Nippon Telegr & Teleph Corp <Ntt> | Image spectrometry device |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5729839B2 (en) * | 1979-03-28 | 1982-06-24 | ||
| JPH01138443A (en) * | 1987-08-22 | 1989-05-31 | Amersham Internatl Plc | Biological sensor |
| JPH0217431A (en) * | 1988-05-10 | 1990-01-22 | Amersham Internatl Plc | Surface plasmon resonance sensor |
| JPH02223847A (en) * | 1989-02-23 | 1990-09-06 | Shimadzu Corp | Infrared microscope |
-
1990
- 1990-03-15 JP JP2635490U patent/JPH03117749U/ja active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5729839B2 (en) * | 1979-03-28 | 1982-06-24 | ||
| JPH01138443A (en) * | 1987-08-22 | 1989-05-31 | Amersham Internatl Plc | Biological sensor |
| JPH0217431A (en) * | 1988-05-10 | 1990-01-22 | Amersham Internatl Plc | Surface plasmon resonance sensor |
| JPH02223847A (en) * | 1989-02-23 | 1990-09-06 | Shimadzu Corp | Infrared microscope |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003083811A (en) * | 2001-09-13 | 2003-03-19 | Nippon Telegr & Teleph Corp <Ntt> | Image spectrometry device |
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