JPS6220357U - - Google Patents

Info

Publication number
JPS6220357U
JPS6220357U JP11209285U JP11209285U JPS6220357U JP S6220357 U JPS6220357 U JP S6220357U JP 11209285 U JP11209285 U JP 11209285U JP 11209285 U JP11209285 U JP 11209285U JP S6220357 U JPS6220357 U JP S6220357U
Authority
JP
Japan
Prior art keywords
optical path
infrared light
infrared
sample holder
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11209285U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11209285U priority Critical patent/JPS6220357U/ja
Publication of JPS6220357U publication Critical patent/JPS6220357U/ja
Pending legal-status Critical Current

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  • Investigating Or Analysing Materials By Optical Means (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本考案の一実施例を示す装置の構成
図、第2図は、同上装置における反射鏡の一実施
例を示す断面図、第3図は同上装置による測定結
果を示す赤外透過特性図、及び第4図は従来装置
により測定された赤外透過特性図である。 1……反射鏡、2……赤外光源、4……透明基
板、5……金属層、6……試料ホルダ。
Fig. 1 is a configuration diagram of an apparatus showing an embodiment of the present invention, Fig. 2 is a sectional view showing an embodiment of a reflector in the same device, and Fig. 3 is an infrared measurement result showing the results of measurement by the same device. The transmission characteristic diagram and FIG. 4 are infrared transmission characteristic diagrams measured by a conventional device. DESCRIPTION OF SYMBOLS 1...Reflector, 2...Infrared light source, 4...Transparent substrate, 5...Metal layer, 6...Sample holder.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 赤外光源と試料保持具の光路上に、赤外透光性
基板の裏面に金属膜を形成してなる反射鏡を基板
側を光路側に向けて配設してなる薄膜特性測定用
赤外分光光度計。
Infrared light for measuring thin film characteristics, consisting of a reflector made of an infrared transparent substrate with a metal film formed on the back side, placed on the optical path between the infrared light source and the sample holder, with the substrate side facing the optical path side. Spectrophotometer.
JP11209285U 1985-07-20 1985-07-20 Pending JPS6220357U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11209285U JPS6220357U (en) 1985-07-20 1985-07-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11209285U JPS6220357U (en) 1985-07-20 1985-07-20

Publications (1)

Publication Number Publication Date
JPS6220357U true JPS6220357U (en) 1987-02-06

Family

ID=30992634

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11209285U Pending JPS6220357U (en) 1985-07-20 1985-07-20

Country Status (1)

Country Link
JP (1) JPS6220357U (en)

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