JPH0325143U - - Google Patents
Info
- Publication number
- JPH0325143U JPH0325143U JP8631189U JP8631189U JPH0325143U JP H0325143 U JPH0325143 U JP H0325143U JP 8631189 U JP8631189 U JP 8631189U JP 8631189 U JP8631189 U JP 8631189U JP H0325143 U JPH0325143 U JP H0325143U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- infrared rays
- infrared
- optical medium
- analysis device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 claims description 11
- 238000010521 absorption reaction Methods 0.000 claims description 7
- 238000009795 derivation Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 8
- 238000000034 method Methods 0.000 description 7
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
第１図は、本考案の第１実施例に係るＡＴＲ法
による赤外線吸収強度測定装置の構成図である。
第２図は、本考案の第２実施例に係るＡＴＲ法に
よる赤外線吸収強度測定装置の構成図である。第
３図は、本考案の第３実施例に係るＲＡＳ法によ
るマイクロ高感度反射測定装置の構成図である。
第４図〜第６図は、従来技術を説明するための図
で、第４図は、従来のＡＴＲ法による赤外線吸収
強度測定装置の構成図、第５図は、従来のＡＴＲ
法による赤外線吸収強度測定装置の構成図、第６
図は、ＡＴＲ法による赤外線吸収強度測定装置に
おける問題点を説明するための図である。
１……光源、２……検出器、７……光学媒体、
８……試料、９……偏光子、１４，１５，１６，
１８，１９……導光路。
FIG. 1 is a configuration diagram of an infrared absorption intensity measuring device using the ATR method according to a first embodiment of the present invention.
FIG. 2 is a configuration diagram of an infrared absorption intensity measuring device using the ATR method according to a second embodiment of the present invention. FIG. 3 is a configuration diagram of a micro high-sensitivity reflection measuring device using the RAS method according to the third embodiment of the present invention.
Figures 4 to 6 are diagrams for explaining the prior art. Figure 4 is a configuration diagram of an infrared absorption intensity measuring device using the conventional ATR method, and Figure 5 is a diagram for explaining the conventional ATR method.
Block diagram of the infrared absorption intensity measuring device according to the method, No. 6
The figure is a diagram for explaining problems in an infrared absorption intensity measuring device using the ATR method. 1... Light source, 2... Detector, 7... Optical medium,
8... Sample, 9... Polarizer, 14, 15, 16,
18, 19...Light guide path.
Claims (1)
される光路中に試料と光学媒体とを互いに接する
ように設け、前記光学媒体に入射した赤外線が前
記試料との接触面で全反射するとき前記接触面で
試料中に含まれる測定成分に吸収される赤外線吸
収強度に基づいて試料中の測定成分を分析するよ
うにした赤外線照射による試料分析装置において
、前記光学媒体への赤外線の導入側および光学媒
体からの赤外線の導出側に、それぞれ赤外線を通
過させる導光路を設けたことを特徴とする赤外線
照射による試料分析装置。 (2) 赤外線を発する光源と検出器との間に形成
される光路中に試料と光学媒体とを互いに接する
ように設け、前記光学媒体に入射した赤外線が前
記試料との接触面で全反射するときの前記接触面
で試料中に含まれる測定成分に吸収される赤外線
吸収強度に基づいて試料中の測定成分を分析する
ようにした赤外線照射による試料分析装置におい
て、前記光学媒体に、赤外線の導入および導出の
機能をもたせたことを特徴とする赤外線照射によ
る試料分析装置。 (3) 赤外線を発する光源と検出器との間に形成
される光路中に試料を設け、前記光源からの赤外
線を偏光子を介して前記試料に照射したときの反
射光の強度に基づいて試料中の測定成分を分析す
るようにした赤外線照射による試料分析装置にお
いて、前記偏光子への赤外線の導入側および前記
試料の表面で反射される赤外線の導出側に、それ
ぞれ赤外線を通過させる導光路を設けたことを特
徴とする赤外線照射による試料分析装置。[Claims for Utility Model Registration] (1) A sample and an optical medium are provided so as to be in contact with each other in an optical path formed between a light source that emits infrared rays and a detector, and the infrared rays incident on the optical medium are In a sample analyzer using infrared irradiation, a sample analysis device using infrared irradiation is configured to analyze a component to be measured in a sample based on the intensity of infrared absorption absorbed by the component to be measured contained in the sample at the contact surface when totally reflected at the contact surface with the sample. 1. A sample analysis device using infrared irradiation, characterized in that a light guide path for passing infrared rays is provided on a side where infrared rays are introduced into an optical medium and on a side where infrared rays are taken out from the optical medium. (2) A sample and an optical medium are provided so as to be in contact with each other in an optical path formed between a light source that emits infrared rays and a detector, and the infrared rays incident on the optical medium are totally reflected at the contact surface with the sample. In the sample analysis device using infrared irradiation, which analyzes a component to be measured in a sample based on the intensity of infrared absorption absorbed by the component to be measured contained in the sample at the contact surface, the infrared rays are introduced into the optical medium. A sample analysis device using infrared irradiation, characterized in that it has a derivation function. (3) A sample is placed in the optical path formed between a light source that emits infrared rays and a detector. In a sample analyzer using infrared irradiation for analyzing components to be measured in the sample, a light guide path for passing infrared rays is provided on the infrared rays introduction side to the polarizer and the infrared rays reflected on the surface of the sample, respectively. A sample analysis device using infrared irradiation, characterized by the following:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8631189U JPH0325143U (en) | 1989-07-21 | 1989-07-21 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8631189U JPH0325143U (en) | 1989-07-21 | 1989-07-21 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0325143U true JPH0325143U (en) | 1991-03-14 |
Family
ID=31635814
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8631189U Pending JPH0325143U (en) | 1989-07-21 | 1989-07-21 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0325143U (en) |
-
1989
- 1989-07-21 JP JP8631189U patent/JPH0325143U/ja active Pending
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