JPS637629B2 - - Google Patents
Info
- Publication number
- JPS637629B2 JPS637629B2 JP57139718A JP13971882A JPS637629B2 JP S637629 B2 JPS637629 B2 JP S637629B2 JP 57139718 A JP57139718 A JP 57139718A JP 13971882 A JP13971882 A JP 13971882A JP S637629 B2 JPS637629 B2 JP S637629B2
- Authority
- JP
- Japan
- Prior art keywords
- semiconductors
- connector module
- connector
- aging device
- aging
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000032683 aging Effects 0.000 claims description 35
- 239000004065 semiconductor Substances 0.000 claims description 24
- 238000009423 ventilation Methods 0.000 claims description 6
- 239000011810 insulating material Substances 0.000 claims description 4
- 238000012360 testing method Methods 0.000 claims description 4
- 230000001143 conditioned effect Effects 0.000 claims description 3
- 239000000758 substrate Substances 0.000 description 8
- 238000005057 refrigeration Methods 0.000 description 5
- 238000001816 cooling Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000011144 upstream manufacturing Methods 0.000 description 2
- 238000007664 blowing Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000003507 refrigerant Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2642—Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57139718A JPS5931033A (ja) | 1982-08-13 | 1982-08-13 | 半導体等のエ−ジング装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57139718A JPS5931033A (ja) | 1982-08-13 | 1982-08-13 | 半導体等のエ−ジング装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5931033A JPS5931033A (ja) | 1984-02-18 |
| JPS637629B2 true JPS637629B2 (zh) | 1988-02-17 |
Family
ID=15251787
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57139718A Granted JPS5931033A (ja) | 1982-08-13 | 1982-08-13 | 半導体等のエ−ジング装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5931033A (zh) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0310276U (zh) * | 1989-06-16 | 1991-01-31 |
-
1982
- 1982-08-13 JP JP57139718A patent/JPS5931033A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5931033A (ja) | 1984-02-18 |
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