JPS637618B2 - - Google Patents

Info

Publication number
JPS637618B2
JPS637618B2 JP55148209A JP14820980A JPS637618B2 JP S637618 B2 JPS637618 B2 JP S637618B2 JP 55148209 A JP55148209 A JP 55148209A JP 14820980 A JP14820980 A JP 14820980A JP S637618 B2 JPS637618 B2 JP S637618B2
Authority
JP
Japan
Prior art keywords
thin film
measured
film
thermal conductivity
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55148209A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5772052A (en
Inventor
Susumu Fujimori
Koji Takei
Sakae Maebotoke
Kazutoshi Nagai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP14820980A priority Critical patent/JPS5772052A/ja
Publication of JPS5772052A publication Critical patent/JPS5772052A/ja
Publication of JPS637618B2 publication Critical patent/JPS637618B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00Investigating or analyzing materials by the use of thermal means
    • G01N25/18Investigating or analyzing materials by the use of thermal means by investigating thermal conductivity

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
JP14820980A 1980-10-24 1980-10-24 Measuring method for heat transmission factor of thin film Granted JPS5772052A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14820980A JPS5772052A (en) 1980-10-24 1980-10-24 Measuring method for heat transmission factor of thin film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14820980A JPS5772052A (en) 1980-10-24 1980-10-24 Measuring method for heat transmission factor of thin film

Publications (2)

Publication Number Publication Date
JPS5772052A JPS5772052A (en) 1982-05-06
JPS637618B2 true JPS637618B2 (enrdf_load_html_response) 1988-02-17

Family

ID=15447700

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14820980A Granted JPS5772052A (en) 1980-10-24 1980-10-24 Measuring method for heat transmission factor of thin film

Country Status (1)

Country Link
JP (1) JPS5772052A (enrdf_load_html_response)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59210352A (ja) * 1983-05-16 1984-11-29 Nippon Telegr & Teleph Corp <Ntt> 熱伝導率測定法
JPS6110752A (ja) * 1984-06-26 1986-01-18 Ichiro Hatta 交流カロリメトリによる熱拡散率測定方法
JPS61205162A (ja) * 1985-03-08 1986-09-11 Brother Ind Ltd シリアルプリンタ

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5329114B2 (enrdf_load_html_response) * 1973-09-26 1978-08-18

Also Published As

Publication number Publication date
JPS5772052A (en) 1982-05-06

Similar Documents

Publication Publication Date Title
US5812261A (en) Method and device for measuring the thickness of opaque and transparent films
JP3430258B2 (ja) 熱拡散率と界面熱抵抗の測定方法
Matthias et al. In-situ investigation of laser ablation of thin films
US7937240B2 (en) Method and device for characterizing, using active pyrometry, a thin-layer material arranged on a substrate
Ong et al. Calculations of melting threshold energies of crystalline and amorphous materials due to pulsed-laser irradiation
Zenobi et al. Surface temperature measurement of dielectric materials heated by pulsed laser radiation
JPH03189547A (ja) 熱拡散率測定方法及び測定装置
JPS637618B2 (enrdf_load_html_response)
Duley et al. Coupling coefficient for cw CO2 laser radiation on stainless steel
Dreyfus et al. Energy deposition at insulator surfaces below the ultraviolet photoablation threshold
Peercy et al. Energy absorption during pulsed‐laser annealing
Burzo et al. Influence of the metallic absorption layer on the quality of thermal conductivity measurements by the transient thermo-reflectance method
Burzo et al. Minimizing the uncertainties associated with the measurement of thermal properties by the transient thermo-reflectance method
JP3083120B2 (ja) はんだ濡れ性評価方法とその装置
JPH0333221B2 (enrdf_load_html_response)
JPH06196852A (ja) レーザ接合方法
Grigoropoulos et al. Transient reflectivity measurements and heat transfer modeling in laser annealing of semiconductor films
Yagi et al. Development of thin film reference material for thermal diffusivity
SU1293592A1 (ru) Способ измерени малых коэффициентов поглощени оптических материалов
Hironaka et al. Picosecond pulsed X-ray diffraction from a pulsed laser heated Si (111)
Balzer et al. Size effects and determination of absolute temperature increases in laser heating of dielectrics
Cozzens et al. Laser degradation of polymer coatings on reflective heat sinks
JP2570478B2 (ja) 薄膜熱伝導率測定方法
Stafe A Spectroscopic and Theoretical Photo-Thermal Approach for Analysing Laser Ablated Structures
Murphy et al. Coating thickness determination using time dependent surface temperature measurements