JPS6375535A - Chromatoscanner - Google Patents
ChromatoscannerInfo
- Publication number
- JPS6375535A JPS6375535A JP22152786A JP22152786A JPS6375535A JP S6375535 A JPS6375535 A JP S6375535A JP 22152786 A JP22152786 A JP 22152786A JP 22152786 A JP22152786 A JP 22152786A JP S6375535 A JPS6375535 A JP S6375535A
- Authority
- JP
- Japan
- Prior art keywords
- plate
- mark
- sample
- measuring light
- transparent
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 claims description 26
- 238000004587 chromatography analysis Methods 0.000 claims description 3
- 230000003287 optical effect Effects 0.000 abstract description 7
- 230000000007 visual effect Effects 0.000 abstract description 4
- 230000004907 flux Effects 0.000 abstract description 2
- 230000001788 irregular Effects 0.000 abstract 2
- 239000000499 gel Substances 0.000 description 6
- 238000001962 electrophoresis Methods 0.000 description 4
- 238000002835 absorbance Methods 0.000 description 3
- 238000012790 confirmation Methods 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000003550 marker Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- -1 polytetrafluoroethylene Polymers 0.000 description 1
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 1
- 239000004810 polytetrafluoroethylene Substances 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 238000004809 thin layer chromatography Methods 0.000 description 1
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
【発明の詳細な説明】
（産業上の利用分野）
本発明は薄層クロマトプレー１・や電気泳動ゲルの吸光
度測定を行なうクロマ１−スキャナに関するものである
。DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a chroma 1-scanner for measuring the absorbance of thin-layer chromatoplates 1 and electrophoresis gels.
（従来の技術）
クロマトスキャナでは薄層クロマトプレートや電気泳動
ゲルのような試料プレート」二に測定光を照射し、その
測定光を試料プレー１〜上で走査することによって、試
料プレート上の吸光度の測定を行なう。(Prior art) In a chromato scanner, a sample plate such as a thin-layer chromatography plate or an electrophoresis gel is irradiated with measurement light, and the measurement light is scanned over sample plates 1 to 1 to measure the absorbance on the sample plate. Perform measurements.
（発明が解決しようとする問題点）
試料プレートが薄層クロマトプレー１−である場合には
、測定モードは反射吸収測定モードとなるので、照射光
束が可視光であれば直ちに照射点を目視確認でき、おお
よその照射位置（Ｘ座標及びＹ座標）を読み取ることが
できる。しかし、試料プレートが電気泳動ゲル（特に平
板ゲル）の場合は、試料プレートが基本的には透明体で
あるため、可視光であっても照射点を目視確認すること
ができないという不便さがある。(Problem to be Solved by the Invention) When the sample plate is a thin layer chromato plate 1-, the measurement mode is a reflection/absorption measurement mode, so if the irradiation light flux is visible light, the irradiation point must be immediately visually confirmed. The approximate irradiation position (X and Y coordinates) can be read. However, when the sample plate is an electrophoresis gel (especially a flat gel), the sample plate is basically transparent, so there is the inconvenience that the irradiation point cannot be visually confirmed even with visible light. .
本発明は、試料プレートが電気泳動ゲルの平板ゲルのよ
うな透明体であっても、照射光束の存在位置を目視確認
できるようにすることを目的とするものである。An object of the present invention is to enable visual confirmation of the position of the irradiation light beam even if the sample plate is a transparent body such as a flat plate of electrophoresis gel.
（問題点を解決するための手段）
本発明のクロマトスキャナでは、載置される試料面に接
近して測定光の照射光束位置の試料面の−１一方又は下
方に、照射光束を乱反射させる目印を刻んだ透明板を着
脱可能に設けた。(Means for Solving the Problems) In the chromatography scanner of the present invention, a mark that is located close to the sample surface on which the sample is placed and diffusely reflects the irradiated light beam is placed on one side or below the sample surface at the position of the irradiated light beam of the measurement light. A removable transparent plate with engraved on it is provided.
（実施例）
第１図（Ａ）は一実施例を示す側面断面図、同図（Ｂ）
は同実施例の要部正面図である。(Example) Figure 1 (A) is a side cross-sectional view showing one example, and Figure 1 (B)
FIG. 2 is a front view of main parts of the same embodiment.
２はクロマトスキャナ本体内の光学系を格納しているケ
ースの壁面を表わし、ケース壁面２の一部に半透明鏡４
が窓板として貼りつけられている。2 represents the wall of the case that houses the optical system inside the chromato scanner body, and a semi-transparent mirror 4 is attached to a part of the case wall 2.
is attached as a window board.
測定光６はケースの内側から半透明鏡４を透過して試料
プレート８へと向う。半透明鏡４では測定光６の一部が
反射されてモニター用の光電子増倍管に入射するように
なっている。The measurement light 6 passes through the semi-transparent mirror 4 from inside the case and heads towards the sample plate 8. A part of the measurement light 6 is reflected by the semi-transparent mirror 4 and enters a photomultiplier tube for monitoring.
半透明鏡４を透過した測定光６は、試料プレート８に対
して垂直方向に入射する。試料プレート８に接近して、
その試料プレート８の上方（試料プレート８に対して測
定光６の入射側）に、試料プレート８に平行な透明板１
８が設けられている。The measurement light 6 transmitted through the semi-transparent mirror 4 enters the sample plate 8 in the vertical direction. Approaching the sample plate 8,
A transparent plate 1 parallel to the sample plate 8 is placed above the sample plate 8 (on the incident side of the measurement light 6 with respect to the sample plate 8).
8 is provided.
試料プレート８の下側には、試料プレート８を透過した
測定光６を検出する透過光測定用の光電子増倍管１０が
設けられている。試料プレート８で反射した測定光を検
出するために、ケースの内側に窓板１４を介して反射光
測定用の光電子増倍管１２が設けられている。１６は光
電子増倍管１２に外部光が入射するのを防止するための
遮光部材である。 ′
透明板１８は可動支持板２０に取り付けられ、可動支持
板２０に開けられた穴を通して測定光６が透明板１８を
通って試料プレート８に入射する。A photomultiplier tube 10 for measuring transmitted light is provided below the sample plate 8 to detect the measurement light 6 transmitted through the sample plate 8 . In order to detect the measurement light reflected by the sample plate 8, a photomultiplier tube 12 for measuring the reflected light is provided inside the case via a window plate 14. Reference numeral 16 denotes a light shielding member for preventing external light from entering the photomultiplier tube 12. ' The transparent plate 18 is attached to the movable support plate 20, and the measurement light 6 passes through the transparent plate 18 and enters the sample plate 8 through a hole made in the movable support plate 20.
可動支持板２０は断面がＬ字型に折れ曲っており、透明
板１８が取り付けられている面は試料プレート８に平行
な水平面である。ケース壁面２の内、測定光６と平行に
なる壁面には、水平方向に並んだ２個の止めネジ２２を
取り付け、一方、可動支持板２０の垂直方向の面には水
平方向に延びる長孔２４を開け、この長孔２４を止めネ
ジ２２に通すとともに、板金で作られた固定バネ板２５
によって支持板２０をケース壁面２と止めネジ２２の間
に支持する。このときケース壁面２と可動支持板２０の
間、及び可動支持板２０と固定バネ板２５の間にはポリ
テ１〜ラフロオロエチレン製のスペーサ（座金に似た形
状のもの）を挟んでおく。２６は可動支持板２０に設け
られた摘みである。この摘み２６を手で左右に動かすこ
とによって、可動支持板２０が固定バネ板２５に対して
水平方向に＝３−
移動することができる。The movable support plate 20 has an L-shaped cross section, and the surface on which the transparent plate 18 is attached is a horizontal plane parallel to the sample plate 8. Two setscrews 22 arranged horizontally are installed on the wall surface parallel to the measurement light 6 of the case wall surface 2, while elongated holes extending horizontally are installed on the vertical surface of the movable support plate 20. 24, and pass the set screw 22 through this elongated hole 24, and attach the fixed spring plate 25 made of sheet metal.
The support plate 20 is supported between the case wall surface 2 and the setscrews 22. At this time, between the case wall surface 2 and the movable support plate 20, and between the movable support plate 20 and the fixed spring plate 25, spacers (shaped like washers) made of polytetrafluoroethylene are sandwiched. 26 is a knob provided on the movable support plate 20. By manually moving this knob 26 to the left or right, the movable support plate 20 can be moved horizontally by =3- with respect to the fixed spring plate 25.
第２図（Ａ）は透明板１８を示す斜視図、同図（Ｂ）は
そのＡ−Ａ’線位置での断面図である。FIG. 2(A) is a perspective view showing the transparent plate 18, and FIG. 2(B) is a sectional view taken along the line AA'.
透明板１８には下面から目印となる円錐状の穴２８を刻
みつけておく。測定光６がこの透明板１８の穴２８を通
過するとき、その穴２８の境界面で乱反射が起こり、測
定光６が当っているのを確認することができる。A conical hole 28 is cut into the transparent plate 18 from the bottom surface to serve as a mark. When the measurement light 6 passes through the hole 28 of the transparent plate 18, diffuse reflection occurs at the boundary surface of the hole 28, and it can be confirmed that the measurement light 6 is hitting the hole 28.
本実施例において測定光６の照射位置を確めるためには
、可動支持板２０の摘み２６を左右に動かして、測定光
６が透明板１８の穴２８に当って乱反射する位置を捜す
。In this embodiment, in order to confirm the irradiation position of the measurement light 6, move the knob 26 of the movable support plate 20 left and right to find the position where the measurement light 6 hits the hole 28 of the transparent plate 18 and is diffusely reflected.
次に試料プレートの吸光度を実測する場合は、再び摘み
２６を手で動かして、透明板１８及び可動支持板２０を
測定光６の光路から外れる位置まで移動させる。Next, when actually measuring the absorbance of the sample plate, manually move the knob 26 again to move the transparent plate 18 and the movable support plate 20 to a position out of the optical path of the measurement light 6.
上記の実施例では透明板１８を試料プレーｌ−８の上方
に配置しているが、透明板１８を試料プレート８の下方
に配置してもよい。In the above embodiment, the transparent plate 18 is placed above the sample plate 1-8, but the transparent plate 18 may be placed below the sample plate 8.
第３図は目印を持った透明板１８を試料室の蓋の開閉操
作と連動させ、機械的に動作させることにより、蓋が開
けば自動的に透明板１８が照射光の光路中へ挿入される
ようにしたものである。FIG. 3 shows that a transparent plate 18 with a mark is mechanically operated in conjunction with the opening/closing operation of the lid of the sample chamber, so that when the lid is opened, the transparent plate 18 is automatically inserted into the optical path of the irradiation light. It was designed so that
透明板１８を取り付ける可動支持板３０の両端に固定棒
３２，３４を取り付け、固定棒３２の一端をＬ字型のア
ーム３６の一端に回動可能に取り付け、固定棒３４の一
端をアーム３８の一端に回動可能に取り付ける。アーム
３６の折曲り部とアーム３８の他端を試料室の左右の壁
面に回動可能に取り付ける。アーム３６の他端は、アー
ム案内板４０の案内溝に沿って移動することのできるア
ーム４２の一端に回動可能に取り付けられ、アーム４２
の他端、すなわちアーム案内板４０に案内される部分に
はアーム４４の一端が回動可能に取り付けられ、アーム
４４の他端はアーム取り付は板４６を介して試料室の蓋
５０に回動可能に取り付けられている。Fixing rods 32 and 34 are attached to both ends of the movable support plate 30 to which the transparent plate 18 is attached, one end of the fixing rod 32 is rotatably attached to one end of the L-shaped arm 36, and one end of the fixing rod 34 is attached to the end of the arm 38. Rotatably attached to one end. The bent portion of the arm 36 and the other end of the arm 38 are rotatably attached to the left and right walls of the sample chamber. The other end of the arm 36 is rotatably attached to one end of an arm 42 that can move along a guide groove of an arm guide plate 40.
One end of an arm 44 is rotatably attached to the other end, that is, the portion guided by the arm guide plate 40, and the other end of the arm 44 is rotatably attached to the lid 50 of the sample chamber via a plate 46. movably mounted.
この実施例によれば、試料室の蓋５０を開けることによ
って、アームの連動により透明板１８が測定光６の光路
位置に移動する。また、測定時、試料室の蓋５０を閉め
ることによって、透明板１８と可動支持板３０が測定光
６の光路から退避する。According to this embodiment, when the lid 50 of the sample chamber is opened, the transparent plate 18 is moved to the optical path position of the measurement light 6 by the interlocking movement of the arm. Furthermore, during measurement, by closing the lid 50 of the sample chamber, the transparent plate 18 and the movable support plate 30 are retracted from the optical path of the measurement light 6.
透明板１８に刻みつける目印は実施例に示されるような
円錐状の凹み２８に限定されない。例えばこの凹み２８
を四角推状として、その四面の方向に十字放射状の延長
辺を出し、照射点のＸＹ座標の読み取りの助けになるよ
うにしてもよい。The mark carved on the transparent plate 18 is not limited to the conical recess 28 shown in the embodiment. For example, this dent 28
It is also possible to make it a rectangular shape with extended sides in the shape of a cross in the direction of its four faces to help read the XY coordinates of the irradiation point.
また、透明板１８に適量の蛍光物質を混入させるか、ま
たは表面に塗布することによって、照射光が紫外線であ
る場合でも目視確認することができるようになる。Furthermore, by mixing an appropriate amount of fluorescent material into the transparent plate 18 or coating it on the surface, visual confirmation becomes possible even when the irradiated light is ultraviolet light.
第３図に示されるように透明板１８の移動を試料室の蓋
５０の開閉と連動させた場合は、透明板１８を測定光の
光路から退避させるのを忘れて測定を開始してしまうと
いうミスをなくすことができる。If the movement of the transparent plate 18 is linked to the opening and closing of the lid 50 of the sample chamber as shown in FIG. 3, it is possible to forget to move the transparent plate 18 out of the optical path of the measurement light before starting the measurement. You can eliminate mistakes.
（発明の効果）
本発明のクロマトスキャナでは載置される試料面に接近
して照射光束位置の試料面の上方又は下７一
方に、照射光束を乱反射させる目印を刻んだ透明板を着
脱可能に設けたので、電気泳動ゲルを測定する場合であ
っても、試料スポットの有無に拘わらず照射点の位置を
目視確認することが可能になる。(Effects of the Invention) In the chromatography scanner of the present invention, a transparent plate with a mark for diffusely reflecting the irradiated light beam is removably attached to one side above or below the sample surface at the irradiation light beam position close to the sample surface on which the irradiation light beam is placed. With this provision, even when measuring an electrophoretic gel, it becomes possible to visually confirm the position of the irradiation point regardless of the presence or absence of a sample spot.
第１図（Ａ）は一実施例を示す断面図、同図（Ｂ）は同
実施例の要部正面図、第２図（Ａ）は透明板の部分を示
す斜視図、同図（ｒ３）は同図（Ａ）のＡ−Ａ’線位置
での断面図、第３図は他の実施例を示す要部斜視図であ
る。
６・・・・・・測定光、
８・・・・・・試料プレート、
１８・・・・・・透明板、
２８・・・・・・目印。FIG. 1(A) is a sectional view showing one embodiment, FIG. 1(B) is a front view of main parts of the same embodiment, FIG. ) is a sectional view taken along line AA' in FIG. 3(A), and FIG. 3 is a perspective view of main parts showing another embodiment. 6...Measurement light, 8...Sample plate, 18...Transparent plate, 28...Marker.
Claims (1)
置の試料面の上方又は下方に、照射光束を乱反射させる
目印を刻んだ透明板を着脱可能に設けたクロマトスキャ
ナ。(1) A chromatography scanner that is removably provided with a transparent plate inscribed with marks that diffusely reflect the irradiated light beam above or below the sample surface at the position of the irradiated light beam of measurement light close to the sample surface on which it is placed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22152786A JPH0833343B2 (en) | 1986-09-18 | 1986-09-18 | Chromatoskiana |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22152786A JPH0833343B2 (en) | 1986-09-18 | 1986-09-18 | Chromatoskiana |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6375535A true JPS6375535A (en) | 1988-04-05 |
| JPH0833343B2 JPH0833343B2 (en) | 1996-03-29 |
Family
ID=16768110
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP22152786A Expired - Lifetime JPH0833343B2 (en) | 1986-09-18 | 1986-09-18 | Chromatoskiana |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0833343B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03214040A (en) * | 1990-01-18 | 1991-09-19 | Japan Spectroscopic Co | Light analyzing apparatus |
| JP2011228072A (en) * | 2010-04-19 | 2011-11-10 | Hitachi High-Technologies Corp | Analyzer, ionizer and analysing method |
-
1986
- 1986-09-18 JP JP22152786A patent/JPH0833343B2/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03214040A (en) * | 1990-01-18 | 1991-09-19 | Japan Spectroscopic Co | Light analyzing apparatus |
| JP2011228072A (en) * | 2010-04-19 | 2011-11-10 | Hitachi High-Technologies Corp | Analyzer, ionizer and analysing method |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0833343B2 (en) | 1996-03-29 |
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