JPS6363870B2 - - Google Patents

Info

Publication number
JPS6363870B2
JPS6363870B2 JP52133660A JP13366077A JPS6363870B2 JP S6363870 B2 JPS6363870 B2 JP S6363870B2 JP 52133660 A JP52133660 A JP 52133660A JP 13366077 A JP13366077 A JP 13366077A JP S6363870 B2 JPS6363870 B2 JP S6363870B2
Authority
JP
Japan
Prior art keywords
information processing
circuit
processing circuit
module
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP52133660A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5360534A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS5360534A publication Critical patent/JPS5360534A/ja
Publication of JPS6363870B2 publication Critical patent/JPS6363870B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/16—Error detection or correction of the data by redundancy in hardware
    • G06F11/1629—Error detection by comparing the output of redundant processing systems
    • G06F11/1637—Error detection by comparing the output of redundant processing systems using additional compare functionality in one or some but not all of the redundant processing components
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D1/00—Measuring arrangements giving results other than momentary value of variable, of general application
    • G01D1/02—Measuring arrangements giving results other than momentary value of variable, of general application giving mean values, e.g. root means square values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
    • G01R23/10—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by converting frequency into a train of pulses, which are then counted, i.e. converting the signal into a square wave
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/16—Error detection or correction of the data by redundancy in hardware
    • G06F11/20—Error detection or correction of the data by redundancy in hardware using active fault-masking, e.g. by switching out faulty elements or by switching in spare elements
    • G06F11/202—Error detection or correction of the data by redundancy in hardware using active fault-masking, e.g. by switching out faulty elements or by switching in spare elements where processing functionality is redundant
    • G06F11/2023—Failover techniques
    • G06F11/2033—Failover techniques switching over of hardware resources
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/16—Error detection or correction of the data by redundancy in hardware
    • G06F11/20—Error detection or correction of the data by redundancy in hardware using active fault-masking, e.g. by switching out faulty elements or by switching in spare elements
    • G06F11/202—Error detection or correction of the data by redundancy in hardware using active fault-masking, e.g. by switching out faulty elements or by switching in spare elements where processing functionality is redundant
    • G06F11/2038—Error detection or correction of the data by redundancy in hardware using active fault-masking, e.g. by switching out faulty elements or by switching in spare elements where processing functionality is redundant with a single idle spare processing component
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations
    • G06F17/18—Complex mathematical operations for evaluating statistical data, e.g. average values, frequency distributions, probability functions, regression analysis

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Data Mining & Analysis (AREA)
  • Quality & Reliability (AREA)
  • Mathematical Physics (AREA)
  • Pure & Applied Mathematics (AREA)
  • Computational Mathematics (AREA)
  • Mathematical Optimization (AREA)
  • Mathematical Analysis (AREA)
  • Evolutionary Biology (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Operations Research (AREA)
  • Probability & Statistics with Applications (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Algebra (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Databases & Information Systems (AREA)
  • Software Systems (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Testing And Monitoring For Control Systems (AREA)
JP13366077A 1976-11-09 1977-11-09 Information monitor Granted JPS5360534A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/740,323 US4156929A (en) 1976-11-09 1976-11-09 Digital monitoring system

Publications (2)

Publication Number Publication Date
JPS5360534A JPS5360534A (en) 1978-05-31
JPS6363870B2 true JPS6363870B2 (en, 2012) 1988-12-08

Family

ID=24976010

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13366077A Granted JPS5360534A (en) 1976-11-09 1977-11-09 Information monitor

Country Status (7)

Country Link
US (1) US4156929A (en, 2012)
JP (1) JPS5360534A (en, 2012)
CA (1) CA1087743A (en, 2012)
DE (1) DE2750154A1 (en, 2012)
ES (1) ES463969A1 (en, 2012)
GB (1) GB1563046A (en, 2012)
IT (1) IT1206425B (en, 2012)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07168829A (ja) * 1994-09-30 1995-07-04 Hitachi Ltd 文書作成方法
JPH08263486A (ja) * 1995-03-24 1996-10-11 Nec Corp かな漢字変換装置及び方法

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4445175A (en) * 1981-09-14 1984-04-24 Motorola, Inc. Supervisory remote control system employing pseudorandom sequence
JPS58201154A (ja) * 1982-05-19 1983-11-22 Nissan Motor Co Ltd アンチスキッド制御装置用マイクロコンピュータのモード監視制御装置
DE3325340A1 (de) * 1983-07-13 1985-01-24 Siemens AG, 1000 Berlin und 8000 München Verfahren zur messung von impulsraten
US4608648A (en) * 1984-04-09 1986-08-26 Mitsubishi Denki Kabushiki Kaisha Data display system
TW200625113A (en) * 2004-12-21 2006-07-16 Ind Tech Res Inst Method for work place monitoring data management and analysis
IT1391785B1 (it) * 2008-11-21 2012-01-27 St Microelectronics Srl Sistema elettronico per il rilevamento di un guasto
CN113155880B (zh) * 2021-05-08 2023-06-27 电子科技大学 一种采用无人机和xrf技术对土壤重金属污染的检测方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3770948A (en) * 1972-05-26 1973-11-06 Gte Automatic Electric Lab Inc Data handling system maintenance arrangement
US3895223A (en) * 1973-01-03 1975-07-15 Westinghouse Electric Corp Circuit arrangement for enhancing the reliability of common bus outputs of plural redundant systems

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07168829A (ja) * 1994-09-30 1995-07-04 Hitachi Ltd 文書作成方法
JPH08263486A (ja) * 1995-03-24 1996-10-11 Nec Corp かな漢字変換装置及び方法

Also Published As

Publication number Publication date
CA1087743A (en) 1980-10-14
DE2750154A1 (de) 1978-05-18
ES463969A1 (es) 1978-07-16
GB1563046A (en) 1980-03-19
IT1206425B (it) 1989-04-21
JPS5360534A (en) 1978-05-31
US4156929A (en) 1979-05-29

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