JPS6362108B2 - - Google Patents
Info
- Publication number
- JPS6362108B2 JPS6362108B2 JP54136661A JP13666179A JPS6362108B2 JP S6362108 B2 JPS6362108 B2 JP S6362108B2 JP 54136661 A JP54136661 A JP 54136661A JP 13666179 A JP13666179 A JP 13666179A JP S6362108 B2 JPS6362108 B2 JP S6362108B2
- Authority
- JP
- Japan
- Prior art keywords
- type
- polycrystalline silicon
- source
- silicon film
- film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/0123—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
- H10D84/0126—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
- H10D84/0165—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs the components including complementary IGFETs, e.g. CMOS devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/02—Manufacture or treatment characterised by using material-based technologies
- H10D84/03—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
- H10D84/038—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
Landscapes
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Electrodes Of Semiconductors (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13666179A JPS5660063A (en) | 1979-10-23 | 1979-10-23 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13666179A JPS5660063A (en) | 1979-10-23 | 1979-10-23 | Manufacture of semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5660063A JPS5660063A (en) | 1981-05-23 |
JPS6362108B2 true JPS6362108B2 (en, 2012) | 1988-12-01 |
Family
ID=15180536
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13666179A Granted JPS5660063A (en) | 1979-10-23 | 1979-10-23 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5660063A (en, 2012) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59115554A (ja) * | 1982-12-22 | 1984-07-04 | Toshiba Corp | 半導体装置の製造方法 |
DE3304588A1 (de) * | 1983-02-10 | 1984-08-16 | Siemens AG, 1000 Berlin und 8000 München | Verfahren zum herstellen von mos-transistoren mit flachen source/drain-gebieten, kurzen kanallaengen und einer selbstjustierten, aus einem metallsilizid bestehenden kontaktierungsebene |
JPS59208772A (ja) * | 1983-05-12 | 1984-11-27 | Nec Corp | 半導体装置の製造方法 |
JPS59208773A (ja) * | 1983-05-12 | 1984-11-27 | Nec Corp | 半導体装置の製造方法 |
JPS6165470A (ja) * | 1984-09-07 | 1986-04-04 | Hitachi Ltd | 半導体集積回路装置 |
JPS61139058A (ja) * | 1984-12-11 | 1986-06-26 | Seiko Epson Corp | 半導体製造装置 |
US4648175A (en) * | 1985-06-12 | 1987-03-10 | Ncr Corporation | Use of selectively deposited tungsten for contact formation and shunting metallization |
JP2807226B2 (ja) * | 1987-09-12 | 1998-10-08 | ソニー株式会社 | 半導体装置の製造方法 |
JPH0226021A (ja) * | 1988-07-14 | 1990-01-29 | Matsushita Electron Corp | 多層配線の形成方法 |
-
1979
- 1979-10-23 JP JP13666179A patent/JPS5660063A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5660063A (en) | 1981-05-23 |
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