JPS6361136U - - Google Patents

Info

Publication number
JPS6361136U
JPS6361136U JP15455986U JP15455986U JPS6361136U JP S6361136 U JPS6361136 U JP S6361136U JP 15455986 U JP15455986 U JP 15455986U JP 15455986 U JP15455986 U JP 15455986U JP S6361136 U JPS6361136 U JP S6361136U
Authority
JP
Japan
Prior art keywords
semiconductor manufacturing
objective lenses
finished
inspecting
semi
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15455986U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP15455986U priority Critical patent/JPS6361136U/ja
Publication of JPS6361136U publication Critical patent/JPS6361136U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP15455986U 1986-10-08 1986-10-08 Pending JPS6361136U (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15455986U JPS6361136U (ko) 1986-10-08 1986-10-08

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15455986U JPS6361136U (ko) 1986-10-08 1986-10-08

Publications (1)

Publication Number Publication Date
JPS6361136U true JPS6361136U (ko) 1988-04-22

Family

ID=31074460

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15455986U Pending JPS6361136U (ko) 1986-10-08 1986-10-08

Country Status (1)

Country Link
JP (1) JPS6361136U (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009524071A (ja) * 2006-02-10 2009-06-25 アーテーゲー ルーテル ウント メルツァー ゲーエムベーハー コンポーネント化されていない印刷回路基板の検査のためのフィンガーテスター及びフィンガーテスターでコンポーネント化されていない印刷回路基板を検査する方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53113309A (en) * 1977-03-16 1978-10-03 Howa Mach Ltd Reciprocating compressor

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53113309A (en) * 1977-03-16 1978-10-03 Howa Mach Ltd Reciprocating compressor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009524071A (ja) * 2006-02-10 2009-06-25 アーテーゲー ルーテル ウント メルツァー ゲーエムベーハー コンポーネント化されていない印刷回路基板の検査のためのフィンガーテスター及びフィンガーテスターでコンポーネント化されていない印刷回路基板を検査する方法

Similar Documents

Publication Publication Date Title
JPS6361136U (ko)
JPS57167651A (en) Inspecting device for surface of semiconductor wafer
SE7714443L (sv) Anordning for kontroll av tversnittsprofiler
JPS5980965A (ja) 固体撮像素子検査装置
JPH05332739A (ja) 外観検査装置
JPS6224581U (ko)
DE19613516C2 (de) Sauggreifer
JPS62141279U (ko)
JPS583299Y2 (ja) 半導体装置の検査装置
JPH03152408A (ja) Ｉｃパッケージのリード検査装置
JPH07103730A (ja) リードフレーム検査装置
CN207007741U (zh) 摄像模组组装前污点测试结构
JPH0543008U (ja) 物品の外観検査装置
KR100214013B1 (ko) 칩 얼라이먼트 장치
JPS6325308U (ko)
JPH01209579A (ja) Ｉｃの位置認識装置
JPH03269246A (ja) ボンディングワイヤ検査装置
JPH0260245U (ko)
JPS63103932A (ja) 複合レンズの芯出し方法及び装置
DE4326704A1 (de) Verfahren zur Messung von geometrischen Größen mit Hilfe von optischen Positionsdetektoren in der Kamerafokusebene
JPS6239812B2 (ko)
JPH012096A (ja) 液晶表示パネルの位置決め装置
JPH0732188B2 (ja) 半導体装置の検査装置
HEMEL Operator and technician tasks for the heads-up display test set and versatile avionics shop test/VAST
JPS61280628A (ja) 半導体リ−ド検査装置