JPS6361111A - Surface roughness measuring machine - Google Patents
Surface roughness measuring machineInfo
- Publication number
- JPS6361111A JPS6361111A JP20639986A JP20639986A JPS6361111A JP S6361111 A JPS6361111 A JP S6361111A JP 20639986 A JP20639986 A JP 20639986A JP 20639986 A JP20639986 A JP 20639986A JP S6361111 A JPS6361111 A JP S6361111A
- Authority
- JP
- Japan
- Prior art keywords
- light
- lens
- screen
- measured
- surface roughness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003746 surface roughness Effects 0.000 title claims abstract description 7
- 230000001678 irradiating effect Effects 0.000 abstract description 2
- 101700004678 SLIT3 Proteins 0.000 abstract 1
- 102100027339 Slit homolog 3 protein Human genes 0.000 abstract 1
- 230000001066 destructive effect Effects 0.000 abstract 1
- 235000006732 Torreya nucifera Nutrition 0.000 description 2
- 244000111306 Torreya nucifera Species 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明はプラスチック成形品のシボ面等の表面粗さの測
定機に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a measuring device for measuring the surface roughness of a textured surface of a plastic molded product.
従来、この種の測定の手段としてはシボ模様の見本板と
照し合わせて比較する等の方法がとられていた。Conventionally, this type of measurement has been carried out by comparing it with a grained sample board.
しかし、従来の方法では、観察者の主観によシ結論にく
い違いが生じ、良否の判定が非常に困難でありた。However, with conventional methods, differences that are difficult to conclude due to the subjectivity of the observer occur, making it extremely difficult to judge whether the product is good or bad.
本発明の面粗さ測定機は、光源、レンズ、スリットから
成る発光部と、レンズおよびスクリーン等の投影部から
成る受光部とを有している。The surface roughness measuring device of the present invention has a light emitting section consisting of a light source, a lens, and a slit, and a light receiving section consisting of a projection section such as a lens and a screen.
次に１本発明の実施例について図面を参照して説明する
。Next, an embodiment of the present invention will be described with reference to the drawings.
第１図は本発明の一実施例を示す斜視図である。FIG. 1 is a perspective view showing an embodiment of the present invention.
図において、光源ｌを出た光はレンズ２全通シ、極めて
幅の狭いス！Ｊ 、ｙ ） ３に通過すると平面波の光
になる。この平面光を被測定物４に照射し、その反射光
をレンズ５でとらえレンズ６で拡大した後、カメラ７や
スクリーン上に投影し観察する。In the figure, the light emitted from the light source 1 passes through the entire lens 2 and has an extremely narrow width. J , y ) 3, it becomes plane wave light. The object to be measured 4 is irradiated with this plane light, and the reflected light is captured by a lens 5 and magnified by a lens 6, and then projected onto a camera 7 or a screen for observation.
スクリーン上には第２図に示す様に、レンズ５゜６によ
シ切断されたシボ面の稜線が拡大されて投影される。As shown in FIG. 2, the ridgeline of the textured surface cut by the lens 5.6 is enlarged and projected onto the screen.
以上説明したように本発明は、スリットを通した平面光
を被測定物の表面に照射し、その反射光をレンズを通し
拡大してスクリーンやフィルム上に投影することにより
、表面粗さを定量的に非破壊で測定できる効果がある。As explained above, the present invention quantifies surface roughness by irradiating plane light through a slit onto the surface of the object to be measured, magnifying the reflected light through a lens, and projecting it onto a screen or film. It has an effect that can be measured non-destructively.
第１図は本発明の一実施例を示す斜視図、第２図は本発
明によシ被測定物の表面粗さがスクリーン上に拡大され
た像を示す平面図である。
１・・・・・・光源、２・・・・・・レンズ、３・・・
・・・スリット、４・・・・・・被測定物、５・・・・
・・レンズ、６・・・・・・レンズ、７・・・・・・カ
メラ。
茅 １ 図
茅 ２Ｉ！１FIG. 1 is a perspective view showing an embodiment of the present invention, and FIG. 2 is a plan view showing an enlarged image of the surface roughness of an object to be measured on a screen according to the present invention. 1...Light source, 2...Lens, 3...
...Slit, 4...Object to be measured, 5...
...lens, 6...lens, 7...camera. Kaya 1 Figure Kaya 2I! 1
Claims (1)
物に照射する極めて幅の狭いスリットと、前記被測定物
からの反射光を拡大してスクリーンやカメラのフィルム
等に投影するレンズ機構とを有する面粗さ測定機。A light source, an extremely narrow slit that receives the light from the light source and converts it into a plane wave and irradiates it onto the object to be measured, and a lens mechanism that magnifies the light reflected from the object to be measured and projects it onto a screen, camera film, etc. A surface roughness measuring machine with
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20639986A JPS6361111A (en) | 1986-09-01 | 1986-09-01 | Surface roughness measuring machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20639986A JPS6361111A (en) | 1986-09-01 | 1986-09-01 | Surface roughness measuring machine |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6361111A true JPS6361111A (en) | 1988-03-17 |
Family
ID=16522710
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP20639986A Pending JPS6361111A (en) | 1986-09-01 | 1986-09-01 | Surface roughness measuring machine |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6361111A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008145318A (en) * | 2006-12-12 | 2008-06-26 | Hiroshima Univ | Device and method for inspecting member surface |
-
1986
- 1986-09-01 JP JP20639986A patent/JPS6361111A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008145318A (en) * | 2006-12-12 | 2008-06-26 | Hiroshima Univ | Device and method for inspecting member surface |
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