JPS6360275A - Sputtering device - Google Patents

Sputtering device

Info

Publication number
JPS6360275A
JPS6360275A JP20459586A JP20459586A JPS6360275A JP S6360275 A JPS6360275 A JP S6360275A JP 20459586 A JP20459586 A JP 20459586A JP 20459586 A JP20459586 A JP 20459586A JP S6360275 A JPS6360275 A JP S6360275A
Authority
JP
Japan
Prior art keywords
substrate
targets
sputtering
film
base plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20459586A
Other languages
Japanese (ja)
Inventor
Eisuke Ueda
上田 映介
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP20459586A priority Critical patent/JPS6360275A/en
Publication of JPS6360275A publication Critical patent/JPS6360275A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target

Abstract

PURPOSE:To uniformly form a thin alloy film having arbitrary composition on a base plate by arranging the base plate freely rotatably around a rotation axis in a film-forming chamber and also arranging plural targets having oblique angle respectively for the rotation axis of the base plate. CONSTITUTION:Respective base plates 4 are revolved around the rotation axis S of a revolving holder 2 under the rotation thereof and also intermittently rotated on own axes around the rotation axes (s) of the base plates 4 by a fixed gear 7. Simultaneously sputtering is performed by conducting electricity to targets 5A, 5B having oblique angle respectively for the base plates 4 from electric sources 6A, 6B. Therefor the base plates 4 are intermittently stuck with a thin alloy film in a glow discharge region. At this time, the composition of alloy of the thin film to be formed can be arbitrarily changed by reciprocating targets 5A, 5B to regulate the ratio of distances Da, Db for the center O of the base plate or regulating electric power of sputtering electric sources 6A, 6B or using both in combination.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、合金薄膜の成膜に利用されるスパッタリング
′A社に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a sputtering method used for forming alloy thin films.

[従来の技術] 従来、スパッタリング法で合金薄膜を作成する場合、チ
ャンバ内で成膜基板に対設されるターゲットに、0合金
ターゲツトを用いる、■複合ターゲットを用いる、のい
ずれかの方法が主に利用されている。前者は、予め目的
の成分組成に溶製しである合金ターゲットをスパッタし
て、基板面に当該合金組成の薄膜を得ようとするもので
ある。
[Conventional technology] Conventionally, when creating an alloy thin film using a sputtering method, the main methods are to use a 0 alloy target or to use a composite target as a target placed opposite to the film forming substrate in a chamber. It is used for. The former method involves sputtering an alloy target that has been melted to a desired composition in advance to obtain a thin film having the alloy composition on the substrate surface.

これに対し後者は、゛第4図、第5図に例示する如く、
部分的に異種の材料へ、Bで形成される複合ターゲット
Tをスパッタして、基板面にそれらのスパッタ粒子を同
時に付着させ目的合金組成の薄膜を得ようとするもので
ある(例えば、共立出版発刊;甲用・和佐著「Fj9膜
化技術」の第124頁参照)。
On the other hand, the latter, as illustrated in Figures 4 and 5,
A composite target T made of B is sputtered onto partially different materials, and the sputtered particles are simultaneously attached to the substrate surface to obtain a thin film with the desired alloy composition (for example, Kyoritsu Shuppan Co., Ltd. (Published; see page 124 of "Fj9 Film Formation Technology" by Kouyou and Wasa).

[発明が解決しようとする問題点] しかし、上記いずれの成膜手段も本質的には、基板上に
成膜される薄膜の合金組成を、ターゲットのもつ合金組
成又は機械的な材料複合比にそのまま対応させるように
したbのであるから、11i2の合金組成比率を任意に
可変することは困難である。言い換えると、従前のスパ
ッタリング装置で基板上に成膜づる薄膜の合金組成を変
更するためには、その都度ターゲットを巽種のものに交
換しなければならない不具合がある。
[Problems to be Solved by the Invention] However, all of the above film forming methods essentially change the alloy composition of the thin film to be formed on the substrate to the alloy composition or mechanical material composite ratio of the target. Since it is made to correspond as is, it is difficult to arbitrarily vary the alloy composition ratio of 11i2. In other words, in order to change the alloy composition of a thin film formed on a substrate using a conventional sputtering apparatus, there is a problem in that the target must be replaced with a Tatsumi type each time.

本発明は、かかる問題点に着目してなされたもので、チ
ャンバ内に一旦ターゲットをセットしたならば、その交
換を必要とせずに、基板上に均一でかつ任意の組成を右
する合金′1tIJ膜を成。摸することができるスパッ
タリング装置を新たに提供せんとするものである。
The present invention has been made in view of this problem, and once the target is set in the chamber, it is possible to form an alloy '1tIJ with a uniform and arbitrary composition on the substrate without the need for replacement. Forms a membrane. The purpose is to provide a new sputtering device that can be simulated.

[問題点を解決するための手段] 上記の目的を達成するために本発明が採乞手程は、スパ
ッタリング装置のチャンバ内に形成される成膜室におい
て、基板を少なくとも自転運動可能に、即ちその軸心ま
わりに回転自在に配置するとともに、この基板に対向し
て、該基板の軸心に対し各々適宜の傾斜角を有する二個
以上のターゲットを配置したことである。
[Means for Solving the Problems] In order to achieve the above object, the present invention provides a step in which the substrate is made at least rotatable in a film forming chamber formed in a chamber of a sputtering apparatus, that is, Two or more targets are arranged to be rotatable around the axis of the substrate, and are arranged opposite to the substrate, each having an appropriate inclination angle with respect to the axis of the substrate.

[作用] 本発明のスパッタリング装置を用いた成膜プロセスの概
要が、第3図に図示されている。すなわち、この装置に
よると、基板4をその軸心Sのまわりで回転させながら
、該基板4とそれぞれ斜め向きで対向している複数のタ
ーゲット5A、5Bとに間でグロー放電させ各ターゲッ
ト5A、5Bを同時にスパッタする。すると、基板4に
は、各ターゲット5A、5Bからのスパッタ粒子が同時
に付着して行き各ターゲット5△と5Bとを目的の合金
成分に応じ異秤の材料で形成しておけば、基板面にはそ
れらの合金薄膜が形成されることになる。このさい、各
ターゲット5A、5Bは基板4に対し傾斜角を有するた
め、基板面に付着されるスパッタ粒子の量は各ターゲッ
ト5A、5Bから基板4に至る距離差に応じ、その近接
側と遠方側とで図示aSbのように異なる分布状態を示
すことになるが、基板4をその軸心Sまわりに適当な角
速度で回転すれば、基板4のヒの全ての部分で等しい組
成比率の合金薄膜を形成することが可能となる。そして
、基板4上に形成される合金薄膜は、各ターゲット5A
、5Bの基板4に対する距離を可変調整する手段及び/
又はそのスパッタ吊を相互に可変調整する手段を用いる
ことで、広範囲に亙りその成分組成を任意に変更できる
[Operation] An outline of the film forming process using the sputtering apparatus of the present invention is illustrated in FIG. That is, according to this device, while rotating the substrate 4 around its axis S, glow discharge is caused between the substrate 4 and a plurality of targets 5A, 5B diagonally facing each other. 5B is sputtered at the same time. Then, the sputtered particles from the targets 5A and 5B adhere to the substrate 4 at the same time, and if the targets 5Δ and 5B are made of different materials depending on the target alloy composition, the sputtered particles will be attached to the substrate surface. A thin film of these alloys will be formed. At this time, since each target 5A, 5B has an inclination angle with respect to the substrate 4, the amount of sputtered particles attached to the substrate surface is determined depending on the distance difference between each target 5A, 5B and the substrate 4. Although the distribution state will be different depending on the side as shown in the figure aSb, if the substrate 4 is rotated around its axis S at an appropriate angular velocity, an alloy thin film with the same composition ratio will be formed in all parts of the substrate 4. It becomes possible to form. Then, the alloy thin film formed on the substrate 4 is formed on each target 5A.
, 5B to the substrate 4 and/or
Alternatively, by using means for mutually variably adjusting the sputtering ratio, the component composition can be arbitrarily changed over a wide range.

「実施例] 以下、第1図、第2図に示す一実施例について本発明を
より具体的に説明する。
“Example” The present invention will be described in more detail below with reference to an example shown in FIGS. 1 and 2.

第1図は、スパッタリング装置の図示しないチt・ンバ
内部の成膜室1における基板1とターゲット5A、5B
との配置状態を示している。この場合、装置は1チヤー
ジで複数枚の基板4を同時に成膜処理できる構成を具備
している。
FIG. 1 shows a substrate 1 and targets 5A and 5B in a film forming chamber 1 inside a chamber (not shown) of a sputtering apparatus.
It shows the arrangement status with. In this case, the apparatus has a configuration that allows film formation on a plurality of substrates 4 at the same time with one charge.

ここにおいて、複数枚の基板4(図では便宜上4枚の例
を示すが、より多数枚であってもよい)は、中心に回転
支軸2aを有する大径円盤状の公転ホルダ2の下面に、
それぞれ小径円盤状の自転ホルダ3を介して取付けられ
、該公転ホルダ2の軸心Sのまわりの同心円周上で等角
rWI隔の位置に配置されている。この公転ホルダ2に
対する前記の各自転ホルダ3の取付構造は次のようであ
る。
Here, a plurality of substrates 4 (the figure shows an example of four substrates for convenience, but a larger number may be used) are mounted on the lower surface of a large-diameter disk-shaped revolving holder 2 having a rotational support shaft 2a at the center. ,
They are each attached via a rotating holder 3 in the form of a small diameter disk, and are arranged at equiangular rWI intervals on a concentric circle around the axis S of the revolving holder 2. The mounting structure of each of the above-mentioned rotating holders 3 to this revolving holder 2 is as follows.

即ち、各自転ホルダ3は、公転ホルダ2の下面に凹設し
た凹陥部2 bl、:i&め込むように装填されるとと
もに、その上面側に一体に突設した支軸部3bを公転ホ
ルダ2の軸通孔2cに貫支させて、該公転ホルダ2にそ
れらの各軸心Sのまわりで回転自在に保持されている。
That is, each rotating holder 3 is loaded so as to fit into the recessed part 2 bl,:i & provided on the lower surface of the revolving holder 2, and the supporting shaft part 3b integrally protruded from the upper surface thereof is inserted into the recessed part 2 bl,:i& of the revolving holder 2. They are held in the revolving holder 2 so as to be freely rotatable about their respective axes S by penetrating through the shaft through holes 2c.

そして、これらの各自転ホルダ3にはその外周面にギヤ
3aが刻設してあり、このギヤ3aが前記公転ホルダ2
の一側で外周近傍に配設しである固定歯車7のギvia
と間欠的に噛合するように構成している。そして、これ
ら自転ホルダ3の下面にそれぞれ基板4が同心に配着さ
れる。
A gear 3a is carved on the outer peripheral surface of each of these rotating holders 3, and this gear 3a is connected to the rotating holder 2.
The gear via of the fixed gear 7 is arranged near the outer periphery on one side.
It is configured so that it engages intermittently. Substrates 4 are concentrically arranged on the lower surfaces of these rotating holders 3, respectively.

かくして、前記公転ホルダ2を、その回転支軸2a1.
:連接している図外の駆動源により適当な角速度で軸心
Sのまわりに回転させると、各基板4はその軸心Sが該
公転ホルダ2の軸心Sまわりを旋回する公転運動を行う
と同時に、前記自転ホルダ3のギヤ3aと前記固定歯車
7のギヤ7aとの間欠的な噛合送りによる回転機構によ
り、自転ホルダ3と共にその各軸心Sのまわりに間欠的
に回転する自転運動を行うものとなり、各基板4は所定
の成膜位置(グロー放電領域)に臨む毎にその回転位相
がずらされる。なお、合金薄膜の均一性を確保する目的
からは、成膜位置での各基板4の回転位相がいつも異な
るように、各基板4(自転ホルダ3)の間欠自転量を調
整するのが有用である。
In this way, the revolving holder 2 is rotated around its rotational support shaft 2a1.
: When rotated around the axis S at an appropriate angular velocity by a connected drive source (not shown), each substrate 4 performs a revolution movement in which the axis S rotates around the axis S of the revolving holder 2. At the same time, a rotation mechanism in which the gear 3a of the rotating holder 3 and the gear 7a of the fixed gear 7 are intermittently engaged with each other allows the rotational movement of the rotating holder 3 to rotate intermittently around each axis S. The rotational phase of each substrate 4 is shifted each time it faces a predetermined film forming position (glow discharge region). Note that for the purpose of ensuring uniformity of the alloy thin film, it is useful to adjust the amount of intermittent rotation of each substrate 4 (rotating holder 3) so that the rotation phase of each substrate 4 at the film forming position is always different. be.

一方、前記公転ホルダ2の一側下方位置で基板4に対向
されるターゲット5Δ、5Bは、図示例の場合2個で、
異種材料により形成されている。
On the other hand, the targets 5Δ and 5B facing the substrate 4 at the lower position on one side of the revolving holder 2 are two in the illustrated example,
It is made of different materials.

これらは各基板4の前記軸心Sに対し、それぞれ適当な
傾斜角α、βを有する傾斜姿勢で対向配置される。この
場合、傾斜角α、βは、成膜室1内でのレイアウト上支
障無い節回で挟角とした方がスパッタ効率等の諸点で有
利であるが、各々任意に調整できる。
These are arranged opposite to the axis S of each substrate 4 in an inclined posture having appropriate inclination angles α and β, respectively. In this case, it is advantageous in terms of sputtering efficiency and the like to set the inclination angles α and β to angles that do not interfere with the layout within the film forming chamber 1, but each can be adjusted as desired.

そして、ターゲット5A、5Bは、所定の成膜位置にあ
る基板4の中心O(各基板4の公転円周上にある)に対
し、図示省略の往復動機構によりそれぞれ図示矢印■、
■の方向に遠近調整可能に配設され、図中では、一方の
ターゲット5Aを距MDa 、他方のターゲット5Bを
距離Dbの異なる距離の位置に設定した場合を例示して
いる。そして又、これら両ターゲット5Δ、5Bは、各
々別個にグロ〜・放電電力を制御できて、そのスパッタ
量を任意に可変し得る独立したスパッタ電源6A、6B
を備えている。
Then, the targets 5A and 5B are moved by a reciprocating mechanism (not shown) with respect to the center O of the substrate 4 (located on the revolution circumference of each substrate 4) at a predetermined film forming position, respectively with the arrows shown in the figure.
They are disposed so as to be adjustable in distance in the direction (2), and the figure shows an example in which one target 5A is set at a distance MDa and the other target 5B is set at different distances Db. Furthermore, these two targets 5Δ, 5B are provided with independent sputtering power supplies 6A, 6B which can control the glow/discharge power separately and can arbitrarily vary the amount of sputtering.
It is equipped with

なお、成膜室1を画するチ11ンバには、図示されない
けれども、スパッタリング装置に必要な排気系やガス導
入系等が付設されている。
Although not shown in the drawings, the chamber 11 that defines the film forming chamber 1 is provided with an exhaust system, a gas introduction system, etc. necessary for the sputtering apparatus.

以上のように構成してなるスパッタリング装置では、公
転ホルダ2の回転下で各基板4を軸心Sまわりに公転さ
せ、同時にその軸心Sのまわりに間欠的に自転させなが
らターゲット5A、5Bのスパッタ電源6A、6Bを通
電ONL、で、スパッタリングを行う。すると、公転ホ
ルダ2にセットされた基板4には、グロー放電領域にさ
らされる位置に来る毎にターゲット6A、6Bの距離Q
a、Dbとスパッタ電力に対応するスパッタ量とに見合
う比率の合金薄膜が間欠的に付着されて行く。
In the sputtering apparatus configured as described above, each substrate 4 is made to revolve around the axis S under the rotation of the revolving holder 2, and at the same time, the targets 5A and 5B are rotated intermittently about the axis S. Sputtering is performed by energizing the sputtering power supplies 6A and 6B ONL. Then, the distance Q between the targets 6A and 6B is shown on the substrate 4 set in the revolving holder 2 every time the substrate 4 comes to a position exposed to the glow discharge area.
An alloy thin film is deposited intermittently at a ratio commensurate with a, Db and the amount of sputtering corresponding to the sputtering power.

このさい、各基板4に対するスパッタ粒子の付着量は、
前述したように各ターゲット5A、5Bに対する位置関
係により偏った分布を示すが、各基板4は周期的に成膜
される毎に自転して回転位相がずらされるようになって
いるから、各基板4に成膜される薄膜の合金組成は最終
的に各部で均一化される。そして、公転ホルダ2の回転
下に各基板4に対し所定時間スパッタリングを行うと、
該。
At this time, the amount of sputtered particles attached to each substrate 4 is
As mentioned above, the distribution is biased depending on the positional relationship with respect to each target 5A, 5B, but since each substrate 4 rotates on its own axis and the rotational phase is shifted every time a film is periodically formed, each substrate The alloy composition of the thin film formed in step 4 is finally made uniform in each part. Then, sputtering is performed on each substrate 4 for a predetermined time while the revolving holder 2 is rotating.
Applicable.

公転ホルダ2に取付けた複数枚の基板4には、同時にか
つ均等に一定比率の組成を右する合金薄膜が形成される
。そして、これら複数枚の基板4に同時に成膜されるF
i9膜の合金組成は、ターゲット5A、5Bを往復動さ
せて相互の基板中心0に対する距MDa SDbの比率
を調整するか、又はスパッタ電源6A、6Bの電力に対
応するスパッタ量の比率を調整するか、あるいはその双
方の手段を併用することにより、任意に可変することが
できる。
On a plurality of substrates 4 attached to the revolving holder 2, alloy thin films having a constant composition are simultaneously and evenly formed. Then, F film is formed on these plurality of substrates 4 at the same time.
The alloy composition of the i9 film can be determined by reciprocating the targets 5A and 5B to adjust the ratio of the mutual distance MDa to SDb with respect to the substrate center 0, or by adjusting the ratio of the amount of sputtering corresponding to the power of the sputtering power sources 6A and 6B. It can be arbitrarily varied by using either or both means in combination.

以上、好適なる実施例として、1ヂヤージで複数基板に
成膜処理可能なスパッタリング装置を説明したが、本発
明は既に第3図により説明したように、基本的には基板
4に1枚づつ合金薄膜を成膜処理して行く場合について
から有効に適用されるものである。その場合、基板4に
公転運動を与えることは必ずしも必要でなく、前記実施
例における公転ホルダ2の使用は不要と、される。
As described above, as a preferred embodiment, a sputtering apparatus capable of forming films on a plurality of substrates in one direction has been described, but as already explained with reference to FIG. This method is effectively applied to the case where thin films are formed. In that case, it is not necessarily necessary to give the substrate 4 a revolution motion, and the use of the revolution holder 2 in the embodiment described above is unnecessary.

なお、前記実施例によると、傾斜配置するター1: +
l−L sn粘LQ Iln L l  #−gnA 
”’y +、rり;−一ム小へ合薄膜を成膜したい場合
などでは、成膜室1に異種材質のターゲットを3個以上
配古するようにするようにしてもよい。また、前記実施
例では、各ターゲット5A、5Bのスパッタ電源6A、
6Bに直流電源を使用する場合を図示したが、これは勿
論高周波電源を利用するものであってもよい。
Incidentally, according to the embodiment, the tar 1 arranged at an angle: +
l-L sn viscous LQ Iln L l #-gnA
In cases where it is desired to form a composite thin film on a surface of 1 mm or less, three or more targets made of different materials may be arranged in the film forming chamber 1.Also, In the embodiment, the sputtering power source 6A for each target 5A, 5B,
Although the case where a DC power source is used for 6B is illustrated, it is of course possible to use a high frequency power source.

さらに、基板4をその軸心Sのまわりに回転させる機構
は、例示のもの以外にも適宜の機構が採用でき、ターゲ
ット5A、5Bを往復動させる機構等も随意の手段によ
る。
Further, as the mechanism for rotating the substrate 4 around its axis S, any suitable mechanism other than the one illustrated may be employed, and the mechanism for reciprocating the targets 5A, 5B may also be any arbitrary means.

[発明の効果] 以上に説明した通り、本発明はスパッタリング装置の成
膜室で、軸心まわりに回転自在に配置した基板に対し、
傾斜角を有する複数のターゲットを対向配置してなるも
のであるから、ターゲット交換することなく基板上に均
一でかつ任意の組成を有する合金薄膜を成膜することが
できるものである。
[Effects of the Invention] As explained above, the present invention provides a film forming chamber for a sputtering apparatus in which a substrate rotatably arranged around an axis is
Since a plurality of targets having an inclination angle are arranged facing each other, a uniform thin alloy film having an arbitrary composition can be formed on a substrate without replacing the targets.

4、面の簡単な説明 グ装置の廿部概略図であり、第2図は第1図の部分平面
図℃゛ある。第3図は本発明に係る成膜プロセスの様f
を示1説明図である。第4図と第5図は、従来例を示す
ターゲットの平面図である。
4. Brief explanation of aspects This is a schematic diagram of the bottom part of the gage device, and FIG. 2 is a partial plan view of FIG. 1. Figure 3 shows the film forming process according to the present invention.
FIG. 1 is an explanatory diagram. FIGS. 4 and 5 are plan views of targets showing conventional examples.

1・・−成膜室      2・・・公転ホルダ3・・
・自転ホルダ    4・・・基板5Δ、5B・・・タ
ーゲット 6A、6B・・・スパッタ電源 7・・・固定歯車
1...-film formation chamber 2...revolving holder 3...
・Rotating holder 4... Substrate 5Δ, 5B... Target 6A, 6B... Sputter power supply 7... Fixed gear

Claims (1)

【特許請求の範囲】[Claims] 成膜室に、基板を軸心まわりに回転自在に配置するとと
もに、この基板に対向して該基板の軸心に対し各々傾斜
角を有する複数のターゲットを配置したことを特徴とす
るスパッタリング装置。
A sputtering apparatus characterized in that a substrate is arranged in a film forming chamber so as to be rotatable around an axis, and a plurality of targets are arranged facing the substrate and each having an inclination angle with respect to the axis of the substrate.
JP20459586A 1986-08-29 1986-08-29 Sputtering device Pending JPS6360275A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20459586A JPS6360275A (en) 1986-08-29 1986-08-29 Sputtering device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20459586A JPS6360275A (en) 1986-08-29 1986-08-29 Sputtering device

Publications (1)

Publication Number Publication Date
JPS6360275A true JPS6360275A (en) 1988-03-16

Family

ID=16493067

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20459586A Pending JPS6360275A (en) 1986-08-29 1986-08-29 Sputtering device

Country Status (1)

Country Link
JP (1) JPS6360275A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02185967A (en) * 1989-01-13 1990-07-20 Hitachi Ltd Method and device for bias sputtering
JPH04143274A (en) * 1990-10-05 1992-05-18 Shinku Kikai Kogyo Kk Thin film forming device
JP2001234336A (en) * 2000-02-18 2001-08-31 Ulvac Japan Ltd Sputtering method and sputtering system
US6461484B2 (en) * 2000-09-13 2002-10-08 Anelva Corporation Sputtering device
EP2921572B1 (en) * 2012-11-14 2020-06-24 Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.) Film deposition device

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56156766A (en) * 1980-05-08 1981-12-03 Fujitsu Ltd Spattering device
JPS6212923A (en) * 1985-07-10 1987-01-21 Fujitsu Ltd Production of magnetic recording medium
JPS6333565A (en) * 1986-07-23 1988-02-13 Nec Corp Production of multi-layered metallic film

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56156766A (en) * 1980-05-08 1981-12-03 Fujitsu Ltd Spattering device
JPS6212923A (en) * 1985-07-10 1987-01-21 Fujitsu Ltd Production of magnetic recording medium
JPS6333565A (en) * 1986-07-23 1988-02-13 Nec Corp Production of multi-layered metallic film

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02185967A (en) * 1989-01-13 1990-07-20 Hitachi Ltd Method and device for bias sputtering
JPH04143274A (en) * 1990-10-05 1992-05-18 Shinku Kikai Kogyo Kk Thin film forming device
JP2001234336A (en) * 2000-02-18 2001-08-31 Ulvac Japan Ltd Sputtering method and sputtering system
US6461484B2 (en) * 2000-09-13 2002-10-08 Anelva Corporation Sputtering device
EP2921572B1 (en) * 2012-11-14 2020-06-24 Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.) Film deposition device

Similar Documents

Publication Publication Date Title
KR900002082B1 (en) Thin film deposition apparatus and method
US4284033A (en) Means to orbit and rotate target wafers supported on planet member
JPS6360275A (en) Sputtering device
US3656453A (en) Specimen positioning
CN115992344A (en) Crystal vibrating diaphragm thickness monitoring device and coating equipment
JP3458450B2 (en) Sputtering method
JPH01184277A (en) Substrate rotating device
JP2746695B2 (en) Sputtering apparatus and sputtering method
JPS6314865A (en) Sputtering device
JPH0765159B2 (en) Vacuum deposition equipment
JPS63255368A (en) Film thickness correcting device for film forming device
JP2637171B2 (en) Multi-source sputtering equipment
JPH05320892A (en) Vacuum device for forming thin film
CN216738504U (en) Multi-workpiece-disc film coating device
JPH0226935Y2 (en)
JPH0452275A (en) Sputtering device
JP4550540B2 (en) Sample stage and ion sputtering equipment
JP2825822B2 (en) Vapor deposition film forming apparatus, vapor deposition film forming method, and substrate formed by these
JP2002097570A (en) Film forming apparatus
JP2590367B2 (en) Sputtering equipment
JP2004027306A (en) Ion beam sputtering apparatus
JPH0726378A (en) Film forming substrate holding device in film forming device
JPS6365071A (en) Sputtering device
JPH02179870A (en) Thin film forming device
JP2000219964A (en) Film forming method and film forming device