JPH02179870A - Thin film forming device - Google Patents

Thin film forming device

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Publication number
JPH02179870A
JPH02179870A JP33283188A JP33283188A JPH02179870A JP H02179870 A JPH02179870 A JP H02179870A JP 33283188 A JP33283188 A JP 33283188A JP 33283188 A JP33283188 A JP 33283188A JP H02179870 A JPH02179870 A JP H02179870A
Authority
JP
Japan
Prior art keywords
shutter
target
thin film
substrate
sputtering
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP33283188A
Other languages
Japanese (ja)
Inventor
Kenji Kondo
健治 近藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP33283188A priority Critical patent/JPH02179870A/en
Publication of JPH02179870A publication Critical patent/JPH02179870A/en
Pending legal-status Critical Current

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  • Physical Vapour Deposition (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)

Abstract

PURPOSE:To efficiently form the films on a plurality of base plates in the respective different conditions by thoroughly shielding the base plates with a shutter and performing presputtering and thereafter exposing only the required base plate to perform sputtering. CONSTITUTION:A plurality of base plates 2 are attached to a base plate table 4 rotatable around a rotary shaft 4a by a rotating mechanism 3 in an exhaustible vacuum vessel 1. A target 5 is arranged oppositely to the base plates 2. Furthermore a shutter 17 is arranged to the intermediate position between the base plates 2 and the target 5 so that the shutter 17 can be rotated around a hollow shutter shaft 17c by a rotating mechanism 18. In a thin film forming device having the above-mentioned constitution, voltage is impressed to the target 5 from a power source 6 to generate plasma and presputtering of the target 5 is performed in such a state that the base plates 2 have been thoroughly shielded by the shutter 17. Thereafter the required base plate 2 is arranged to the prescribed position and exposed by transferring the shutter 17 and film formation is performed. Thereby film formation is performed on the base plates 2 at every arbitrary sheet thereof in the arbitrary conditions by sputtering of one time without opening the vacuum vessel 1.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明はスパッタリング法による薄膜形成装置として
、真空容器内に薄膜が形成される複数の基板が取り付け
られた基板テーブルと薄膜物質となるターゲットとを対
向させて配置するとともに基板テーブルとターゲットと
の中間位置にシャッタを基板がターゲットから遮蔽され
るように配して容器内にスパッタリングガスを導入し、
ターゲットと基板との間にプラズマ発生用電源から電圧
を印加してプラズマを発生させ、ターゲットをスパッタ
リングしつつシャッタを開いて基板に薄膜を形成する薄
膜形成装置に係わり、特に、研究開発を目的とした薄膜
形成装置の構成に関する。
[Detailed Description of the Invention] [Industrial Application Field] The present invention is a thin film forming apparatus using a sputtering method, which includes a substrate table on which a plurality of substrates on which thin films are to be formed are attached in a vacuum container, and a target to be a thin film material. The sputtering gas is introduced into the container by placing the shutters facing each other and placing a shutter at an intermediate position between the substrate table and the target so that the substrate is shielded from the target.
It relates to thin film forming equipment that applies voltage from a plasma generation power supply between a target and a substrate to generate plasma, and opens a shutter while sputtering the target to form a thin film on the substrate. The present invention relates to the configuration of a thin film forming apparatus.

〔従来の技術〕[Conventional technology]

この種薄膜形成装置の従来の構成例を第7図に示す。真
空容器1内に、薄膜が形成される基板2が取り付けられ
真空容器10大気側に基板テーブル回転機構3を備えた
基板テーブル4と、薄膜物質となるターゲット5とを対
向させて配置するとともに基板テーブル4とターゲット
5との間にシャッタ7を配して容器内にスパッタリング
ガスを導入し、成膜条件に適する真空度に容器内圧力が
保たれるようにスパッタリングガスの流量を調整した後
、シャッタ7を閉じた状態でターゲット5にプラズマ発
生用電源6から電圧を印加して、接地電位であるシャッ
タ7とターゲット5との間の空間にプラズマを発生させ
、ターゲット5をこのプラズマによりスパッタリングす
る。その後適宜の時点でシャッタ7を開いて、接地電位
である基板テーブル4とターゲット5との間の空間にプ
ラズマを発生させて基板2に薄膜を形成する。基板2と
ターゲット5との間に配されているシャッタ7は、それ
が閉じている間、ターゲット5から叩き出されたスパッ
タ粒子が基板2に付着することを防ぐ。通常ターゲット
表面層には大気にさらされたときに吸着した水分や酸素
などによって不純物層が形成されており、これらの不純
物は形成される薄膜の膜質の劣化をひきおこすため成膜
に先立って除去する必要がある。一般には、前述のよう
に、最初、シャッタを閉じた状態でプラズマ放電を開始
し、シャッタ7とターゲット5との間の空間に生じたプ
ラズマによるスパッタリングによりターゲット表面の不
純物層を除去する。この過程はプリスパッタと呼ばれる
もので、一定時間プリスパックした後シャッタを開き、
基板上に薄膜を形成する。複数の基板が一度に取り付け
られるような基板テーブルを持つ従来の薄膜形成装置で
は、シャッタは、ターゲットを覆い隠す構造のもの、も
しくは基板の設置されている基板テーブル全体を覆い隠
す構造のものなどが用いられている。
An example of a conventional configuration of this type of thin film forming apparatus is shown in FIG. A substrate 2 on which a thin film is to be formed is mounted in a vacuum container 1, and a substrate table 4 equipped with a substrate table rotation mechanism 3 on the atmosphere side of the vacuum container 10 and a target 5 to be a thin film material are placed facing each other. A shutter 7 is arranged between the table 4 and the target 5, and sputtering gas is introduced into the container, and the flow rate of the sputtering gas is adjusted so that the pressure inside the container is maintained at a degree of vacuum suitable for the film forming conditions. With the shutter 7 closed, voltage is applied to the target 5 from the plasma generation power source 6 to generate plasma in the space between the shutter 7 and the target 5, which is at ground potential, and the target 5 is sputtered by this plasma. . Thereafter, the shutter 7 is opened at an appropriate time to generate plasma in the space between the substrate table 4 and the target 5, which are at ground potential, to form a thin film on the substrate 2. A shutter 7 disposed between the substrate 2 and the target 5 prevents sputtered particles ejected from the target 5 from adhering to the substrate 2 while the shutter 7 is closed. Usually, an impurity layer is formed on the target surface layer due to moisture, oxygen, etc. adsorbed when exposed to the atmosphere, and these impurities are removed before film formation because they cause deterioration of the quality of the thin film that is formed. There is a need. Generally, as described above, plasma discharge is first started with the shutter closed, and the impurity layer on the target surface is removed by sputtering by the plasma generated in the space between the shutter 7 and the target 5. This process is called pre-sputtering, and after pre-sputtering for a certain period of time, the shutter is opened.
A thin film is formed on a substrate. In conventional thin film forming equipment that has a substrate table on which multiple substrates can be attached at once, the shutter has a structure that covers the target or the entire substrate table on which the substrates are installed. It is used.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

シャッタ構造として、前述のように、ターゲットを覆い
隠す構造のものや、基板テーブル全体を覆い隠す構造と
したシャッタにおける問題点は次の通りである。すなわ
ち、基板テーブルに設置された基板は全て同じ条件でス
パッタリングした薄膜しか形成させることができず、異
なる条件下でスパッタリングした薄膜を得るためには、
一つの条件下でのスパッタリングが終了する度に、真空
容器を大気に開放し、基板を交換した後、再び真空排気
、プリスパッタを行わなければならない。
As described above, problems with the shutter structure that covers the target or the shutter that covers the entire substrate table are as follows. In other words, all the substrates placed on the substrate table can only be sputtered under the same conditions to form thin films; in order to obtain thin films sputtered under different conditions,
Every time sputtering under one condition is completed, the vacuum chamber must be opened to the atmosphere, the substrate must be replaced, and then evacuation and pre-sputtering must be performed again.

特に研究開発などにおいては、異なる条件下でスパッタ
リングした薄膜が形成された基板を少量ずつ必要とする
場合が多い。このような場合、真空排気、プリスパッタ
という工程を繰り返すことは時間的に無駄なばかりでな
く、度々のプリスパッタによってターゲットの使用可能
時間も短くなり、ターゲットの交換頻度が多くなるとい
う問題があった。
Particularly in research and development, it is often necessary to use small quantities of substrates on which thin films are sputtered under different conditions. In such cases, repeating the steps of evacuation and pre-sputtering is not only a waste of time, but frequent pre-sputtering also shortens the usable time of the target, leading to the problem that the target must be replaced more frequently. Ta.

この発明の目的は、真空容器を開放することなく、基板
テーブルに取り付けられた複数の基板全部のプリスパッ
タと、所望の枚数ごと、あるいはそのつど任意の枚数で
、それぞれ異なるスパッタリング条件での成膜とが可能
な薄膜形成装置を提供することである。
The purpose of the present invention is to pre-sputter all of a plurality of substrates attached to a substrate table without opening a vacuum container, and to perform film deposition for each desired number of substrates or any number of substrates each time under different sputtering conditions. An object of the present invention is to provide a thin film forming apparatus capable of performing the following steps.

〔課題を解決するための手段〕[Means to solve the problem]

この課題を解決するために、本発明においては、真空容
器内に薄膜が形成される複数の基板が取り付けられた基
板テーブルと薄膜物質となるターゲットとを対向させて
配置するとともに基板テーブルとターゲットとの中間位
置にシャッタを基板がターゲットから遮蔽されるように
配して容器内にスパッタリングガスを導入し、ターゲッ
トと基板との間にプラズマ発生用電源から電圧を印加し
てプラズマを発生させ、ターゲットをスパッタリングし
つつシャッタを開いて基板に薄膜を形成する薄膜形成装
置において、前記シャッタを、基板への薄膜形成に先立
つプリスパッタ時には複数の基板のすべてをターゲット
から遮蔽し、薄膜形成のためのスパッタ時には複数の基
板の内の所望の基板だけをターゲットに露出させるとと
もに残りの基板をターゲットから遮蔽せしめうるように
形成するとともに、真空容器外部に前記シャッタを操作
するシャッタ操作手段を配し、大気側からシャッタの操
作を可能にするものとする。
In order to solve this problem, in the present invention, a substrate table on which a plurality of substrates on which thin films are to be formed are placed facing each other in a vacuum container, and a target to be made into a thin film material are placed facing each other. Sputtering gas is introduced into the container by placing a shutter at an intermediate position so that the substrate is shielded from the target, and a voltage is applied from the plasma generation power supply between the target and the substrate to generate plasma, and the target In a thin film forming apparatus that forms a thin film on a substrate by opening a shutter while sputtering, the shutter is used to shield all of the plurality of substrates from the target during pre-sputtering prior to forming a thin film on the substrate, Sometimes, only a desired substrate out of a plurality of substrates is exposed to the target while the remaining substrates are shielded from the target, and a shutter operation means for operating the shutter is disposed outside the vacuum chamber, and It shall be possible to operate the shutter from

〔作用〕[Effect]

薄膜形成装置をこのように構成することにより、大気側
からの操作のみにより、真空容器を大気に開放すること
なく、少なくとも2種類以上の異なる条件下でのスパッ
タリングが可能になり、所望の試料を得るまでの真空排
気、プリスパッタの回数を減らすことができ、研究開発
の効率が顕著に向上する。
By configuring the thin film forming apparatus in this way, it is possible to perform sputtering under at least two different conditions by operating only from the atmosphere side and without opening the vacuum container to the atmosphere. It is possible to reduce the number of vacuum evacuations and pre-sputtering steps required to obtain the desired results, significantly improving the efficiency of research and development.

〔実施例〕〔Example〕

第1図に本発明のシャッタ機構を備えた薄膜形成装置の
第1の実施例を示す。シャッタを、プリスパッタ中は複
数の基板のすべてをターゲットから遮蔽し、スパッタ中
は所望の基板だけがターゲットに露出するように操作す
るシャッタ操作手段は、本実施例では、基板テーブル4
と同軸に配された。以下に詳細を説明するシャッタ17
を回転駆動するシャッタ回転機構8として基板テーブル
4の回転機構3とは独立して形成され、真空容器1を気
密に貫通する中空のシャツタ軸17cを介してシャッタ
17を回転させる。シャツタ軸17cの内径側と基板テ
ーブル4の回転軸4aとの間の気密は気密シール部材1
2により保持される。
FIG. 1 shows a first embodiment of a thin film forming apparatus equipped with a shutter mechanism of the present invention. In this embodiment, the shutter operation means for operating the shutter so that all of the plurality of substrates are shielded from the target during pre-sputtering and only desired substrates are exposed to the target during sputtering is the substrate table 4.
placed on the same axis. Shutter 17, detailed below
A shutter rotation mechanism 8 for rotationally driving the shutter 17 is formed independently of the rotation mechanism 3 of the substrate table 4, and rotates the shutter 17 via a hollow shutter shaft 17c that hermetically passes through the vacuum container 1. The airtight seal member 1 is used to maintain airtightness between the inner diameter side of the shutter shaft 17c and the rotating shaft 4a of the substrate table 4.
2 is maintained.

第2図にシャッタ17の構成を示す。シャッタ17は、
金属製円板からなるシャツタ板17aと、絶縁材からな
る扁平な円形ケース状のシャツタ板取付は台17bと、
この取付は台17bと一体に形成された絶縁中空軸17
cとにより構成され、基板テーブル4の全体を覆ってい
る。この図においては一例として基板が4枚取り付けら
れている。シャツタ板17aには一つの基板が完全に露
出するような開口部11が形成され、その開口部の数は
一つの条件下で成膜すべき基板数と同数とし、その位置
は成膜すべき基板だけが正しく露出し、その他の基板は
確実に覆われるような位置に形成されている。
FIG. 2 shows the structure of the shutter 17. The shutter 17 is
A shirt plate 17a made of a metal disc, a flat circular case-shaped shirt plate made of an insulating material and a mounting base 17b,
This installation is performed using an insulating hollow shaft 17 formed integrally with the stand 17b.
c, and covers the entire substrate table 4. In this figure, four boards are attached as an example. Openings 11 are formed in the shirt cover plate 17a so that one substrate is completely exposed, the number of openings is the same as the number of substrates to be deposited under one condition, and the positions thereof are the same as the number of substrates to be deposited under one condition. The position is such that only the substrate is properly exposed and the other substrates are reliably covered.

このようなシャッタを用いて選択的な成膜を開始するた
めには、まず、シャツタ板17aの開口部11の位置を
シャッタ回転機構8 (第1図)によって第2図のよう
にどの基板も露出せず、かつ成膜用基板2に最も近い位
置に固定する。その後、成膜用基板がターゲット正面に
位置するように基板テーブル4とシャッタ17とを同時
に移動させ、プリスパッタを始める。プリスパッタが終
了したら、開口部11を第3図のように成膜用基板が完
全に露出するような位置まで最短距離を経由して移動し
、基板上に成膜する。所望の成膜時間が経過後、スパッ
タリングを終了する。先と異なる条件で2枚目の基板に
成膜する際には再び開口部をその基板に最も近く、かつ
どの基板も露出しないような位置に移動させて同じ工程
を繰り返す。2枚以上の基板に一つの条件下で成膜する
場合には、所望の基板が全て同時に露出するような位置
に開口部を持つシャツタ板を用意し、プリスパッタが終
了して開口部が移動し、成膜用基板が完全に露出してス
パッタが始まると同時に基板テーブルとシャッタとを同
じ回転数で回転させれば良い。第4図は2枚の基板を同
時に成膜する際に用いるシャツタ板の一例を示す。
In order to start selective film formation using such a shutter, first, the position of the opening 11 of the shutter plate 17a is adjusted by the shutter rotation mechanism 8 (Fig. 1) to any substrate as shown in Fig. 2. It is not exposed and is fixed at a position closest to the film forming substrate 2. Thereafter, the substrate table 4 and shutter 17 are simultaneously moved so that the film-forming substrate is positioned in front of the target, and pre-sputtering is started. After the pre-sputtering is completed, the opening 11 is moved via the shortest distance to a position where the film forming substrate is completely exposed as shown in FIG. 3, and a film is formed on the substrate. After the desired film-forming time has elapsed, sputtering is terminated. When forming a film on a second substrate under different conditions, the same process is repeated by moving the opening to a position closest to that substrate and not exposing any substrate. When depositing films on two or more substrates under the same conditions, prepare a shutter plate with openings at positions that expose all the desired substrates at the same time, and then move the openings after pre-sputtering is completed. However, the substrate table and the shutter may be rotated at the same rotation speed at the same time when the film-forming substrate is completely exposed and sputtering begins. FIG. 4 shows an example of a shutter plate used when forming films on two substrates at the same time.

第5図および第6図に本考案の第2の実施例を示す。こ
の実施例においては、シャッタはシャツタ板が基板のそ
れぞれを独立に覆い、それぞれが独立に開閉できるよう
に構成されている。すなわち、シャツタ板27aは、第
6図(a)に示すように、基板2よりやや大きめの金属
円板として形成され、大気側から操作棒27c (第5
図)を回動駆動することにより、開閉レバー27bを介
して所望の基板2をターゲット5に露出させる。操作棒
27cは中空の絶縁駆動軸27dの上下両端面で自身の
軸まわり回動自在に支承され、また絶縁駆動軸27dの
上端面では、気密シール部材27eを用いて中空の絶縁
駆動軸27dの内径側と操作棒27c周面との間の気密
が保たれている。そして絶縁駆動軸27dは、所望の基
板の露出後、シャッタ回転機構18により基板テーブル
回転機構13による基板テーブル回転数と同一回転数で
回転駆動される。このようにして、基板テーブル上の複
数の基板は、全部同時のプリスパッタと、そのつど異な
る枚数ごとに、異なるスパッタ条件下での成膜が可能と
なる。
A second embodiment of the present invention is shown in FIGS. 5 and 6. In this embodiment, the shutter is configured such that a shutter plate covers each of the substrates independently, and each can be opened and closed independently. That is, as shown in FIG. 6(a), the shutter plate 27a is formed as a metal disk slightly larger than the substrate 2, and the operating rod 27c (fifth
A desired substrate 2 is exposed to the target 5 via the opening/closing lever 27b by rotationally driving the substrate 2 shown in FIG. The operating rod 27c is supported rotatably about its own axis on both the upper and lower end surfaces of the hollow insulated drive shaft 27d, and an airtight seal member 27e is used on the upper end surface of the hollow insulated drive shaft 27d to close the hollow insulated drive shaft 27d. Airtightness is maintained between the inner diameter side and the circumferential surface of the operating rod 27c. After exposing the desired substrate, the insulated drive shaft 27d is rotated by the shutter rotation mechanism 18 at the same rotation speed as the substrate table rotation speed by the substrate table rotation mechanism 13. In this way, a plurality of substrates on the substrate table can be pre-sputtered all at the same time, and each time a different number of substrates can be deposited under different sputtering conditions.

〔発明の効果〕〔Effect of the invention〕

以上に述べたように、本発明によれば、真空容器内に薄
膜が形成される複数の基板が取り付けられた基板テーブ
ルと薄膜物質となるターゲットとを対向させて配置する
とともに基板テーブルとターゲットとの中間位置にシャ
ッタを基板がターゲフトから遮蔽されるように配して容
器内にスパッタリングガスを導入し、ターゲットと基板
との間にプラズマ発生用電源から電圧を印加してプラズ
マを発生させ、ターゲットをスパッタリングしつつシャ
ッタを開いて基板に薄膜を形成する薄膜形成装置におい
て、前記ンヤッタを、基板への薄膜形成に先立つプリス
パッタ時には複数の基板のすべてをターゲットから遮蔽
し、薄膜形成のためのスパッタ時には複数の基板の内の
所望の基板だけをターゲットに露出させるとともに残り
の基板をターゲットから遮蔽せしめうるように形成する
とともに、真空容器外部に前記シャッタを操作するシャ
ッタ操作手段を配したので、真空容器を大気に開放する
ことなく、少なくとも2種類以上の異なるスパッタリン
グ条件下での成膜が可能となり、所望の試料を得るまで
の真空排気、プリスパッタの回数が減り、装置の稼働時
間が短くなり、研究開発の効率が向とするとともにター
ゲットの交換頻度が少なくなり利用効率が向上するとい
う効果が得られる。
As described above, according to the present invention, a substrate table on which a plurality of substrates on which thin films are to be formed are placed in a vacuum container and a target to be a thin film material are placed facing each other, and the substrate table and the target are arranged to face each other. Sputtering gas is introduced into the container by placing a shutter at an intermediate position so that the substrate is shielded from the target, and a voltage is applied from a plasma generation power supply between the target and the substrate to generate plasma, and the target In a thin film forming apparatus that forms a thin film on a substrate by opening a shutter while sputtering, all of the plurality of substrates are shielded from the target during pre-sputtering prior to forming a thin film on the substrate, and the sputtering for forming the thin film is performed. In some cases, only a desired substrate out of a plurality of substrates is exposed to the target while the remaining substrates are shielded from the target, and a shutter operation means for operating the shutter is disposed outside the vacuum chamber, so that the vacuum It is possible to form films under at least two different sputtering conditions without exposing the container to the atmosphere, reducing the number of evacuations and pre-sputtering required to obtain the desired sample, and shortening the operating time of the equipment. , the efficiency of research and development is improved, and the frequency of target replacement is reduced, resulting in improved utilization efficiency.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の第1の実施例によるシャッタならびに
その操作手段を備えた薄膜形成装置の構成例を示す説明
断面図、第2図は第1図の実施例におけるシャッタの構
成を示すもので(a)は平面図。 わ〕は要部側面断面図、第3図は第2図のシャッタ構成
におけるンヤッタ板と基板テーブルとのスパッタ中の位
置関係を示す平面図、第4図は第2図の構成によるシャ
ッタのシャツタ板を2枚の基板同時成膜を可能とするシ
ャツタ板の構造を示す平面図、第5図は本発明の第2の
実施例によるシャッタならびにその操作手段を備えた薄
膜形成装置の構成例を示す説明断面図、第6図は第5図
の実施例におけるシャッタの構成を示す平面図であって
、(a)はプリスパッタ時のシャッタの状態を示す図、
う)はスパッタ時のシャッタの状態を示す図である。第
7図はシャッタを備えた従来の薄膜形成装置の構成例を
示す説明断面図である。 ■ 真空容器、2 基板、4.14 基板テーブル、5
 ターゲット、6 電源(プラズマ発生用電源) 、7
.17.27  シャッタ、8,18夕回転機構(ンヤ
ッタ操作手段)。 シャツ 第  1  図 (a) 第 図 第 図 第 図 第 図 第 図 手続補正書(0り 1.事件の表示 特願昭i、3−J、itJ’、3/ 3、補正をする者 事件との関係 住  所 名  称
FIG. 1 is an explanatory cross-sectional view showing a configuration example of a thin film forming apparatus equipped with a shutter and its operation means according to a first embodiment of the present invention, and FIG. 2 shows a configuration of the shutter in the embodiment of FIG. 1. (a) is a plan view. ] is a side sectional view of the main part, FIG. 3 is a plan view showing the positional relationship during sputtering between the shutter plate and the substrate table in the shutter configuration of FIG. 2, and FIG. FIG. 5 is a plan view showing the structure of a shutter plate that enables film formation on two substrates at the same time, and FIG. FIG. 6 is a plan view showing the configuration of the shutter in the embodiment shown in FIG. 5, and (a) is a diagram showing the state of the shutter during pre-sputtering.
(c) is a diagram showing the state of the shutter during sputtering. FIG. 7 is an explanatory cross-sectional view showing a configuration example of a conventional thin film forming apparatus equipped with a shutter. ■ Vacuum container, 2 Substrate, 4.14 Substrate table, 5
Target, 6 Power supply (power supply for plasma generation), 7
.. 17.27 Shutter, 8, 18 evening rotation mechanism (nyatta operation means). Shirt Figure 1 (a) Figure Figure Figure Figure Figure Procedure Amendment (0ri 1. Indication of Case Patent Application Sho I, 3-J, itJ', 3/3, Person Making Amendment Case and Related address name

Claims (1)

【特許請求の範囲】[Claims] 1)真空容器内に薄膜が形成される複数の基板が取り付
けられた基板テーブルと薄膜物質となるターゲットとを
対向させて配置するとともに基板テーブルとターゲット
との中間位置にシャッタを基板がターゲットから遮蔽さ
れるように配して容器内にスパッタリングガスを導入し
、ターゲットと基板との間にプラズマ発生用電源から電
圧を印加してプラズマを発生させ、ターゲットをスパッ
タリングしつつシャッタを開いて基板に薄膜を形成する
薄膜形成装置において、前記シャッタが基板への薄膜形
成に先立つプリスパッタ時には複数の基板のすべてをタ
ーゲットから遮蔽し、薄膜形成のためのスパッタ時には
複数の基板の内の所望の基板だけをターゲットに露出さ
せるとともに残りの基板をターゲットから遮蔽せしめう
るように形成されるとともに真空容器外部に前記シャッ
タを操作するシャッタ操作手段が配されたことを特徴と
する薄膜形成装置。
1) A substrate table on which a plurality of substrates on which thin films are to be formed are placed in a vacuum container and a target to be formed into a thin film are placed facing each other, and a shutter is placed at an intermediate position between the substrate table and the targets so that the substrates are shielded from the targets. A sputtering gas is introduced into the container, and a voltage is applied between the target and the substrate from a plasma generation power source to generate plasma. While sputtering the target, the shutter is opened and a thin film is deposited on the substrate. In a thin film forming apparatus for forming a thin film, the shutter shields all of the plurality of substrates from the target during pre-sputtering prior to forming a thin film on the substrate, and shields only a desired substrate among the plurality of substrates during sputtering for thin film formation. 1. A thin film forming apparatus, characterized in that the thin film forming apparatus is formed to be able to expose the remaining substrate to the target and to shield the remaining substrate from the target, and a shutter operating means for operating the shutter is disposed outside the vacuum chamber.
JP33283188A 1988-12-29 1988-12-29 Thin film forming device Pending JPH02179870A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP33283188A JPH02179870A (en) 1988-12-29 1988-12-29 Thin film forming device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33283188A JPH02179870A (en) 1988-12-29 1988-12-29 Thin film forming device

Publications (1)

Publication Number Publication Date
JPH02179870A true JPH02179870A (en) 1990-07-12

Family

ID=18259288

Family Applications (1)

Application Number Title Priority Date Filing Date
JP33283188A Pending JPH02179870A (en) 1988-12-29 1988-12-29 Thin film forming device

Country Status (1)

Country Link
JP (1) JPH02179870A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20020091949A (en) * 2001-06-01 2002-12-11 삼성전자 주식회사 Sputtering system with moblie target
KR20040043046A (en) * 2002-11-15 2004-05-22 삼성전자주식회사 Magnetron sputtering apparatus and method thereof
CN113249699A (en) * 2021-05-13 2021-08-13 沈阳仪表科学研究院有限公司 Method for preparing high-precision wavelength gradient optical filter based on magnetron sputtering technology and device adopted by method

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20020091949A (en) * 2001-06-01 2002-12-11 삼성전자 주식회사 Sputtering system with moblie target
KR20040043046A (en) * 2002-11-15 2004-05-22 삼성전자주식회사 Magnetron sputtering apparatus and method thereof
CN113249699A (en) * 2021-05-13 2021-08-13 沈阳仪表科学研究院有限公司 Method for preparing high-precision wavelength gradient optical filter based on magnetron sputtering technology and device adopted by method
CN113249699B (en) * 2021-05-13 2022-11-04 沈阳仪表科学研究院有限公司 Method for preparing high-precision wavelength gradient optical filter based on magnetron sputtering technology and device adopted by method

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