JPH04193948A - Film forming device - Google Patents

Film forming device

Info

Publication number
JPH04193948A
JPH04193948A JP32689890A JP32689890A JPH04193948A JP H04193948 A JPH04193948 A JP H04193948A JP 32689890 A JP32689890 A JP 32689890A JP 32689890 A JP32689890 A JP 32689890A JP H04193948 A JPH04193948 A JP H04193948A
Authority
JP
Japan
Prior art keywords
shutter
target
film forming
substrate
film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP32689890A
Other languages
Japanese (ja)
Inventor
Yoshio Fujii
善夫 藤井
Yoshiyuki Nakagi
義幸 中木
Takashi Tokunaga
隆志 徳永
Tatsuya Fukami
達也 深見
Kazuhiko Tsutsumi
和彦 堤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP32689890A priority Critical patent/JPH04193948A/en
Publication of JPH04193948A publication Critical patent/JPH04193948A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To increase film forming speed and to miniaturize film forming device by providing plural opening and closing mechanisms per a target between the target and a film forming substrate and attaining intermittent film formation. CONSTITUTION:In the vacuum vessel 1 a shutter consisting of divided rectangular blades 5a1-5a4, 5b1-5b4 is provided between each of targets 4a, 4b and a film forming substrate 3, respectively. In this constitution, while closing the shutters upon the targets 4a, 4b, high voltage is impressed to the targets 4c, 4b to generate plasma. In the case of film formation, each of the rectangular blades 5a1-5a4, 5b1-5b4 is rotated about 90 deg. centering its own one side as the fulcrum. By this method, necessary space for driving the shutter or necessary space for sustaining the opened shutter is reduced and the distance between the substrate 3 and the targets 4a, 4b is also reduced, thus obtaining high speed film formation and miniaturizing the vacuum vessel 1 are attained.

Description

【発明の詳細な説明】 [産業上の利用分野コ この発明は、薄膜を基板に形成する蒸着装置、スパッタ
装置などの成膜装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a film forming apparatus such as a vapor deposition apparatus and a sputtering apparatus for forming a thin film on a substrate.

[従来の技術] 通常、成膜装置において、薄膜を基板上に堆積形成する
際、蒸着源と基板の間に成膜を断続する機構としてシャ
ッターが設けられている0例えばスパッタ装置において
は、成膜に先立って蒸着源であるターゲット表面の酸化
層など不純物を取り除くため。
[Prior Art] Usually, in a film forming apparatus, a shutter is provided as a mechanism for intermittent film formation between an evaporation source and a substrate when depositing a thin film on a substrate. To remove impurities such as the oxide layer on the target surface, which is the source of evaporation, prior to forming a film.

ターゲット上のシャッターを閉じたまま、ターゲットに
高電圧を印加しプラズマ放電させるプリスパッタ工程が
行なわれる。またプリスパッタは、多元スパッタ装置に
おいて複数のターゲットの放電を維持したまま特定のタ
ーゲットからのスパッタ成膜を行なう際に、他のターゲ
ットからの成膜現象を防止する目的でも行なわれる。ま
た成膜装置の中で逆スパツタ工程を行なう場合などは、
逆スパツタ時に蒸着源が汚染されることを防止するため
にやはりシャッターが用いられている。
A pre-sputtering process is performed in which a high voltage is applied to the target to cause plasma discharge while the shutter above the target is kept closed. Pre-sputtering is also performed for the purpose of preventing film formation from other targets when performing sputter film formation from a specific target while maintaining the discharge of a plurality of targets in a multi-source sputtering apparatus. In addition, when performing a reverse sputtering process in the film forming equipment,
A shutter is also used to prevent the deposition source from being contaminated during reverse sputtering.

従来、このプリスパッタを行なうための、または蒸着源
汚染防止のためのシャッター等の開閉機構としては、シ
ャッターの片側を支点として扉のように回転開閉するタ
イプのもの及びシャッターがスライドするタイプのもの
などが知られている。
Conventionally, the opening/closing mechanisms for shutters, etc. for performing this pre-sputtering or for preventing deposition source contamination have been of the type that rotates to open and close like a door using one side of the shutter as a fulcrum, and of the type in which the shutter slides. etc. are known.

第6図は例えば特開昭62−3448号公報に示された
前者のタイプのシャッターを有するスパッタ装置の断面
構成図である。(3)はその上に成膜を行なう被成膜基
板、(4a)、(4b)はターゲット、(5a)及び(
5b)はそれぞれターゲット(4a) 、 (4b)の
上方に設置された開閉機構のシャッターである。シャッ
ター(5a)は閉じた状態、シャッター(5b)は開い
た状態を示している。プリスパッタを行なうには、ター
ゲット上のシャッターを閉じたままターゲットに高電圧
を印加しプラズマ放電させ、また成膜を行なう際にはシ
ャッターを開く。
FIG. 6 is a sectional view of a sputtering apparatus having a shutter of the former type disclosed in, for example, Japanese Unexamined Patent Publication No. 62-3448. (3) is a substrate on which a film is to be formed, (4a) and (4b) are targets, (5a) and (
5b) is a shutter of an opening/closing mechanism installed above the targets (4a) and (4b), respectively. The shutter (5a) is shown in a closed state, and the shutter (5b) is shown in an open state. To perform pre-sputtering, a high voltage is applied to the target while keeping the shutter on the target closed to cause plasma discharge, and when forming a film, the shutter is opened.

[発明が解決しようとする課題] しかしながらこの従来例のシャッター構造では、シャッ
ター(5b)の様にシャッターを開いた状態にするには
、開くためのシャッターの動作空間、また開いたシャッ
ターを保持する空間が、被成膜基板(3)とターゲット
(4a)、 (4b)とのあいだに必要になる。そのた
め、基板とターゲット間の距離が大きくなって、成膜速
度が遅くなり、また真空槽が大型化し、それに伴って排
気系も能力の大きな大型真空ポンプが必要となる。
[Problems to be Solved by the Invention] However, in the shutter structure of this conventional example, in order to open the shutter like the shutter (5b), it is necessary to create an operating space for the shutter to open, and also to hold the opened shutter. A space is required between the substrate to be film-formed (3) and the targets (4a) and (4b). Therefore, the distance between the substrate and the target becomes large, the film formation rate becomes slow, the vacuum chamber becomes large, and the exhaust system also requires a large vacuum pump with a large capacity.

また後者のタイプのスライド式シャッターでも、シャッ
ターをターゲット上からスライドさせてシャッターを開
いた状態にしたときに、真空槽内にスライドしたシャッ
ターを保持する空間が余分に必要となり真空槽が大型化
する。
In addition, even with the latter type of sliding shutter, when the shutter is slid from above the target to open the shutter, extra space is required to hold the slid shutter inside the vacuum chamber, making the vacuum chamber larger. .

この発明は、かかる課題を解決するためになされたもの
で、成膜速度が大きく、小型化した成膜装置を得ること
を目的とする。
The present invention has been made to solve this problem, and an object of the present invention is to provide a compact film forming apparatus with a high film forming rate.

[課題を解決するための手段] この発明の成膜装置は、真空槽、この真空槽に設けた被
成膜基板、上記真空槽に上記被成膜基板に対向して設け
たターゲット、このターゲットに高電圧を印加し上記被
成膜基板にターゲット成分を成膜する電源および上記タ
ーゲットと被成膜基板間に、成膜を断続するように設け
たターゲット当り複数の開閉機構を備えたものである。
[Means for Solving the Problems] The film forming apparatus of the present invention includes a vacuum chamber, a substrate to be film-formed provided in the vacuum chamber, a target provided in the vacuum chamber facing the substrate to be film-formed, and this target. It is equipped with a power source that applies a high voltage to deposit a target component on the substrate to be deposited, and a plurality of opening/closing mechanisms per target provided between the target and the substrate to be deposited so as to intermittent film formation. be.

[作用] この発明において、ターゲット当り複数の開閉機構を設
けることにより被成膜基板とターゲット間距離を小さく
することができ、高成膜速度および成膜装置の小型化が
達成できる。
[Operation] In the present invention, by providing a plurality of opening/closing mechanisms per target, the distance between the target substrate and the target can be reduced, and a high deposition rate and miniaturization of the deposition apparatus can be achieved.

[実施例] 第1図はこの発明の一実施例の成膜装置であるスパッタ
装置の断面構成図であり、図において(1)は真空槽、
(2)は回転機構を有する基板ホルダ、(3)はその上
に成膜を行なう被成膜基板、 (4a)、 (4b)は
ターゲット、(5a+ )〜(5a4)、 (5b+ 
)〜(5ba )はそれぞれターゲット(4aL (4
b)上に設けられた短冊状の羽根板に分割されたシャッ
ターでありシャッター(5a+)〜(5a4)は閉じた
状態を、シャッター(5b+ )〜(5ha )は開い
た状態を示している。(6)は上記シャッターを支える
シャッター保持具である。
[Example] FIG. 1 is a cross-sectional configuration diagram of a sputtering apparatus which is a film forming apparatus according to an example of the present invention, and in the figure (1) is a vacuum chamber,
(2) is a substrate holder with a rotation mechanism, (3) is a substrate on which a film is to be formed, (4a), (4b) are targets, (5a+) to (5a4), (5b+
) to (5ba) are the targets (4aL (4
b) A shutter divided into rectangular blades provided on the top; shutters (5a+) to (5a4) are shown in a closed state, and shutters (5b+) to (5ha) are shown in an open state. (6) is a shutter holder that supports the shutter.

第2図(a)および(b)は、それぞれ第1図における
シャッターの閉じた状態(5a+)〜(5aa )およ
び開いた状態(5b+ )〜(5ha)を示す斜視図で
ある。
FIGS. 2(a) and 2(b) are perspective views showing closed states (5a+) to (5aa) and open states (5b+) to (5ha) of the shutter in FIG. 1, respectively.

即ち、上記成膜装置を用いてブリスパッタを行なうには
、ターゲット上のシャッターを閉じたまま(第2図(a
))ターゲットに電源(図示しない)により高電圧を印
加してプラズマ放電させ、成膜を行なう際にはシャッタ
ーを開く(第2図(b))、閉じた状態のシャッターを
開いた状態にするには、各短冊状の分割された羽根板の
それぞれの一辺を支点として概略90度回転することに
より行なう、このシャッターを動作させるのに必要な空
間、あるいは開いたシャンターを保持するのに必要な空
間としては分割された各羽根板の回転半径があれば充分
である。従って、基板とターゲット間距離を小さくして
高成膜速度を得ることができ、また真空槽を小型化する
ことができる。
That is, in order to perform bliss sputtering using the film forming apparatus described above, the shutter above the target must be kept closed (see Fig. 2 (a)).
)) A high voltage is applied to the target by a power source (not shown) to cause plasma discharge, and when forming a film, the shutter is opened (Fig. 2 (b)), and the closed shutter is opened. The space required to operate this shutter, or the space required to hold an open shunter, is achieved by rotating each of the rectangular divided blades approximately 90 degrees using one side as a fulcrum. As for the space, it is sufficient that there is a radius of rotation of each divided vane. Therefore, the distance between the substrate and the target can be reduced to obtain a high film formation rate, and the vacuum chamber can be downsized.

第3図(a)および(b)は、それぞれこの発明の他の
実施例の成膜装置に係わる閉じた状態のシャッターおよ
び開いた状態のシャッターの斜視図である。
FIGS. 3(a) and 3(b) are perspective views of a shutter in a closed state and a shutter in an open state, respectively, relating to a film forming apparatus according to another embodiment of the present invention.

即ち、閉じた状態(第3図(a))では各羽根板の端部
のみが重なった状態であり、これを開くには、各羽根板
を平行移動させ、各羽根板の概略全面を重なり合わせる
(第3図(b))。
In other words, in the closed state (Fig. 3 (a)), only the ends of each vane overlap, but in order to open it, each vane is moved in parallel, and approximately the entire surface of each vane is overlapped. (Figure 3(b)).

第4図(a)および(b)は、それぞれこの発明の他の
実施例の成膜装置に係わる閉じた状態のシャッターおよ
び開いた状態のシャッターの斜視図である。
FIGS. 4(a) and 4(b) are perspective views of a shutter in a closed state and a shutter in an open state, respectively, relating to a film forming apparatus according to another embodiment of the present invention.

各羽根板は、扇型の形状をしており、各中心部で回転軸
に連結されている。即ち、閉じた状態(第4図(a))
では各扇型の羽根板の端部のみが重なった状態であり、
これを開くには、各羽根板を回転移動させ各羽根板の概
略全面を重なり合わせる(第4図(b))。
Each vane has a fan-like shape and is connected to a rotating shaft at its center. That is, the closed state (Fig. 4(a))
In this case, only the ends of each fan-shaped blade plate overlap,
To open this, each vane plate is rotated so that approximately the entire surface of each vane plate overlaps (FIG. 4(b)).

第5図(a)および(b)は、それぞれこの発明のさら
に他の実施例の成膜装置に係わる閉じた状態のシャッタ
ーおよび開いた状態のシャッターの斜視図である。シャ
ッターを構成する各羽根板は、それぞれの−辺がヒンジ
によって他の羽根板と連結されている。即ち、閉じた状
態(第5図(a))では羽根板の連結部のヒンジは開い
た状態にある。このシャッターを開くには、連結部のヒ
ンジを閉じて各羽根板を折り畳み、その概略全面を重な
り合わせる(第5図(b))。
FIGS. 5(a) and 5(b) are perspective views of a shutter in a closed state and a shutter in an open state, respectively, relating to a film forming apparatus according to still another embodiment of the present invention. Each of the blades constituting the shutter is connected to another blade by a hinge at its respective negative side. That is, in the closed state (FIG. 5(a)), the hinge of the connecting portion of the vane is in an open state. To open this shutter, the hinge of the connecting portion is closed and each blade plate is folded so that their entire surfaces overlap (FIG. 5(b)).

以上述べた3種の他の実施例においても、一実施例と同
様にシャッターの占有空間を、従来のシャッター機構よ
りも小さくでき、成膜装置にこれらのシャッターを設け
ることによってこの発明の目的を達成できる事は明らか
である。
In the three other embodiments described above, the space occupied by the shutter can be made smaller than in the conventional shutter mechanism, as in the first embodiment, and by providing these shutters in the film forming apparatus, the object of the present invention can be achieved. What can be achieved is clear.

上記実施例では、通常のスパッタ装置の場合を示したが
、蒸着装置など他の成膜装置についても同様の効果があ
ることは言うまでもない。
In the above embodiment, the case of a normal sputtering apparatus is shown, but it goes without saying that other film forming apparatuses such as a vapor deposition apparatus can have similar effects.

また上記実施例の図では、シャッターの分割数は、基板
当り4であるが、この値は、使用者が、成膜装置の真空
槽や蒸着源のサイズ等により適宜選ぶことができる。
Further, in the figures of the above embodiment, the number of shutter divisions is 4 per substrate, but the user can select this value as appropriate depending on the size of the vacuum chamber of the film forming apparatus, the size of the evaporation source, etc.

またシャッター形状としては、上記実施例の図にあるよ
うな矩形、扇型に限らず、ターゲット形状に合わせて適
宜、選ぶことができる。
Further, the shutter shape is not limited to the rectangular or fan-shaped as shown in the figures of the above embodiment, but can be appropriately selected according to the target shape.

またこの発明は、特に複数のターゲットを有する多元ス
パッタ装置で、各ターゲットにシャッターを設けた場合
、シャッター占有空間が小さいので、一つのターゲット
の開けられたシャッターが隣接するターゲットの上方を
遮らない様に設計することが容易で、かつ装置を小型化
することが可能である。
In addition, this invention particularly provides a multi-source sputtering apparatus having a plurality of targets, and when each target is provided with a shutter, the space occupied by the shutter is small, so that the opened shutter of one target does not block the upper part of the adjacent target. It is easy to design the device, and it is possible to downsize the device.

さらに、この発明の実施例を逆スパツタ時に適用しても
所期目的を達成できるのは言うまでもない。
Furthermore, it goes without saying that the intended purpose can be achieved even when the embodiments of the present invention are applied to reverse sputtering.

[発明の効果] 以上説明した通り、この発明は、真空槽、この真空槽に
設けた被成膜基板、上記真空槽に上記被成膜基板に対向
して設けたターゲット、このターゲットに高電圧を印加
し上記被成膜基板にターゲット成分を成膜する電源およ
び上記ターゲットと被成膜基板間に成膜を断続するよう
に設けたターゲット当り複数の開閉機構を備えたものを
用いることにより、成膜速度が大きく、小型化した成膜
装置を得ることができる。
[Effects of the Invention] As explained above, the present invention provides a vacuum chamber, a substrate to be film-formed provided in the vacuum chamber, a target provided in the vacuum chamber opposite to the substrate to be film-formed, and a high voltage applied to the target. By using a power supply that applies a voltage to form a film of the target component on the film-forming substrate and a plurality of opening/closing mechanisms per target provided to intermittent film formation between the target and the film-forming substrate. It is possible to obtain a film forming apparatus that has a high film forming rate and is compact.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の一実施例の成膜装置の断面構成図、
第2図(a)および(b)は、それぞれこの発明の一実
施例の成膜装置に係わる開閉機構の閉じた状態および開
いた状態を示す斜視図、第3図(a)および(b)は、
それぞれこの発明の他の実施例の成膜装置に係わる閉じ
た状態のrM開閉機構よび開いた状態の開閉機構の斜視
図、第4図(a)および(b)は、それぞれこの発明の
他の実施例の成膜装置に係わる閉じた状態の開閉機構お
よび開いた状態の開閉機構の斜視図、第5図(a)およ
び(b)は、それぞれこの発明のさらに他の実施例の成
膜装置に係わる閉じた状態の開閉機構および開いた状態
の開閉機構の斜視図、第6図は従来の成膜装置の断面構
成図である。 図において(1)は真空槽、(3)は被成膜基板、 (
4a)および(4b)はターゲット、 (5a+ )〜
(5aa )および(5b+ )〜(5ha)は開閉機
構である。 なお各図中、同一符号は同一または相当部分を示す。
FIG. 1 is a cross-sectional configuration diagram of a film forming apparatus according to an embodiment of the present invention;
FIGS. 2(a) and (b) are perspective views respectively showing the closed and open states of the opening/closing mechanism of a film forming apparatus according to an embodiment of the present invention, and FIGS. 3(a) and (b) teeth,
FIGS. 4(a) and 4(b) are perspective views of a closed rM opening/closing mechanism and an open opening/closing mechanism of a film forming apparatus according to another embodiment of the present invention, respectively. FIGS. 5(a) and 5(b) are perspective views of the opening/closing mechanism in the closed state and the opening/closing mechanism in the open state, respectively, of the film forming apparatus according to still another embodiment of the present invention. FIG. 6 is a perspective view of the opening/closing mechanism in a closed state and the opening/closing mechanism in an open state, and FIG. 6 is a cross-sectional configuration diagram of a conventional film forming apparatus. In the figure, (1) is a vacuum chamber, (3) is a substrate to be film-formed, (
4a) and (4b) are targets, (5a+)~
(5aa) and (5b+) to (5ha) are opening/closing mechanisms. In each figure, the same reference numerals indicate the same or corresponding parts.

Claims (1)

【特許請求の範囲】[Claims]  真空槽、この真空槽に設けた被成膜基板、上記真空槽
に上記被成膜基板に対向して設けたターゲット、このタ
ーゲットに高電圧を印加し上記被成膜基板にターゲット
成分を成膜する電源および上記ターゲットと被成膜基板
間に成膜を断続するように設けたターゲット当り複数の
開閉機構を備えた成膜装置。
A vacuum chamber, a substrate to be deposited in the vacuum chamber, a target provided in the vacuum chamber facing the substrate to be deposited, and applying a high voltage to this target to form a film of the target component on the substrate to be deposited. and a plurality of opening/closing mechanisms per target provided to intermittent film formation between the target and the substrate to be film-formed.
JP32689890A 1990-11-27 1990-11-27 Film forming device Pending JPH04193948A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP32689890A JPH04193948A (en) 1990-11-27 1990-11-27 Film forming device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP32689890A JPH04193948A (en) 1990-11-27 1990-11-27 Film forming device

Publications (1)

Publication Number Publication Date
JPH04193948A true JPH04193948A (en) 1992-07-14

Family

ID=18192981

Family Applications (1)

Application Number Title Priority Date Filing Date
JP32689890A Pending JPH04193948A (en) 1990-11-27 1990-11-27 Film forming device

Country Status (1)

Country Link
JP (1) JPH04193948A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5584973A (en) * 1994-06-08 1996-12-17 Tel Varian Limited Processing apparatus with an invertible collimator and a processing method therefor
JP2000178728A (en) * 1998-12-18 2000-06-27 Olympus Optical Co Ltd Device for producing optical thin film and production of optical thin film
GB2390376B (en) * 2002-05-10 2005-08-03 Trikon Technologies Ltd Shutter
EP2217737A1 (en) * 2007-12-12 2010-08-18 Sandvik Intellectual Property AB A shutter system
US20110147199A1 (en) * 2009-12-22 2011-06-23 Canon Anelva Corporation Sputtering apparatus and electronic device manufacturing method
JP2013095937A (en) * 2011-10-28 2013-05-20 Kobe Steel Ltd Film formation apparatus and film formation method
WO2018011614A1 (en) * 2016-07-13 2018-01-18 Essilor International (Compagnie Générale d'Optique) Shutters and methods using the same

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US5584973A (en) * 1994-06-08 1996-12-17 Tel Varian Limited Processing apparatus with an invertible collimator and a processing method therefor
JP2000178728A (en) * 1998-12-18 2000-06-27 Olympus Optical Co Ltd Device for producing optical thin film and production of optical thin film
GB2390376B (en) * 2002-05-10 2005-08-03 Trikon Technologies Ltd Shutter
US6929724B2 (en) 2002-05-10 2005-08-16 Trikon Technologies Limited Shutter
JP2011506768A (en) * 2007-12-12 2011-03-03 サンドビック インテレクチュアル プロパティー アクティエボラーグ Shutter system
EP2217737A4 (en) * 2007-12-12 2010-12-01 Sandvik Intellectual Property A shutter system
EP2217737A1 (en) * 2007-12-12 2010-08-18 Sandvik Intellectual Property AB A shutter system
US8232539B2 (en) 2007-12-12 2012-07-31 Sandvik Intellectual Property Ab Shutter system
US20110147199A1 (en) * 2009-12-22 2011-06-23 Canon Anelva Corporation Sputtering apparatus and electronic device manufacturing method
US8652309B2 (en) * 2009-12-22 2014-02-18 Canon Anelva Corporation Sputtering apparatus and electronic device manufacturing method
JP2013095937A (en) * 2011-10-28 2013-05-20 Kobe Steel Ltd Film formation apparatus and film formation method
WO2018011614A1 (en) * 2016-07-13 2018-01-18 Essilor International (Compagnie Générale d'Optique) Shutters and methods using the same
CN109689924A (en) * 2016-07-13 2019-04-26 依视路国际公司 Shield and its application method

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