JPS59226177A - Thin film forming device - Google Patents

Thin film forming device

Info

Publication number
JPS59226177A
JPS59226177A JP9936983A JP9936983A JPS59226177A JP S59226177 A JPS59226177 A JP S59226177A JP 9936983 A JP9936983 A JP 9936983A JP 9936983 A JP9936983 A JP 9936983A JP S59226177 A JPS59226177 A JP S59226177A
Authority
JP
Japan
Prior art keywords
shutter
shutters
film forming
thin film
film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9936983A
Other languages
Japanese (ja)
Inventor
Tamotsu Shimizu
保 清水
Hideki Tateishi
秀樹 立石
Susumu Aiuchi
進 相内
Katsuhiro Iwashita
岩下 克博
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP9936983A priority Critical patent/JPS59226177A/en
Publication of JPS59226177A publication Critical patent/JPS59226177A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/54Controlling or regulating the coating process

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)

Abstract

PURPOSE:To decrease the variance in the thickness of the film on a base plate by disposing two sheets of shutters between a base plate to be formed thereon with the thin film and a film forming source in such a way as to be superposed in front of the base plate and moving simultaneously two sheets of the shutters in different directions. CONSTITUTION:Two sheets of shutters 13 and 14 are disposed between a base plate 7 on which a thin film is to be formed and a film forming source in such a way as to be superposed in front of the plate 7 and are connected to a shutter opening/closing mechanism 15. The opening and closing of the shutters 13, 14 are accomplished by rotating the driving shaft 19 of a revolution transmitting machine 18 via belt 17 and turning the shutter 13 attached to an arm 26. Gears 24, 25 are rotated at the same time to rotate a driven shaft 20, by which the shutter 14 attached to an arm 27 is turned in the direction opposite to the rotating direction of the shutter 13. The time when the plate 7 is exposed to the film forming material scattering to said plate by the opening and closing of the shutters 13, 14 is thus made identical and the thickness of the film formed on the plate 7 is made practically identical.

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明は、ICやファクシミリ等の薄膜素子を形成する
薄膜形成装置に係り、特に薄膜形成基板(以下、基板と
いう)の膜厚バラツキを小さくするために好適な薄膜形
成装置に関する。
[Detailed Description of the Invention] [Field of Application of the Invention] The present invention relates to a thin film forming apparatus for forming thin film elements such as ICs and facsimiles, and particularly to a method for reducing film thickness variations of a thin film forming substrate (hereinafter referred to as a substrate). The present invention relates to a thin film forming apparatus suitable for this purpose.

〔発明の背景〕[Background of the invention]

従来の薄膜形成装置では、1枚のシャッタを移動させて
、基板への成膜材料の付着を遮蔽しているので、基板内
における曝露時間がシャッタの移動方向の両端部におい
て異なり、この結果基板に形成された薄膜の、膜厚バラ
ツキが大きい欠点があった。
In a conventional thin film forming apparatus, one shutter is moved to block the deposition material from adhering to the substrate, so the exposure time inside the substrate is different at both ends in the direction of shutter movement, and as a result, the substrate There was a drawback that the thickness of the thin film formed was large.

この点を、図面に沿ってさらに詳しく説明する。This point will be explained in more detail with reference to the drawings.

第1図は薄膜形成装置の一例としてスパッタ装置の概略
を示し、第2図はスパッタ装置のシャッタとその開閉動
作を示す。
FIG. 1 shows an outline of a sputtering apparatus as an example of a thin film forming apparatus, and FIG. 2 shows a shutter of the sputtering apparatus and its opening/closing operation.

スパッタリングは低圧(10〜1oPa)のガス雰囲気
中(通常、Arガスが用いられる)でグロー放電を起こ
し、陰極に置かれた成膜材料(ターゲット)をイオンの
衝撃によってはじき出しこれを成膜材料に対向して置か
れた基板上に付着堆積させ、薄膜を形成する技術である
Sputtering generates a glow discharge in a low-pressure (10-1oPa) gas atmosphere (usually Ar gas is used), and the film-forming material (target) placed on the cathode is repelled by ion bombardment, which converts it into a film-forming material. This is a technique to form a thin film by depositing it on substrates placed opposite each other.

第1図に示すスパッタ装置では、真空容器1は真空ポン
プ2により高真空(=10Pa以下)に排気した後、ガ
ス導入系3により所定の圧力(10−1〜10Pa)ま
でArガス12を導入する。そして、スパッタ電極4と
アノード6間に高電圧を印加し、グロー放電を発生させ
る。薄膜が形成される基板7は、基板ホルダ8に保持さ
れスノ(ツタ電極4に静止対向して設置されている。基
板7とスパッタ電極4との間には、シャッタ9が設けら
れ、基板7に成膜材料5が飛んで来ないように遮蔽する
。また、シャッタ開閉機構10により、前記シャッタ9
を所定時間開き、基板7を、飛んで来る成膜材料に曝し
、成膜を行う。
In the sputtering apparatus shown in FIG. 1, a vacuum chamber 1 is evacuated to a high vacuum (=10 Pa or less) by a vacuum pump 2, and then Ar gas 12 is introduced to a predetermined pressure (10-1 to 10 Pa) by a gas introduction system 3. do. A high voltage is then applied between the sputter electrode 4 and the anode 6 to generate glow discharge. A substrate 7 on which a thin film is to be formed is held by a substrate holder 8 and placed stationary opposite the sputter electrode 4. A shutter 9 is provided between the substrate 7 and the sputter electrode 4, and the substrate 7 The film-forming material 5 is shielded so that it does not fly away.Furthermore, the shutter opening/closing mechanism 10
is opened for a predetermined period of time, the substrate 7 is exposed to the flying film-forming material, and film-forming is performed.

と、ころで、今日広く用いられているプレーナマグネト
ロン型のスパッタ電極では、高速成膜が可能となり、成
膜速度1.4μm/分(ただし、成膜材料はAl )が
得られている。
By the way, the planar magnetron type sputtering electrode that is widely used today enables high-speed film formation, and a film formation rate of 1.4 μm/min (however, the film forming material is Al) has been obtained.

従来の薄膜形成装置では第2図に示すごとく1枚のシャ
ッタ9を開閉させるようにしており該シャッタ9は矢印
11の方向に移動するので、シャッタ9の開き始めは第
2図中に破線で示す位置にあり、基板Z内のA部がB部
よりも早く曝露される。またA部の方がB部より遅くシ
ャッタ9が閉じるため、−A部の曝露時間がB部よりも
長くなる。この結果A部の方がB部に比べ膜厚が厚くな
り、膜厚バラツキを生じる。この様に、従来の薄膜形成
装置ではシャッタ9を閉じるときと、開けるときの方向
が異なるだめ、シャッタ9の開閉によって基板7内の膜
厚バラツキを生じる欠点があった。例えば、成膜速度1
.4μm/分で、膜厚1μmの成膜を行う場合、シャッ
タ9の開閉による基板7(基板径φ150朋)内の膜厚
バラツキを±1条以下にするためには、シャッタ9の開
閉をそれぞれ0,4秒以下にしなければならない。しか
しこの様に高速で7ヤツタ9を動かすと、シャッタが停
止しようとする時に振動が生じたり、またシャッタ9に
付着した膜がはがれ、基板に異物を落とす欠点があり、
このため実用上、前述の様に高速でシャッタ9を動かす
ことはできない。
In the conventional thin film forming apparatus, one shutter 9 is opened and closed as shown in FIG. 2, and the shutter 9 moves in the direction of arrow 11, so the beginning of opening of the shutter 9 is indicated by the broken line in FIG. At the position shown, part A in the substrate Z is exposed earlier than part B. Further, since the shutter 9 closes later in the A section than in the B section, the exposure time of the -A section is longer than that of the B section. As a result, the film thickness in part A becomes thicker than in part B, resulting in film thickness variations. As described above, the conventional thin film forming apparatus has the drawback that the opening and closing of the shutter 9 causes variations in the film thickness within the substrate 7 because the shutter 9 is closed and opened in different directions. For example, the deposition rate is 1
.. When forming a film with a thickness of 1 μm at a rate of 4 μm/min, in order to reduce the film thickness variation within the substrate 7 (substrate diameter φ150) due to the opening and closing of the shutter 9 to ±1 line or less, the opening and closing of the shutter 9 must be It must be less than 0.4 seconds. However, when the shutter 9 is moved at such a high speed, vibrations occur when the shutter tries to stop, and the film attached to the shutter 9 peels off, causing foreign matter to drop onto the board.
Therefore, in practice, it is not possible to move the shutter 9 at high speed as described above.

〔発明の目的〕[Purpose of the invention]

本発明の目的は、通常のシャツタ開閉時間でシャッタを
開閉し、しかも基板の膜厚バラツキを小さくできる薄膜
形成装置を提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a thin film forming apparatus that can open and close a shutter in the normal shutter opening and closing time and can reduce variations in film thickness of a substrate.

〔発明の概要〕[Summary of the invention]

本発明は、基板と成膜源との間に、2枚のシャッタを前
記基板の前方で重合し得るように配置したこと、前記2
枚のシャッタを同時にかつ互いに異なる方向に移動させ
るシャッタ開閉機構に連結したことによシ、通常のシャ
ツタ開閉時間(開閉にそれぞれ1〜2秒)でシャッタを
開閉しても、基板の膜厚バラツキを小さくできる様にし
た薄膜形成装置である。
The present invention provides that two shutters are disposed between a substrate and a film forming source so that polymerization can occur in front of the substrate;
By connecting the shutters to a shutter opening/closing mechanism that moves the shutters simultaneously and in different directions, even if the shutters are opened and closed within the normal shutter opening/closing time (1 to 2 seconds each), the film thickness of the substrate will vary. This is a thin film forming device that can be made smaller.

〔発明の実施例〕[Embodiments of the invention]

以下、本発明の一実施例を第3図および第4図Jより説
明する。
An embodiment of the present invention will be described below with reference to FIG. 3 and FIG. 4J.

薄膜を形成する基板7と成膜源との間に、2枚のシャッ
タ13.14が前記基板7の前方で重合し得るように配
置され、また前記2枚のシャッタ13.14はシャッタ
開閉機構15に連結されている。
Two shutters 13.14 are arranged between the substrate 7 on which a thin film is to be formed and the film formation source so as to be able to overlap in front of the substrate 7, and the two shutters 13.14 have a shutter opening/closing mechanism. 15.

前記基板7は、基板ホルダ8に保持され成膜源に対向配
置されている。
The substrate 7 is held by a substrate holder 8 and placed opposite to the film forming source.

前記成膜源は、スパッタ装置ではス・くツタ電極、成膜
髪材料およびアノードを備えて構成されているが、第6
図および第4図中では省略されている。
In the sputtering apparatus, the film forming source is configured to include a sputter electrode, a film forming hair material, and an anode.
It is omitted in the figure and FIG.

前記シャッタ開閉機構15は、第4図に示すように、真
空容器1の外部に設置されたモータ1にのモータ16に
ベルト17を通じて駆動連結された回転導入機18、こ
の回転導入機18から真空容器1の内部に挿設された駆
動軸19、真空容器1の内部において前記駆動軸19と
平行に設けられた受動軸20、前記駆動軸19と受動軸
20とに取り符けられかづ育いにかみ合わされた2個歯
車2425、前記駆動軸19と受動軸20にそれぞれ結
合されたアーム26.27を備えている。前記受動軸2
0は、真空容器1の内側に固定された軸受箱21に設け
られた軸受22,23に支持されている。前記駆動軸1
9と受動軸20とは、歯車24,251.(介して同時
にかつ互いに異なる方向に回転し得るようになっている
。前言己アーム26.27には、それぞれ前記シャッタ
13.14が取り付けられて陽る。
As shown in FIG. 4, the shutter opening/closing mechanism 15 includes a rotation introducing machine 18 which is drive-connected to a motor 16 through a belt 17 to a motor 1 installed outside the vacuum container 1, and a vacuum is supplied from the rotation introduction machine 18. A drive shaft 19 inserted into the interior of the vacuum container 1, a passive shaft 20 provided parallel to the drive shaft 19 inside the vacuum container 1, and a shaft mounted on the drive shaft 19 and the passive shaft 20. It includes two gears 2425 meshed with each other, and arms 26 and 27 connected to the driving shaft 19 and the driven shaft 20, respectively. Said passive shaft 2
0 is supported by bearings 22 and 23 provided in a bearing box 21 fixed inside the vacuum container 1. The drive shaft 1
9 and the passive shaft 20 are gears 24, 251 . The shutters 13, 14 are attached to the arms 26, 27, respectively.

前記実施例の薄膜形成装置では、シャッタ1614が開
いている状態からシャッタ開閉機構15の駆動軸19を
第3図において矢・印C方向に回転させると、アーム2
6を介してシャッタ16が矢印e方向に移動し、これと
同時に歯車24.25を通じて受動軸20が矢印e′方
向に回転し、アーム27を介してシャッタ14が矢印e
′方向に移動する。その結果、基板7の前方において2
枚のシャッタ13、14が第6図に2点鎖線で示すよう
に重合し基板7に成膜材料が飛んで来ないように遮蔽す
る0 次にシャッタ13.14が閉じている状態(2点鎖線で
示す。)からシャッタ開閉機構15の駆動@19を第3
図の矢印d方向に回転させると、アーム26を介してシ
ャッタ16が矢印f方向に移動し、歯車24.25を通
じて受動711120が矢印d′方向に回転し、アーム
27′f;c介してシャッタ14が前記シャッタ13と
同時に矢印f′方向に移動し、基板7に成膜材料が飛び
込んで来るように、シャッタ13.14が開く。
In the thin film forming apparatus of the above embodiment, when the drive shaft 19 of the shutter opening/closing mechanism 15 is rotated in the direction of the arrow C in FIG. 3 from the state where the shutter 1614 is open, the arm 2
6, the shutter 16 moves in the direction of the arrow e, and at the same time, the driven shaft 20 rotates in the direction of the arrow e' through the gear 24.25, and the shutter 14 moves in the direction of the arrow e through the arm 27.
’ direction. As a result, 2
The two shutters 13 and 14 overlap as shown by the two-dot chain line in FIG. ) to the third drive @19 of the shutter opening/closing mechanism 15.
When rotated in the direction of the arrow d in the figure, the shutter 16 moves in the direction of the arrow f through the arm 26, the driven 711120 rotates in the direction of the arrow d' through the gears 24.25, and the shutter 16 moves in the direction of the arrow d' through the arm 27'f;c. 14 moves in the direction of arrow f' at the same time as the shutter 13, and the shutters 13 and 14 open so that the film-forming material jumps onto the substrate 7.

このように、2枚のシャッタ13.14を同時にかつ互
いに異なる方向に移動させて開閉するので、基板7にお
けるシャッタ13..14の移動方向上のN部とN部の
膜厚を殆んど同一にすることができ、したがって通常の
シ・ヤツタ開閉時間でシャッタ15.14を開閉さすて
も膜厚バラツキを小さくすることができる。
In this way, since the two shutters 13 and 14 are opened and closed simultaneously and moved in different directions, the shutters 13 and 14 on the substrate 7 are opened and closed simultaneously. .. It is possible to make the film thicknesses of the N part and the N part in the moving direction of the shutter 14 almost the same, so that the film thickness variation can be reduced even if the shutter 15.14 is opened and closed during the normal shutter opening and closing time. Can be done.

なお、この実施例の他の構成9作用については、前記第
1図に示すものと同様である。
Note that the other functions of the structure 9 of this embodiment are the same as those shown in FIG. 1 above.

また、本発明ではシャッタ開閉機構15の具体的構造は
図示実施例に限らず、要は2枚のシャッタ15.1/l
を同時にかつ互いに異なる方向に移動させ得る構造であ
ればよい。
In addition, in the present invention, the specific structure of the shutter opening/closing mechanism 15 is not limited to the illustrated embodiment;
Any structure may be sufficient as long as it can move both at the same time and in different directions.

〔発明の効果〕〔Effect of the invention〕

以上説明した本発明によれば、基板と成膜源との間に、
2枚のシャッタを基板の前方で重合し得るように配置し
、前記2枚のシャッタを同時にかつ互いに反対方向に移
動させ得るシャッタ開閉機構に連結したことにより、基
板におけるシーヤツタの移動方向の両端部のV厚を同一
にすることができるので、通常のシャツタ開閉時間でシ
ャッタを器間しても、膜厚バラツキを小さくできる。
According to the present invention described above, between the substrate and the film forming source,
By arranging two shutters so that they can overlap in front of the board and connecting the two shutters to a shutter opening/closing mechanism that can move the two shutters simultaneously and in opposite directions, both ends of the board in the direction of movement of the shutters are Since the V thickness of the film can be made the same, variations in film thickness can be reduced even if the shutter is opened and closed at a normal shutter opening/closing time.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来のスパッタ装置の概略を示す縦断面図、第
2図は第1図に示すスパッタ装置のシャッタの開閉を示
す正面図、第6図および第4図は本発明の一実施例を示
すもので、その第3図は要部としてのシャッタとシャッ
タ開閉機構の正面図、第4図は同縦断側面図である。 1・・・真壁容器 4・・・成膜源を構成するスパッタ電極5・・・成膜材
料(ターゲット) 6・・・アノード    7・・・基板13.14・・
・シャッタ  15・・・シャッタ開閉機構16・・・
モータ     18・・・回転導入機19・・・駆動
軸     20・・受動軸24.25・・・歯車  
  26.27・・・アーム沁1図 舊2図 デ″50
FIG. 1 is a longitudinal sectional view schematically showing a conventional sputtering apparatus, FIG. 2 is a front view showing opening and closing of the shutter of the sputtering apparatus shown in FIG. 1, and FIGS. 6 and 4 are an embodiment of the present invention. FIG. 3 is a front view of the main parts of the shutter and the shutter opening/closing mechanism, and FIG. 4 is a longitudinal sectional side view of the same. DESCRIPTION OF SYMBOLS 1... Makabe container 4... Sputtering electrode 5... Film forming material (target) which constitutes a film forming source 6... Anode 7... Substrate 13.14...
・Shutter 15...Shutter opening/closing mechanism 16...
Motor 18...Rotation introduction machine 19...Drive shaft 20...Passive shaft 24.25...Gear
26.27...Arm 1 figure 2 figure de''50

Claims (1)

【特許請求の範囲】[Claims] 薄膜形成基板と成膜源との間に一12枚のシャッタを前
記薄膜形成基板の前方で重合し得るように配置するとと
もに、前記2枚のシャッタを同時にかつ互いに異なる方
向に移動させるシャッタ開閉機構に連結したことを特徴
とする薄膜形成装置。
112 shutters are arranged between a thin film forming substrate and a film forming source so that they can overlap in front of the thin film forming substrate, and a shutter opening/closing mechanism moves the two shutters simultaneously and in different directions. A thin film forming apparatus characterized by being connected to.
JP9936983A 1983-06-06 1983-06-06 Thin film forming device Pending JPS59226177A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9936983A JPS59226177A (en) 1983-06-06 1983-06-06 Thin film forming device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9936983A JPS59226177A (en) 1983-06-06 1983-06-06 Thin film forming device

Publications (1)

Publication Number Publication Date
JPS59226177A true JPS59226177A (en) 1984-12-19

Family

ID=14245627

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9936983A Pending JPS59226177A (en) 1983-06-06 1983-06-06 Thin film forming device

Country Status (1)

Country Link
JP (1) JPS59226177A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6333574A (en) * 1986-07-25 1988-02-13 Nec Corp Method for opening and closing shutter for controlling plasma flow
CN102653854A (en) * 2011-03-03 2012-09-05 鸿富锦精密工业(深圳)有限公司 Film coating device
CN112442661A (en) * 2019-08-28 2021-03-05 佳能株式会社 Evaporation plating device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
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CN102653854A (en) * 2011-03-03 2012-09-05 鸿富锦精密工业(深圳)有限公司 Film coating device
CN112442661A (en) * 2019-08-28 2021-03-05 佳能株式会社 Evaporation plating device

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